EP2939059A1 - Vorrichtung zur markierung einer probe sowie beobachtungssystem mit solch einer markierungsvorrichtung - Google Patents

Vorrichtung zur markierung einer probe sowie beobachtungssystem mit solch einer markierungsvorrichtung

Info

Publication number
EP2939059A1
EP2939059A1 EP13815001.6A EP13815001A EP2939059A1 EP 2939059 A1 EP2939059 A1 EP 2939059A1 EP 13815001 A EP13815001 A EP 13815001A EP 2939059 A1 EP2939059 A1 EP 2939059A1
Authority
EP
European Patent Office
Prior art keywords
mark
sample
mesh
μηι
marking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP13815001.6A
Other languages
English (en)
French (fr)
Inventor
Pierre Joly
Emmanuelle Schultz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Biomerieux SA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Biomerieux SA
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Biomerieux SA, Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Biomerieux SA
Publication of EP2939059A1 publication Critical patent/EP2939059A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/34Microscope slides, e.g. mounting specimens on microscope slides
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/26Stages; Adjusting means therefor
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/0304Detection arrangements using opto-electronic means
    • G06F3/0317Detection arrangements using opto-electronic means in co-operation with a patterned surface, e.g. absolute position or relative movement detection for an optical mouse or pen positioned with respect to a coded surface
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06KGRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/06009Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06KGRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/06009Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking
    • G06K19/06037Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking multi-dimensional coding
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06KGRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/06009Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking
    • G06K19/06046Constructional details
    • G06K19/06178Constructional details the marking having a feature size being smaller than can be seen by the unaided human eye
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2813Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
    • G01N2001/282Producing thin layers of samples on a substrate, e.g. smearing, spinning-on with mapping; Identification of areas; Spatial correlated pattern

