ES8500444A1 - Dispositivo para el control no destructivo del estado de tensiones de una lamina de vidrio atemperada termicamente - Google Patents
Dispositivo para el control no destructivo del estado de tensiones de una lamina de vidrio atemperada termicamenteInfo
- Publication number
- ES8500444A1 ES8500444A1 ES525755A ES525755A ES8500444A1 ES 8500444 A1 ES8500444 A1 ES 8500444A1 ES 525755 A ES525755 A ES 525755A ES 525755 A ES525755 A ES 525755A ES 8500444 A1 ES8500444 A1 ES 8500444A1
- Authority
- ES
- Spain
- Prior art keywords
- plate glass
- internal stress
- stress state
- destructive testing
- tempered plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000005357 flat glass Substances 0.000 title 1
- 238000009659 non-destructive testing Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 abstract 3
- 239000012141 concentrate Substances 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 239000005341 toughened glass Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
- G01L1/241—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet by photoelastic stress analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
DISPOSITIVO PARA LA MEDICION DE LAS TENSIONES MECANICAS QUE LLEGAN A ESTABLECERSE EN EL INTERIOR DE UN MEDIO TRANSPARENTE, Y EN PARTICULAR EN EL INTERIOR DEL VIDRIO TERMICAMENTE ATEMPERADO O TEMPLADO.CONSTA DE UNA FUENTE DE RADIACION INFRARROJA MONOCROMATICA (S) QUE EMITE UNA RADIACION A LO LARGO DE UN EJE OPTICO; DE UNA LENTE (L1) QUE CONCENTRA LA RADIACION INCIDENTE Y LA HACE INCIDIR EN UN PUNTO (F) DE LA LAMINA DE VIDRIO (V); DE UN POLARIZADOR INFRARROJO (P1); Y DE UNA SEGUNDA LENTE (L2) QUE HACE CONVERGER LOS RAYOS POLARIZADOS EN UN DETECTOR (R) DE RAYOS INFRARROJOS.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT49143/82A IT1149352B (it) | 1982-09-21 | 1982-09-21 | Dispositivo per il controllo non distruttivo dello stato tensionale di lastre di vetro temperate termicamente |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| ES525755A0 ES525755A0 (es) | 1984-10-01 |
| ES8500444A1 true ES8500444A1 (es) | 1984-10-01 |
Family
ID=11269768
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES525755A Expired ES8500444A1 (es) | 1982-09-21 | 1983-09-20 | Dispositivo para el control no destructivo del estado de tensiones de una lamina de vidrio atemperada termicamente |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4584476A (es) |
| EP (1) | EP0104151B1 (es) |
| DE (1) | DE3368125D1 (es) |
| ES (1) | ES8500444A1 (es) |
| IT (1) | IT1149352B (es) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3543632A1 (de) * | 1985-12-11 | 1987-06-19 | Hoechst Ag | Verfahren und vorrichtung zur bestimmung von dicken- und/oder orientierungsaenderungen innerhalb einer optisch aktiven materialbahn |
| CN1087424A (zh) * | 1992-09-29 | 1994-06-01 | 昆士兰大学 | 检测的玻璃中缺陷 |
| DE19720330C1 (de) * | 1997-05-15 | 1998-11-12 | Sekurit Saint Gobain Deutsch | Verfahren und Vorrichtung zur Messung von Spannungen in Glasscheiben mit Hilfe des Streulichtverfahrens |
| US5929993A (en) * | 1998-03-03 | 1999-07-27 | J.A. Woollam Co. Inc. | Total film retardance monitoring system, and method of use |
| US7705995B1 (en) | 2004-12-20 | 2010-04-27 | J.A. Woollam Co., Inc. | Method of determining substrate etch depth |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1681991A (en) * | 1926-11-20 | 1928-08-28 | Corning Glass Works | Method of detecting and measuring strains |
| GB830313A (en) * | 1958-02-18 | 1960-03-16 | Zeiss Jena Veb Carl | Improvements in instruments for visualizing mechanical strain in opaque workpieces capable of transmitting infra-red light |
| FR1308015A (fr) * | 1961-09-20 | 1962-11-03 | Saint Gobain | Procédé et dispositifs pour l'examen des contraintes dans des pièces en matière transparente, en verre par exemple |
| US3589812A (en) * | 1968-08-29 | 1971-06-29 | France Armed Forces | Processes and devices for measuring stresses within a transparent body for electromagnetic waves |
| US3818339A (en) * | 1972-08-14 | 1974-06-18 | Burroughs Corp | Amplitude comparison circuit |
| JPS55104743A (en) * | 1979-02-06 | 1980-08-11 | Fujitsu Ltd | Method for inspecting substrate |
-
1982
- 1982-09-21 IT IT49143/82A patent/IT1149352B/it active
-
1983
- 1983-09-19 EP EP83830178A patent/EP0104151B1/en not_active Expired
- 1983-09-19 US US06/534,627 patent/US4584476A/en not_active Expired - Fee Related
- 1983-09-19 DE DE8383830178T patent/DE3368125D1/de not_active Expired
- 1983-09-20 ES ES525755A patent/ES8500444A1/es not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| EP0104151B1 (en) | 1986-12-03 |
| DE3368125D1 (en) | 1987-01-15 |
| EP0104151A2 (en) | 1984-03-28 |
| IT8249143A0 (it) | 1982-09-21 |
| US4584476A (en) | 1986-04-22 |
| EP0104151A3 (en) | 1984-10-03 |
| IT1149352B (it) | 1986-12-03 |
| ES525755A0 (es) | 1984-10-01 |
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