EP3985366A3 - Hyperspektrales element, hyperspektraler sensor damit und hyperspektrales bilderzeugungsgerät - Google Patents

Hyperspektrales element, hyperspektraler sensor damit und hyperspektrales bilderzeugungsgerät Download PDF

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Publication number
EP3985366A3
EP3985366A3 EP21202397.2A EP21202397A EP3985366A3 EP 3985366 A3 EP3985366 A3 EP 3985366A3 EP 21202397 A EP21202397 A EP 21202397A EP 3985366 A3 EP3985366 A3 EP 3985366A3
Authority
EP
European Patent Office
Prior art keywords
hyperspectral
wavelength
same
generating apparatus
image generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP21202397.2A
Other languages
English (en)
French (fr)
Other versions
EP3985366B1 (de
EP3985366A2 (de
Inventor
Youngzoon YOON
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020210118543A external-priority patent/KR20220048930A/ko
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of EP3985366A2 publication Critical patent/EP3985366A2/de
Publication of EP3985366A3 publication Critical patent/EP3985366A3/de
Application granted granted Critical
Publication of EP3985366B1 publication Critical patent/EP3985366B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/805—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G01J3/0259—Monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0272—Handheld
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/806—Optical elements or arrangements associated with the image sensors
    • H10F39/8063—Microlenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1213—Filters in general, e.g. dichroic, band
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1226—Interference filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G01J2003/2806—Array and filter array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G01J2003/2826—Multispectral imaging, e.g. filter imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Filters (AREA)
  • Solid State Image Pick-Up Elements (AREA)
EP21202397.2A 2020-10-13 2021-10-13 Hyperspektrales element, hyperspektraler sensor damit und hyperspektrales bilderzeugungsgerät Active EP3985366B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20200132137 2020-10-13
KR1020210118543A KR20220048930A (ko) 2020-10-13 2021-09-06 초분광 요소, 이를 포함하는 초분광 센서, 및 초분광 영상 생성 장치

Publications (3)

Publication Number Publication Date
EP3985366A2 EP3985366A2 (de) 2022-04-20
EP3985366A3 true EP3985366A3 (de) 2022-06-08
EP3985366B1 EP3985366B1 (de) 2024-12-04

Family

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Family Applications (1)

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EP21202397.2A Active EP3985366B1 (de) 2020-10-13 2021-10-13 Hyperspektrales element, hyperspektraler sensor damit und hyperspektrales bilderzeugungsgerät

Country Status (4)

Country Link
US (1) US12148775B2 (de)
EP (1) EP3985366B1 (de)
JP (1) JP7818373B2 (de)
CN (1) CN114353942A (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114812815B (zh) * 2022-04-24 2025-07-29 合肥和光微电子科技有限公司 新型超材料多光谱成像芯片及其制备方法
WO2023222278A1 (en) * 2022-05-20 2023-11-23 ams Sensors Germany GmbH Multispectral optical sensor, camera system and parallax compensation method
US20240188827A1 (en) * 2022-12-12 2024-06-13 Lextar Electronics Corporation Photosensitive device
US12487119B2 (en) 2023-01-09 2025-12-02 Nanohmics, Inc. Integral field spectral imager
EP4481341A1 (de) * 2023-06-23 2024-12-25 Urugus S.A. Einstellbares bildgebungssystem, vorrichtung und verfahren
CN117571634B (zh) * 2024-01-12 2024-04-12 杭州海康威视数字技术股份有限公司 用于监控水质的摄像机
WO2025204244A1 (ja) * 2024-03-27 2025-10-02 ソニーセミコンダクタソリューションズ株式会社 光検出装置、光検出装置の製造方法、および電子機器
CN119854657B (zh) * 2025-03-21 2025-05-30 杭州高谱成像技术有限公司 一种用于高光谱相机二级光谱滤除方法及系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180084167A1 (en) * 2016-09-19 2018-03-22 Omnivision Technologies, Inc. Stacked-filter image-sensor spectrometer and associated stacked-filter pixels
US20180372546A1 (en) * 2015-12-14 2018-12-27 Ams Ag Optical sensing device and method for manufacturing an optical sensing device
US20190096932A1 (en) * 2017-09-22 2019-03-28 Qualcomm Incorporated Solid state image sensor with on-chip filter and extended spectral response
US20190189696A1 (en) * 2016-05-20 2019-06-20 Sony Corporation Solid-state imaging apparatus and electronic apparatus
US10605658B2 (en) * 2017-09-29 2020-03-31 Samsung Electronics Co., Ltd. Spectrometer

