ES2025544T1 - Sonda para pruebas electricas. - Google Patents

Sonda para pruebas electricas.

Info

Publication number
ES2025544T1
ES2025544T1 ES199090306846T ES90306846T ES2025544T1 ES 2025544 T1 ES2025544 T1 ES 2025544T1 ES 199090306846 T ES199090306846 T ES 199090306846T ES 90306846 T ES90306846 T ES 90306846T ES 2025544 T1 ES2025544 T1 ES 2025544T1
Authority
ES
Spain
Prior art keywords
bar
guide member
guide hole
guide
square
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
ES199090306846T
Other languages
English (en)
Inventor
Mark A. Swart
Charles J. Johnston
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Everett Charles Technologies Inc
Original Assignee
Everett Charles Contact Products Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Everett Charles Contact Products Inc filed Critical Everett Charles Contact Products Inc
Publication of ES2025544T1 publication Critical patent/ES2025544T1/es
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

UN MONTAJE DE SONDA COMPRENDE UNA BARRA (22) QUE TIENE UN HUECO INTERIOR Y UN EMBOLO (130) EL CUAL SE DESLIZA AXIALMENTE EN EL INTERIOR DE LA BARRA (22). EL EMBOLO (30) TIENE UNA PORCION EXTERIOR QUE SE EXTIENDE A TRAVES DEL EXTREMO ABIERTO DE LA BARRA, TERMINANDO EN UNA PUNTA DE CONTACTO (32) FUERA DE LA BARRA (22) PARA CONTACTAR CON UN PUNTO DE TEXTO. EN UN DISEÑO, EL EMBOLO (3) TAMBIEN TIENE UN RECEPTACULO ALARGADO HUECO (36) EXTENDIENDOSE A TRAVES DEL INTERIOR DE LA BARRA (22). EL RECEPTACULO (36) TIENE UN AGUJERO GUIA CON FORMA GEOMETRICA (40), PREFERIBLEMENTE CUADRADO , SEPARADO DEL EXTREMO ABIERTO DE LA BARRA (22). UN MIEMBRO GUIA ALARGADO FIJO (54) EN LA BARRA (22) SE EXTIENDE A TRAVES DEL AGUJERO GUIA (40). EL MIEMBRO GUIA (54) SE EXTIENDE A TRAVES DEL INTERIOR DE LA BARRA (22) LEJOS EL AGUJERO GUIA (40). EL MIEMBRO GUIA (54) TIENE UNA SUPERFICIE EXTERIOR DE FORMA CUADRADA ENLAZADO EL AGUJERO GUIA (40). UN MUELLE (63) DENTRO DE LA BARRA (22) SE EXTIENDE A LO LARGO DEL MIEMBRO GUIA(54) Y ES DERIVADO CONTRA EL EXTREMO INTERNO DEL RECEPTACULO (36) DENTRO DE LA BARRA (22). EL RECORRIDO AXIAL DEL EMBOLO (3) DENTRO DE LA BARRA (22) ES, CONTRA LA DERIVACION DEL MUELLE (63). LA SUPERFICIE EXTERIOR EN FORMA DE CUADRADO DEL MIEMBRO GUIA (54), ENLAZADO AGUJERO GUIA CUADRADO (40), CONTROLA EL MOVIMIENTO ROTATORIO DEL EMBOLO (3) MIENTRAS HACE EL RECORRIDO A LO LARGO DEL MIEMBRO GUIA (54) CONTRA LA DERIVACION DEL MUELLE (63). EN OTRO DISEÑO, UNA CONFIGURACION ESPIRAL (54) EN LA SUPERFICIE EXTERIOR DE LA GUIA (54), ENLAZA EL AGUJERO GUIA (40) PARA QUE EL RECORRIDO AXIAL DEL RECEPTACULO (36) CAUSE QUE EL EMBOLO (30) GIRE SOBRE SU EJE, DE MODO QUE DE UN BUEN CONTACTO FUICCIONAL ENTRE LA PUNTA DEL EMBOLO (32) Y EL PUNTO DE EXAMEN EN LA UNIDAD BAJO SONDEO. EN OTRO DISEÑO, LAS PARTES ENLAZADAS DE FORMA CUADRADA COOPERADORAS DEL MIEMBRO GUIA (54) Y EL AGUJERO GUIA (40) SUMINISTRA UN RECORRIDO LINEAL CONTROLADO, NO-ROTACIONAL DEL EMBOLO (30) RELATIVO A LA BARRA (22).
ES199090306846T 1989-11-03 1990-06-22 Sonda para pruebas electricas. Pending ES2025544T1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/431,477 US5032787A (en) 1989-11-03 1989-11-03 Electrical test probe having rotational control of the probe shaft

