ES1154460Y - Dispositivo de portal de inspección por rayos X - Google Patents

Dispositivo de portal de inspección por rayos X

Info

Publication number
ES1154460Y
ES1154460Y ES201500706U ES201500706U ES1154460Y ES 1154460 Y ES1154460 Y ES 1154460Y ES 201500706 U ES201500706 U ES 201500706U ES 201500706 U ES201500706 U ES 201500706U ES 1154460 Y ES1154460 Y ES 1154460Y
Authority
ES
Spain
Prior art keywords
ray inspection
portal device
inspection portal
ray
portal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES201500706U
Other languages
English (en)
Other versions
ES1154460U (es
Inventor
Peter Rothschild
Lee Grodzins
Anatoli Arodzero
Joseph Callerame
Dan-Cristian Dinca
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
Original Assignee
American Science and Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Publication of ES1154460U publication Critical patent/ES1154460U/es
Application granted granted Critical
Publication of ES1154460Y publication Critical patent/ES1154460Y/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/201—Measuring radiation intensity with scintillation detectors using scintillating fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/203—Measuring radiation intensity with scintillation detectors the detector being made of plastics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/204—Measuring radiation intensity with scintillation detectors the detector being a liquid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/06—Measuring neutron radiation with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T5/00—Recording of movements or tracks of particles; Processing or analysis of such tracks
    • G01T5/08—Scintillation chambers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
ES201500706U 2012-02-14 2013-02-04 Dispositivo de portal de inspección por rayos X Expired - Fee Related ES1154460Y (es)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US201261598521P 2012-02-14 2012-02-14
US201261598576P 2012-02-14 2012-02-14
US61/598576 2012-02-14
US61/598521 2012-02-14
US201261607066P 2012-03-06 2012-03-06
US61/607066 2012-03-06

Publications (2)

Publication Number Publication Date
ES1154460U ES1154460U (es) 2016-04-13
ES1154460Y true ES1154460Y (es) 2016-07-08

Family

ID=48945537

Family Applications (4)

Application Number Title Priority Date Filing Date
ES201500706U Expired - Fee Related ES1154460Y (es) 2012-02-14 2013-02-04 Dispositivo de portal de inspección por rayos X
ES201600176U Expired - Fee Related ES1153636Y (es) 2012-02-14 2013-02-04 Dispositivo de inspección por Rayos X para inspeccionar los bajos de un vehículo
ES201600177U Expired - Fee Related ES1153640Y (es) 2012-02-14 2013-02-04 Aparato para detectar rayos X incidentes en el aparato
ES13749372.2T Active ES2685971T3 (es) 2012-02-14 2013-02-04 Inspección de rayos X usando detectores de centelleo acoplados mediante fibra con desplazamiento de longitud de onda

Family Applications After (3)

Application Number Title Priority Date Filing Date
ES201600176U Expired - Fee Related ES1153636Y (es) 2012-02-14 2013-02-04 Dispositivo de inspección por Rayos X para inspeccionar los bajos de un vehículo
ES201600177U Expired - Fee Related ES1153640Y (es) 2012-02-14 2013-02-04 Aparato para detectar rayos X incidentes en el aparato
ES13749372.2T Active ES2685971T3 (es) 2012-02-14 2013-02-04 Inspección de rayos X usando detectores de centelleo acoplados mediante fibra con desplazamiento de longitud de onda

Country Status (18)

Country Link
US (4) US9285488B2 (es)
EP (1) EP2825904B1 (es)
JP (6) JP2015513075A (es)
KR (4) KR102266814B1 (es)
CN (4) CN104204854B (es)
BR (1) BR112014019517B1 (es)
CA (2) CA3080221A1 (es)
CL (1) CL2014002144U1 (es)
DE (2) DE202013012100U1 (es)
ES (4) ES1154460Y (es)
GT (1) GT201400009U (es)
HK (1) HK1244541A1 (es)
IL (3) IL234076B (es)
MX (1) MX337476B (es)
PE (1) PE20150237Z (es)
PL (2) PL125062U1 (es)
RU (1) RU2606698C2 (es)
WO (1) WO2013122763A1 (es)

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ES2685971T3 (es) 2018-10-15
EP2825904B1 (en) 2018-07-04
CL2014002144U1 (es) 2014-12-19
EP2825904A1 (en) 2015-01-21
ES1153640Y (es) 2016-07-08
US9285488B2 (en) 2016-03-15
MX2014009790A (es) 2014-09-12
IL234076A0 (en) 2014-09-30
PE20150237Z (es) 2015-02-12
KR20200044998A (ko) 2020-04-29
RU2606698C2 (ru) 2017-01-10
CN113302521A (zh) 2021-08-24
CA2864354A1 (en) 2013-08-22
WO2013122763A1 (en) 2013-08-22
DE202013012103U1 (de) 2015-06-03
RU2014133352A (ru) 2016-04-10
HK1202633A1 (en) 2015-10-02
CN113302521B (zh) 2024-06-18
JP2015513075A (ja) 2015-04-30
CA2864354C (en) 2023-02-28
CN104204854A (zh) 2014-12-10
US9658343B2 (en) 2017-05-23
JP6525477B2 (ja) 2019-06-05
ES1153636U (es) 2016-03-31
DE202013012100U1 (de) 2015-05-06
IL234076B (en) 2018-06-28
PL125720U1 (pl) 2017-10-23
CN107193034A (zh) 2017-09-22
GT201400009U (es) 2015-07-08
KR102105727B1 (ko) 2020-05-29
KR102266814B1 (ko) 2021-06-17
US20170315242A1 (en) 2017-11-02
CA3080221A1 (en) 2013-08-22
CN118501923A (zh) 2024-08-16
JP2021167846A (ja) 2021-10-21
BR112014019517A8 (pt) 2017-07-11
KR20200044997A (ko) 2020-04-29
KR20140123996A (ko) 2014-10-23
IL259737B (en) 2021-09-30
US20160170044A1 (en) 2016-06-16
ES1153636Y (es) 2016-07-08
JP2018155764A (ja) 2018-10-04
JP7138751B2 (ja) 2022-09-16
KR102293638B1 (ko) 2021-08-24
US10209372B2 (en) 2019-02-19
BR112014019517B1 (pt) 2022-05-10

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