EP0542177A2 - Appareil de commande de l'épaisseur d'une couche - Google Patents

Appareil de commande de l'épaisseur d'une couche Download PDF

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Publication number
EP0542177A2
EP0542177A2 EP92119161A EP92119161A EP0542177A2 EP 0542177 A2 EP0542177 A2 EP 0542177A2 EP 92119161 A EP92119161 A EP 92119161A EP 92119161 A EP92119161 A EP 92119161A EP 0542177 A2 EP0542177 A2 EP 0542177A2
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Prior art keywords
time
film
thickness
state
equation
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EP92119161A
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German (de)
English (en)
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EP0542177B1 (fr
EP0542177A3 (en
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Noriyuki c/o Nagoya Research & Dev. Ctr Akasaka
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Mitsubishi Heavy Industries Ltd
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Mitsubishi Heavy Industries Ltd
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B13/00—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
    • G05B13/02—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
    • G05B13/0205—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric not using a model or a simulator of the controlled system
    • G05B13/024—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric not using a model or a simulator of the controlled system in which a parameter or coefficient is automatically adjusted to optimise the performance
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/03—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor characterised by the shape of the extruded material at extrusion
    • B29C48/07—Flat, e.g. panels
    • B29C48/08—Flat, e.g. panels flexible, e.g. films
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25—Component parts, details or accessories; Auxiliary operations
    • B29C48/88—Thermal treatment of the stream of extruded material, e.g. cooling
    • B29C48/911—Cooling
    • B29C48/9135—Cooling of flat articles, e.g. using specially adapted supporting means
    • B29C48/914—Cooling drums
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25—Component parts, details or accessories; Auxiliary operations
    • B29C48/92—Measuring, controlling or regulating
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D5/00—Control of dimensions of material
    • G05D5/02—Control of dimensions of material of thickness, e.g. of rolled material
    • G05D5/03—Control of dimensions of material of thickness, e.g. of rolled material characterised by the use of electric means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92009—Measured parameter
    • B29C2948/92114—Dimensions
    • B29C2948/92152—Thickness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92323—Location or phase of measurement
    • B29C2948/92428—Calibration, after-treatment, or cooling zone
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/9258—Velocity
    • B29C2948/926—Flow or feed rate
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/92609—Dimensions
    • B29C2948/92647—Thickness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/92704—Temperature
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92819—Location or phase of control
    • B29C2948/92923—Calibration, after-treatment or cooling zone
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C55/00—Shaping by stretching, e.g. drawing through a die; Apparatus therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29K—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
    • B29K2995/00—Properties of moulding materials, reinforcements, fillers, preformed parts or moulds
    • B29K2995/0037—Other properties
    • B29K2995/005—Oriented
    • B29K2995/0053—Oriented bi-axially
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
    • B29L2007/00—Flat articles, e.g. films or sheets
    • B29L2007/008—Wide strips, e.g. films, webs