Definitions

  • the present invention relates to a device for locating a sample, the device being intended to be placed opposite the sample for the observation of the latter.
  • the tracking device comprises a plurality of meshes, defining a mesh, each mesh comprising an identification marking.
  • the present invention also relates to an observation system comprising a sample holder, a light source suitable for illuminating the sample holder, and such a tracking device.
  • the observation system comprises a device for observing at least one image of a sample that can be arranged on the sample support.
  • the invention is particularly applicable to tracking devices for observation using an optical microscope.
  • the observation zone When observing different elements of a sample using an optical microscope, the observation zone generally has limited dimensions in comparison with the overall dimensions of the sample to be observed.
  • the observation zone is typically a rectangle whose side has a value between 100 ⁇ and 1 mm, while the sample typically has dimensions of between 5 mm and 20 mm.
  • the observation zone corresponds to the intersection between the field of the observation device and the sample support.
  • a microscope equipped with a motorized translation stage In order to remedy this problem, it is known to use a microscope equipped with a motorized translation stage. However, such a motorized stage is relatively expensive, and also requires noting the different positions of the observation areas, or to use additional software to perform a survey of different positions. It is also known to use a sample holder in the form of a graduated transparent blade. Such a blade comprises a grid consisting of continuous lines, this grid defining a mesh. Each box of this grid, also called mesh, is distinguished from the others by an identification marking in the form of alphanumeric character strings, such as capital letters or numbers.
  • the object of the invention is therefore to propose a locating device making it possible to easily locate a mesh among the set of meshes, while optimizing the free surface of the marking device, that is to say the surface of the measuring device. identification free of identification marking. There is then more free space than in the state of the art, while allowing a precise location of the mesh observed on the tracking device.
  • the subject of the invention is a tracking device of the aforementioned type, in which the or each identification marking corresponds to an identifier of the mesh and comprises a main mark and at least one secondary mark, the identifier of said mesh being a function of the position of the or each secondary mark relative to the main mark,
  • the or each identification tag has a plurality of secondary marks
  • the identifier preferably comprises a first number and a second number, the two numbers being expressed in a respective arithmetic base, and each secondary mark corresponds to both a respective digit of the first number and a respective digit of the second number.
  • the marking device comprises one or more of the following characteristics, taken separately or in any technically possible combination:
  • the identification marking comprising the main mark and the or each secondary mark, is distinct from an alphanumeric coding
  • the main mark has an asymmetrical shape suitable for indicating an orientation of said mesh
  • the arithmetic base is the decimal base
  • each mesh comprises a marker, the identifier being determined from the coordinates of each secondary mark in this mark;
  • each mesh comprises a marker, and the main mark forms a scale for the determination of at least one coordinate of each secondary mark according to at least one axis of this marker;
  • the main mark forms a scale for determining the coordinates of each secondary mark along each axis of the marker
  • Each secondary mark has a footprint of dimensions less than or equal to 10 ⁇ x 10 ⁇ ;
  • the secondary marks are of a size and / or of a distinct form from one secondary mark to another;
  • the main mark has a size of less than or equal to 20 ⁇ x 40 ⁇ , preferably less than or equal to 15 ⁇ x 30 ⁇ , more preferably less than or equal to 10 ⁇ x 20 ⁇ .
  • the subject of the invention is also an observation system comprising a sample support, a source of light suitable for illuminating the sample support, and a device for locating a sample, the sample being intended to be arranged. on the sample carrier, wherein the tracking device is as defined above.
  • the observation system comprises one or more of the following characteristics, taken separately or in any technically possible combination:
  • the marking device is arranged facing the sample support;
  • the sample holder comprises a sample receiving plate, and the tracking device is formed on said plate.
  • FIG. 1 is a schematic representation of an observation system comprising a microscope, a sample support adapted to receive a sample and a device for locating the sample placed opposite the sample for the observation of this one,
  • FIG. 2 is a diagrammatic representation of a mesh of the marking device of FIG. 1, and of an identification marking of said mesh according to one embodiment of the invention, the identification marking comprising a mark. principal and secondary marks,
  • FIG. 3 is an image of several identification markings of FIG. 2