Publications (1)

Publication Number Publication Date
ES2025544T1 true ES2025544T1 (es) 1992-04-01

Family

ID=23712120

Family Applications (1)

Application Number Title Priority Date Filing Date
ES199090306846T Pending ES2025544T1 (es) 1989-11-03 1990-06-22 Sonda para pruebas electricas.

Country Status (5)

Country Link
US (1) US5032787A (es)
EP (1) EP0426275A3 (es)
JP (1) JPH03269264A (es)
DE (1) DE426275T1 (es)
ES (1) ES2025544T1 (es)

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USD347187S (en) 1992-02-20 1994-05-24 Shu-Hui Chou Electric test pen
US5225773A (en) * 1992-02-26 1993-07-06 Interconnect Devices, Inc. Switch probe
US5227718A (en) * 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly
US5576631A (en) * 1992-03-10 1996-11-19 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly
US5420519A (en) * 1992-03-10 1995-05-30 Virginia Panel Corporation Double-headed spring contact probe assembly
USD346338S (en) 1993-02-26 1994-04-26 Tektronix, Inc. Electrical test probe
USD346122S (en) 1993-03-01 1994-04-19 Tektronix, Inc. Probing head for an electrical test probe
US5518410A (en) * 1993-05-24 1996-05-21 Enplas Corporation Contact pin device for IC sockets
USD355861S (en) 1993-07-30 1995-02-28 Walsh Kevin P Electronic voltage tester instrument
JP3659662B2 (ja) * 1993-12-24 2005-06-15 株式会社デンソー プローブコンタクト
US5391995A (en) * 1994-02-01 1995-02-21 Everett Charles Technologies, Inc. Twisting electrical test probe with controlled pointing accuracy
DE4414770A1 (de) * 1994-04-27 1995-11-02 Hubert Driller Testsystem für bestückte und unbestückte Leiterplatten
US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
US5484306A (en) * 1994-10-20 1996-01-16 Interconnect Devices Inc. Quick-connect terminal and receptacle
US5942906A (en) * 1994-11-18 1999-08-24 Virginia Panel Corporation Interface system utilizing engagement mechanism
DE29519413U1 (de) * 1995-12-07 1996-01-25 TSK Prüfsysteme GmbH, 32457 Porta Westfalica Prüfstift
US5818248A (en) * 1996-07-29 1998-10-06 Delaware Capital Formation, Inc Loaded board test fixture with integral translator fixture for testing closely spaced test sites
US5804984A (en) * 1996-08-02 1998-09-08 International Business Machines Corporation Electronic component test apparatus with rotational probe
US6051982A (en) * 1996-08-02 2000-04-18 International Business Machines Corporation Electronic component test apparatus with rotational probe and conductive spaced apart means
US5781023A (en) * 1997-01-31 1998-07-14 Delware Capital Formation, Inc. Hollow plunger test probe
US6411112B1 (en) 1998-02-19 2002-06-25 International Business Machines Corporation Off-axis contact tip and dense packing design for a fine pitch probe
US6104205A (en) * 1998-02-26 2000-08-15 Interconnect Devices, Inc. Probe with tab retainer
US6377059B2 (en) * 1999-02-19 2002-04-23 Delaware Capital Formation, Inc. Crown shaped contact barrel configuration for spring probe
US6538424B1 (en) * 2000-07-31 2003-03-25 Le Croy Corporation Notched electrical test probe tip