Definitions

  • the present invention relates to a film thickness controller for use in an extrusion molding apparatus or a flowing type molding apparatus such as a film manufacturing apparatus.
  • Fig. 2 schematically illustrates a general process of manufacturing film.
  • An extruder 1 a is used to melt resin particles by a screw and liquefy them.
  • the molten resin is pushed out from a narrow gap 3a of a warm die 2a.
  • the gap 3a is kept to be the same width perpendicular to paper of Fig. 2 and accordingly liquefied resin 4a in the form of thin plate flows down from the die 2a.
  • the plate - like liquefied resin 4a comes into contact with a cooled rotating roller 5a to be hardened so that film 6a having a thickness is formed.
  • the film 6a is extended by a longitudinal extender 13 and a lateral extender 14 after the rotating roller 5a in order to obtain a profile having a predetermined thickness.
  • the longitudinal extender 13 increases a speed of movement of the film 6a along the flowing direction of the film to thereby extend the film 6a in the flowing direction and thin the thickness of the film.
  • the lateral extender 14 broadens the width of the film 6a without change of the film speed to thereby thin the thickness of the film.
  • the film 6a from the lateral extender 14 is wound on a winder 9a.
  • the film 6a is required to have the same predetermined thickness in the width direction. However, since it is difficult to cause the liquefied resin to pass through the narrow gap 3a of the die 2a in the width direction at the same speed, the thickness of the film 6a is not necessarily the same in the width direction.
  • a thickness gauge 10 measures a thickness of the film 6a.
  • a radiation by natural collapse of radioactive substance is utilized to measure a thickness of the film 6a in accordance with an attenuation factor of the radiation when the radiation passes through the film 6a.
  • a single detector included in the thickness gauge 10 is moved in the reciprocating manner in the width direction of the film 6a to thereby measure a thickness of the film in the width direction.
  • a number of heaters 12a are distributed and embedded in both sides of the gap 3a of the die 2a in the width direction of the film to uniform a flow of the liquefied resin at the gap 3a in the width direction of the film.
  • Fig. 4 is a block diagram schematically illustrating a principle of the thickness control.
  • a difference between a thickness of film measured by a thickness measuring instrument or a thickness gauge 10 and a set value of thickness is supplied to a controller 13.
  • the controller issues a command for heat to be generated of the heater 12a to vary generated heat from the heater 12a.
  • a speed of resin in the die 2a can be changed and a thickness of film at a portion where the generated heat of the heater is varied can be changed to thereby control the thickness of the film at the portion.
  • the conventional film thickness controller has technical problems (1), (2) and (3) as described hereinafter.
  • the thickness gauge 10 When a thickness gauge utilizing radiation is used, the thickness gauge 10 is moved in the reciprocating manner in the width direction of the film and when the thickness gauge reaches an end of the film, measurement of all of thickness data along the width direction is completed and control operation is started. In this case, time is required until the thickness gauge 10 reaches the end of the film after the thickness gauge 10 has measured a thickness at a certain portion of the film. This time is a lag time L2 until the control operation is actually stated after the thickness data has been obtained.
  • Fig. 5(a) is a block diagram schematically illustrating a thickness control system similar to the block diagram of Fig. 4 except that the lag times L1 and L2 are considered.
  • Fig. 5(b) is a block diagram in which the lag times are combined into one block equivalently. A conventional feedback control system does not have such lag time, while the thickness control system has the large lag time (L1 + L2) as shown in Fig. 5(b).
  • the film thickness controller as shown in Fig. 6 has been filed by the same applicant as this patent application.
  • the operational calculator estimates the state occurring earlier by the lag time and corrects a phase delay component due to the lag time by means of the time integration by the state shifter and the state prediction device.
  • G 1 (s) is a transfer function producing time variation of the thickness 3' when only the heater 3, for example, is varied.
  • G 2 (s) is a transfer function producing time variation of the thickness 3' when only the heater 2 or 4 is varied.
  • G 3 (s) is a transfer function producing time variation of the thickness 3' when only the heater 1 or 5 is varied.
  • the equation (1) does not include the lag time due to a film movement delay from the outlet of the die to the thickness gauge 10 and accordingly G 1 (s), G 2 (s) and G 3 -(s) are expressed by a rational function of the Laplace operator. Further, non - diagonal items of the transfer function matrix G(s) of equation (2) represent interference to thickness by adjacent heaters.
  • the output equation (3) is used to obtain the output Yp from the solution x(t) of the state equation (2) and the Laplace transform of the output Yp is multiplied by the transfer function e -SL corresponding to the lag time. This result is subjected to the Laplace transformation so that the output y(t) is obtained.
  • the thickness gauge 10 measures thickness of the film while being moved in the reciprocating manner in the width direction of the film. Since the film is moved at a certain speed, the thickness gauge 10 measures the thickness of the film along a locus as shown in Fig. 9. Thus, the control operation is made at points A and B. When the control operation is made at the end point A of the film and a measurement point of the thickness 3' is indicated by a point C of Fig. 9, the lag time L2 due to the movement of the thickness gauge 10 is expressed by a movement time L2' between the points C and A of Fig. 9.
