EP0866944A2 - Dispositif pour controler les dimensions de composants plats - Google Patents

Dispositif pour controler les dimensions de composants plats

Info

Publication number
EP0866944A2
EP0866944A2 EP96946156A EP96946156A EP0866944A2 EP 0866944 A2 EP0866944 A2 EP 0866944A2 EP 96946156 A EP96946156 A EP 96946156A EP 96946156 A EP96946156 A EP 96946156A EP 0866944 A2 EP0866944 A2 EP 0866944A2
Authority
EP
European Patent Office
Prior art keywords
sections
radiation
radiation source
measured
detector arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP96946156A
Other languages
German (de)
English (en)
Other versions
EP0866944B1 (fr
Inventor
Christian Feige
Franz-Josef Urban
Steffen Hildebrandt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vacutec Messtechnik GmbH
Original Assignee
Vacutec Messtechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vacutec Messtechnik GmbH filed Critical Vacutec Messtechnik GmbH
Publication of EP0866944A2 publication Critical patent/EP0866944A2/fr
Application granted granted Critical
Publication of EP0866944B1 publication Critical patent/EP0866944B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Definitions

  • the invention relates to a device for controlling surface masses during the production of material webs by means of a radiation source which radiates through the material web or the material to be measured and detection of the residual radiation on the side of the material to be measured which is opposite the radiation source with the aid of a gas-filled ionization detector.
  • Such devices are used, for example, for the continuous thickness measurement of cold or hot-rolled sheets or foils, or also for the continuous thickness measurement of paper webs or the like.
  • the thickness measurement is carried out in a punctiform manner with the aid of a radiation source, such as an X-ray or nuclear radiation source with suitable intensity, type of radiation and energy, the radiation intensity of which is weakened by the material web or the material to be measured is measured by an ionization chamber.
  • a radiation source such as an X-ray or nuclear radiation source with suitable intensity, type of radiation and energy, the radiation intensity of which is weakened by the material web or the material to be measured is measured by an ionization chamber.
  • the radiation source and the ionization chamber can be attached to a carrier which is then moved across the material web to be measured.
  • the disadvantage here is that the thickness measurement continues to be punctiform, which in particular with very fast moving material webs, as is usually the case with rolling mills, leads to the fact that only a principally incomplete statement is made about the material thickness to the width of the material web is possible. An interpolation of the measured values across the entire width of the material is admittedly possible. but does not always produce the desired accuracy.
  • a similar result is achieved if a large number of ionization chambers are arranged in a line next to one another and the radiation source is moved in a traversing frame relative to the ionization chambers and transversely to the direction of movement of the material web to be measured.
  • the use of a linear radiation source and an ionization chamber which can be moved relative to this are also known.
  • Such a device for measuring the thickness of flat profiles is known from DE 31 40 714 AI.
  • one or more point-shaped radiation sources are arranged above the flat profile to be measured, to which a plurality of ionization chambers are assigned below the flat profile. Since the radiation sources are designed as point sources and the radiation is masked out in the form of a fan, the ionization chambers each assigned to a radiation source are aligned with the radiation source.
  • the ionization chambers are arranged in a collimator bar, which is provided with cylindrical collimator openings, the axes of which are exactly aligned with the radiation source.
  • this does not ensure that the radiation intensity reaching each ionization chamber is the same.
  • the invention is therefore based on the object of providing a device for checking surface masses, which avoids the deficiencies of the prior art and which in particular provides as detailed information as possible about the surface mass.
  • the invention creates the possibility of measuring the transverse profile of material webs, so that it is possible to exert an immediate influence on the production process. Since the radiation source and the measuring chambers no longer have to be moved during the measuring process, the technical outlay is considerably reduced. In addition, the short distance between the radiation source and the measuring chambers enables the use of soft radiation.
  • the common gas filling prevents changes in sensitivity caused by the filling gas.
  • 1 shows a detector arrangement according to the invention with a linear radiation source
  • 2 shows a perspective detailed illustration of the detector arrangement
  • FIG. 3 shows a detector arrangement with a linear radiation source and a collimator
  • Fig. 8 shows a two-row arrangement of sections.
  • FIG. 1 and 2 show a detector arrangement 1 according to the invention comprising a trough-shaped housing 2 with internal sections 3.
  • the sections 3 are delimited by wall electrodes 4 arranged between them and by the housing 2 of the detector arrangement 1.
  • collecting electrodes 5 are fastened on supports 6, which are fixed in a gas-tight manner in the bottom 7 of the housing 2 via insulators 8.
  • the upper end of the housing 2 is formed by a closure plate 10 provided with radiation entry windows 9, which is connected to the housing 2 in a gas-tight manner.
  • the radiation entry windows 9 are closed in the usual way by a thin metal foil, which is preferably arched upwards under prestress.
  • the wall electrodes 4 are only connected to the side walls of the housing 2, the lower and upper end edges 13 leaving a space 14 between the bottom 7 and the closure plate 10. Instead of these gaps 14, slots or bores can also be provided in the wall electrodes 4. In this way it is ensured that the same physical parameters can be set within the housing 2 and thus within the sections 3 with regard to the gas filling.
  • the detector arrangement 1 permits the use of soft beta emitters, so that the possible uses are expanded, in particular for measured materials with a low mass per unit area.
  • a linear radiation source 15 in the form of an isotope source is arranged above the detector arrangement 1 and at a small distance from it.
  • any other radiation sources the selection of which depends on the type of the measured material 16 to be measured, which is to be passed between the radiation source 15 and the detector arrangement 1, so that the radiation 17 penetrates the measured material 16 and into the Sections 3 causes an ionization of the gas contained therein.
  • spotlights with each section 3 then having to be assigned a spotlight.
  • a collimator 18 can be arranged directly under the radiation source 15, the openings 19 of which are each arranged above a measuring chamber 3. This results in a partial masking of the radiation 17 and thus a clear assignment of the measured values of the measuring chambers 3 to the material to be measured 16.
  • the parallel arrangement of the measuring chambers 3 and a colinear emission of the radiation by using the linear radiation source 15 in connection with the collimator system eliminates the problems associated with the radiation divergence.
  • the chamber current caused by the ionizing radiation 17 is converted with the aid of current-voltage converters 20, which are connected to the supports 6, and can then be evaluated in the usual way.
  • a DC voltage source 21 is connected between the collecting electrodes 5 and the housing 2.
  • the number and the size of the measuring chambers 3 to be arranged within the housing 2 can be freely selected depending on the required resolution and the width of the material web to be measured.
  • FIG. 4 shows a plan view of a detector arrangement 1 with round measuring chambers 3 and associated radiation entry windows 9
  • FIG. 5 shows a detector arrangement 1 with angular measuring chambers 3 and round radiation entry windows 9.
  • FIG. 6 shows a variant of the detector arrangement 1, in which a continuous radiation entrance window 9 is provided which covers all measuring chambers 3, as a result of which the production outlay can be reduced.
  • FIG. 7 Another variant of the detector arrangement 1 is shown in FIG. 7.
  • the radiation entry windows 9 have one particularly large rectangular cross section, so that a high sensitivity / resolution is achieved even with a soft radiation source 15.
  • the measuring chambers 3 can also be arranged offset in two rows (FIG. 8), with a linear radiation source 15 in connection with a corresponding collimator in this case if there is sufficient radiation divergence transversely to the longitudinal extent 18 is sufficient.
  • the above-described device for checking surface masses is particularly simple to manufacture, since complex adjustment or alignment processes are dispensed with. In addition, there is no need for any traversing processes, since the surface mass is measured with stationary elements, it being possible to determine a thickness profile over the entire width of the measured material 16 and thus to exert a direct influence on the manufacturing process.

