EP4721120A2 - Schnelle photoemissionselektronenmikroskopie für biologische und andere anwendungen - Google Patents

Schnelle photoemissionselektronenmikroskopie für biologische und andere anwendungen

Info

Publication number
EP4721120A2
EP4721120A2 EP24816365.1A EP24816365A EP4721120A2 EP 4721120 A2 EP4721120 A2 EP 4721120A2 EP 24816365 A EP24816365 A EP 24816365A EP 4721120 A2 EP4721120 A2 EP 4721120A2
Authority
EP
European Patent Office
Prior art keywords
biological sample
sample
stage
imaging
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP24816365.1A
Other languages
English (en)
French (fr)
Inventor
Sarah B. KING
Narayanan Kasthuri
Peter B. Littlewood
Kevin Michael BOERGENS
Ruiyu LI
Gregg Anthony WILDENBERG
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Chicago
University of Illinois at Urbana Champaign
University of Illinois System
Original Assignee
University of Chicago
University of Illinois at Urbana Champaign
University of Illinois System
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Chicago, University of Illinois at Urbana Champaign, University of Illinois System filed Critical University of Chicago
Publication of EP4721120A2 publication Critical patent/EP4721120A2/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/285—Emission microscopes, e.g. field-emission microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/084—Investigating materials by wave or particle radiation secondary emission photo-electric effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/612—Specific applications or type of materials biological material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/285—Emission microscopes
    • H01J2237/2855—Photo-emission

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
EP24816365.1A 2023-05-31 2024-05-30 Schnelle photoemissionselektronenmikroskopie für biologische und andere anwendungen Pending EP4721120A2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202363470042P 2023-05-31 2023-05-31
PCT/US2024/031542 WO2024249548A2 (en) 2023-05-31 2024-05-30 Fast photoemission electron microscopy for biological and other applications

Publications (1)

Publication Number Publication Date
EP4721120A2 true EP4721120A2 (de) 2026-04-08

Family

ID=93658815

Family Applications (1)

Application Number Title Priority Date Filing Date
EP24816365.1A Pending EP4721120A2 (de) 2023-05-31 2024-05-30 Schnelle photoemissionselektronenmikroskopie für biologische und andere anwendungen

Country Status (4)

Country Link
EP (1) EP4721120A2 (de)
KR (1) KR20260017443A (de)
CN (1) CN121285734A (de)
WO (1) WO2024249548A2 (de)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8203120B2 (en) * 2008-10-09 2012-06-19 California Institute Of Technology 4D imaging in an ultrafast electron microscope
US10395888B2 (en) * 2017-03-30 2019-08-27 The Regents Of The University Of California Optical-cavity based ponderomotive phase plate for transmission electron microscopy
CA3111824A1 (en) * 2018-09-10 2020-03-19 Fluidigm Canada Inc. High speed modulation sample imaging apparatus and method

Also Published As

Publication number Publication date
WO2024249548A2 (en) 2024-12-05
WO2024249548A3 (en) 2025-01-09
KR20260017443A (ko) 2026-02-05
CN121285734A (zh) 2026-01-06

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