  • FIGS. 4 and 5 are diagrammatic representations of the main mark, and secondary markings respectively, of the identification mark in a complementary aspect
  • FIGS. 6 and 7 are diagrammatic representations of two examples of identification marking according to this complementary aspect.
  • FIG. 8 is a view similar to that of FIG. 3 according to this complementary aspect.
  • Figure 9 is a view similar to that of Figure 5 according to a variant.
  • an observation system 20 comprises a light source 22, a support 24 of a sample 26 and a device 28 for locating the sample 26, the locating device 28 being intended to be placed facing each other. of the sample 26 for the observation of the sample 26 using the observation system 20.
  • observation system 20 comprises a device 29 for acquiring images.
  • the observation system 20 then forms an imaging system.
  • the observation system 20 is intended to perform an image observation of the sample 26 when it is arranged on the sample support 24.
  • the light source 22 is able to emit a light beam 30 in order to illuminate the sample 26 disposed on the sample support 24.
  • the observation system 20 is an optical microscope, and then comprises a mirror 34 able to reflect the light beam 30, coming from the light source 22, towards the support of sample 24 in a vertical direction Z.
  • the microscope 20 comprises a plate 36 on which is disposed the sample holder 24.
  • the microscope 20 further comprises three lenses 38, each lens 38 having a first lens 40, also called lens objective.
  • Each objective 38 allows observation of a sample with a different magnification.
  • the microscope 20 comprises a separation device 42, such as a prism, and an eyepiece 44, the separation device 42 being able to direct the transmitted radiation through the sample support 24 and the sample 26, on the one hand, towards the eyepiece 44, and on the other hand, towards the acquisition device 29.
  • the microscope 20 makes it possible to observe a part of the sample support 24, this part being called the observation zone.
  • Sample holder 24 includes a plate, not shown, for receiving sample 26.
  • Sample holder 24 is preferably a planar support.
  • the sample holder 24 is transparent, and is for example in the form of a transparent slide for observation using the microscope. Alternatively, the sample holder 24 is opaque, and is for example in the form of a silicon wafer.
  • the sample holder 24 is for example disposed between the light source 22 and the observation device 29 when the observation device 29 is able to acquire images of the radiation transmitted by the sample support 24 on which is arranged the sample 26.
  • the sample support 24 is then substantially perpendicular to the direction of illumination of the sample 26, represented by the vertical direction Z in FIG.
  • the sample support 24 has a thickness in the vertical direction Z, for example between 50 ⁇ and 1 mm, preferably between 100 ⁇ and 500 ⁇ , in general 170 ⁇ .
  • the marking device 28 is divided into a mesh comprising a plurality of meshes 50, each mesh 50 being marked with at least one identification marking 52.
  • each observation zone can be located spatially, with respect to the marking device 28, by identifying a mesh 50 covered by said zone. This identification is obtained by a decoding of the identification marking 52 corresponding to said mesh 50.
  • the tracking device 28 object of the invention is either integrated in the sample holder 24, or intended to be applied facing the latter. It is then in the form of a device distinct from the sample support 24.
  • the term "opposite" designates the fact that the tracking device 28 is placed facing the sample support 24, without necessarily being placed in contact with the sample holder 24. sample holder 24.
  • the marking device 28 is integrated in the sample holder 24, and the marking device 28 is then, for example, made on the plate of the sample holder. 24 intended to receive the sample 26.
  • the marking device 28 comprises the plurality of meshes 50, defining a mesh, and the or each identification marking 52 of said corresponding mesh 50, as shown in FIG. 2. This identification marking 52 also allows a delimitation of the mesh 50 in the observation area.
  • the marking device 28 comprises a plurality of meshes 50 and an identification marking 52 for each mesh 50.
  • the image acquisition device 29 is suitable for acquiring images of the sample 26 illuminated by the light beam 30.
  • the image acquisition device 29 comprises, for example, a matrix photodetector PM, visible in FIG. 1, such as a CMOS sensor (from the English Complementary Metal Oxide Semi-conductor) or a CCD (Charged-Couple Devicé), comprising a plurality of pixels, not shown.
  • a matrix photodetector PM visible in FIG. 1, such as a CMOS sensor (from the English Complementary Metal Oxide Semi-conductor) or a CCD (Charged-Couple Devicé), comprising a plurality of pixels, not shown.
  • Each mesh 50 is intended to receive an element, not shown, of the sample 26 for observing at least one image of the sample element using the observation system 20.
  • Each mesh 50 is, for example, in the form of a quadrilateral, for example a square of side A, the value of A being between 50 ⁇ and 1 mm, preferably equal to 100 m.
  • Each identification marking 52 corresponds to an identifier 53 of the mesh 50, the identifier 53 being unique for said mesh 50.