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

L'invention concerne, d'une part, un dispositif pour contrôler des composants plats pendant la production de bandes de materiau au moyen d'une source de rayonnement qui irradie la bande ou le produit à mesurer et, d'autre part, la détection du rayonnement résiduel sur le côté du produit à mesurer opposé à la source de rayonnement à l'aide d'un détecteur d'ionisation rempli de gaz. L'invention a pour objet de créer un dispositif de contrôle de composants plats qui comble les lacunes de la technique antérieure, notamment, en fournissant des informations si possible détaillées sur le composant plat. L'invention est caractérisée en ce que le système détecteur (3) est composé d'une pluralité de sections (3) interconnectées et présentant des électrodes de captage (5), lesdites sections étant disposées dans un boîtier (2) commun, en ce que les sections (3) peuvent être mises sous vide ensemble et remplies d'un gaz ionisable, en ce qu'une fenêtre d'entrée du rayonnement (9) est affectée à chaque section (3) et en ce que la source de rayonnement (15) affectée aux sections (3) présente une répartition linéaire du rayonnement.
EP96946156A 1995-12-05 1996-12-03 Dispositif pour controler les dimensions de composants plats Expired - Lifetime EP0866944B1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19545340A DE19545340C2 (de) 1995-12-05 1995-12-05 Vorrichtung zur Kontrolle von Flächenmassen
DE19545340 1995-12-05
PCT/DE1996/002314 WO1997021075A2 (fr) 1995-12-05 1996-12-03 Dispositif de contrôle de composants plats

