ES2083379T3 - Sistema de comprobacion de dispositivos electronicos. - Google Patents

Sistema de comprobacion de dispositivos electronicos.

Info

Publication number
ES2083379T3
ES2083379T3 ES89304810T ES89304810T ES2083379T3 ES 2083379 T3 ES2083379 T3 ES 2083379T3 ES 89304810 T ES89304810 T ES 89304810T ES 89304810 T ES89304810 T ES 89304810T ES 2083379 T3 ES2083379 T3 ES 2083379T3
Authority
ES
Spain
Prior art keywords
test head
test
electronic device
cable
cable support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES89304810T
Other languages
English (en)
Inventor
Alyn R Holt
Bryan R Moore
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
InTest Corp
Original Assignee
InTest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by InTest Corp filed Critical InTest Corp
Application granted granted Critical
Publication of ES2083379T3 publication Critical patent/ES2083379T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/0009—Energy-transferring means or control lines for movable machine parts; Control panels or boxes; Control parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measuring Fluid Pressure (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Debugging And Monitoring (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
  • Molding Of Porous Articles (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

SISTEMA DE EXAMEN PARA DISPOSITIVO ELECTRONICO DEL TIPO EN EL QUE UN CABEZAL EXAMINADOR SE MONTA CON MOVIMIENTO PIVOTANTE SOBRE TRES EJES ORTOGONALES. UN CABLE SE INTRODUCE EN EL CABEZAL DE EXAMEN A LO LARGO DE UN EJE PERPENDICULAR QUE SE EXTIENDE A TRAVES DE LOS MEDIOS POR LOS CUALES LA CABEZA DE EXAMEN SE MONTA PARA EL MOVIMIENTO PIVOTANTE SOBRE EL EJE HORIZONTAL. EL SISTEMA TAMBIEN TIENE UN SOPORTE PARA EL CABLE SUJETO A UN EXTREMO PARA QUE EL CABEZAL O LA HORQUILLA DEL MISMO, Y EN EL EXTREMO OPUESTO A UNA CABINA QUE CONTIENE PARTE DE LOS COMPONENTES ELECTRONICOS. EL CABLE, QUE SE EXTIENDE ENTRE LA CABINA Y EL CABEZAL, SE SOPORTA MEDIANTE UN SOPORTE ADECUADO. EL SOPORTE DEL CABLE SE DISPONE PARA AJUSTAR CAMBIOS EN LOS ESPACIOS DE SU EXTREMO Y LA ORIENTACION DE SU EJE PRODUCIDO POR CAMBIOS EN LA POSICION O EN LA ORIENTACION DEL CABEZAL DE EXAMEN.
ES89304810T 1988-05-13 1989-05-11 Sistema de comprobacion de dispositivos electronicos. Expired - Lifetime ES2083379T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/193,768 US4893074A (en) 1988-05-13 1988-05-13 Electronic device testing system

Publications (1)

Publication Number Publication Date
ES2083379T3 true ES2083379T3 (es) 1996-04-16

Family

ID=22714925

Family Applications (1)

Application Number Title Priority Date Filing Date
ES89304810T Expired - Lifetime ES2083379T3 (es) 1988-05-13 1989-05-11 Sistema de comprobacion de dispositivos electronicos.

Country Status (8)