  • the lag time L2 due to the movement of the thickness gauge 10 is expressed by a movement time L2" between points C' and B of Fig. 9. It is apparent from Fig. 9 that distances of L2' and L2" are generally different and accordingly the lag time L represented by the transfer function e -SL of Fig. 8 is different depending on the control operation for the thickness 3' made at the end point A and the control operation made at the end point B of the film.
  • the thickness gauge 10 uses an arrival end identification signal d representing whether the thickness gauge reaches either of both ends of the film.
  • x(t), y(t) ... etc. are all vectors. However, in order to make description more concretely below, the third components x a (t) and y 3 (t) are described as a typical example.
  • a difference between a detected value y 3 (t) and a set value r 3 (t) of the thickness 3' is calculated by the subtracter.
  • the integrator must integrate the difference E (t) from a time for the last control operation to a time t for the current control operation. However, actually, the integration can not be made until time (t-L) due to the lag time L.
  • An output /x I (t) of the integrator corresponding to u 3 (t) is expressed by
  • C 3 represents the third row of the matrix C of the equation (3).
  • the first term of the right side of the equation (6) is a time integration of an amount obtainable from the thickness gauge actually until time t and accordingly it can be calculated from the measured value.
  • an amount to be integrated of the second term of the right side can not be obtained from the thickness gauge and the time integration can be calculated as it is. Accordingly, in order to obtain /x I (t), the following expanded system including /x I (t) as the state variable is considered.
  • Equation (8) is expressed as follows: where /A and /B are matrix and vector as represented by
  • f 1 represents the first column of the matrix /F. Further, if /x(t) and x(t) is obtained and the feedback gain matrix /F is defined so that all peculiar values of the matrix (/A-/B/F) is within a stable area, the thickness y 3 (t) can be controlled to a predetermined value stably by means of the input u(t). Since the matrices /A and /B does not include influence of the lag time L, the feedback gain matrix /F can be decided such as a system having no lag time L, and rapidity and steady accuracy of the control system can be ensured.
  • /x I (t) and x(t) are obtained by initializing time (t-L) and integrating the equation (9) from time (t-L) to time t. Since the input u(t) is already known, the state amounts /x I (t) and x(t) can be obtained by performing the integration retroactively to the past by the lag time L.
  • an average value /L of the lag time L at the thickness control points of the whole width of the film is employed at first.
  • the average lag time /L is equal to the whole lag time L at the center thickness control point of the film.
  • the state amounts /x I (t) and x(t) at time that the control operation is made this time are obtained by the following equation by using the equation (2') with /x I (t - L) and x(t - L) as the initial state.
  • the first term /x I (t-L) of the right side of the equation (12) is expressed by the following equation by integrating the equation (7).
  • Equation (13) Since the right side of the equation (13) is a calculable amount and is equal to an integrated value of control difference of the output y 3 (t) until time t for this time control operation, the equation (13) is expressed as follows: where x I (t) is an integrated value of the control difference of the detected value y 3 (t) of the thickness 3' until time t.
  • the design method of the operational calculator is described below.
  • the control operation is made each time the thickness gauge 10 reaches the points A and B as shown in Fig. 9 or at intervals of a predetermined period of time T.
  • the time is a time required for the thickness gauge 10 to be moved across the film width.
  • the lag time L for the point C of the thickness 3' is different depending on the points A and B. That is, It is apparent that L A > L B for the point C.
  • Fig. 10 schematically illustrates calculation of the estimated value x(t K+1 -L A ) in the control operation at the point A.
  • the generated heat u(K) of the heater is maintained constant between the control operation time t K and t K+1 .
  • time t 1 is earlier than time tK+ by the lag time L A and time to is earlier than time t K by the lag time L B .
  • Time t 1 is early by several periods of the control period T in accordance with a magnitude of the lag time L A .
  • time t 1 is within a section (t Ki , t Ki+1 ).
  • Fig. 11 schematically illustrates calculation of the estimated value x(t K+1 - L B ) in the control operation at the point B.
  • the time interval T of the control operation are fixed, while since the lag times L A and L B at the points A and B are different, a difference of time corresponding to the estimated values and is different from the time interval T.
  • the estimated value w(t K+1 ) is obtained from the equations (18) and (19) as follows. First of all, the control operation at the point A shown in Fig. 10 is considered.
  • the estimated value to be obtained is expressed by w(t 1 ).
  • the predicted value w(t 1 ) of the state variable at time t 1 can be calculated on the basis of the known x(t o ) and input after time to from the equation (18) as follows.
  • K is a matrix for gain of the operational calculator.
  • the integration is to calculate a variation amount of state by input u( ⁇ ) from time (t-/L) to t.
  • Fig. 12 shows the case where /L satisfies T ⁇ /L ⁇ 2T.
  • the integrator 102 compensates external heat for varying the thickness y 3 by the generated heat from the heater and serves as an external compensator so that the thickness y 3 is always coincident with the set value.