Publications (2)

Publication Number Publication Date
EP0866944A2 true EP0866944A2 (fr) 1998-09-30
EP0866944B1 EP0866944B1 (fr) 2001-08-08

Family

ID=7779239

Family Applications (1)

Application Number Title Priority Date Filing Date
EP96946156A Expired - Lifetime EP0866944B1 (fr) 1995-12-05 1996-12-03 Dispositif pour controler les dimensions de composants plats

Country Status (5)

Country Link
US (1) US6204507B1 (fr)
EP (1) EP0866944B1 (fr)
JP (1) JP2000501188A (fr)
DE (2) DE19545340C2 (fr)
WO (1) WO1997021075A2 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19731608C1 (de) * 1997-07-23 1998-10-22 Vacutec Mestechnik Gmbh Ionisationskammer für radiometrische Meßeinrichtungen
EP0968519B1 (fr) * 1997-03-21 2003-05-21 Vacutec Messtechnik GmbH Chambre d'ionisation pour instruments de mesure radiometriques
DE19913929A1 (de) 1999-03-26 2000-09-28 Voith Sulzer Papiertech Patent Vorrichtung und Verfahren zum Bestimmen von Eigenschaften einer Materialbahn
US7106828B2 (en) * 2001-11-26 2006-09-12 Agilent Technologies, Inc. X-ray imaging using pixelated gas detectors
DE10214584B4 (de) * 2002-03-01 2004-07-08 Mahlo Gmbh & Co Kg Verfahren zur Kompensation des Einflusses physikalisch-chemischer, das Resultat einer Flächengewichtsmessung verfälschender Änderungen des Absorptionsvermögens einer Umgebungsatmosphäre in der Nähe geförderter Materialien
DE102007001358B4 (de) * 2007-01-09 2020-12-24 Fagus-Grecon Greten Gmbh & Co. Kg Vorrichtung zum Schutz einer Verarbeitungseinrichtung für einen vorzugsweise endlosen, bewegten Materialstrang gegen mechanische Beschädigungen
CN118647866A (zh) * 2022-08-30 2024-09-13 宁德时代新能源科技股份有限公司 极片检测的设备

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1260805A (fr) 1956-03-23 1961-05-12 Ohmart Corp Chambre d'ionisation notamment pour systèmes de mesure ou de contrôle
US3160753A (en) * 1959-02-02 1964-12-08 Industrial Nucleonics Corp Method and means for measuring hardness
DE1812893A1 (de) 1968-12-05 1970-06-18 Knapsack Ag, 5033 Knapsack Anordnung zur Dickenmessung von Walzgut, insbesondere von Folien
DE3140714A1 (de) * 1981-10-14 1983-04-28 Paul Ing.(Grad.) Flormann Vorrichtung zur dickenmessung von flachprofilen
DE3327267A1 (de) * 1983-07-28 1985-02-14 Fuji Electric Co., Ltd., Kawasaki, Kanagawa Vorrichtung zur messung der wandstaerke eines rohrfoermigen teils
JPS60230009A (ja) 1984-04-28 1985-11-15 Toshiba Corp 放射線厚さ計
EP0233389A1 (fr) * 1986-02-12 1987-08-26 Josef W. Repsch Méthode de mesure du poids par unité de surface, de la densité et de l'épaisseur d'une bande en défilement
US4720808A (en) 1985-05-15 1988-01-19 Josef Repsch Method and apparatus for measuring sheet products
DE3707107A1 (de) * 1987-03-05 1988-09-15 Flormann Paul Vorrichtung zur simultanen erfassung des dickenquerprofils und der bandbreite beim warmwalzen von flachprofilen
FI83706C (fi) * 1988-11-03 1991-08-12 Kajaani Electronics Foerfarande och anordning foer maetning av pappersformation.
CN1027021C (zh) * 1993-03-18 1994-12-14 清华大学 气体电离型高能x.γ辐射成象阵列探测装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO9721075A2 *

Also Published As

Publication number Publication date
WO1997021075A2 (fr) 1997-06-12
DE19545340C2 (de) 1998-01-29
US6204507B1 (en) 2001-03-20
JP2000501188A (ja) 2000-02-02
EP0866944B1 (fr) 2001-08-08
WO1997021075A3 (fr) 1997-07-17
DE59607463D1 (de) 2001-09-13
DE19545340A1 (de) 1997-06-12

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