EP4721120A2 - Microscopie électronique à photoémission rapide pour applications biologiques et autres - Google Patents
Microscopie électronique à photoémission rapide pour applications biologiques et autresInfo
- Publication number
- EP4721120A2 EP4721120A2 EP24816365.1A EP24816365A EP4721120A2 EP 4721120 A2 EP4721120 A2 EP 4721120A2 EP 24816365 A EP24816365 A EP 24816365A EP 4721120 A2 EP4721120 A2 EP 4721120A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- biological sample
- sample
- stage
- imaging
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/285—Emission microscopes, e.g. field-emission microscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/084—Investigating materials by wave or particle radiation secondary emission photo-electric effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/612—Specific applications or type of materials biological material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/285—Emission microscopes
- H01J2237/2855—Photo-emission
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Système d'imagerie comprenant une source de lumière configurée pour rayonner un échantillon biologique, la source de lumière étant optimisée pour une imagerie rapide de l'échantillon biologique à l'aide d'un effet photoélectrique. Le système comprend également un porte-échantillon configuré pour fixer l'échantillon biologique pendant l'imagerie. Le système comprend également un ensemble étage sur lequel le porte-échantillon est monté, l'ensemble étage déplaçant l'échantillon biologique pendant l'imagerie. Le système comprend en outre un détecteur configuré pour recevoir des électrons émis par l'échantillon biologique en réponse à un rayonnement provenant de la source de lumière.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202363470042P | 2023-05-31 | 2023-05-31 | |
| PCT/US2024/031542 WO2024249548A2 (fr) | 2023-05-31 | 2024-05-30 | Microscopie électronique à photoémission rapide pour applications biologiques et autres |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP4721120A2 true EP4721120A2 (fr) | 2026-04-08 |
Family
ID=93658815
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP24816365.1A Pending EP4721120A2 (fr) | 2023-05-31 | 2024-05-30 | Microscopie électronique à photoémission rapide pour applications biologiques et autres |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP4721120A2 (fr) |
| KR (1) | KR20260017443A (fr) |
| CN (1) | CN121285734A (fr) |
| WO (1) | WO2024249548A2 (fr) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8203120B2 (en) * | 2008-10-09 | 2012-06-19 | California Institute Of Technology | 4D imaging in an ultrafast electron microscope |
| US10395888B2 (en) * | 2017-03-30 | 2019-08-27 | The Regents Of The University Of California | Optical-cavity based ponderomotive phase plate for transmission electron microscopy |
| CA3111824A1 (fr) * | 2018-09-10 | 2020-03-19 | Fluidigm Canada Inc. | Appareil et procede d'imagerie d'echantillon a modulation a grande vitesse |
-
2024
- 2024-05-30 EP EP24816365.1A patent/EP4721120A2/fr active Pending
- 2024-05-30 CN CN202480036531.8A patent/CN121285734A/zh active Pending
- 2024-05-30 KR KR1020257043777A patent/KR20260017443A/ko active Pending
- 2024-05-30 WO PCT/US2024/031542 patent/WO2024249548A2/fr not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024249548A2 (fr) | 2024-12-05 |
| WO2024249548A3 (fr) | 2025-01-09 |
| KR20260017443A (ko) | 2026-02-05 |
| CN121285734A (zh) | 2026-01-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
|
| 17P | Request for examination filed |
Effective date: 20251201 |
|
| AK | Designated contracting states |
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