ES2075193T3 - Dispositivo para la evaluacion automatica del voltaje de ruptura de condensadores. - Google Patents
Dispositivo para la evaluacion automatica del voltaje de ruptura de condensadores.Info
- Publication number
- ES2075193T3 ES2075193T3 ES90901446T ES90901446T ES2075193T3 ES 2075193 T3 ES2075193 T3 ES 2075193T3 ES 90901446 T ES90901446 T ES 90901446T ES 90901446 T ES90901446 T ES 90901446T ES 2075193 T3 ES2075193 T3 ES 2075193T3
- Authority
- ES
- Spain
- Prior art keywords
- capacitor
- breakdown voltage
- capacitors
- automatic evaluation
- predetermined
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 title abstract 7
- 230000015556 catabolic process Effects 0.000 title abstract 2
- 238000011156 evaluation Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
- G01R31/016—Testing of capacitors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Relay Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
DISPOSITIVO PARA VERIFICAR AUTOMATICAMENTE LA TENSION DISRUPTIVA DE UN CAPACITOR UN APARATO (FIG.1, ELEMENTO 10) PARA MEDIR AUTOMATICAMENTE LAS CARACTERISTICAS DE TENSION DISRUPTIVA DIELECTRICA DE CADA UNO DE UNA PLURALIDAD DE CAPACITORES. EL APARATO INCLUYE UN NUMERO PREDETERMINADO DE ADAPTADORES DE PRUEBA (28-1 A 28-N), ESTANDO CADA ADAPTADOR DE PRUEBA ADAPTADO PARA RECIBIR UNO O MAS DE LOS CAPACITORES A PROBAR. HAY CONECTADA UNA RED RETRANSMISION (FIG. 2A, ELEMENTO 70), QUE TIENE UNA PLURALIDAD DE RETRANSMISORES (72, 74, 76 Y 78) DENTRO DE ELLA, DE TAL MODO QUE AL MENOS UNO DE LOS RETRANSMISORES DE LA RED DE RETRANSMISION QUEDA COLOCADO ENTRE CADA ADAPTADOR DE PRUEBA Y UNA FUENTE DE ALTA TENSION DE VARIACION EN EL TIEMPO (12) DE POTENCIAL ELECTRICO. TAMBIEN HAY EN EL APARATO DE PRUEBA UNA CIRCUITERIA (20 Y 94) PARA ENERGETIZAR ZONAS PREDETERMINADAS DE LOS RETRANSMISORES SEGUN UNA SECUENCIA PREDETERMINADA PARA ASI CONECTAR EL CAPACITOR ASOCIADO A CADA RETRANSMISOR A LA FUENTE DE ALTA TENSION. HAY UNA CIRCUITERIA DE CONTROL (20 Y 140) PARA CONTROLAR LA SALIDA DE LA FUENTE DE TENSION PARA APLICAR UNA SEÑAL DE ALTA TENSION PREDETERMINADA QUE TIENE UNA FORMA DE ONDA PREDETERMINADA ASOCIADA CON ELLA A CADA CAPACITOR CONECTADO A LA FUENTE MEDIANTE LA ENERGETIZACION DE UN RETRANSMISOR. EL APARATO INCLUYE ADEMAS UNA CIRCUITERIA DE MEDICION (12M) PARA MEDIR LA CORRIENTE QUE FLUYE A TRAVES DEL CAPACITOR CONECTADO A LA FUENTE DE ALTA TENSION MEDIANTE LA ENERGETIZACION DE UN RETRANSMISOR Y UN DISPOSITIVO REGISTRADOR (20R) ASOCIADO A LA CIRCUITERIA DE MEDICION PARA REGISTRAR EL VALOR DE LA ALTA TENSION CUANDO LA CORRIENTE QUE FLUYE A TRAVES DEL CAPACITOR SOBREPASA UN UMBRAL DE CORRIENTE DISRUPTIVA PREDETERMINADO. EL VALOR DEL REGISTRO DE LA ALTA TENSION DEFINE LA TENSION DISRUPTIVA DEL CAPACITOR.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/285,535 US4906939A (en) | 1988-12-16 | 1988-12-16 | Device for automatically ascertaining capacitor breakdown voltage |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2075193T3 true ES2075193T3 (es) | 1995-10-01 |