  • Each identification marking 52 comprises a main mark 54 and at least one secondary mark 56A, 56B, 56C, the identifier 53 of the mesh 50 being a function of the position of the or each secondary mark 56A, 56B, 56C relative to the main mark 54.
  • Each identification marking 52 is distinct from an alphanumeric coding, according to which each mesh 50 differs from another mesh 50 by a different alphanumeric character (s).
  • the identifier 53 comprises, for example, at least one number X, Y, expressed in an arithmetic base.
  • the identifier 53 comprises two numbers, namely a first number X and a second number Y.
  • the first number X and the second number Y respectively correspond to the abscissa and the ordinate of the mesh 50.
  • the arithmetic base is the decimal base, and the numeral (s) of the numbers X, Y are numerical values between 0 and 9, as known per se.
  • the arithmetic base is a base N, where N is an integer with a value greater than or equal to 2, in which the numeral (s) of the numbers X, Y are values between 0 and N-1, as known per se. .
  • the identifier 53 comprises two numbers X, Y, each secondary mark 56A, 56B, 56C corresponding to a respective digit of said number.
  • the identifier 53 is given as an indication; it is naturally not drawn on the marking device 28.
  • the two numbers X, Y are, for example, a value between 0 and 999, and the identification marking then comprises three secondary marks 56A, 56B, 56C, namely a first secondary mark 56A corresponding to the units of said number, a second secondary mark 56B corresponding to the tens of said number and a third secondary mark 56C corresponding to the hundreds of said number.
  • the secondary marks 56A, 56B, 56C are represented by u, d, c, to make it easier to understand the coding used and to indicate which marks correspond to the units, the tens and the hundreds, respectively.
  • the secondary marks 56A, 56B, 56C are, for example, geometric shapes, including alphanumeric characters, in the form of disks, rings, triangles, rectangles, or of squares, as will be described in more detail later.
  • each geometric shape corresponds to the same secondary mark 56A, 56B, 56C.
  • each geometrical shape corresponds to the same secondary mark 56A, 56B, 56C, said secondary mark 56A, 56B, 56C representing either the units, the tens or the hundreds.
  • the tracking device 28 makes it possible to uniquely identify 1000 x 1000 different meshes 50, ie one million distinct meshes 50.
  • the sample support 24 has dimensions of up to 10 cm ⁇ 10 cm, that is to say dimensions greater than the dimensions typical of microscope slides, said blades being generally in the form of a rectangle of 7.5 cm x 2.5 cm.
  • the main mark 54 makes it possible to delimit the mesh 50, while the or each secondary mark 56A, 56B, 56C participates in the identification of the mesh 50, and consequently the location of the position of this mesh 50.
  • the or each secondary mark 56A, 56B, 56C makes it possible to determine the identifier 53.
  • the main mark 54 preferably has an asymmetric shape, to indicate the orientation of the mesh 50.
  • the main mark 54 comprises, for example, a first leg 58A and a second leg 58B, the two branches 58A, 58B being connected at a common point 60, and the second leg 58B being of greater length than that of the first leg 58A.
  • the main mark 54 is L-shaped.
  • the first branch 58A indicates for example the direction of a first axis xx 'of the mesh
  • the second branch 58B indicates the direction of a second axis yy 'of the mesh.
  • the identifier 53 of a mesh 50 is then obtained by determining the respective coordinates of each secondary mark 56A, 56B, 56C according to the first axis xx 'and the second axis y-y'.
  • the orientation from the common point 60 to the free end of each branch 58A, 58B corresponds, for example, for each direction in the increasing direction of said coordinates.
  • the mesh of the locating device 28 is made along the first axis xx 'and the second axis y-y', the direction of the first axis x-x ', respectively that of the second axis y-y' , being indicated by the direction of the first branch 58A, respectively that of the second branch 58B.
  • the L shape of the main mark 54 makes it possible to distinguish the longest axis from the shortest axis.
  • the main mark 54 in the form of L makes it possible to identify each axis x-x ', yy' without ambiguity.
  • each x-x ', y-y' axis of the mesh will be identifiable by making, for example, varying the width of each branch 58A. , 58B, such as a thicker branch for the vertical axis y-y '.
  • the main mark 54 has two different shapes, respectively aligned along the first axis x-x 'and the second axis y-y' of the mesh.
  • the main mark 54 has dimensions smaller than those of the mesh 50.
  • the main mark 54 has a size of less than or equal to 50 ⁇ x 50 ⁇ , preferably less than or equal to 10 ⁇ x 20 ⁇ .
  • the length of the first branch 58A is for example equal to one-tenth of the value of the side A, and the length of the second branch 58B is, for example, equal to one-fifth of the value of the side A.
  • the length of the first branch 58A is then preferably equal to 10 ⁇ and that of the second branch 58B preferably equal to 20 ⁇ .
  • the thickness of the branches 58A, 58B is, for example, equal to 2 ⁇ .
  • the main mark 54 has, for example, the same shape for all the identification markings 52 present on the sample holder 24. This unique shape of the main mark 54 for all the identification markings 52 allows then to easily identify each mesh 50.