  • OPERATION AMOUNT COMMANDER Generated heat u(K+1) by the heater from time K+1 to the next control operation time t K+1 is defined by the following equation using state feedback gain (f 1 , f 2 ).
  • the adder 107 supplies the approximate state estimated value , at time t K+i to the heat commander 108 and the heat commander 108 multiplies the state estimated value by the state feedback gain to thereby define the heat command value.
  • the conventional film thickness controller has the following problems.
  • a film molding apparatus including a die having a mechanism for adjusting and operating a discharge amount of molten resin along the width of film and a thickness gauge for detecting thickness of the film moving with a lag time Li from a position of the die to a position of the thickness gauge while moving in the direction perpendicular to a moving direction of the film in the reciprocating manner
  • respective adapters are added to an operational calculator, a state prediction device, a state shifter and an operation amount commander constituting the film thickness controller so that a matrix of a control operation equation is automatically modified to a value coincident with operation conditions with respect to variation of a lag time due to movement of the film and the matrix of the control operation equation, a gain matrix of a regulator and a gain of the operational calculator to values coincident with the operation conditions with respect to variation of film thickness sensitivity for input variation of a heater due to variation of the operation conditions.
  • a difference between a thickness value detected by the thickness gauge and a set thickness value at a position of the detection is calculated by a subtracter.
  • the thickness difference is time-integrated by an integrator.
  • An operation amount time sequence of the operation amount commander past by a time equal to a sum L of the lag time L 1 and a time L 2 until the thickness gauge reaches the end of the film starting from the measurement position is stored in a memory.
  • the stored information of the memory is supplied to the operational calculator, and an estimated value of state variable earlier than a time that the thickness gauge reaches the film side end and all thickness detected values of film are inputted by the lag time L in accordance with the film side end which the thickness gauge has reached.
  • the adapter for the operational calculator modifies the matrix used in the operation equation in the operational calculator to be coincident with the operation conditions.
  • the state shifter multiplies a coefficient for shifting the state by the average lag time /L which is an average value of the lag time L at both film side ends from outputs of the integrator and the operational calculator and produces the state estimated value at time when the thickness gauge reaches the film side end.
  • the adapter of the shifter modifies the matrix used in the operation equation in the state shifter to be coincident with the operation conditions.
  • the state prediction device produces an state variation amount by setting of input from time when the thickness gauge has reached the film side end to time past the average lag time /L on the basis of the past operation amount time sequence of an operation end stored in the memory.
  • the adapter for the state prediction device modifies the matrix used in the operation equation in the state prediction device to be coincident with the operation conditions.
  • Outputs of the state shifter and the state prediction device are added by the adder to obtain a state estimated value at time that the thickness gauge reaches the film side end.
  • This state estimated value is supplied to the operation amount commander and is multiplied by a state feedback gain to be produced as operation amount command value of the operation end.
  • the adapter for the operation amount commander modifies the matrix used in the operation equation in the operation amount commander to be coincident with the operation conditions.
  • the matrix of the control operation equation is automatically modified to a value coincident with the operation conditions with respect to variation of the lag time by movement of the film due to variation of the operation conditions and the matrix in the control operation equation, the gain matrix of the regulator and the gain matrix of the operational calculator are automatically modified to a value coincident with the operation conditions with respect to variation of film thickness sensitivity to the variation of heater input due to variation of the operation conditions, so that the predetermined rapidity of thickness control can be always obtained even if the operation conditions are varied.
  • Fig. 1 is a block diagram schematically illustrating a configuration of a film thickness controller according to an embodiment of the present invention.
  • the film thickness controller according to the present invention comprises an operational calculator adapter 200, a state prediction device adapter 201, a state shifter adapter 202 and an operation amount commander adapter 203 added to the operational calculator 103, the state prediction device 106, the state shifter 105 and the operation amount commander 108, respectively, in the film thickness controller shown in Fig. 6.
  • Other configuration is the same as that of the apparatus of Fig. 6. Accordingly, like elements are designated by like reference numeral and detailed description thereof is omitted.
  • Variation of the gain constant corresponding to variation of the discharge amount of the extruder is expressed by k2.
  • the variation k2 is defined by the following equation.
  • the equation (39) represents that the film thickness becomes thicker as the discharge amount of the extruder is increased.
  • Variation of the gain constant corresponding to variation of the extension magnification is expressed by k3.