US6945827B2 (en) * 2002-12-23 2005-09-20 Formfactor, Inc. Microelectronic contact structure
US7109732B2 (en) * 2003-07-31 2006-09-19 Endicott Interconnect Technologies, Inc. Electronic component test apparatus
KR100546361B1 (ko) * 2003-08-08 2006-01-26 삼성전자주식회사 반도체 소자 검사장치의 포고 핀 및 그 운용방법
JP4089976B2 (ja) * 2004-05-17 2008-05-28 リーノ アイエヌディー．インコーポレイテッド 大電流用プローブ
US7411405B2 (en) * 2004-11-03 2008-08-12 Panduit Corp. Method and apparatus for reliable network cable connectivity
US7259576B2 (en) * 2005-03-14 2007-08-21 Agilent Technologies, Inc. Method and apparatus for a twisting fixture probe for probing test access point structures
US7461771B2 (en) * 2005-04-22 2008-12-09 Hewlett-Packard Development Company, L.P. Method of treating and probing a via
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
US7671613B1 (en) 2006-01-06 2010-03-02 Lecroy Corporation Probing blade conductive connector for use with an electrical test probe
US9140724B1 (en) 2006-01-06 2015-09-22 Lecroy Corporation Compensating resistance probing tip optimized adapters for use with specific electrical test probes
US9404940B1 (en) 2006-01-06 2016-08-02 Teledyne Lecroy, Inc. Compensating probing tip optimized adapters for use with specific electrical test probes
US7442045B1 (en) * 2007-08-17 2008-10-28 Centipede Systems, Inc. Miniature electrical ball and tube socket with self-capturing multiple-contact-point coupling
US7491069B1 (en) 2008-01-07 2009-02-17 Centipede Systems, Inc. Self-cleaning socket for microelectronic devices
US8648616B2 (en) 2009-12-22 2014-02-11 Ltx-Credence Corporation Loaded printed circuit board test fixture and method for manufacturing the same
GB201000344D0 (en) * 2010-01-11 2010-02-24 Cambridge Silicon Radio Ltd An improved test probe
TWI534432B (zh) 2010-09-07 2016-05-21 瓊斯科技國際公司 用於微電路測試器之電氣傳導針腳
US20120139574A1 (en) * 2010-12-06 2012-06-07 International Business Machines Corporation Vertical probe tip rotational scrub and method
USD699607S1 (en) * 2012-03-01 2014-02-18 Yamaichi Electronics Co., Ltd. Contact probe
US8777675B2 (en) * 2012-09-26 2014-07-15 Intel Corporation Vertical contact for shielded sockets
JP6193719B2 (ja) * 2013-10-22 2017-09-06 日本電子材料株式会社 コンタクトプローブ
US9209548B2 (en) * 2014-04-01 2015-12-08 Interconnect Devices, Inc. Electrical probe with rotatable plunger
CN104538791B (zh) * 2014-12-18 2016-11-30 中航光电科技股份有限公司 连接器
EP4080684B1 (en) * 2021-04-20 2025-02-26 Preci-Dip Sa Piston assembly and spring-loaded contact
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
CN115267277A (zh) * 2022-08-11 2022-11-01 渭南木王智能科技股份有限公司 一种可以防止针轴旋转的双头双动测试探针

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EP0068986A1 (en) * 1981-06-23 1983-01-05 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Two-part contact probe assembly
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Also Published As

Publication number Publication date
EP0426275A3 (en) 1992-04-01
US5032787A (en) 1991-07-16
EP0426275A2 (en) 1991-05-08
DE426275T1 (de) 1992-01-16
JPH03269264A (ja) 1991-11-29

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