  • Each secondary mark 56A, 56B, 56C is associated with a respective number of the number or numbers X, Y of the identifier 53.
  • the coordinates of each secondary mark 56A, 56B, 56C according to the first axis xx ' respectively represent the number of units, tens and hundreds of the coordinate of the mesh 50 along the first axis x-x ', these coordinates being determined by taking, as origin, a remarkable point of the main mark 54, in particular the angle formed by the L, ie the common point 60.
  • each secondary mark 56A, 56B, 56C according to the second axis yy ' respectively represent the number of units, tens and hundreds of the coordinate of the mesh 50 along the second axis y-y '.
  • the coordinates of the mesh 50 along the first and second axes x-x ', yy' of the mesh constitute the identifier 53 of the identification marking 52.
  • each cell 50 is assigned a marker, the identifier 53 being determined from the coordinates of each secondary mark 56A, 56B, 56C in this frame.
  • the origin of the marker of each mesh is placed at the level of the main mark 54, the origin of the marker being for example the common point 60.
  • the main mark 54 is configured to determine the distance between successive coordinates along each axis x-x ', y-y'.
  • the first branch 58A oriented along the first axis x-x ' indicates the distance between two successive abscissae x, x + 1, that is to say two abscissas distant by one unit.
  • the second branch 58B oriented along the second axis y-y ' indicates the distance between two ordinates y, y + 2 distant from two units.
  • the second branch 58B then also forms a scale for the second axis y-y ', while being twice the length of the first branch 58A to define an orientation of the mesh 50 as indicated above.
  • the main mark 54 constitutes a scale for determining the coordinates of each secondary mark 56A, 56B, 56C along each axis x-x ', y-y' of the mesh.
  • the identifier 53 of the mesh 50 is a function of the position, and in particular the distance, of the corresponding secondary mark 56A, 56B, 56C with respect to the main mark 54, and more precisely the coordinates of each secondary mark 56A, 56B, 56C in a reference associated with each mesh 50, said mark being oriented along the x-x ', yy' axes of the mesh, the origin of the mark being preferably associated with the main mark 54.
  • the first secondary mark 56A is of abscissa equal to 3
  • the second secondary mark 56A is of abscissa equal to 2
  • the third secondary mark 56C is of abscissa equal to 1 , so that the first number X of the identifier 53 is equal to 123.
  • the first secondary mark 56A is of ordinate equal to 6
  • the second secondary mark 56A is of ordinate equal to 5
  • the third secondary mark 56C is of ordinate equal to 4, so that the second number Y of the identifier 53 is equal to 456.
  • each secondary mark 56A, 56B, 56C is of size different from one secondary mark to another.
  • the first secondary mark 56A corresponding to the units of the numbers X, Y is for example the secondary mark of smaller size
  • the second secondary mark 56B corresponding to the tens of the numbers X
  • Y is the intermediate mark of intermediate size
  • the third secondary mark 56C corresponding to the hundreds of numbers X, Y is the secondary mark of larger size.
  • the three secondary marks 56A, 56B, 56C are all circular in shape, for example in the form of rings of different radii, in the example of FIGS. 2 and 3. This makes it possible to code an identifier 53 where the three digits of the number X , Y have the same value, the three secondary brands 56A, 56B, 56C being then concentric.
  • the first secondary mark 56A is, for example, in the form of a disk with a diameter of 2 ⁇
  • the second secondary mark 56B is in the form of a ring with an internal diameter equal to 2 ⁇ and an external diameter equal to 4 ⁇ , as shown in Figure 3 where the image was acquired with an objective 38 x40 magnification.
  • the numbers X, Y of the identifier 53 are between 0 and 99, so that the identification marking 52 does not include a third secondary mark.
  • the third secondary mark 56C is, for example, in the form of a ring of internal diameter equal to 4 ⁇ and external diameter equal to 6 ⁇ .
  • each secondary mark 56A, 56B, 56C is substantially the same size, but of distinct shape from one secondary mark to another.
  • the first secondary mark 56A is in the form of a disc
  • the second secondary mark 56B is in the form of a triangle
  • the third secondary mark 56C is in the form of a square.
  • each secondary mark 56A, 56B, 56C has a size and a shape distinct from one secondary mark to another.
  • Each secondary mark 56A, 56B, 56C has a size less than or equal to 10 ⁇ x 10 ⁇ .
  • the identification marking 52 associated with the mesh 50 makes it possible to locate the mesh 50 by the identifier 53 corresponding to the identification marking. This identification is unique when the identifier 53 is unique for each mesh 50.
  • the marking device 28 equipped with the identification markings 52 according to the invention greatly facilitates the observation of the different elements of the sample 26, since the main mark 54 and the secondary mark or marks 56A, 56B, 56C are of reduced dimensions compared to those of the mesh 50.
  • the identification markings 52 of the tracking device 28 allow the unique identification of the different observation zones of a sample support 24 having dimensions up to 10 cm x 10 cm, that is to say dimensions larger than the typical dimensions of the microscope slides.