Family
ID=23094663
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES90901446T Expired - Lifetime ES2075193T3 (es) | 1988-12-16 | 1989-12-21 | Dispositivo para la evaluacion automatica del voltaje de ruptura de condensadores. |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US4906939A (es) |
| EP (1) | EP0506655B1 (es) |
| JP (1) | JPH04501915A (es) |
| KR (1) | KR940002721B1 (es) |
| AT (1) | ATE124146T1 (es) |
| DE (1) | DE68923182T2 (es) |
| ES (1) | ES2075193T3 (es) |
| WO (1) | WO1991010147A1 (es) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5202640A (en) * | 1991-06-03 | 1993-04-13 | International Business Machines Corporation | Capacitance and leakage test method and apparatus |
| JP2921270B2 (ja) * | 1992-07-16 | 1999-07-19 | 三菱電機株式会社 | 経時絶縁膜破壊評価方法および経時絶縁膜破壊評価装置 |
| TW460701B (en) * | 2000-01-20 | 2001-10-21 | Winbond Electronics Corp | Improved test circuit of TDDB |
| JP4368704B2 (ja) * | 2004-03-12 | 2009-11-18 | 三井金属鉱業株式会社 | 電子部品実装用プリント配線板の電気検査方法および電気検査装置ならびにコンピュータ読み取り可能な記録媒体 |
| CN1877350B (zh) * | 2006-04-26 | 2011-05-04 | 深圳创维-Rgb电子有限公司 | 电子产品异常通断电的测试方法及装置 |
| US8441265B2 (en) * | 2006-12-18 | 2013-05-14 | Kemet Electronics Corporation | Apparatus and method for screening electrolytic capacitors |
| US20090105983A1 (en) * | 2007-10-23 | 2009-04-23 | Texas Instruments Incorporated | Test definer, a method of automatically determining and representing functional tests for a pcb having analog components and a test system |
| CN101668227A (zh) * | 2008-09-02 | 2010-03-10 | 雷登军 | 铁路信号继电器插座 |
| US8683420B2 (en) | 2010-11-17 | 2014-03-25 | Intermolecular, Inc. | Method and system of improved reliability testing |
| CN102135580B (zh) * | 2011-01-24 | 2013-05-01 | 宁波海利达电器有限公司 | 一种电容器的检测装置 |
| CN102788907A (zh) * | 2012-08-03 | 2012-11-21 | 昆山微容电子企业有限公司 | Cap/df测试装置 |
| US10260983B2 (en) | 2014-01-20 | 2019-04-16 | Lear Corporation | Apparatus and method for diagnostics of a capacitive sensor with plausibility check |
| US10006956B2 (en) * | 2015-03-26 | 2018-06-26 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Systems and methods for determining an operational condition of a capacitor package |
| RU2679471C1 (ru) * | 2017-12-12 | 2019-02-11 | Публичное акционерное общество "Ракетно-космическая корпорация "Энергия" имени С.П. Королева" | Способ контроля исправности блока конденсаторов (варианты) |
| KR101980844B1 (ko) * | 2018-02-26 | 2019-05-21 | 주식회사 엘지화학 | 전기화학소자용 분리막의 절연 특성 평가 방법 |
| EP3706281B1 (en) * | 2018-11-14 | 2023-02-15 | Guangdong Oppo Mobile Telecommunications Corp., Ltd. | Method and system for verifying failure of electronic equipment |
| CN110703073B (zh) * | 2019-08-29 | 2021-08-27 | 国营芜湖机械厂 | 一种继电器测试工装 |
| JP6749625B1 (ja) * | 2020-03-17 | 2020-09-02 | 株式会社 電子制御国際 | 耐電圧試験装置 |
| CN112505495B (zh) * | 2020-11-03 | 2024-01-26 | 温州威斯康工业有限公司 | 电容芯子耐电压强度测试仪 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2925553A (en) * | 1955-07-22 | 1960-02-16 | Western Electric Co | Electrical test sets |
