ES2061755T3 - Montura de medicion de componentes de microondas. - Google Patents

Montura de medicion de componentes de microondas.

Info

Publication number
ES2061755T3
ES2061755T3 ES89104951T ES89104951T ES2061755T3 ES 2061755 T3 ES2061755 T3 ES 2061755T3 ES 89104951 T ES89104951 T ES 89104951T ES 89104951 T ES89104951 T ES 89104951T ES 2061755 T3 ES2061755 T3 ES 2061755T3
Authority
ES
Spain
Prior art keywords
microwave components
support
measuring
measuring mount
mount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES89104951T
Other languages
English (en)
Inventor
Walter Zimmermann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Siemens Corp
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Application granted granted Critical
Publication of ES2061755T3 publication Critical patent/ES2061755T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

UN SOPORTE DE MEDIDA, EN ESPECIAL PARA COMPONENTES DE MICROONDAS TAMBIEN DEBE SATISFACER LAS EXIGENCIAS DE PRECISION DE MEDIDA DE LOS COMPONENTES DE MICROONDAS MONTABLES CON DISPOSITIVOS AUTOMATICOS. EL SOPORTE POSEE UNA CORREDERA (6 A 9) PARA INTRODUCIR EL COMPONENTE (30) A MEDIR EN EL SOPORTE Y PARA POSICIONAR Y CONTACTAR EL COMPONENTE (30) EN EL SOPORTE.
ES89104951T 1989-03-20 1989-03-20 Montura de medicion de componentes de microondas. Expired - Lifetime ES2061755T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP89104951A EP0388485B1 (de) 1989-03-20 1989-03-20 Messfassung für Mikrowellenbauelemente

Publications (1)

Publication Number Publication Date
ES2061755T3 true ES2061755T3 (es) 1994-12-16

Family

ID=8201115

Family Applications (1)

Application Number Title Priority Date Filing Date
ES89104951T Expired - Lifetime ES2061755T3 (es) 1989-03-20 1989-03-20 Montura de medicion de componentes de microondas.

Country Status (6)

Country Link
US (1) US5086268A (es)
EP (1) EP0388485B1 (es)
JP (1) JPH02285270A (es)
CA (1) CA2012407A1 (es)
DE (1) DE58908477D1 (es)
ES (1) ES2061755T3 (es)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE146294T1 (de) * 1991-08-13 1996-12-15 Polygram Int Holding Verfahren zum herstellen eines vorbespielten magnetbandes sowie magnetbandgerät zum durchführen dieses verfahrens
US5541225A (en) * 1994-10-11 1996-07-30 The General Hospital Corporation α-Linolenic acid and eicosatetraynoic acid in the prevention and treatment of ventricular tachyarrhythmia
DE102008011240B4 (de) * 2008-02-26 2016-11-17 Airbus Ds Electronics And Border Security Gmbh Vorrichtung zur Kontaktierung eines T/R-Moduls mit einer Testeinrichtung
DE102008023130B3 (de) * 2008-05-09 2009-12-31 Eads Deutschland Gmbh Vorrichtung zur Kontaktierung eines T/R-Moduls mit einer Testeinrichtung
CN112180244B (zh) * 2020-12-01 2021-02-12 四川斯艾普电子科技有限公司 一种载板式裸芯片功放模块测试装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4365195A (en) * 1979-12-27 1982-12-21 Communications Satellite Corporation Coplanar waveguide mounting structure and test fixture for microwave integrated circuits
US4340860A (en) * 1980-05-19 1982-07-20 Trigon Integrated circuit carrier package test probe
US4367584A (en) * 1980-09-15 1983-01-11 Universal Instruments Corporation Method and apparatus for straightening leads and verifying the orientation and functionality of components
US4478352A (en) * 1982-05-19 1984-10-23 Micro Component Technology, Inc. Integrated circuit component handler singulation apparatus
US4535307A (en) * 1982-06-30 1985-08-13 Raytheon Company Microwave circuit device package
US4747784A (en) * 1986-05-16 1988-05-31 Daymarc Corporation Contactor for integrated circuits
US4689556A (en) * 1984-10-12 1987-08-25 Daymarc Corporation Broad band contactor assembly for testing integrated circuit devices
US4707656A (en) * 1985-03-18 1987-11-17 Marzan Jose M Circuit test fixture
US4836797A (en) * 1986-12-16 1989-06-06 Sym-Tek Systems, Inc. Electrical device contactor
US4835464A (en) * 1987-04-23 1989-05-30 Micro Component Technology, Inc. Decoupling apparatus for use with integrated circuit tester
DE8810268U1 (de) * 1988-04-08 1988-11-17 Itronic Fuchs GmbH, 7809 Denzlingen Vorrichtung zur 4-Pol-Kontaktierung

Also Published As

Publication number Publication date
DE58908477D1 (de) 1994-11-10
JPH02285270A (ja) 1990-11-22
EP0388485A1 (de) 1990-09-26
EP0388485B1 (de) 1994-10-05
US5086268A (en) 1992-02-04
CA2012407A1 (en) 1990-09-20

Similar Documents

Publication Publication Date Title
DE69010988D1 (de) Münzprüfvorrichtung mit Kompensation der äusseren Umgebungsbedingungen.
DE3688015D1 (de) Profilmesseinrichtung mit vom lichtfleck ueberstreifter apertur.
IT7868025A0 (it) Vite con portata particolarmente utile come perno di cerniera per occhiali
DK68189A (da) Indretning til maaling af tykkelsen af fremfoerte vaerdipapirer
DE69031747D1 (de) Kompensierter Detektor für bewegte Ziele mit veränderlicher Wiederholungsfrequenz
FR2642123B1 (fr) Guide lineaire de precision
ES2061755T3 (es) Montura de medicion de componentes de microondas.
DE69006197D1 (de) Wiegeplatte mit Schnellabnahmevorrichtung.
DE69026899D1 (de) Integriertes Halbleiterschaltungsgerät mit Prüfschaltung
BR8402615A (pt) Mesa corredica de precisao
NO911503D0 (no) Skrukappe med et garantibaand som er utvidbart ved foerstegangs oppskruing.
DE3865074D1 (de) Referenzzeitvorrichtung mit konstanter stabilitaet fuer kurz- und langzeitmessungen.
ES2194259T3 (es) Aparato de medida de coordenadas o maquina de mecanizacion.
DE68903445D1 (de) Reibungsfrei gelagerte hebelanordnung.
JPS644717A (en) Photointerrupter
SU1830708A1 (ru) Устройство для перемещения декоративно-оформительских атрибутов информационно-зрелищных комплексов
SU638905A1 (ru) Устройство дл измерени состовл ющей потерь на перемагничивание
DE58902056D1 (de) Lichtelektrische positionsmesseinrichtung.
DE69015145D1 (de) Rechner mit cache-speicher.
JPS52144296A (en) Solid light emitting display device
IT1133361B (it) Tavolo rotondo con piano di appoggio intero,allungabile mediante lo slittamento delle due parti di un identico piano posto sotto al precedente
KR910008136U (ko) 자체 dc 바이어스를 갖는 alc 회로
SE7601559L (sv) Forfarande och anleggning for att astadkomma metljuset i fotoelektroniska apparater
IT216773Z2 (it) Armadio metallico con superficie trasparente incorporata.
JPS51146263A (en) Angle measuring device

Legal Events

Date Code Title Description
FG2A Definitive protection

Ref document number: 388485

Country of ref document: ES