EP2474041A2 - Matériau stratifié à semiconducteur et cellule solaire à hétérojonction - Google Patents
Matériau stratifié à semiconducteur et cellule solaire à hétérojonctionInfo
- Publication number
- EP2474041A2 EP2474041A2 EP10728700A EP10728700A EP2474041A2 EP 2474041 A2 EP2474041 A2 EP 2474041A2 EP 10728700 A EP10728700 A EP 10728700A EP 10728700 A EP10728700 A EP 10728700A EP 2474041 A2 EP2474041 A2 EP 2474041A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- layers
- semiconductor
- semiconductor layer
- layer
- solar cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000000463 material Substances 0.000 title claims abstract description 42
- 239000004065 semiconductor Substances 0.000 title claims abstract description 34
- 150000001875 compounds Chemical class 0.000 claims abstract 2
- 150000004767 nitrides Chemical class 0.000 claims abstract 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 12
- 229910052710 silicon Inorganic materials 0.000 claims description 12
- 239000010703 silicon Substances 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 10
- 238000000137 annealing Methods 0.000 claims description 5
- 238000002161 passivation Methods 0.000 claims description 5
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 2
- 229910052796 boron Inorganic materials 0.000 claims description 2
- 229910052698 phosphorus Inorganic materials 0.000 claims description 2
- 239000011574 phosphorus Substances 0.000 claims description 2
- 238000005496 tempering Methods 0.000 abstract 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 11
- 229910021417 amorphous silicon Inorganic materials 0.000 description 9
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 5
- 229910010271 silicon carbide Inorganic materials 0.000 description 5
- 229910004298 SiO 2 Inorganic materials 0.000 description 4
- 239000002800 charge carrier Substances 0.000 description 4
- 239000002086 nanomaterial Substances 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 125000005842 heteroatom Chemical group 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 2
- 229910021419 crystalline silicon Inorganic materials 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 241000196324 Embryophyta Species 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000002803 fossil fuel Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
- H10F77/162—Non-monocrystalline materials, e.g. semiconductor particles embedded in insulating materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/16—Photovoltaic cells having only PN heterojunction potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/122—Active materials comprising only Group IV materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/146—Superlattices; Multiple quantum well structures
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
Definitions
- the invention relates to a semiconductor layer material, in particular for use as an emitter material for a solar cell, as well as a heterojunction solar cell.
- a semiconductor layer material in particular for use as an emitter material for a solar cell, as well as a heterojunction solar cell.
- heterojunction solar cells significantly higher voltages can be achieved because of the lower blocking saturation currents of the emitters compared to homojunction cells.
- the efficiency potential of heterojunction cells is 1-2% absolute above the efficiency potential of homojunction cells.
- the hitherto available heterojunction solar cells have a doped hetero-emitter of amorphous silicon (aSi); see . M. Tanaka, M. Taguchi, T.
- the doping of the emitter allows the formation of a pn junction and thus the extraction of the charge carriers generated by sunlight.
- the most important task of the amorphous silicon layer is to passivate the wafer surface of the solar cell and thus reduce the recombination rate of the charge carriers generated by sunlight, thereby increasing the concentration of the charge carriers in the solar cell , The higher charge carrier concentration leads to a greater splitting of the quasi-Fermi levels in the cell, which is equivalent to a higher achievable electrical voltage at the solar cell.
- the high doping of the aSi emitter leads to the fact that light absorbed in the emitter does not contribute to the generation of electricity in the solar cell; see .
- tandem solar cells based on silicon in which stacks of alternating Si and SiO x layers are used as the light-absorbing and charge-carrier-generating layer of a solar cell.
- the invention has for its object to provide an improved solution for the realization of the emitter layer of a heterojunction solar cell, which combines in particular good passivation properties with sufficiently high conductivity and high transparency for the active components of sunlight.
- the most important advantage of the Si-based nanostructure material proposed here as a hetero emitter is the significantly lower light absorption in comparison to the previously used amorphous silicon, whereby the losses due to light absorption in the electrically "dead” amorphous Si layer can be significantly minimized W.