Country Link
US (1) US4893074A (es)
EP (1) EP0342045B1 (es)
JP (1) JP2899307B2 (es)
AT (1) ATE134772T1 (es)
DE (1) DE68925750T2 (es)
ES (1) ES2083379T3 (es)
HK (1) HK209396A (es)
SG (1) SG43806A1 (es)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5030869A (en) * 1990-07-25 1991-07-09 Intest Corporation Device testing system with cable pivot
US5270641A (en) * 1992-01-22 1993-12-14 Everett Charles Technologies, Inc. Dual side access test fixture
US5600258A (en) 1993-09-15 1997-02-04 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
US5440943A (en) * 1993-09-15 1995-08-15 Intest Corporation Electronic test head manipulator
US6057695A (en) * 1993-09-15 2000-05-02 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
US5561386A (en) * 1994-02-23 1996-10-01 Fujitsu Limited Chip tester with improvements in handling efficiency and measurement precision
US5982182A (en) * 1994-09-01 1999-11-09 Chiu; Michael A. Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces
US5550466A (en) * 1994-09-30 1996-08-27 Hewlett-Packard Company Hinged conduit for routing cables in an electronic circuit tester
JP3869465B2 (ja) * 1995-02-23 2007-01-17 テラダイン・インコーポレーテッド 自動テスト装置のテストヘッド用マニピュレータ
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation
US5606262A (en) * 1995-06-07 1997-02-25 Teradyne, Inc. Manipulator for automatic test equipment test head
DE19622475A1 (de) * 1996-06-05 1997-12-11 Index Werke Kg Hahn & Tessky Werkzeugmaschine
US5923180A (en) * 1997-02-04 1999-07-13 Hewlett-Packard Company Compliant wafer prober docking adapter
WO1999004273A1 (en) * 1997-07-15 1999-01-28 Wentworth Laboratories, Inc. Probe station with multiple adjustable probe supports
MY144519A (en) 2000-03-01 2011-09-30 Intest Corp Vertical counter balanced test head manipulator
US6741072B2 (en) * 2000-09-15 2004-05-25 James E. Orsillo Docking system for connecting a tester to a probe station using an A-type docking configuration
US6586925B2 (en) 2001-04-09 2003-07-01 St Assembly Test Services Ltd. Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate
EP1410048B1 (en) * 2001-07-16 2010-12-29 inTEST Corporation Test head docking system and method
US6646431B1 (en) 2002-01-22 2003-11-11 Elite E/M, Inc. Test head manipulator
US6722215B2 (en) * 2002-06-18 2004-04-20 Michael Caradonna Manipulator apparatus with low-cost compliance
TWI439709B (zh) 2006-12-29 2014-06-01 Intest Corp 用於使負載沿平移軸線平移之操縱器與負載定位系統
US8350584B2 (en) * 2006-12-29 2013-01-08 Intest Corporation Test head positioning system and method
CN101680911B (zh) * 2007-05-07 2014-06-18 英泰斯特股份有限公司 测试头操作器的支架与缆线保持器
US8212578B1 (en) 2008-03-17 2012-07-03 Intest Corporation Test head positioner system
US8844387B1 (en) * 2010-07-09 2014-09-30 General Construction Company, Inc. Inspection sled
US8981807B2 (en) 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
SG10201605656TA (en) 2011-07-12 2016-08-30 Intest Corp Method and apparatus for docking a test head with a peripheral
WO2013106177A1 (en) 2012-01-09 2013-07-18 Packsize Llc Cable-based measuring system
JP7183667B2 (ja) * 2018-09-27 2022-12-06 株式会社ジェイテクト ラインガイド機構及び旋回装置
JP7544573B2 (ja) * 2020-11-20 2024-09-03 株式会社東京精密 マルチプローバ

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3731191A (en) * 1969-12-22 1973-05-01 Ibm Micro-miniature probe assembly
GB2040856A (en) * 1979-01-23 1980-09-03 Rich Services Inc Roy Cable handling systems
US4229136A (en) * 1979-03-19 1980-10-21 International Business Machines Corporation Programmable air pressure counterbalance system for a manipulator
US4379335A (en) * 1980-10-28 1983-04-05 Auto-Place, Inc. Electronic controller and portable programmer system for a pneumatically-powered point-to-point robot
EP0102217B1 (en) * 1982-08-25 1988-06-01 InTest Corporation Electronic test head positioner for test systems
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
US4588346A (en) * 1982-08-25 1986-05-13 Intest Corporation Positioner for maintaining an object in a substantially weightless condition
US4652204A (en) * 1985-08-02 1987-03-24 Arnett Edward M Apparatus for handling hazardous materials
IT208046Z2 (it) * 1986-09-15 1988-03-31 Tecno Mobili E Forniture Per A Organo passocavo flessibile a snodi bidirezionali.

Also Published As

Publication number Publication date
EP0342045A2 (en) 1989-11-15
DE68925750D1 (de) 1996-04-04
ATE134772T1 (de) 1996-03-15
EP0342045B1 (en) 1996-02-28
JPH0273170A (ja) 1990-03-13
EP0342045A3 (en) 1991-06-19
DE68925750T2 (de) 1996-09-19
US4893074A (en) 1990-01-09
SG43806A1 (en) 1997-11-14
JP2899307B2 (ja) 1999-06-02
HK209396A (en) 1996-11-29

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