ES2067142T3 - Procedimiento y dispositivo para determinar la calidad optica de una placa transparente. - Google Patents
Procedimiento y dispositivo para determinar la calidad optica de una placa transparente.Info
- Publication number
- ES2067142T3 ES2067142T3 ES91250284T ES91250284T ES2067142T3 ES 2067142 T3 ES2067142 T3 ES 2067142T3 ES 91250284 T ES91250284 T ES 91250284T ES 91250284 T ES91250284 T ES 91250284T ES 2067142 T3 ES2067142 T3 ES 2067142T3
- Authority
- ES
- Spain
- Prior art keywords
- light
- rays
- plate
- detector
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
- G01N2021/8967—Discriminating defects on opposite sides or at different depths of sheet or rod
Landscapes
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Manufacturing Optical Record Carriers (AREA)
Abstract
PROCEDIMIENTO PARA LA DETERMINACION DE LA CALIDAD OPTICA DE UNA PLACA TRANSPARENTE, EN PARTICULAR DE UN DISCO DE FLOAT-GLASS, EN EL QUE DOS RAYOS DE LUZ PARALELOS QUE MUESTRAN UNA DISTANCIA OPUESTA BAJO UN ANGULO DE PUNTA REFERIDO A PLACAS NORMALES SON DIRIGIDOS A LA PLACA; LOS RAYOS DE LUZ QUE SON REFLEJADOS POR LA PLACA SON CAPTADOS POR SEPARADO MEDIANTE UN EQUIPO DETECTOR QUE MUESTRA UN DETECTOR SENSIBLE A LA LUZ, Y SE APROVECHA LA DIRECCION DE LOS RAYOS DE LUZ REFLEJADOS, CON LO CUAL LOS CUATRO RAYOS DE LUZ A1, A2, B1, B2 QUE SON REFLEJADOS POR AMBAS SUPERFICIES DE LA PLACA SON ATRAPADOS POR UN DETECTOR; LA DISTANCIA OPUESTA Y EL ANGULO DE INCIDENCIA DE LOS RAYOS DE LUZ INCIDENTES A, B DEPENDIENTES DEL GROSOR DE LA PLACA SON AJUSTADOS DE TAL MANERA QUE LOS RAYOS DE LUZ REFLEJADOS A1, A2 , B1, B2 SON REGISTRADOS POR EL EQUIPO DETECTOR COMO SEPARADOS EN EL ESPACIO, Y DE LOS LUGARES DE INCIDENCIA DE LOS CUATRO RAYOS DE LUZ REFLEJADOS A1, A2, B1, B2 SE CALCULAN EN EL DETECTOR, LOS PARAMETROS PARA LA DETERMINACION CUANTITATIVA DE LA CALIDAD OPTICA DE LA PLACA.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE4035168A DE4035168A1 (de) | 1990-11-06 | 1990-11-06 | Verfahren und vorrichtung zur bestimmung der optischen qualitaet einer transparenten platte |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2067142T3 true ES2067142T3 (es) | 1995-03-16 |
Family
ID=6417687
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES91250284T Expired - Lifetime ES2067142T3 (es) | 1990-11-06 | 1991-10-15 | Procedimiento y dispositivo para determinar la calidad optica de una placa transparente. |
Country Status (16)
| Country | Link |
|---|---|
| US (1) | US5210592A (es) |
| EP (1) | EP0485043B1 (es) |
| JP (1) | JPH0776752B2 (es) |
| AR (1) | AR246351A1 (es) |
| AT (1) | ATE115288T1 (es) |
| AU (1) | AU640058B2 (es) |
| BR (1) | BR9104819A (es) |
| DE (2) | DE4035168A1 (es) |
| DK (1) | DK0485043T3 (es) |
| ES (1) | ES2067142T3 (es) |
| FI (1) | FI101750B1 (es) |
| GR (1) | GR3015315T3 (es) |
| MX (1) | MX9101932A (es) |
| PL (1) | PL167918B1 (es) |
| RU (1) | RU2072510C1 (es) |
| ZA (1) | ZA918798B (es) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999012022A1 (es) * | 1997-09-03 | 1999-03-11 | Vitro Flotado, S.A. De C.V. | Aparato y metodo para determinar la distorsion optica de un substrato transparente |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9205655D0 (en) * | 1992-03-14 | 1992-04-29 | Roke Manor Research | Improvements in or relating to surface curvature measurement |
