ES2080734T3 - Micromanipulador. - Google Patents
Micromanipulador.Info
- Publication number
- ES2080734T3 ES2080734T3 ES89111893T ES89111893T ES2080734T3 ES 2080734 T3 ES2080734 T3 ES 2080734T3 ES 89111893 T ES89111893 T ES 89111893T ES 89111893 T ES89111893 T ES 89111893T ES 2080734 T3 ES2080734 T3 ES 2080734T3
- Authority
- ES
- Spain
- Prior art keywords
- support
- objects
- micromanipulator
- move
- microscopic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J7/00—Micromanipulators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N2/00—Electric machines in general using piezoelectric effect, electrostriction or magnetostriction
- H02N2/02—Electric machines in general using piezoelectric effect, electrostriction or magnetostriction producing linear motion, e.g. actuators; Linear positioners ; Linear motors
- H02N2/021—Electric machines in general using piezoelectric effect, electrostriction or magnetostriction producing linear motion, e.g. actuators; Linear positioners ; Linear motors using intermittent driving, e.g. step motors, piezoleg motors
- H02N2/025—Inertial sliding motors
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N2/00—Electric machines in general using piezoelectric effect, electrostriction or magnetostriction
- H02N2/02—Electric machines in general using piezoelectric effect, electrostriction or magnetostriction producing linear motion, e.g. actuators; Linear positioners ; Linear motors
- H02N2/04—Constructional details
- H02N2/043—Mechanical transmission means, e.g. for stroke amplification
- H02N2/046—Mechanical transmission means, e.g. for stroke amplification for conversion into rotary motion
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N2/00—Electric machines in general using piezoelectric effect, electrostriction or magnetostriction
- H02N2/02—Electric machines in general using piezoelectric effect, electrostriction or magnetostriction producing linear motion, e.g. actuators; Linear positioners ; Linear motors
- H02N2/06—Drive circuits; Control arrangements or methods
- H02N2/065—Large signal circuits, e.g. final stages
- H02N2/067—Large signal circuits, e.g. final stages generating drive pulses
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Mechanical Engineering (AREA)
- Robotics (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manipulator (AREA)
- Microscoopes, Condenser (AREA)
- Micromachines (AREA)
Abstract
PARA MOVER UNOS OBJETOS MICROSCOPICOS Y PODERLOS ANALIZAR EN UNA POSICION DETERMINADA O MECANIZARLOS, SE INDICA UN MICROMANIPULADOR QUE SE UTILIZA EN MICROSCOPIOS (RTM) CON TUNEL Y RETICULO. EL MICROMANIPULADOR PRESENTA VARIOS ELEMENTOS (2, 2'', 2'''') MOVIBLES QUE SOPORTAN Y MUEVEN EL OBJETO (1). PARA REALIZAR EL MOVIMIENTO MICROSCOPICO DE OBJETOS SE AJUSTAN PIEZOELECTRICAMENTE LOS ELEMENTOS MOVIBLES. LOS APOYOS (3, 3'', 3'''') SE PUEDEN DESPLAZAR A TRAVES DE LA DEFORMACION DE MATERIAS PIEZOELECTRICAS. PARA PODER REALIZAR EL MOVIMIENTO DE OBJETOS MICROSCOPICOS CON EL MICROMANIPULADOR SE GUIAN LOS OBJETOS MICROSCOPICOS POR UNO DE LOS ELEMENTOS (2) MOVIBLES. ES APROPIADO IGUALMENTE EL AUTOMATIZAR EL SOPORTE (3) DEL ELEMENTO (2) MOVIBLE. EL SOPORTE (3) SE PUEDE ASENTAR EN UN PUENTE PIEZOELECTRICO. PARA PODER MOVER OBJETOS MACROSCOPICOS EL SOPORTE (3) SE PUEDE CONFORMAR COMO UNA PIEZA (14) DE LA PLACA BASE (5A) SOBRE LA CUAL SE FIJA EL ELEMENTO (2A, 2''A, 2''''A) MOVIBLE.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3822504A DE3822504A1 (de) | 1988-07-03 | 1988-07-03 | Mikromanipulator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2080734T3 true ES2080734T3 (es) | 1996-02-16 |