  • the variation k3 is defined by the following equation.
  • the equation (40) represents that the film thickness becomes thicker as the extension magnification is increased.
  • the matrices (A, B, C) are the representation of the state equation given as a minimum realization system of transfer matrix kG0(s) in certain operation conditions.
  • Matrices of the state equation giving the minimum realization system of G0(s) are (A0, B0, CO).
  • the matrices (A, B, C) of the minimum realization system of the transfer function matrix kG0(s) are given by the following equation.
  • the matrices A and B are the same matrices AO and BO in the reference operation conditions even if the operation conditions are changed.
  • the matrix C is obtained by multiplying the matrix CO by the gain constant k defined by the equation (41).
  • the matrix /A used in the control operation equation (12) includes a part of the matrix C as described in the equation (10) and accordingly the matrix /A is changed when the operation conditions are changed.
  • the integration start time ti is assumed to be within the time section ( Ki , tKi+ 1).
  • Time t 1 is earlier than the current time t K+1 by the lag time L A or L B and accordingly time t 1 is changed depending on the operation conditions.
  • magnitudes m1 and m2 of the integration section of the equations (45) and (46) are determined.
  • the integration section (t 1 -to) is different for each control point but is not changed even if the operation conditions are changed.
  • the matrices A and B are not changed even if the operation conditions are changed as described in the equation (42) and accordingly may be calculated once previously.
  • variation of the operation conditions is treated by selecting a matrix corresponding to the following matrices:
  • the matrices are required to calculate the prediction values for each control point from the following matrix previously calculated by using the matrices A and B in the reference operation conditions.
  • the convergence of the operational calculator 103 is required not to be changed even if the operation conditions are changed. Accordingly, description is made to a line of thinking the gain matrix K of the operational calculator in the equations (27) and (30) when the operation conditions are changed.
  • a peculiar value of the operational calculator 103 is given by a peculiar value of the following matrix.
  • the gain matrix of the operational calculator in the reference operation conditions is K0, and it is understood that the peculiar value of the above matrix is the same as that in the reference operation conditions if the gain matrix K obtained by multiplying the gain matrix KO by 1/k is used when only the matrix C becomes k times in some operation conditions. Accordingly, in order that the convergence of the operational calculator is not changed even if the operational conditions are changed, the whole of the gain matrix KO of the operational calculator is required to be multiplied by 1/k.
  • the matrices /Ad, /Bd in the above operation conditions is determined from the matrices /Ado, /Bdo in the reference operational conditions by the following equation.
  • e /AIL is obtained as follows. For example, it is assumed that magnitude of /L is 3T ⁇ /L ⁇ 4T At this time, e /A/L is expressed by the following equation. e /A(3T) is already determined in the procedure (i) of (2) for the state prediction device 106. e /A(N ⁇ t) is selected and approximated from the matrix e /A(N ⁇ t) calculated in the procedure (ii) of (2) for the state prediction device 106.
  • the gain matrix of the regulator obtained in the reference operation conditions is /FO and the gain matrix /F obtained by multiplying only the first column of the gain matrix /FO by 1/k when the thickness sensitivity in some operation conditions becomes k times is used, the peculiar value of the matrix (/A-/B/F) at this time is almost the same as in the reference operation conditions. This is dependent on the fact that the matrices A and B are not changed for the operation conditions as described in the equation (42) and only the first term of the vector of the right side of the equation (11) becomes k times.
  • Operation for modifying the gain matrix /F of the regulator described above is made by the operation amount commander adapter 203 shown in Fig. 1.
  • a control model having ten heater as shown in Fig. 13 is disposed in the middle of a product and a simulation for controlling film thickness at control points 3 to 8 to a predetermined value has been made.
  • control performance is compared.
  • Fig. 14 shows control performance at the control points 3 to 5 when the set value of film thickness is increased by 0.5 ⁇ m in accordance with the control points 3 to 8 at the casting speed 40m/min.
  • Fig. 14 thickness variations at the positions corresponding to the heaters 1 and 2 are shown.
  • the control performance for the control points 6 to 8 represent the same result as Fig. 14.
  • the lag time for the film thickness detection is increased as the casting speed is reduced, while it is understood that the control performance is not almost changed and the settled state is reached in about 15 minutes even if the casting speed is varied.
  • the matrix of the control operation equation is automatically modified to a value coincident with the operation conditions in accordance with variation of the lag time due to movement of the film by change of the operation conditions
  • the gain matrix of the operational calculator, the gain matrix of the regulator and the matrix in the control operation equation are automatically modified to values coincident with the operation conditions with respect to variation of film thickness sensitivity to variation of heater input by change of the operation conditions, so that the rapidity of the predetermined thickness control can be always obtained even if the operation conditions are varied.