| CN1087424A (zh) * | 1992-09-29 | 1994-06-01 | 昆士兰大学 | 检测的玻璃中缺陷 |
| DE4318358C2 (de) * | 1993-05-28 | 1996-09-05 | Visolux Elektronik Gmbh | Verfahren und Vorrichtung zum Messen von Streulicht erzeugenden Oberflächenfehlern von optischen Medien, wie Glas oder Kunststoff, insbesondere von Fahrzeugscheiben |
| ES2076083B1 (es) * | 1993-06-04 | 1996-06-01 | Fuesca Sl | Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado. |
| US5726749A (en) * | 1996-09-20 | 1998-03-10 | Libbey-Owens-Ford Co. | Method and apparatus for inspection and evaluation of angular deviation and distortion defects for transparent sheets |
| US5724140A (en) * | 1996-10-28 | 1998-03-03 | Ford Motor Company | Method and apparatus for determining the quality of flat glass sheet |
| US6285451B1 (en) * | 1999-04-30 | 2001-09-04 | John M. Herron | Noncontacting optical method for determining thickness and related apparatus |
| US6359686B1 (en) * | 1999-06-29 | 2002-03-19 | Corning Incorporated | Inspection system for sheet material |
| DE10027473B4 (de) * | 2000-06-02 | 2007-04-19 | Basler Ag | Verfahren zum Ermitteln der Neigungen von wenigstens zwei übereinander angeordneten Flächen |
| US6985231B2 (en) * | 2001-09-20 | 2006-01-10 | Strainoptics, Inc. | Method and apparatus for measuring the optical quality of a reflective surface |
| US6857937B2 (en) * | 2002-05-30 | 2005-02-22 | Komag, Inc. | Lapping a head while powered up to eliminate expansion of the head due to heating |
| US7435941B2 (en) * | 2003-03-14 | 2008-10-14 | Inphase Technologies, Inc. | Methods for measuring optical characteristics by differential diffractive scanning |
| DE102004005019A1 (de) * | 2004-01-30 | 2005-08-18 | Isra Glass Vision Gmbh | Verfahren zur Bestimmung der Tiefe eines Fehlers in einem Glasband |
| JP2005233773A (ja) * | 2004-02-19 | 2005-09-02 | Denso Corp | 距離検出装置 |
| DE102004010311A1 (de) * | 2004-03-03 | 2005-09-22 | Isra Glass Vision Gmbh | Vorrichtung und Verfahren zur Messung der Dicke einer transparenten Probe |
| US8023110B1 (en) * | 2007-02-07 | 2011-09-20 | Kla-Tencor Corporation | Priori crack detection in solar photovoltaic wafers by detecting bending at edges of wafers |
| JP5817721B2 (ja) | 2010-06-07 | 2015-11-18 | 旭硝子株式会社 | 形状測定装置、形状測定方法、およびガラス板の製造方法 |
| CN102939513B (zh) | 2010-06-15 | 2016-09-07 | 旭硝子株式会社 | 形状测定装置、形状测定方法及玻璃板的制造方法 |
| CN102455290B (zh) * | 2010-10-18 | 2013-03-27 | 北京众智同辉科技有限公司 | 电致液晶雾化玻璃光学不均匀性的测试方法 |
| RU2475726C1 (ru) * | 2011-06-16 | 2013-02-20 | Некоммерческая организация Научно-техническое учреждение "Инженерно-технический центр" открытого акционерного общества "Ижевский мотозавод "Аксион-холдинг" (НТУ "ИТЦ") | Устройство контроля качества стекла |
| KR101700109B1 (ko) * | 2015-02-03 | 2017-02-13 | 연세대학교 산학협력단 | 결함 분포 3차원 광 계측 장치 및 방법 |
| KR102492294B1 (ko) * | 2016-11-02 | 2023-01-27 | 코닝 인코포레이티드 | 투명 기판 상의 결함 검사 방법 및 장치, 및 입사광 조사 방법 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3799679A (en) * | 1972-06-27 | 1974-03-26 | Ppg Industries Inc | Glass distortion scanning system |
