EP4702589A1 - Procédé de préparation de substrat photonique et procédé de préparation ou de fabrication de guide d'ondes photonique - Google Patents
Procédé de préparation de substrat photonique et procédé de préparation ou de fabrication de guide d'ondes photoniqueInfo
- Publication number
- EP4702589A1 EP4702589A1 EP24726718.0A EP24726718A EP4702589A1 EP 4702589 A1 EP4702589 A1 EP 4702589A1 EP 24726718 A EP24726718 A EP 24726718A EP 4702589 A1 EP4702589 A1 EP 4702589A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- optical waveguide
- substrate
- copper
- layer
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P36/00—Gettering within semiconductor bodies
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
Landscapes
- Optical Integrated Circuits (AREA)
Abstract
L'invention concerne un procédé de préparation ou de fabrication de dispositif de guide d'ondes optiques à circuit intégré photonique comprenant la fourniture d'un substrat de silicium, le dépôt d'au moins une couche ou un matériau de nitrure de silicium à piégeage de cuivre, le dépôt d'au moins une couche ou un matériau de gainage de guide d'ondes optique, la formation d'au moins un guide d'ondes optique ou d'une structure de guide d'ondes optique et le recuit thermique du ou des substrats de silicium après la formation du ou des guides d'ondes optiques ou de la structure de guide d'ondes optique sur le ou les substrats de silicium pour éliminer les impuretés d'hydrogène ou les impuretés liées à l'hydrogène du ou des guides d'ondes optiques, et pour capturer ou piéger les impuretés de cuivre du ou des substrats de silicium dans la ou les couches ou le ou les matériaux de nitrure de silicium à piégeage de cuivre.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP23169810 | 2023-04-25 | ||
| PCT/IB2024/053818 WO2024224247A1 (fr) | 2023-04-25 | 2024-04-19 | Procédé de préparation de substrat photonique et procédé de préparation ou de fabrication de guide d'ondes photonique |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP4702589A1 true EP4702589A1 (fr) | 2026-03-04 |
Family
ID=86226567
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP24726718.0A Pending EP4702589A1 (fr) | 2023-04-25 | 2024-04-19 | Procédé de préparation de substrat photonique et procédé de préparation ou de fabrication de guide d'ondes photonique |
Country Status (2)
| Country | Link |
|---|---|
| EP (1) | EP4702589A1 (fr) |
| WO (1) | WO2024224247A1 (fr) |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6620632B2 (en) * | 2000-04-06 | 2003-09-16 | Seh America, Inc. | Method for evaluating impurity concentrations in semiconductor substrates |
| JP2003017497A (ja) * | 2001-07-04 | 2003-01-17 | Nec Corp | 半導体装置の製造方法 |
| US20030104680A1 (en) * | 2001-11-13 | 2003-06-05 | Memc Electronic Materials, Inc. | Process for the removal of copper from polished boron-doped silicon wafers |
| US7657390B2 (en) * | 2005-11-02 | 2010-02-02 | Applied Materials, Inc. | Reclaiming substrates having defects and contaminants |
| JP6427946B2 (ja) * | 2014-05-13 | 2018-11-28 | 株式会社Sumco | エピタキシャルシリコンウェーハの製造方法、エピタキシャルシリコンウェーハ、および固体撮像素子の製造方法 |
| KR20150134543A (ko) * | 2014-05-22 | 2015-12-02 | 삼성전자주식회사 | 소자 제조용 기판 및 반도체 소자 |
| US10191215B2 (en) | 2015-05-05 | 2019-01-29 | Ecole Polytechnique Federale De Lausanne (Epfl) | Waveguide fabrication method |
| US11187532B2 (en) * | 2020-03-06 | 2021-11-30 | Anello Photonics, Inc. | Process flow for fabricating integrated photonics optical gyroscopes |
| CN113506733A (zh) * | 2021-06-22 | 2021-10-15 | 华虹半导体(无锡)有限公司 | 降低硅片金属杂质的方法 |
| JP7487407B2 (ja) * | 2021-09-30 | 2024-05-20 | 信越半導体株式会社 | エピタキシャルウェーハの製造方法 |
-
2024
- 2024-04-19 WO PCT/IB2024/053818 patent/WO2024224247A1/fr not_active Ceased
- 2024-04-19 EP EP24726718.0A patent/EP4702589A1/fr active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024224247A1 (fr) | 2024-10-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: UNKNOWN |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
|
| 17P | Request for examination filed |
Effective date: 20251114 |
|
| AK | Designated contracting states |
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