EP0409765A3 - Interferometrische Einrichtung - Google Patents
Interferometrische Einrichtung Download PDFInfo
- Publication number
- EP0409765A3 EP0409765A3 EP19900710016 EP90710016A EP0409765A3 EP 0409765 A3 EP0409765 A3 EP 0409765A3 EP 19900710016 EP19900710016 EP 19900710016 EP 90710016 A EP90710016 A EP 90710016A EP 0409765 A3 EP0409765 A3 EP 0409765A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- filter
- distance
- interference
- substance
- lines
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/2886—Investigating periodic spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/067—Electro-optic, magneto-optic, acousto-optic elements
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Die Erfindung betrifft ein interferometrische Einrichtung zum
Nachweis einer Substanz mit strukturiertem, insbesondere
periodischem oder quasiperiodischem Absorptionsspektrum und
besteht aus einer Strahlungsquelle, in deren Strahlengang die zu
untersuchende Substanz, ein Interferenzfilter, dessen Dicke den
Abstand der Interferenzlinien bestimmt sowie ein Detektor
angeordnet sind. Das Interferenzfilter ist ein thermooptisch
abstimmbares Filter, welches aus einer Platte aus
thermooptisch aktivem Material besteht, deren Stirnseiten
teildurchlässig verspiegelt sein können. Eine Verschiebung
der Durchlaßcharakteristik des Filters wird mit Hilfe einer
Temperaturänderung des Filters erzeugt wird, wobei die
Temperaturdifferenz ein Maß für die Verschiebung ist. Die Dicke
der Platte ist so gewählt, daß der Abstand der erzeugten
Interferenzlinien dem Abstand der Absorptionslinien der zu
bestimmenden Substanz entspricht.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3923831A DE3923831A1 (de) | 1989-07-19 | 1989-07-19 | Interferometrische einrichtung |
| DE3923831 | 1989-07-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP0409765A2 EP0409765A2 (de) | 1991-01-23 |
| EP0409765A3 true EP0409765A3 (de) | 1991-03-27 |
Family
ID=6385340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP19900710016 Withdrawn EP0409765A3 (de) | 1989-07-19 | 1990-07-04 | Interferometrische Einrichtung |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5059026A (de) |
| EP (1) | EP0409765A3 (de) |
| JP (2) | JPH0357942A (de) |
| DE (1) | DE3923831A1 (de) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1995035317A1 (en) * | 1990-03-14 | 1995-12-28 | National Research Council Of Canada | Identification, quantitation and purification of insecticidal proteins from bacillus thuringiensis |
| JP2522865B2 (ja) * | 1991-06-12 | 1996-08-07 | 日本無線株式会社 | 炭素同位体分析装置 |
| IT1249939B (it) * | 1991-06-28 | 1995-03-30 | Cselt Centro Studi Lab Telecom | Sistema di spettroscopia ad alta risoluzione. |
| US5347377A (en) * | 1992-06-17 | 1994-09-13 | Eastman Kodak Company | Planar waveguide liquid crystal variable retarder |
| US5408319A (en) * | 1992-09-01 | 1995-04-18 | International Business Machines Corporation | Optical wavelength demultiplexing filter for passing a selected one of a plurality of optical wavelengths |
| EP0686256B1 (de) * | 1993-02-23 | 1997-07-09 | Physical Sciences, Inc. | Abbildungsverfahren und -apparat |
| JP3294986B2 (ja) * | 1996-03-22 | 2002-06-24 | 富士通株式会社 | 温度依存性のない光素子 |
| EP1019686B1 (de) * | 1997-07-12 | 2009-08-26 | Roper Industries, Inc. | Multispektraler zweidimensionaler bildgebeuder spekteometer |
| US5982497A (en) * | 1998-07-09 | 1999-11-09 | Optical Insights, Llc | Multi-spectral two-dimensional imaging spectrometer |
| US6661950B1 (en) | 2001-01-10 | 2003-12-09 | Nomadics, Inc. | Microresonator-based tuned optical filter |
| US6856466B2 (en) | 2001-07-05 | 2005-02-15 | Science & Engineering Associates, Inc. | Multiple imaging system |
| AU2002219261A1 (en) * | 2001-12-18 | 2003-06-30 | Nokia Corporation | Electrically tunable interferometric filter |
| US20040145741A1 (en) * | 2003-01-24 | 2004-07-29 | Honeywell International Inc. | Comb etalon fluid analyzer |
| JP5608025B2 (ja) * | 2010-09-22 | 2014-10-15 | 紀男 伊吹 | ガス濃度測定方法及びガス濃度測定装置 |
| CN106324826A (zh) * | 2016-09-23 | 2017-01-11 | 北极光电(深圳)有限公司 | 一种基于温度控制硅镀膜基片光学厚度的可调谐光滤波器及其控制方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3939348A (en) * | 1974-06-11 | 1976-02-17 | Allied Chemical Corporation | Infrared gas analysis |
| EP0337054A2 (de) * | 1988-04-14 | 1989-10-18 | Hartmann & Braun Aktiengesellschaft | Interferometrische Einrichtung |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS604115U (ja) * | 1975-08-22 | 1985-01-12 | ベ−エフジエ・グラスグル−プ | 積層光透過性防火遮蔽パネル |
| JPS5729664A (en) * | 1980-07-25 | 1982-02-17 | Kanebo Ltd | Production of feather fabric |
| JPS5753644A (en) * | 1980-09-17 | 1982-03-30 | Olympus Optical Co Ltd | Photometric device using more than one wavelength |
| FR2581190B1 (fr) * | 1985-04-25 | 1987-06-19 | Elf France | Detecteur interferometrique de gaz |
| FR2619621B1 (fr) * | 1987-08-18 | 1989-12-22 | Centre Nat Rech Scient | Procede de mesure de la concentration d'un gaz dans un melange gazeux et dispositif pour la mise en oeuvre de ce procede |
-
1989
- 1989-07-19 DE DE3923831A patent/DE3923831A1/de active Granted
-
1990
- 1990-07-04 EP EP19900710016 patent/EP0409765A3/de not_active Withdrawn
- 1990-07-12 US US07/551,419 patent/US5059026A/en not_active Expired - Fee Related
- 1990-07-19 JP JP2189615A patent/JPH0357942A/ja active Pending
-
1994
- 1994-12-12 JP JP015311U patent/JPH0736049U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3939348A (en) * | 1974-06-11 | 1976-02-17 | Allied Chemical Corporation | Infrared gas analysis |
| EP0337054A2 (de) * | 1988-04-14 | 1989-10-18 | Hartmann & Braun Aktiengesellschaft | Interferometrische Einrichtung |
Non-Patent Citations (1)
| Title |
|---|
| APPLIED OPTICS, Band 8, Nr. 6, Juni 1969, Seiten 1125-1128, New York, US; D.C. AUTH: "Experimental investigation of thermally scanned fabry-perot interferometry" * |
Also Published As
| Publication number | Publication date |
|---|---|
| US5059026A (en) | 1991-10-22 |
| DE3923831C2 (de) | 1992-01-30 |
| EP0409765A2 (de) | 1991-01-23 |
| JPH0357942A (ja) | 1991-03-13 |
| JPH0736049U (ja) | 1995-07-04 |
| DE3923831A1 (de) | 1991-01-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): DE FR GB IT NL |
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| PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
| AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): DE FR GB IT NL |
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| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
| 18D | Application deemed to be withdrawn |
Effective date: 19910928 |