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Health & Medical Sciences (AREA)
  • Thermal Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Software Systems (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)
  • Moulding By Coating Moulds (AREA)
  • Shaping By String And By Release Of Stress In Plastics And The Like (AREA)
EP92119161A 1991-11-12 1992-11-09 Appareil de commande de l'épaisseur d'une couche Expired - Lifetime EP0542177B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP295978/91 1991-11-12
JP3295978A JP3021135B2 (ja) 1991-11-12 1991-11-12 フィルム厚み制御装置

Publications (3)

Publication Number Publication Date
EP0542177A2 true EP0542177A2 (fr) 1993-05-19
EP0542177A3 EP0542177A3 (en) 1993-09-08
EP0542177B1 EP0542177B1 (fr) 1999-01-20

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ID=17827559

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Application Number Title Priority Date Filing Date
EP92119161A Expired - Lifetime EP0542177B1 (fr) 1991-11-12 1992-11-09 Appareil de commande de l'épaisseur d'une couche

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US (1) US5359532A (fr)
EP (1) EP0542177B1 (fr)
JP (1) JP3021135B2 (fr)
DE (1) DE69228224T2 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1001320A1 (fr) * 1998-11-10 2000-05-17 Siemens Aktiengesellschaft Procédé pour l' identification d' un processus avec retard utilisant une compensation et dispositif pour la commande d' un tel processus
WO2000028389A1 (fr) * 1998-11-10 2000-05-18 Siemens Aktiengesellschaft Dispositif de regulation de la temperature d'un processus technique
EP1325806A4 (fr) * 2000-09-19 2007-11-07 Toray Industries Procede de fabrication de feuilles

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6363330B1 (en) 1998-04-10 2002-03-26 Satnam Singh Sampuran Alag Thermocouple failure detection in power generation turbines
JP4834946B2 (ja) * 2000-09-21 2011-12-14 東レ株式会社 シートの製造方法およびシート厚み制御装置
EP1987942A3 (fr) * 2000-09-21 2009-12-23 Toray Industries Inc. Feuille obtenue par l'extrusion et le moulage d'une matière première
JP4571345B2 (ja) * 2001-08-06 2010-10-27 株式会社カネカ フィルム製造装置における、アクチュエータと厚みセンサとの間の対応関係のずれを検出するための方法、フィルムの厚み制御方法、装置およびプログラム
DE10300375B4 (de) * 2003-01-06 2013-06-13 Windmöller & Hölscher Kg Verfahren zur Regelung der Dicke extrudierter Folie I
DE10300374B4 (de) * 2003-01-06 2010-12-23 Windmöller & Hölscher Kg Verfahren und Vorrichtung zur Regelung der Dicke extrudierter Folie
EP4259341B1 (fr) * 2020-12-09 2025-07-30 3M Innovative Properties Company Réglage de position de filière plate à contrainte de sonnerie
CN113478713A (zh) * 2021-07-16 2021-10-08 浙江锦盛装饰材料有限公司 一种用于立体装饰膜制作的延展拉伸组件
CN117863422B (zh) * 2024-01-18 2024-10-29 钛玛科（北京）工业科技有限公司 一种流延机薄膜厚度自动测量控制系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3176317D1 (en) * 1980-02-28 1987-08-20 Mitsubishi Heavy Ind Ltd Method and apparatus for controlling the thickness of a film product
US4994976A (en) * 1988-02-17 1991-02-19 Mitsubishi Jukogyo Kabushiki Kaisha Film thickness controller
US5038397A (en) * 1989-02-15 1991-08-06 Mitsubishi Jukogyo K.K. Film thickness controller
US5104593A (en) * 1990-03-21 1992-04-14 Joseph Daniel R Method and apparatus for gauging and controlling circumference of extrusion-blown film

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1001320A1 (fr) * 1998-11-10 2000-05-17 Siemens Aktiengesellschaft Procédé pour l' identification d' un processus avec retard utilisant une compensation et dispositif pour la commande d' un tel processus
WO2000028389A1 (fr) * 1998-11-10 2000-05-18 Siemens Aktiengesellschaft Dispositif de regulation de la temperature d'un processus technique
EP1325806A4 (fr) * 2000-09-19 2007-11-07 Toray Industries Procede de fabrication de feuilles

Also Published As

Publication number Publication date
JP3021135B2 (ja) 2000-03-15
DE69228224T2 (de) 1999-09-23
JPH05131527A (ja) 1993-05-28
US5359532A (en) 1994-10-25
EP0542177B1 (fr) 1999-01-20
DE69228224D1 (de) 1999-03-04
EP0542177A3 (en) 1993-09-08

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