ES2043252T3 - Circuito semiconductor integrado para medidas termicas. - Google Patents

Circuito semiconductor integrado para medidas termicas.

Info

Publication number
ES2043252T3
ES2043252T3 ES90201455T ES90201455T ES2043252T3 ES 2043252 T3 ES2043252 T3 ES 2043252T3 ES 90201455 T ES90201455 T ES 90201455T ES 90201455 T ES90201455 T ES 90201455T ES 2043252 T3 ES2043252 T3 ES 2043252T3
Authority
ES
Spain
Prior art keywords
semiconductor circuit
signal
integrated semiconductor
comparator
thermal measurements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES90201455T
Other languages
English (en)
Inventor
Johan Hendrik Huijsing
Frank Robert Riedijk
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bronkhorst High-Tech BV
Original Assignee
Bronkhorst High-Tech BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bronkhorst High-Tech BV filed Critical Bronkhorst High-Tech BV
Application granted granted Critical
Publication of ES2043252T3 publication Critical patent/ES2043252T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
    • G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
    • G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
    • G01F1/696—Circuits therefor, e.g. constant-current flow meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K17/00—Measuring quantity of heat
    • G01K17/04—Calorimeters using compensation methods, i.e. where the absorbed or released quantity of heat to be measured is compensated by a measured quantity of heating or cooling

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Fluid Mechanics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Measuring Volume Flow (AREA)
  • Measuring Fluid Pressure (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

CIRCUITO SEMICONDUCTOR INTEGRADO PARA MEDICIONES TERMICAS, COMPRENDIENDO POR LO MENOS UN DETECTOR DE CORRIENTE TERMICA O TEMPERATURA Y UN COMPARADOR (8) DE SEÑALES, ESTANDO PROVISTO EL COMPARADOR (8) CON UN BUCLE DE REALIMENTACION DE SEÑALES QUE CONTIENE UN CONVERSOR (3) DE SEÑALES DA, MAS ESPECIFICAMENTE, EL COMPARADOR (8) SIENDO UN COMPARADOR DE CORRIENTE TERMICA O TEMPERATURA, COMPRENDIENDO EL CONVERSOR DE SEÑALES DA (3) UNA POTENCIA DISPONIBLE Y EL BUCLE DE REALIMENTACION DE SEÑALES COMPRENDIENDO COMPONENTES PARA LA TRANSFERENCIA DE SEÑALES TERMICAS.
ES90201455T 1989-06-23 1990-06-07 Circuito semiconductor integrado para medidas termicas. Expired - Lifetime ES2043252T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8901602A NL8901602A (nl) 1989-06-23 1989-06-23 Geintegreerde halfgeleider-schakeling voor thermische metingen.

Publications (1)

Publication Number Publication Date
ES2043252T3 true ES2043252T3 (es) 1993-12-16

Family

ID=19854900

Family Applications (1)

Application Number Title Priority Date Filing Date
ES90201455T Expired - Lifetime ES2043252T3 (es) 1989-06-23 1990-06-07 Circuito semiconductor integrado para medidas termicas.

Country Status (8)

Country Link
US (1) US5064296A (es)
EP (1) EP0404218B1 (es)
JP (1) JP2999227B2 (es)
AT (1) ATE92182T1 (es)
DE (1) DE69002409T2 (es)
DK (1) DK0404218T3 (es)
ES (1) ES2043252T3 (es)
NL (1) NL8901602A (es)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5295746A (en) * 1992-02-05 1994-03-22 The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services High resolution digital thermometer
US7216064B1 (en) * 1993-09-21 2007-05-08 Intel Corporation Method and apparatus for programmable thermal sensor for an integrated circuit
US5654507A (en) * 1996-07-03 1997-08-05 Board Of Trustees Operating Michigan State University Pulse width modulated constant temperature anemometer
US6055489A (en) * 1997-04-15 2000-04-25 Intel Corporation Temperature measurement and compensation scheme
US6363490B1 (en) 1999-03-30 2002-03-26 Intel Corporation Method and apparatus for monitoring the temperature of a processor
US6789037B2 (en) * 1999-03-30 2004-09-07 Intel Corporation Methods and apparatus for thermal management of an integrated circuit die
US6393374B1 (en) 1999-03-30 2002-05-21 Intel Corporation Programmable thermal management of an integrated circuit die
US7263567B1 (en) 2000-09-25 2007-08-28 Intel Corporation Method and apparatus for lowering the die temperature of a microprocessor and maintaining the temperature below the die burn out
RU2206878C1 (ru) * 2001-10-01 2003-06-20 ОАО Казанский вертолетный завод Способ измерения пространственного распределения температуры и устройство для его осуществления
US6749335B2 (en) * 2002-05-17 2004-06-15 Sun Microsystems, Inc. Adjustment and calibration system for post-fabrication treatment of on-chip temperature sensor
US6966693B2 (en) * 2003-01-14 2005-11-22 Hewlett-Packard Development Company, L.P. Thermal characterization chip
JP4790405B2 (ja) 2005-12-16 2011-10-12 三菱電機株式会社 熱式流量センサ
JP4796414B2 (ja) * 2006-03-14 2011-10-19 日本電波工業株式会社 水晶発振器
US7418878B2 (en) * 2006-09-19 2008-09-02 Los Robles Advertising, Inc. Universal sensor controller for a thermal anemometer
JP5633682B2 (ja) * 2010-06-03 2014-12-03 日産自動車株式会社 電力変換機の制御装置
JP5152538B2 (ja) * 2010-10-21 2013-02-27 横河電機株式会社 コリオリ質量流量計
US20130151319A1 (en) * 2011-12-07 2013-06-13 Yang Pan Predictable Method for Reducing Power Consumption during Peak Demand
WO2013170109A1 (en) * 2012-05-11 2013-11-14 Verto Medical Solutions, LLC Earphones and earbuds with physiologic sensors
US10022004B2 (en) * 2015-03-26 2018-07-17 Tini Topper Brands, LLC Drink lid