| US3788750A (en) * | 1972-12-06 | 1974-01-29 | Libbey Owens Ford Co | Inspecting glass |
| DE2847935A1 (de) * | 1978-11-04 | 1980-05-14 | Herbert Dipl Ing Dr Schreiner | Vorrichtung zum automatischen auffinden von fehlern und/oder verschmutzungen an prueflingen aus transparenten plattenfoermigen werkstoffen, insbesondere flachglas |
| US4255055A (en) * | 1979-05-11 | 1981-03-10 | Libbey-Owens-Ford Company | Surface inspection system for detecting flatness of planar sheet materials |
| DE3800053A1 (de) * | 1988-01-04 | 1989-07-13 | Sick Optik Elektronik Erwin | Optische fehlerinspektionsvorrichtung |
| DE3816392A1 (de) * | 1988-05-13 | 1989-11-23 | Ver Glaswerke Gmbh | Verfahren zur bestimmung der optischen qualitaet von flachglas oder flachglasprodukten |
-
1990
- 1990-11-06 DE DE4035168A patent/DE4035168A1/de not_active Withdrawn
-
1991
- 1991-10-15 AT AT91250284T patent/ATE115288T1/de not_active IP Right Cessation
- 1991-10-15 ES ES91250284T patent/ES2067142T3/es not_active Expired - Lifetime
- 1991-10-15 DK DK91250284.6T patent/DK0485043T3/da active
- 1991-10-15 DE DE59103804T patent/DE59103804D1/de not_active Expired - Fee Related
- 1991-10-15 EP EP91250284A patent/EP0485043B1/de not_active Expired - Lifetime
- 1991-10-31 PL PL91292250A patent/PL167918B1/pl unknown
- 1991-11-01 AU AU86980/91A patent/AU640058B2/en not_active Ceased
- 1991-11-04 RU SU915001985A patent/RU2072510C1/ru active
- 1991-11-05 BR BR919104819A patent/BR9104819A/pt not_active IP Right Cessation
- 1991-11-05 US US07/788,082 patent/US5210592A/en not_active Expired - Fee Related
- 1991-11-05 MX MX9101932A patent/MX9101932A/es unknown
- 1991-11-05 FI FI915218A patent/FI101750B1/fi active
- 1991-11-06 ZA ZA918798A patent/ZA918798B/xx unknown
- 1991-11-06 JP JP3318399A patent/JPH0776752B2/ja not_active Expired - Lifetime
- 1991-11-06 AR AR91321099A patent/AR246351A1/es active
-
1995
- 1995-03-03 GR GR950400493T patent/GR3015315T3/el unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999012022A1 (es) * | 1997-09-03 | 1999-03-11 | Vitro Flotado, S.A. De C.V. | Aparato y metodo para determinar la distorsion optica de un substrato transparente |
Also Published As
| Publication number | Publication date |
|---|---|
| DE4035168A1 (de) | 1992-05-07 |
| AU640058B2 (en) | 1993-08-12 |
| PL292250A1 (en) | 1992-08-24 |
| FI915218A7 (fi) | 1992-05-07 |
| RU2072510C1 (ru) | 1997-01-27 |
| EP0485043B1 (de) | 1994-12-07 |
| GR3015315T3 (en) | 1995-06-30 |
| ATE115288T1 (de) | 1994-12-15 |
| DE59103804D1 (de) | 1995-01-19 |
| JPH0776752B2 (ja) | 1995-08-16 |
| BR9104819A (pt) | 1992-06-23 |
| MX9101932A (es) | 1992-07-08 |
| US5210592A (en) | 1993-05-11 |
| FI101750B (fi) | 1998-08-14 |
| AR246351A1 (es) | 1994-07-29 |
| EP0485043A2 (de) | 1992-05-13 |
| JPH05209840A (ja) | 1993-08-20 |
| EP0485043A3 (en) | 1992-12-09 |
| DK0485043T3 (da) | 1995-05-01 |
| FI915218A0 (fi) | 1991-11-05 |
| ZA918798B (en) | 1992-08-26 |
| AU8698091A (en) | 1992-05-14 |
| PL167918B1 (pl) | 1995-12-30 |
| FI101750B1 (fi) | 1998-08-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG2A | Definitive protection |
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