  • the identification tag (s) 52 make it possible to know on which scale the image of the sample 26 is acquired, the dimensions of the main mark 54 being predetermined and known.
  • the tracking device 28 makes it possible to easily locate a mesh 50 among the set of meshes 50 of the device, while facilitating the observation of the different elements of the sample 26 inside the mesh 50.
  • the main mark 54 and each secondary mark 56A, 56B, 56C are adapted to appear in a contrasting manner in the image acquired by the image acquisition device 29.
  • the main mark 54 and each Secondary mark 56A, 56B, 56C are, for example, opaque and reflective material when the sample holder 24 is transparent. In this case, they appear in dark on a light background, when they are observed in transmission, or in light on a dark background when they are observed in reflection.
  • the main mark 54 and each secondary mark 56A, 56B, 56C are, for example, absorbent, respectively reflective, when the sample holder 24 is respectively reflecting, respectively absorbent.
  • each mark 54, 56A, 56B, 56C is configured to appear in a contrasted manner with respect to the sample support 24, for a given observation mode.
  • the main mark 54 and each secondary mark 56A, 56B, 56C are, for example, made in the following manner.
  • the marking device 28 is covered with a thin layer of platinum oxide by physical vapor deposition, also called PVD (Physical Vapor Deposition). This layer of platinum oxide is then removed by laser photolithography over the entire surface except at the locations of the marks 54, 56A, 56B, 56C.
  • PVD Physical Vapor Deposition
  • the main mark 54 and each secondary mark 56A, 56B, 56C are produced by screen printing or microgravure.
  • Each mark 54, 56A, 56B, 56C is, for example, made of a material suitable for reference to a spectroscopic measurement, this material having a predetermined optical property.
  • optical property is meant a property of fluorescence or Raman scattering.
  • the identification marking 52 is arranged for example on the face carrying the sample 26 or on the face opposite to the bearing face. sample 26.
  • the first alternative is preferred for questions of depth of field.
  • the main mark 54 and each secondary mark 56A, 56B, 56C are arranged for example on the face in contact with the sample or on the face opposite to the face bearing the sample.
  • the first alternative is preferred for questions of depth of field, regardless of the embodiment.
  • FIGS. 4 to 8 illustrate a complementary aspect for which elements similar to the embodiment described above are identified by identical references, and are not described again.
  • each identification marking 52 is in the form of a terminal whose size is included in a side square B, as shown in FIGS. 4 and 6 to 8.
  • the value of the B side is, for example, example, equal to 10 ⁇ .
  • each terminal makes it possible to delimit and identify each mesh 50 of the locating device 28.
  • the main mark 54 preferably has an asymmetrical shape, to indicate an orientation of said mark.
  • a mark 54 for example in the form of an L, has the same advantages as those presented in the description of the embodiment described above.
  • the first branch 58A and the second branch 58B are of substantially identical lengths and have different thicknesses.
  • the first branch 58A is, for example, less thick than the second branch 58B.
  • the thickness of the first branch 58A is equal to 1 ⁇ , and that of the second branch 58B is equal to 2.5 ⁇ .
  • each secondary mark 56A, 56B, 56C is in the form of a rectangular zone 70 of variable length as a function of the value of the digit at which each secondary mark 56A, 56B, 56C corresponds, as represented in FIG. secondary 56A, 56B, 56C correspond to the white areas, that is to say the transparent areas of the identification marking 52.
  • the arithmetic base is the decimal base
  • FIG. the different rectangular zones 70 each corresponding to different values of the digits between 0 and 9 in the decimal base.
  • the pattern of each secondary mark 56A, 56B, 56C corresponds to an alphanumeric character, in this case a number, the correspondence between said pattern and said character forming a code such as that represented in FIG. shown in Figure 9.
  • each mesh 50 is associated with a respective identification marking 52 in the form of a terminal, each identification marking 52 comprising a secondary mark 56A, 56B, 56C, of shape predetermined geometrical shape, for example in the form of a rectangular strip 70, whose position relative to the main mark 54, and possibly the pattern, give information as to the identifier 53 associated with the identification marking 52, said pattern being determined according to a code.
  • Rectangular areas 70 are preferably parallel to each other in the case of a plurality of secondary marks 56A, 56B, 56C.
  • the rectangular zones 70 are, for example, arranged in strips 72 parallel to each other, preferably parallel to one of the branches 58A, 58B, each band 72 being associated with a respective secondary mark 56A, 56B, 56C for a respective number X, Y, as shown in Figure 4.
  • the identification marking 52 comprises six strips 72, parallel to the first branch 58A, denoted respectively Xc, Xd, Xu, Yc, Yd, Yu, starting from the strip 72 furthest away. of the first branch 58A and going up to the band 72 in contact with the first branch 58A.