- An essential idea of the invention is to provide a novel Si nanostructuring material, which has a significantly higher optical transparency than the previously used amorphous Si due to its nanocrystalline structure, but at the same time shows similarly good passivation properties and a similarly good electrical conductivity.
- This nanostructure material is formed in particular by alternating deposition of sub-stoichiometric silicon oxide (SiO x ) (alternatively also silicon carbide (SiC ⁇ ) or silicon nitride (SiN x )) layers and silicon layers in the layer thickness range below 10 nm.
- SiO x sub-stoichiometric silicon oxide
- SiC ⁇ silicon carbide
- SiN x silicon nitride
- the proposed layer material can also be used outside the insert proposed here as the emitter material of a heterojunction solar cell.
- a particularly advantageous embodiment within the scope of the existing task provides that a boundary layer of the stack is formed by a second layer and on the outside of which micro contact areas of the first layer adjacent thereto are exposed.
- nanostructure material used here means that at least the first layers have a nanocrystalline structure
- the thickness of the first and second layers is in each case in the range between 1 nm and 20 nm, preferably between 2 nm and 10 nm
- the total thickness in the range between 5 nm and 100 nm, preferably between 10 nm and 60 nm.
- the total number of layers is between 4 and 20, preferably between 8 and 16.
- the semiconductor material - here in particular silicon - is in an advantageous embodiment as p-material with phosphorus or as n-material with boron with a concentration in the range of 10 18 to 10 20 cm “3 , in particular from 5 x 10 18 to 5 x 10 19 cm “3 , doped. Due to the property of this network to establish contact with the adjacent layer only at individual points, when used in the heterojunction solar cell only quasi point-like transitions between emitter layer and silicon wafer occur, while the majority of the wafer surface is formed by SiO 2 (alternatively SiC or SiN) is passivated. As a result, the advantage of good passivation of the wafer surface which has also been exploited in conventional heterosocial cells is retained.
- FIG. 1 is a schematic representation of the structure of a heterojunction solar cell, as a cross-sectional representation
- FIG. 2A and 2B are schematic cross-sectional views of an embodiment of the semiconductor layer material according to the invention on a semiconductor substrate, after the deposition of a layer stack (FIG. 2A) and after a subsequent heat treatment (FIG. 2B), FIG.
- FIG. 3 shows a comparative graph of the absorption spectra of amorphous silicon (solid line) and of a semiconductor layer material according to the invention
- Fig. 4 is a comparative graph of the electrical
- FIG. 1 shows, in a schematic cross-sectional representation, the structure of a heterojunction solar cell 1 on a p-type or n-type Si semiconductor substrate 3.
- a hetero-emitter layer 5 is arranged on the Si substrate 3 and a TCO layer 7 is arranged thereon ,
- the layer structure is completed by a local front-side contact 9 and at the back by a full-area rear-side contact 11.
- FIGS. 2A and 2B show a stack 50 'or 50 made of a semiconductor layer material, which is used as a hetero-emitter layer 5 in the solar cell structure according to FIG. 1, on a silicon substrate 30.
- FIG. 2A shows the stack designated by the numeral 50 'after a first process stage
- FIG. 2B shows the stack then indicated by the numeral 50 after a second process step, and the reference numerals of individual layers of the stack (see below) are formed in correspondence therewith.
- the layer stack is, as shown in FIG. 2A, "first layers" and SiO layers 52 'are formed as second layers by successive, in particular stacked, Si layers 51. It can be seen that the layer of the stack next to the silicon substrate 30 has a stack SiO layer 52 ', that is, here also referred to as "second layer” layer. The top layer of the stack is also formed by such a second layer 52 '.
- the Si layers 51 'are doped, and the SiO layers 52' are sub-stoichiometric layers, and the layer thicknesses are each less than 10 nm.
