ES1134788Y - Aparato de formacion de imagenes - Google Patents

Aparato de formacion de imagenes

Info

Publication number
ES1134788Y
ES1134788Y ES201490012U ES201490012U ES1134788Y ES 1134788 Y ES1134788 Y ES 1134788Y ES 201490012 U ES201490012 U ES 201490012U ES 201490012 U ES201490012 U ES 201490012U ES 1134788 Y ES1134788 Y ES 1134788Y
Authority
ES
Spain
Prior art keywords
image formation
formation device
image
formation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES201490012U
Other languages
English (en)
Other versions
ES1134788U (es
Inventor
Louis Wainwright
Peter Rothschild
Lee Grodzins
Paul Bradshaw
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
Original Assignee
American Science and Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Publication of ES1134788U publication Critical patent/ES1134788U/es
Application granted granted Critical
Publication of ES1134788Y publication Critical patent/ES1134788Y/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00Details of radiation-measuring instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
ES201490012U 2012-01-27 2013-01-25 Aparato de formacion de imagenes Expired - Fee Related ES1134788Y (es)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US201261591360P 2012-01-27 2012-01-27
US201261598521P 2012-02-14 2012-02-14
US201261598576P 2012-02-14 2012-02-14
US61/598/521 2012-02-14
US61/598576 2012-02-14
US201261607066P 2012-03-06 2012-03-06
US61/607066 2012-03-06
USP61/591360 2012-11-27
PCT/US2013/023125 WO2013112819A1 (en) 2012-01-27 2013-01-25 Hand-held x-ray backscatter imaging device

Publications (2)

Publication Number Publication Date
ES1134788U ES1134788U (es) 2014-12-17
ES1134788Y true ES1134788Y (es) 2015-03-10

Family

ID=48870225

Family Applications (1)

Application Number Title Priority Date Filing Date
ES201490012U Expired - Fee Related ES1134788Y (es) 2012-01-27 2013-01-25 Aparato de formacion de imagenes

Country Status (17)

Country Link
US (1) US20130195248A1 (es)
EP (1) EP2807474A4 (es)
JP (1) JP3195776U (es)
CN (1) CN205103190U (es)
BR (1) BR212014018332Y1 (es)
CA (1) CA2862043A1 (es)
CZ (1) CZ29627U1 (es)
DE (1) DE202013011828U1 (es)
DK (1) DK201600059Y3 (es)
ES (1) ES1134788Y (es)
FI (1) FI11290U1 (es)
IL (1) IL232783B (es)
IT (1) IT201600111552U1 (es)
PE (1) PE20150233Z (es)
PL (1) PL70150Y1 (es)
RU (1) RU151218U1 (es)
WO (1) WO2013112819A1 (es)