  • the first secondary mark 56Ax corresponding to the units of the first number X, the second secondary mark 56Bx corresponding to the tens of the first number X and the third secondary mark 56Cx corresponding to the hundreds of the first number X are then arranged in the bands denoted respectively Xu, Xd and xc.
  • the first secondary mark 56Ay corresponding to the units of the second number Y, the second secondary mark 56By corresponding to the tens of the second number Y and the third secondary mark 56Cy corresponding to the hundreds of the second number Y are arranged in the bands respectively denoted Yu , Yd and Yc.
  • the identification marking 52 comprises a predetermined number of bands 72, the value of said predetermined number being chosen as a function of the quantity of numbers X, Y that the identifier 53 comprises, as well as values taken by these numbers X, Y.
  • the identifier 53 comprises two numbers X, Y, each value between 0 and 9999, then the number of bands 72 is equal to 8.
  • the identifier 53 comprises three numbers X, Y, W each having a value between 0 and 999, then the number of bands 72 is equal to 9.
  • the identification marking 52 represented in FIG. 6 corresponds to the identifier whose first number X is equal to 123 and whose second number Y is equal to 456.
  • the marking of identification 52 shown in Figure 7 corresponds to the identifier whose first number X is equal to 791 and whose second Y is equal to 680.
  • each strip 72 has a length of approximately 7.5 ⁇ and a thickness of approximately 1.5 ⁇ .
  • the strips 72 are preferably contiguous to each other. All six strips 72 in the example of Figures 4 and 6 to 8 then has a thickness of about 9 ⁇ for a length of about 7.5 ⁇ .
  • the length of the branch among the first branch 58A and the second branch 58B which is not parallel to the strips 72 is adapted to the number of bands 72 that comprises the identification marking 52. 4, the length of the second leg 58B is thus adapted to the number of bands 72 included in the identification marking 52.
  • the length of the second branch 58B is equal to 13 ⁇ .
  • the or each secondary mark 56A, 56B, 56C is in the form of a rectangular zone 70 of fixed length, as shown in FIG. 9 where the secondary marks 56A, 56B, 56C correspond to the white areas, that is, i.e., transparent areas of the identification marking 52.
  • the arithmetic base is the decimal base
  • FIG. 9 illustrates the different rectangular zones 70 corresponding to the different values of the digits between 0 and 9 in the decimal base.
  • the value of the figure is a function of the position of the rectangular zone 70 inside the band 72.
  • each strip 72 has a length of approximately 7.5 ⁇ and a thickness of approximately 1.5 ⁇ .
  • Each rectangular zone 70 then has a length of about 0.75 ⁇ .
  • the size of certain identification markings 52 is different from that of other identification markings 52.
  • Some identification markings 52 have a larger size than others, in order to adapt to different magnification optics.
  • the marking device 28 makes it possible to easily locate a mesh 50 among all the stitches 50 of the marking device 28, while facilitating the observation of the different elements of the sample 26 at the same time. inside the mesh 50.
  • sample supports 24, on which the sample 26 is intended to be deposited these sample supports 24 incorporating the tracking device 28 according to the invention.
  • marking devices 28 intended to be arranged facing the sample holder 24.
  • marking devices 28 comprise a mesh support, on which are made the identification mark or labels 52 such as than previously defined. This mesh support is then placed between the light source 22 and the sample support 24, in which case the mesh support is transparent.
  • the sample holder 24 is alternatively disposed between the mesh support and the light source 22, in which case the sample holder 24 must be transparent.
  • Such a mesh support is, for example, in the form of a slat intended to be applied against the sample support 24, while being secured to the latter.
  • This is for example a transparent cover for covering the sample 26, the latter then being between the sample holder 24 and said cover.
  • a sipe intended to be applied under the transparent sample holder 24, the sample 26 then being placed on the sample support 24, the latter being applied against the sipe.
  • the marking device 28 is intended to be disposed facing the sample 26 placed on the sample support 24, the tracking device 28 allowing a spatial identification of the sample 26 on said sample holder 24.
  • the marking device 28 is integrated with the sample holder 24 itself, or the marking device 28 is alternatively distinct from the sample holder 24, for example being applied against the support 24 carrying the sample 26.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EP13815001.6A 2012-12-31 2013-12-30 Vorrichtung zur markierung einer probe sowie beobachtungssystem mit solch einer markierungsvorrichtung Withdrawn EP2939059A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1262994A FR3000567B1 (fr) 2012-12-31 2012-12-31 Dispositif de reperage d'un echantillon, et systeme d'observation comportant un tel dispositif de reperage
PCT/EP2013/078151 WO2014102382A1 (fr) 2012-12-31 2013-12-30 Dispositif de repérage d'un échantillon, et système d'observation comportant un tel dispositif de repérage