- Fig. 2B shows the result of a subsequent annealing at temperatures> 1000 0 C resulting structure 50, in which the interfaces between The first and second layers are structured irregularly such that micro contact regions ("point contacts") 50a are formed between adjacent first layers 51 separated from one another by a second layer 52 and at the interface with the silicon substrate 30
- the function of the layer structure according to the invention of essential microcontact regions is associated with a segregation of Si and stoichiometric SiO 2 during annealing, in the course of which the Si seed layers grow isotropically, contacting the free surface of the layer stack serving as a hetero emitter layer in a solar cell of the type shown in FIG 1 type occurs only after annealing.
- FIG. 3 shows that advantageously the absorption coefficient of semiconductor layer material constructed according to the invention as emitter material (dashed curve) in the region below about 680 nm, ie in the range of visible light, is lower than that of a comparable layer of amorphous silicon (solid line) Line) is.
- FIG. 4 shows current density-voltage characteristics of differently constructed semiconductor layer stacks of Si and SiO x with a total thickness of 60 nm each and matching thickness of the first layers (3 nm) and different thicknesses of the second layers (1.5-5 nm ) before annealing. It can be seen that the respective measured values are in good agreement with the respectively calculated profile (with the exception of voltages below 3 V for the embodiment with 5 nm thick SiO x layers). It can also be seen in particular that the choice of the thickness of the second layers makes it possible to adjust the electrical conductivity of the proposed semiconductor layer material over a wide range.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Photovoltaic Devices (AREA)
Abstract
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102009029017A DE102009029017A1 (de) | 2009-08-31 | 2009-08-31 | Halbleiter-Schichtmaterial und Heteroübergangs-Solarzelle |
| PCT/EP2010/059695 WO2011023441A2 (fr) | 2009-08-31 | 2010-07-07 | Matériau stratifié à semiconducteur et cellule solaire à hétérojonction |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP2474041A2 true EP2474041A2 (fr) | 2012-07-11 |
Family
ID=43524809
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP10728700A Withdrawn EP2474041A2 (fr) | 2009-08-31 | 2010-07-07 | Matériau stratifié à semiconducteur et cellule solaire à hétérojonction |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20120211064A1 (fr) |
| EP (1) | EP2474041A2 (fr) |
| CN (1) | CN102576744B (fr) |
| DE (1) | DE102009029017A1 (fr) |
| WO (1) | WO2011023441A2 (fr) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120318336A1 (en) * | 2011-06-17 | 2012-12-20 | International Business Machines Corporation | Contact for silicon heterojunction solar cells |
| EP2595193A1 (fr) * | 2011-11-16 | 2013-05-22 | Hitachi, Ltd. | Structure de puits quantique multiple |
| JP2014027119A (ja) * | 2012-07-27 | 2014-02-06 | Nippon Telegr & Teleph Corp <Ntt> | 太陽電池 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005106966A1 (fr) * | 2004-04-30 | 2005-11-10 | Unisearch Limited | Semi-conducteurs amorphes artificiels et applications a des cellules solaires |
| US20080135089A1 (en) * | 2006-11-15 | 2008-06-12 | General Electric Company | Graded hybrid amorphous silicon nanowire solar cells |
| US20080110486A1 (en) * | 2006-11-15 | 2008-05-15 | General Electric Company | Amorphous-crystalline tandem nanostructured solar cells |
-
2009
- 2009-08-31 DE DE102009029017A patent/DE102009029017A1/de not_active Withdrawn
-
2010
- 2010-07-07 CN CN201080038231.1A patent/CN102576744B/zh not_active Expired - Fee Related
- 2010-07-07 US US13/392,345 patent/US20120211064A1/en not_active Abandoned
- 2010-07-07 EP EP10728700A patent/EP2474041A2/fr not_active Withdrawn
- 2010-07-07 WO PCT/EP2010/059695 patent/WO2011023441A2/fr not_active Ceased
Non-Patent Citations (1)
| Title |
|---|
| See references of WO2011023441A2 * |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2011023441A2 (fr) | 2011-03-03 |
| US20120211064A1 (en) | 2012-08-23 |
| DE102009029017A1 (de) | 2011-03-03 |
| CN102576744A (zh) | 2012-07-11 |
| CN102576744B (zh) | 2016-02-10 |
| WO2011023441A3 (fr) | 2012-03-29 |
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