EP0853818A4 - Niederspannungs-kurzkanal-graben-dmos-transistor - Google Patents
Niederspannungs-kurzkanal-graben-dmos-transistorInfo
- Publication number
- EP0853818A4 EP0853818A4 EP96927387A EP96927387A EP0853818A4 EP 0853818 A4 EP0853818 A4 EP 0853818A4 EP 96927387 A EP96927387 A EP 96927387A EP 96927387 A EP96927387 A EP 96927387A EP 0853818 A4 EP0853818 A4 EP 0853818A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- low
- mos transistor
- short channel
- voltage short
- diffusion mos
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000009792 diffusion process Methods 0.000 title 1
- 230000009977 dual effect Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/393—Body regions of DMOS transistors or IGBTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/63—Vertical IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions
- H10D64/27—Electrodes not carrying the current to be rectified, amplified, oscillated or switched, e.g. gates
- H10D64/311—Gate electrodes for field-effect devices
- H10D64/411—Gate electrodes for field-effect devices for FETs
- H10D64/511—Gate electrodes for field-effect devices for FETs for IGFETs
- H10D64/514—Gate electrodes for field-effect devices for FETs for IGFETs characterised by the insulating layers
- H10D64/516—Gate electrodes for field-effect devices for FETs for IGFETs characterised by the insulating layers the thicknesses being non-uniform
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US53715695A | 1995-08-21 | 1995-08-21 | |
| US537156 | 1995-08-21 | ||
| PCT/US1996/013039 WO1997007548A1 (en) | 1995-08-21 | 1996-08-15 | Low voltage short channel trench dmos transistor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP0853818A1 EP0853818A1 (de) | 1998-07-22 |
| EP0853818A4 true EP0853818A4 (de) | 1998-11-11 |
Family
ID=24141458
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP96927387A Withdrawn EP0853818A4 (de) | 1995-08-21 | 1996-08-15 | Niederspannungs-kurzkanal-graben-dmos-transistor |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP0853818A4 (de) |
| AU (1) | AU6722396A (de) |
| WO (1) | WO1997007548A1 (de) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6429481B1 (en) * | 1997-11-14 | 2002-08-06 | Fairchild Semiconductor Corporation | Field effect transistor and method of its manufacture |
| DE19935442C1 (de) | 1999-07-28 | 2000-12-21 | Siemens Ag | Verfahren zum Herstellen eines Trench-MOS-Leistungstransistors |
| DE10009345C1 (de) * | 2000-02-28 | 2001-07-19 | Infineon Technologies Ag | Feldeffekt-Transistoranordnung mit hoher Latch-up-Festigkeit und Verfahren zu deren Herstellung |
| US6312993B1 (en) * | 2000-02-29 | 2001-11-06 | General Semiconductor, Inc. | High speed trench DMOS |
| US6921939B2 (en) * | 2000-07-20 | 2005-07-26 | Fairchild Semiconductor Corporation | Power MOSFET and method for forming same using a self-aligned body implant |
| JP4813762B2 (ja) * | 2003-12-25 | 2011-11-09 | ルネサスエレクトロニクス株式会社 | 半導体装置及びその製造方法 |
| US8698232B2 (en) | 2010-01-04 | 2014-04-15 | International Rectifier Corporation | Semiconductor device including a voltage controlled termination structure and method for fabricating same |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5674960A (en) * | 1979-11-22 | 1981-06-20 | Toshiba Corp | Semiconductor integrated circuit |
| US4369564A (en) * | 1979-10-29 | 1983-01-25 | American Microsystems, Inc. | VMOS Memory cell and method for making same |
| US4767722A (en) * | 1986-03-24 | 1988-08-30 | Siliconix Incorporated | Method for making planar vertical channel DMOS structures |
| US4814839A (en) * | 1977-01-11 | 1989-03-21 | Zaidan Hojin Handotai Kenkyu Shinkokai | Insulated gate static induction transistor and integrated circuit including same |
| US5021845A (en) * | 1985-08-30 | 1991-06-04 | Texas Instruments Incorporated | Semiconductor device and process fabrication thereof |
| US5298780A (en) * | 1992-02-17 | 1994-03-29 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device and method of fabricating same |
| US5385853A (en) * | 1992-12-02 | 1995-01-31 | International Business Machines Corporation | Method of fabricating a metal oxide semiconductor heterojunction field effect transistor (MOSHFET) |
| EP0717450A2 (de) * | 1994-12-13 | 1996-06-19 | Mitsubishi Denki Kabushiki Kaisha | Vertikale Halbleiteranordnung mit isoliertem Gate und Vefahren zur Herstellung |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL184551C (nl) * | 1978-07-24 | 1989-08-16 | Philips Nv | Veldeffekttransistor met geisoleerde stuurelektrode. |
| US5910669A (en) * | 1992-07-24 | 1999-06-08 | Siliconix Incorporated | Field effect Trench transistor having lightly doped epitaxial region on the surface portion thereof |
| US5341011A (en) * | 1993-03-15 | 1994-08-23 | Siliconix Incorporated | Short channel trenched DMOS transistor |
-
1996
- 1996-08-15 EP EP96927387A patent/EP0853818A4/de not_active Withdrawn
- 1996-08-15 AU AU67223/96A patent/AU6722396A/en not_active Abandoned
- 1996-08-15 WO PCT/US1996/013039 patent/WO1997007548A1/en not_active Ceased
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4814839A (en) * | 1977-01-11 | 1989-03-21 | Zaidan Hojin Handotai Kenkyu Shinkokai | Insulated gate static induction transistor and integrated circuit including same |
| US4369564A (en) * | 1979-10-29 | 1983-01-25 | American Microsystems, Inc. | VMOS Memory cell and method for making same |
| JPS5674960A (en) * | 1979-11-22 | 1981-06-20 | Toshiba Corp | Semiconductor integrated circuit |
| US5021845A (en) * | 1985-08-30 | 1991-06-04 | Texas Instruments Incorporated | Semiconductor device and process fabrication thereof |
| US4767722A (en) * | 1986-03-24 | 1988-08-30 | Siliconix Incorporated | Method for making planar vertical channel DMOS structures |
| US5298780A (en) * | 1992-02-17 | 1994-03-29 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device and method of fabricating same |
| US5385853A (en) * | 1992-12-02 | 1995-01-31 | International Business Machines Corporation | Method of fabricating a metal oxide semiconductor heterojunction field effect transistor (MOSHFET) |
| EP0717450A2 (de) * | 1994-12-13 | 1996-06-19 | Mitsubishi Denki Kabushiki Kaisha | Vertikale Halbleiteranordnung mit isoliertem Gate und Vefahren zur Herstellung |
Non-Patent Citations (2)
| Title |
|---|
| PATENT ABSTRACTS OF JAPAN vol. 005, no. 141 (E - 073) 5 September 1981 (1981-09-05) * |
| See also references of WO9707548A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| WO1997007548A1 (en) | 1997-02-27 |
| AU6722396A (en) | 1997-03-12 |
| EP0853818A1 (de) | 1998-07-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| 17P | Request for examination filed |
Effective date: 19980310 |
|
| AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE FR GB IT NL |
|
| A4 | Supplementary search report drawn up and despatched |
Effective date: 19980923 |
|
| AK | Designated contracting states |
Kind code of ref document: A4 Designated state(s): DE FR GB IT NL |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN |
|
| 18W | Application withdrawn |
Withdrawal date: 19981216 |