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4008617A (en) * 1975-01-09 1977-02-22 Filac Corporation Electronic thermometer and method
US4186384A (en) * 1975-06-24 1980-01-29 Honeywell Inc. Signal bias remover apparatus
US4045658A (en) * 1976-01-12 1977-08-30 Alnor Instrument Co. Digitized linearizing correction apparatus with frequency modulation
SU851117A1 (ru) * 1979-07-03 1981-07-30 Тернопольский Финансово-Экономи-Ческий Институт Устройство дл измерени темпера-ТуРы
NL177629C (nl) * 1979-07-09 1985-10-16 Brooks Instr Bv Richtingsgevoelige stroomsnelheidsmeter.
SU898266A1 (ru) * 1980-05-16 1982-01-15 Московский институт электронной техники Устройство дл измерени температурных полей
US4439756A (en) * 1982-01-20 1984-03-27 International Telephone And Telegraph Corporation Delta-Sigma modulator with switch capacitor implementation
US4651564A (en) * 1982-09-30 1987-03-24 Honeywell Inc. Semiconductor device
JPS601525A (ja) * 1983-06-20 1985-01-07 Nippon Soken Inc 半導体式流量検出装置
FR2567642B1 (fr) * 1984-07-10 1989-08-04 Renault Capteur de debit de fluide a point de transition thermique
JPH0813004B2 (ja) * 1984-09-07 1996-02-07 株式会社日立製作所 Ａ／ｄ変換器
SU1364911A1 (ru) * 1986-07-14 1988-01-07 Институт Электродинамики Ан Усср Способ определени температуры
US4866442A (en) * 1987-06-01 1989-09-12 Steim Joseph M Analog to digital converter employing delta-sigma modulation
US4782708A (en) * 1987-08-27 1988-11-08 General Motors Corporation Thermocouple sensors
NL8702229A (nl) * 1987-09-18 1989-04-17 Bronkhorst High Tech Bv Richtingsgevoelige stroomsnelheidsmeter.

Also Published As

Publication number Publication date
ATE92182T1 (de) 1993-08-15
NL8901602A (nl) 1991-01-16
JPH0342534A (ja) 1991-02-22
EP0404218B1 (en) 1993-07-28
DE69002409D1 (de) 1993-09-02
US5064296A (en) 1991-11-12
JP2999227B2 (ja) 2000-01-17
DE69002409T2 (de) 1993-12-02
EP0404218A1 (en) 1990-12-27
DK0404218T3 (da) 1993-11-15

Similar Documents

Publication Publication Date Title
ES2043252T3 (es) Circuito semiconductor integrado para medidas termicas.
IT8622732A0 (it) Circuito per la misura lineare della corrente circolante su un carico.
DE69113915D1 (de) Copolyimide mit hoher Glasübergangstemperatur und daraus geformte Verbundstoffe.
DE50011321D1 (de) Temperaturstabilisierbarer Infrarot-Sensor und Infrarot-Thermometer mit einem derartigen Sensor
DE69201715D1 (de) Laserapparat mit stabilisierbarer Temperatur.
DE3786743D1 (de) Kuehlungsanordnung mit hohem waermewirkungsgrad und hoher umgebungssicherheit.
EP0593133A3 (es)
GB2261321B (en) Power semiconductor device with temperature sensor
DE69011249D1 (de) Magnetfelderzeugendes System.
DE3677634D1 (de) Heizvorrichtung.
DE59009578D1 (de) Stromversorgungseinrichtung mit Unsymmetrieüberwachungsschaltung.
DE69012507D1 (de) Freigabeschaltung mit integrierter thermischer Abschaltung.
NO891654D0 (no) Fremgangsmaate for foering av en ved forhoeyet temperatur forloepende reaksjon, og anordning for fremstilling av termisk oemfintlige produkter ved forhoeyete temperaturer.
DE69125437D1 (de) Halbleiteranordnung mit einer Temperaturfühlerschaltung
EP0395259A3 (en) Temperature control system for solid state light source
ATE101291T1 (de) Temperaturregler.
BR8807021A (pt) Dispositivo para a protecao termica de um circuito de potencia eletronico integrado
TW339322B (en) Package for temperature-sensitive planar optical components
FI874753A0 (fi) Anordning foer kylning av halvledarkomponenter.
HUT39871A (en) Method for measuring the temperature of semiconductor laser diode and circuit arrangement for carrying out thereof
DE58909450D1 (de) Leistungs-MOSFET mit Temperatursensor.
NO920652D0 (no) Anvendelse av mono- og bis(metylbenzyl)xylenisomerer som termisk overfoeringsfluid
NO873666D0 (no) Borefluider for lav og hoey temperatur basert paa sulfonerte terpolymerionomerer.
JPS57149784A (en) Laser diode
EP0285400A3 (en) Laser power monitor

Legal Events

Date Code Title Description
FG2A Definitive protection

Ref document number: 404218

Country of ref document: ES