Family
ID=6357870
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES89111893T Expired - Lifetime ES2080734T3 (es) | 1988-07-03 | 1989-06-30 | Micromanipulador. |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5325010A (es) |
| EP (1) | EP0349911B1 (es) |
| JP (1) | JP2802317B2 (es) |
| AT (1) | ATE128270T1 (es) |
| DE (4) | DE3844659A1 (es) |
| ES (1) | ES2080734T3 (es) |
| GR (1) | GR3018451T3 (es) |
Families Citing this family (49)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3918249C1 (es) * | 1989-06-05 | 1990-09-13 | Forschungszentrum Juelich Gmbh, 5170 Juelich, De | |
| US5155361A (en) | 1991-07-26 | 1992-10-13 | The Arizona Board Of Regents, A Body Corporate Acting For And On Behalf Of Arizona State University | Potentiostatic preparation of molecular adsorbates for scanning probe microscopy |
| JP2905643B2 (ja) * | 1992-05-29 | 1999-06-14 | 住友重機械工業株式会社 | 圧電リニアアクチュエータ |
| US5568004A (en) * | 1992-09-07 | 1996-10-22 | Kleindiek; Stephan | Electromechanical positioning device |
| US5616980A (en) * | 1993-07-09 | 1997-04-01 | Nanomotion Ltd. | Ceramic motor |
| IL106296A0 (en) * | 1993-07-09 | 1993-12-28 | Nanomotion Ltd | Ceramic motor |
| US5682076A (en) * | 1993-08-03 | 1997-10-28 | Nanomotion Ltd. | Ceramic disc-drive actuator |
| US5440920A (en) | 1994-02-03 | 1995-08-15 | Molecular Imaging Systems | Scanning force microscope with beam tracking lens |
| US5515719A (en) | 1994-05-19 | 1996-05-14 | Molecular Imaging Corporation | Controlled force microscope for operation in liquids |
| US5753814A (en) | 1994-05-19 | 1998-05-19 | Molecular Imaging Corporation | Magnetically-oscillated probe microscope for operation in liquids |
| US5513518A (en) | 1994-05-19 | 1996-05-07 | Molecular Imaging Corporation | Magnetic modulation of force sensor for AC detection in an atomic force microscope |
| US5866805A (en) | 1994-05-19 | 1999-02-02 | Molecular Imaging Corporation Arizona Board Of Regents | Cantilevers for a magnetically driven atomic force microscope |
| US5629577A (en) * | 1994-07-15 | 1997-05-13 | Micro Medical Devices | Miniature linear motion actuator |
| JPH0837784A (ja) * | 1994-07-25 | 1996-02-06 | Nikon Corp | 移動装置及び移動装置の制御方法 |
| US5621210A (en) * | 1995-02-10 | 1997-04-15 | Molecular Imaging Corporation | Microscope for force and tunneling microscopy in liquids |
| US5750989A (en) * | 1995-02-10 | 1998-05-12 | Molecular Imaging Corporation | Scanning probe microscope for use in fluids |
| US5675154A (en) * | 1995-02-10 | 1997-10-07 | Molecular Imaging Corporation | Scanning probe microscope |
| US5569918A (en) * | 1995-03-17 | 1996-10-29 | Rhk Technology, Inc. | Probe holder and probe mounting method for a scanning probe microscope |
| US5668432A (en) * | 1995-03-24 | 1997-09-16 | Nippondenso Co., Ltd. | Articulation device |
| US5654546A (en) * | 1995-11-07 | 1997-08-05 | Molecular Imaging Corporation | Variable temperature scanning probe microscope based on a peltier device |
