ES2059421T3 - Procedimiento para la deteccion de defectos de superficie y dispositivo para la realizacion del mismo. - Google Patents

Procedimiento para la deteccion de defectos de superficie y dispositivo para la realizacion del mismo.

Info

Publication number
ES2059421T3
ES2059421T3 ES88105660T ES88105660T ES2059421T3 ES 2059421 T3 ES2059421 T3 ES 2059421T3 ES 88105660 T ES88105660 T ES 88105660T ES 88105660 T ES88105660 T ES 88105660T ES 2059421 T3 ES2059421 T3 ES 2059421T3
Authority
ES
Spain
Prior art keywords
light
procedure
window
width
realization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES88105660T
Other languages
English (en)
Inventor
Jurgen Dipl-Ing Klenk
Horst Dr Dipl-Phys Krasowski
Gerhard Dr Dipl-Phys Junemann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daimler Benz AG
Original Assignee
Daimler Benz AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daimler Benz AG filed Critical Daimler Benz AG
Application granted granted Critical
Publication of ES2059421T3 publication Critical patent/ES2059421T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/102—Video camera

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

EN UN PROCEDIMIENTO PARA EL RECONOCIMIENTO DE DEFECTOS SOBRE LA SUPERFICIE SUPERIOR DE UN OBJETO, PREFERENTEMENTE PARA LA IDENTIFICACION DE DEFECTO DE LAQUEADO SOBRE LA SUPERFICIE SUPERIOR DE UNA CARROCERIA DEL VEHICULO SE PRODUCE SOBRE LA SUPERFICIE SUPERIOR UNA FAJA LUMINOSA MEDIANTE UN SISTEMA DE ILUMINACION Y ESTE SE LLEVA A LO LEJOS A TRAVES DE UN MOVIMIENTO RELATIVO ENTRE EL SISTEMA DE ILUMINACION Y LA SUPERFFICIE SUPERIOR; TRAMOS DE FORMA DE TIRA DE LA SUPERFICIE SUPERIOR DEL OBJETO SE REGISTRAN HABITUALMENTE EN EL CAMPO DE LA FAJA LUMINOSA GRADUALMENTE, DONDE EL ANCHO DEL TRAMO DE REGISTRO SIGUIENTE ES MAS PEQUEÑO QUE EL ANCHO DE LA FAJA LUMINOSA. EN UN DISPOSITIVO PARA LA REALIZACION DE ESTE PROCEDIMIENTO EL SISTEMA DE ILUMINACION (3) MUESTRA AL MENOS UNA UNIDAD DE ILUMINACION (3) CON UNA VENTANA DE SALIDA DE LUZ (10) Y EL SISTEMA DE REGISTRO MUESTRA AL MENOS UNA UNIDAD SENSOR (4) CON UNA VENTANA DE ENTRADA DE LA LUZ (19), DONDE LA VENTANA DE SALIDA DE LUZ (10) Y LA VENTANA DE ENTRADA DE LUZ (19) ESTAN DISPUESTAS ESTRECHAMENTE Y SON VECINAS.
ES88105660T 1987-04-13 1988-04-08 Procedimiento para la deteccion de defectos de superficie y dispositivo para la realizacion del mismo. Expired - Lifetime ES2059421T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19873712513 DE3712513A1 (de) 1987-04-13 1987-04-13 Verfahren und vorrichtung zur erkennung von oberflaechenfehlern

Publications (1)

Publication Number Publication Date
ES2059421T3 true ES2059421T3 (es) 1994-11-16

Family

ID=6325542

Family Applications (1)

Application Number Title Priority Date Filing Date
ES88105660T Expired - Lifetime ES2059421T3 (es) 1987-04-13 1988-04-08 Procedimiento para la deteccion de defectos de superficie y dispositivo para la realizacion del mismo.

Country Status (6)

Country Link
US (1) US4918321A (es)
EP (1) EP0286994B1 (es)
JP (1) JP2578897B2 (es)
CA (1) CA1285331C (es)
DE (1) DE3712513A1 (es)
ES (1) ES2059421T3 (es)

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Also Published As

Publication number Publication date
EP0286994B1 (de) 1994-07-20
US4918321A (en) 1990-04-17
JPS6438638A (en) 1989-02-08
EP0286994A3 (en) 1990-03-14
DE3712513A1 (de) 1988-11-03
JP2578897B2 (ja) 1997-02-05
EP0286994A2 (de) 1988-10-19
DE3712513C2 (es) 1993-01-21
CA1285331C (en) 1991-06-25

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