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CN107209282B (zh) 2014-11-20 2019-12-20 爱康公司 X射线扫描系统和方法
CA163498S (en) 2015-02-13 2017-09-28 Helmut Fischer Gmbh Inst Für Elektronik Und Messtechnik Handheld x-ray fluorescence measuring instrument
US10168445B2 (en) * 2015-03-20 2019-01-01 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US9989483B2 (en) 2015-08-17 2018-06-05 The Boeing Company Systems and methods for performing backscatter three dimensional imaging from one side of a structure
CN105652330B (zh) * 2015-12-25 2018-06-26 同方威视技术股份有限公司 便携式背散射成像检查设备及成像方法
CN105445303B (zh) * 2015-12-29 2019-02-19 清华大学 手持式背散射成像仪及其成像方法
US10359522B2 (en) 2016-01-15 2019-07-23 The Board Of Regents Of The Nevada System Of Higher Education On Behalf Of The University Of Nevada, Las Vegas Phoswich detector with fast neutron spectroscopy function
JP6545126B2 (ja) * 2016-06-28 2019-07-17 富士フイルム株式会社 放射線照射装置
US10770195B2 (en) 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
US10983074B2 (en) 2017-05-11 2021-04-20 The Boeing Company Visual light calibrator for an x-ray backscattering imaging system
USD854158S1 (en) * 2017-07-11 2019-07-16 Sociedad Espanola De Electromedicina Y Calidad, Sa Portable x-ray device
USD839430S1 (en) * 2017-07-11 2019-01-29 Sociedad Espanola De Electromedicina Y Calidad, Sa Portable x-ray device
USD839428S1 (en) * 2017-07-11 2019-01-29 Sociedad Espanola De Electromedicina Y Calidad, Sa Portable x-ray device
USD839429S1 (en) * 2017-07-11 2019-01-29 Sociedad Espanola De Electromedicina Y Calidad,Sa Handle assembly for a portable x-ray device
RU176238U1 (ru) * 2017-10-04 2018-01-12 Общество с ограниченной ответственностью "Флэш электроникс" Ручной досмотровый сканер
MX2020008158A (es) * 2018-02-02 2020-11-24 Viken Detection Corp Sistema y kit para formación de imágenes de retrodispersión de rayos x con detector retirable.
US11026646B2 (en) 2018-02-07 2021-06-08 Illinois Tool Works Inc. Systems and methods for digital X-ray imaging
US10648931B2 (en) 2018-03-29 2020-05-12 The Boeing Company X-ray inspection system and method for pipes
US10712292B2 (en) * 2018-03-29 2020-07-14 The Boeing Company Backscatter x-ray inspection system for pipes
CN112424644A (zh) 2018-06-20 2021-02-26 美国科学及工程股份有限公司 波长偏移片耦合的闪烁检测器
JP6763526B2 (ja) * 2018-06-29 2020-09-30 シャープ株式会社 非破壊検査装置、及び、非破壊検査方法
CN109471186A (zh) * 2018-12-18 2019-03-15 东莞深圳清华大学研究院创新中心 一种飞点扫描安检仪及其扫描方法
US11257653B2 (en) * 2020-03-27 2022-02-22 The Boeing Company Integrated aperture shield for x-ray tubes
US11169098B2 (en) 2020-04-02 2021-11-09 The Boeing Company System, method, and apparatus for x-ray backscatter inspection of parts
US12456848B2 (en) * 2020-05-27 2025-10-28 Candela Corporation Fractional handpiece with a passively Q-switched laser assembly
CN115698774A (zh) * 2020-06-02 2023-02-03 维肯检测公司 X射线成像设备和方法
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
EP3933881A1 (en) 2020-06-30 2022-01-05 VEC Imaging GmbH & Co. KG X-ray source with multiple grids
CN114166875B (zh) * 2020-09-11 2024-01-12 同方威视技术股份有限公司 背散射检查系统
CN114166874A (zh) * 2020-09-11 2022-03-11 同方威视技术股份有限公司 背散射检查系统和方法
WO2022061046A1 (en) * 2020-09-16 2022-03-24 Viken Detection Corporation X-ray scanning with variable resolution
CN116547524A (zh) * 2020-10-30 2023-08-04 维肯检测公司 X射线管检查系统
US20230236140A1 (en) * 2020-10-30 2023-07-27 Viken Detection Corporation Target X-Ray Inspection System and Method
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
US12163903B2 (en) 2021-05-12 2024-12-10 The Boeing Company System, method, and apparatus for x-ray backscatter inspection of parts
GB2624599A (en) 2021-10-01 2024-05-22 Rapiscan Holdings Inc Methods and systems for the concurrent generation of multiple substantially similar X-ray beams
WO2023164477A1 (en) * 2022-02-23 2023-08-31 Viken Detection Corporation Target x-ray inspection system and method
US12230468B2 (en) 2022-06-30 2025-02-18 Varex Imaging Corporation X-ray system with field emitters and arc protection
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USD1099326S1 (en) 2024-03-04 2025-10-21 Viken Detection Corporation Handheld X-ray scanner

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Also Published As

Publication number Publication date
JP3195776U (ja) 2015-02-05
EP2807474A4 (en) 2015-12-30
US20130195248A1 (en) 2013-08-01
DE202013011828U1 (de) 2014-10-17
IT201600111552U1 (it) 2018-05-07
DK201600059Y3 (da) 2016-07-08
IL232783B (en) 2018-07-31
CN205103190U (zh) 2016-03-23
WO2013112819A1 (en) 2013-08-01
FI11290U1 (fi) 2016-06-21
PL123398U1 (pl) 2015-09-28
PE20150233Z (es) 2015-02-12
DK201600059U1 (en) 2016-05-27
PL70150Y1 (pl) 2018-08-31
CA2862043A1 (en) 2013-08-01
BR212014018332U2 (pt) 2015-11-10
RU151218U1 (ru) 2015-03-27
CZ29627U1 (cs) 2016-07-12
ES1134788U (es) 2014-12-17
IL232783A0 (en) 2014-07-31
BR212014018332Y1 (pt) 2020-07-21
EP2807474A1 (en) 2014-12-03

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Legal Events

Date Code Title Description
FG1K Utility model granted

Effective date: 20150304

FD1K Utility model lapsed

Effective date: 20230224