| US5821545A (en) * | 1995-11-07 | 1998-10-13 | Molecular Imaging Corporation | Heated stage for a scanning probe microscope |
| US5627371A (en) * | 1996-02-09 | 1997-05-06 | Lucent Technologies Inc. | Tilting positioner for a micropositioning device |
| AU5707796A (en) * | 1996-03-26 | 1997-10-17 | Mats Bexell | An actuator motor and a method for fabrication of such an actuator |
| RU2149752C1 (ru) * | 1998-07-02 | 2000-05-27 | Государственное унитарное предприятие "Научно-производственное объединение конверсионного приборостроения" | Привод микроманипулятора |
| DE19833905C2 (de) * | 1998-07-22 | 2002-05-08 | Hahn Meitner Inst Berlin Gmbh | Piezoelektrische Verstelleinrichtung für die Positonierung eines Probentisches |
| DE19833904C2 (de) * | 1998-07-22 | 2002-07-18 | Hahn Meitner Inst Berlin Gmbh | Verstelleinrichtung für die Positionierung eines Probentisches |
| US6744268B2 (en) | 1998-08-27 | 2004-06-01 | The Micromanipulator Company, Inc. | High resolution analytical probe station |
| US6198299B1 (en) | 1998-08-27 | 2001-03-06 | The Micromanipulator Company, Inc. | High Resolution analytical probe station |
| DE19847995A1 (de) * | 1998-10-17 | 2000-04-20 | Zeiss Carl Jena Gmbh | Anordnung zum Positionieren eines Objektes |
| US6181097B1 (en) * | 1999-02-11 | 2001-01-30 | Institute Of Materials Research And Engineering | High precision three-dimensional alignment system for lithography, fabrication and inspection |
| DE19935570C2 (de) | 1999-07-30 | 2001-07-05 | Forschungszentrum Juelich Gmbh | Mikromanipulator |
| US6742380B2 (en) * | 2000-07-28 | 2004-06-01 | Seagate Technology Llc | Technique for measuring small distances between, and for measuring the flatness of, electrically conductive surfaces |
| US6661575B1 (en) | 2000-10-31 | 2003-12-09 | Sergey A. Yakovenko | Methods and apparata for micromanipulation of micro-and nanoparticles |
| DE10156870A1 (de) * | 2000-11-22 | 2002-07-11 | Univ Ilmenau Tech | Anordnung und Verfahren zur Erzeugung variabler Kennlinien von Antrieben |
| SE520097C2 (sv) * | 2000-12-05 | 2003-05-27 | Nanofactory Instruments Ab | Mikropositioneringsanordning |
| US6848328B2 (en) | 2001-03-09 | 2005-02-01 | Klocke Nanotechnik | Positioning unit and positioning apparatus with at least two positioning units |
| US20040090418A1 (en) * | 2002-11-12 | 2004-05-13 | Bio-Rad Laboratories, Inc., A Corporation Of The State Of Delaware | Joystick with axial disengagement switch |
| FR2850217A1 (fr) * | 2003-01-17 | 2004-07-23 | Cedrat Technologies | Actionneur piezoactif a deplacement amplifie amorti |
| US7055378B2 (en) | 2003-08-11 | 2006-06-06 | Veeco Instruments, Inc. | System for wide frequency dynamic nanomechanical analysis |
| US7180662B2 (en) * | 2004-04-12 | 2007-02-20 | Applied Scientific Instrumentation Inc. | Stage assembly and method for optical microscope including Z-axis stage and piezoelectric actuator for rectilinear translation of Z stage |
| DE102004049371B4 (de) * | 2004-10-09 | 2015-05-21 | Forschungszentrum Jülich GmbH | Nanomanipulator zum Analysieren oder Bearbeiten von Objekten |
| DE102005054551B3 (de) * | 2005-11-14 | 2006-12-28 | Carl Von Ossietzky Universität Oldenburg | Vorrichtung zum Verlagern von Endeffektoren an Mess- oder Handhabungseinrichtungen sowie Verfahren zur Bestimmung der Kontaktkraft oder der Position eines Endeffektors |