Family Cites Families (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6727521B2 (en) 2000-09-25 2004-04-27 Foveon, Inc. Vertical color filter detector group and array
US6864557B2 (en) 2001-06-18 2005-03-08 Foveon, Inc. Vertical color filter detector group and array
DE10225838B4 (de) * 2002-06-11 2021-10-21 Leica Microsystems Cms Gmbh Verfahren zur Scanmikroskopie, Scanmikroskop und Vorrichtung zum Codieren eines Beleuchtungslichtstrahles
US6958729B1 (en) 2004-03-05 2005-10-25 Lucent Technologies Inc. Phased array metamaterial antenna system
JP2008500723A (ja) * 2004-05-27 2008-01-10 フォブオン・インク 非結晶性シリコン垂直カラーフィルター
JP4891840B2 (ja) 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
US7759644B2 (en) * 2008-03-18 2010-07-20 Drs Rsta, Inc. Spectrally tunable infrared image sensor having multi-band stacked detectors
US9752932B2 (en) * 2010-03-10 2017-09-05 Drexel University Tunable electro-optic filter stack
JP2015501432A (ja) 2011-11-04 2015-01-15 アイメックＩｍｅｃ 各画素についてモザイク状フィルタを備えたスペクトルカメラ
EP2817613A4 (de) 2012-02-21 2016-08-03 Massachusetts Inst Technology Spektrometervorrichtung
JP6108172B2 (ja) 2013-09-02 2017-04-05 ソニー株式会社 固体撮像素子およびその製造方法、並びに電子機器
JP5793219B1 (ja) 2014-05-19 2015-10-14 佐鳥　新 撮像装置及び撮像方法
JP2016076567A (ja) 2014-10-06 2016-05-12 ソニー株式会社 撮像装置、製造装置、製造方法
JPWO2016178266A1 (ja) * 2015-05-01 2018-02-22 オリンパス株式会社 撮像装置
KR20160144006A (ko) 2015-06-07 2016-12-15 김택 복수의 반도체 광원을 이용한 휴대용 고분광 카메라 장치
WO2017053609A1 (en) * 2015-09-22 2017-03-30 Hypermed Imaging, Inc. Methods and apparatus for imaging discrete wavelength bands using a mobile device
US10725290B2 (en) 2016-04-29 2020-07-28 The Board Of Trustees Of The Leland Stanford Junior University Device components formed of geometric structures
US10571672B2 (en) * 2016-08-12 2020-02-25 The Regents Of The University Of California Filter array based ultrafast compressive image sensor
JP6789792B2 (ja) 2016-12-13 2020-11-25 ソニーセミコンダクタソリューションズ株式会社 撮像素子、電子機器
KR102040368B1 (ko) 2017-07-20 2019-11-04 이영종 하이퍼스펙트럴 이미지 센서와 이를 이용한 3차원 스캐너
US10571332B2 (en) 2017-08-08 2020-02-25 Samsung Electronics Co., Ltd. Light filter and spectrometer including the light filter
KR102461721B1 (ko) 2017-09-15 2022-11-01 삼성전자주식회사 필터 어레이와 이를 포함하는 분광 측정 소자 및 분광 측정 소자를 채용한 분광기
KR102452955B1 (ko) 2017-11-23 2022-10-11 삼성전자주식회사 광 신호 처리 방법 및 장치
WO2019163368A1 (ja) * 2018-02-21 2019-08-29 ソニーセミコンダクタソリューションズ株式会社 測距システム、及び、受光モジュール
EP3546903A3 (de) 2018-03-09 2020-01-15 Samsung Electronics Co., Ltd. Lichtfilter und spektrometer damit
US10976477B2 (en) * 2018-08-31 2021-04-13 Samsung Electronics Co., Ltd. Optical filter and spectrometer including sub-wavelength reflector, and electronic apparatus including the spectrometer
JP2020053910A (ja) 2018-09-28 2020-04-02 パナソニックＩｐマネジメント株式会社 光学デバイス、および撮像装置
KR102600150B1 (ko) 2018-10-10 2023-11-08 삼성전자주식회사 분광 정보를 분석하는 장치 및 방법
JP6945195B2 (ja) * 2019-01-16 2021-10-06 パナソニックＩｐマネジメント株式会社 光学フィルタ、光検出装置、および光検出システム
KR102877637B1 (ko) 2019-03-29 2025-10-27 삼성전자주식회사 다파장 광을 이용한 광학 장치 및 그 동작 방법
KR20210048951A (ko) 2019-10-24 2021-05-04 삼성전자주식회사 초분광 이미지 센서 및 이를 포함하는 초분광 촬상 장치
KR102813371B1 (ko) 2019-11-19 2025-05-27 삼성전자주식회사 듀얼 카메라 모듈과 이를 포함하는 전자장치와 그 동작방법
KR102813372B1 (ko) 2019-12-05 2025-05-27 삼성전자주식회사 초분광 카메라 모듈을 포함하는 듀얼 카메라 모듈과 이를 포함하는 장치와 그 동작방법
CN115668008B (zh) * 2020-05-29 2026-03-17 松下知识产权经营株式会社 滤波器阵列及光检测系统
US11747533B2 (en) * 2020-07-01 2023-09-05 Spectricity Spectral sensor system using optical filter subarrays
TWI751818B (zh) * 2020-12-01 2022-01-01 晶相光電股份有限公司 影像感測器