| US3042860A (en) * | 1959-01-26 | 1962-07-03 | Western Electric Co | Capacitance measuring and dielectric strength test set |
| US3281675A (en) * | 1963-08-22 | 1966-10-25 | Western Electric Co | Circuit for testing a capacitor for momentary breakdown when a d. c. voltage is applied thereto including means responsive to charging of the capacitor |
| US3465403A (en) * | 1965-12-28 | 1969-09-09 | Western Electric Co | Method of establishing a testing procedure for self-healing capacitors |
| FR1526273A (fr) * | 1967-04-13 | 1968-05-24 | Schlumberger Instrumentation | Dispositif pour la mesure des condensateurs électriques |
| US3518537A (en) * | 1967-11-28 | 1970-06-30 | Richard Mcfee | Apparatus and method for determining the capacitance and conductance of capacitors |
| US3508146A (en) * | 1968-08-14 | 1970-04-21 | Thomas Jefferson Jackson | Measurement of voltage-leakage in capacitors |
| US3652929A (en) * | 1970-02-09 | 1972-03-28 | Western Electric Co | Method for healing short circuits in capacitors |
| US3840809A (en) * | 1972-12-04 | 1974-10-08 | Ibm | Non-destructive measurement of dielectric properties |
| US3943439A (en) * | 1974-12-30 | 1976-03-09 | Zehntel, Inc. | Capacitor test apparatus and method |
| US4218649A (en) * | 1978-04-24 | 1980-08-19 | Bell Telephone Laboratories, Incorporated | High voltage leakage and breakdown test circuit |
| JPS5654367A (en) * | 1979-10-09 | 1981-05-14 | Kenji Machida | Impedance/voltage converting circuit |
| US4337561A (en) * | 1981-08-03 | 1982-07-06 | William James | Plate separator construction method |
| JPS5875074A (ja) * | 1981-10-30 | 1983-05-06 | Yokogawa Hewlett Packard Ltd | 容量あるいは他のパラメ−タの測定装置 |
| US4509012A (en) * | 1982-12-30 | 1985-04-02 | Lin Shi Tron | Method for determining the characteristic behavior of a metal-insulator-semiconductor device in a deep depletion mode |
-
1988
- 1988-12-16 US US07/285,535 patent/US4906939A/en not_active Expired - Fee Related
-
1989
- 1989-12-21 JP JP2502248A patent/JPH04501915A/ja active Pending
- 1989-12-21 ES ES90901446T patent/ES2075193T3/es not_active Expired - Lifetime
- 1989-12-21 DE DE68923182T patent/DE68923182T2/de not_active Expired - Fee Related
- 1989-12-21 EP EP90901446A patent/EP0506655B1/en not_active Expired - Lifetime
- 1989-12-21 KR KR1019900701779A patent/KR940002721B1/ko not_active Expired - Fee Related
- 1989-12-21 WO PCT/US1989/005740 patent/WO1991010147A1/en not_active Ceased
- 1989-12-21 AT AT90901446T patent/ATE124146T1/de not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| DE68923182T2 (de) | 1996-02-29 |
| DE68923182D1 (de) | 1995-07-27 |
| JPH04501915A (ja) | 1992-04-02 |
| ATE124146T1 (de) | 1995-07-15 |
| EP0506655A1 (en) | 1992-10-07 |
| EP0506655A4 (en) | 1992-05-06 |
| WO1991010147A1 (en) | 1991-07-11 |
| KR940002721B1 (ko) | 1994-03-31 |
| US4906939A (en) | 1990-03-06 |
| EP0506655B1 (en) | 1995-06-21 |
| KR920701828A (ko) | 1992-08-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG2A | Definitive protection |
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