| US8059346B2 (en) | 2007-03-19 | 2011-11-15 | New Scale Technologies | Linear drive systems and methods thereof |
| FI20116111A7 (fi) * | 2011-11-10 | 2013-05-11 | Sensapex Oy | Mikromanipulaattorijärjestely |
| CN104584415B (zh) * | 2012-06-18 | 2019-01-25 | 株式会社尼康 | 振动致动器单元、光学装置以及台装置 |
| JP6501388B2 (ja) * | 2014-11-20 | 2019-04-17 | 株式会社ホロン | 移動・傾斜機構 |
| DE102016202582A1 (de) * | 2016-02-19 | 2017-08-24 | Carl Zeiss Microscopy Gmbh | Verstelleinrichtung einer Probenhalterung, Mikroskop mit Verstelleinrichtung und Verfahren |
| WO2018064462A1 (en) * | 2016-09-30 | 2018-04-05 | 3Sae Technologies, Inc | Multi-axis relative positioning stage |
| CN111208320B (zh) * | 2020-03-09 | 2021-06-08 | 中国科学院物理研究所 | 扫描隧道显微镜及其样品架 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5315060A (en) * | 1976-07-28 | 1978-02-10 | Hitachi Ltd | Inching device |
| US4195243A (en) * | 1978-11-06 | 1980-03-25 | Sperry Corporation | Piezoelectric wafer mover |
| CH643397A5 (de) * | 1979-09-20 | 1984-05-30 | Ibm | Raster-tunnelmikroskop. |
| GB2102691B (en) * | 1981-08-05 | 1985-01-09 | Cresta Tech | Rotary filter |
| JPH0614789B2 (ja) * | 1984-06-25 | 1994-02-23 | 株式会社東芝 | テーブル微動方法およびこの方法を用いた微動装置 |
| DE8531859U1 (de) * | 1985-11-11 | 1987-03-12 | Feinmetall Gmbh, 7033 Herrenberg | Mikro-Manipulator |
| DE3610540A1 (de) * | 1986-03-27 | 1987-10-01 | Kernforschungsanlage Juelich | Bewegungseinrichtung zur mikrobewegung von objekten |
| DE3676503D1 (de) * | 1986-07-08 | 1991-02-07 | Ibm | Grobstellanordnung. |
| EP0252745A3 (en) * | 1986-07-11 | 1990-01-24 | AGENCY OF INDUSTRIAL SCIENCE & TECHNOLOGY MINISTRY OF INTERNATIONAL TRADE & INDUSTRY | Relative displacement control apparatus |
| DE3632964A1 (de) * | 1986-09-27 | 1988-04-07 | Physik Instr Pi Gmbh & Co Prod | Piezoelektrisches stellglied |
-
1988
- 1988-07-03 DE DE3844659A patent/DE3844659A1/de active Granted
- 1988-07-03 DE DE3844821A patent/DE3844821C2/de not_active Expired - Lifetime
- 1988-07-03 DE DE3822504A patent/DE3822504A1/de active Granted
-
1989
- 1989-06-28 JP JP1164086A patent/JP2802317B2/ja not_active Expired - Lifetime
- 1989-06-30 AT AT89111893T patent/ATE128270T1/de not_active IP Right Cessation
- 1989-06-30 EP EP89111893A patent/EP0349911B1/de not_active Expired - Lifetime
- 1989-06-30 DE DE58909442T patent/DE58909442D1/de not_active Expired - Lifetime
- 1989-06-30 ES ES89111893T patent/ES2080734T3/es not_active Expired - Lifetime
-
1993
- 1993-08-18 US US08/108,400 patent/US5325010A/en not_active Expired - Lifetime
-
1995
- 1995-12-19 GR GR950403583T patent/GR3018451T3/el unknown
Also Published As
| Publication number | Publication date |
|---|---|
| DE3822504C2 (es) | 1992-10-01 |
| DE58909442D1 (de) | 1995-10-26 |
| DE3822504A1 (de) | 1990-01-04 |
| DE3844821C2 (en) | 1993-07-22 |
| US5325010A (en) | 1994-06-28 |
| EP0349911A2 (de) | 1990-01-10 |
| JP2802317B2 (ja) | 1998-09-24 |
| JPH0266841A (ja) | 1990-03-06 |
| ATE128270T1 (de) | 1995-10-15 |
| GR3018451T3 (en) | 1996-03-31 |
| DE3844659A1 (de) | 1990-11-29 |
| EP0349911A3 (de) | 1991-07-17 |
| EP0349911B1 (de) | 1995-09-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG2A | Definitive protection |
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