Publications (1)

Publication Number Publication Date
EP2939059A1 true EP2939059A1 (de) 2015-11-04

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EP13815001.6A Withdrawn EP2939059A1 (de) 2012-12-31 2013-12-30 Vorrichtung zur markierung einer probe sowie beobachtungssystem mit solch einer markierungsvorrichtung

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Country Link
US (1) US20150338630A1 (de)
EP (1) EP2939059A1 (de)
JP (1) JP2016503192A (de)
FR (1) FR3000567B1 (de)
WO (1) WO2014102382A1 (de)

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CN106249283A (zh) * 2015-06-15 2016-12-21 中国石油化工股份有限公司 多元化的地震资料观测系统定义方法及系统
US11598945B2 (en) * 2017-07-11 2023-03-07 Carl Zeiss Microscopy Gmbh Adapter for use with a sample holder, and method for arranging a sample in a detection beam path of a microscope

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Publication number Priority date Publication date Assignee Title
DE8914053U1 (de) * 1989-01-27 1990-04-12 Wanner, Gerhard, Dr., 8052 Moosburg Plattenförmiger Objektträger für die Mikroskopie
DE3902348A1 (de) * 1989-01-27 1990-08-02 Gerhard Dr Wanner Plattenfoermiger objekttraeger fuer die mikroskopie
TWI235926B (en) * 2002-01-11 2005-07-11 Sonix Technology Co Ltd A method for producing indicators and processing system, coordinate positioning system and electronic book system utilizing the indicators
JP4254441B2 (ja) * 2003-09-16 2009-04-15 カシオ計算機株式会社 平面状記録媒体及び座標読み取り方法
JP2009036969A (ja) * 2007-08-01 2009-02-19 Nikon Corp カバーガラス、スライドガラス、プレパラート、観察方法、及び顕微鏡装置
JP2009237277A (ja) * 2008-03-27 2009-10-15 Nippon Zeon Co Ltd 顕微鏡観察用容器
JP5841310B2 (ja) * 2009-11-27 2016-01-13 シロナ・デンタル・システムズ・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング カメラ及び検索パターンを使用して対象物の空間特性を決定するためのシステム、装置、方法、及びコンピュータプログラム製品
FR2993988B1 (fr) * 2012-07-27 2015-06-26 Horiba Jobin Yvon Sas Dispositif et procede de caracterisation d'un echantillon par des mesures localisees

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See references of WO2014102382A1 *

Also Published As

Publication number Publication date
FR3000567B1 (fr) 2015-09-04
FR3000567A1 (fr) 2014-07-04
US20150338630A1 (en) 2015-11-26
WO2014102382A1 (fr) 2014-07-03
JP2016503192A (ja) 2016-02-01

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