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180372546A1 (en) * 2015-12-14 2018-12-27 Ams Ag Optical sensing device and method for manufacturing an optical sensing device
US20190189696A1 (en) * 2016-05-20 2019-06-20 Sony Corporation Solid-state imaging apparatus and electronic apparatus
US20180084167A1 (en) * 2016-09-19 2018-03-22 Omnivision Technologies, Inc. Stacked-filter image-sensor spectrometer and associated stacked-filter pixels
US20190096932A1 (en) * 2017-09-22 2019-03-28 Qualcomm Incorporated Solid state image sensor with on-chip filter and extended spectral response
US10605658B2 (en) * 2017-09-29 2020-03-31 Samsung Electronics Co., Ltd. Spectrometer

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BLAIR STEVEN ET AL: "A 27-band snapshot hyperspectral imaging system for label-free tumor detection during image-guided surgery", PROGRESS IN BIOMEDICAL OPTICS AND IMAGING, SPIE - INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, BELLINGHAM, WA, US, vol. 10890, 4 March 2019 (2019-03-04), pages 108900G - 108900G, XP060117237, ISSN: 1605-7422, ISBN: 978-1-5106-0027-0, DOI: 10.1117/12.2508944 *
YU HORIE ET AL: "Wide bandwidth and high resolution planar filter array based on DBR-metasurface-DBR structures", ARXIV.ORG, CORNELL UNIVERSITY LIBRARY, 201 OLIN LIBRARY CORNELL UNIVERSITY ITHACA, NY 14853, 12 April 2016 (2016-04-12), XP080964216, DOI: 10.1364/OE.24.011677 *

Also Published As

Publication number Publication date
CN114353942A (zh) 2022-04-15
EP3985366B1 (de) 2024-12-04
US12148775B2 (en) 2024-11-19
JP2022064323A (ja) 2022-04-25
JP7818373B2 (ja) 2026-02-20
EP3985366A2 (de) 2022-04-20
US20220115420A1 (en) 2022-04-14

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