ES2096469T3 - Maquina de traccion in situ y probeta para microscopio electronico de barrido. - Google Patents

Maquina de traccion in situ y probeta para microscopio electronico de barrido.

Info

Publication number
ES2096469T3
ES2096469T3 ES94915193T ES94915193T ES2096469T3 ES 2096469 T3 ES2096469 T3 ES 2096469T3 ES 94915193 T ES94915193 T ES 94915193T ES 94915193 T ES94915193 T ES 94915193T ES 2096469 T3 ES2096469 T3 ES 2096469T3
Authority
ES
Spain
Prior art keywords
test
machine
electron microscope
traction machine
traction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES94915193T
Other languages
English (en)
Inventor
Remi Chiron
Jacques Fryet
De Lesegno Patrick Viaris
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Application granted granted Critical
Publication of ES2096469T3 publication Critical patent/ES2096469T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/04—Chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0014—Type of force applied
    • G01N2203/0016—Tensile or compressive
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/022—Environment of the test
    • G01N2203/0222—Temperature
    • G01N2203/0226—High temperature; Heating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0262—Shape of the specimen
    • G01N2203/0268—Dumb-bell specimens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/04—Chucks, fixtures, jaws, holders or anvils
    • G01N2203/0405—Features allowing alignment between specimen and chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/04—Chucks, fixtures, jaws, holders or anvils
    • G01N2203/0435—Chucks, fixtures, jaws, holders or anvils modifying the type of the force applied, e.g. the chuck transforms a compressive machine for applying a bending test
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/206—Modifying objects while observing
    • H01J2237/2062—Mechanical constraints

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

LA INVENCION SE REFIERE A UNA MAQUINA DE TRACCION IN SITU (1) Y UNA PROBETA DESTINADA A SER COLOCADA EN LA CAMARA DE OBSERVACION DE UN MICROSCOPIO ELECTRONICO DE BARRIDO (M.E.B). Y PARA RECIBIR LA PROBETA. LA MAQUINA SE COMPONE DE UN BASTIDOR RIGIDO (2) SOBRE EL QUE ESTAN DISPUESTAS DOS CABEZAS DE TRACCION (3,4), UNA DE LAS CUALES AL MENOS ES MOVIL (4), DEFINIENDO CADA UNA UN ALOJAMIENTO (3A, 4A) EN EL QUE ES SUSCEPTIBLE DE ANCLARSE EL EXTREMO CORRESPONDIENTE (9A, 9B) DE LA PROBETA (9). ASEGURA EL AUTOBLOQUEO Y EL AUTOALINEAMIENTO DE LA PROBETA. ESTE CONJUNTO DE TRACCION ES MODULAR Y COMPACTO, INTEGRABLE SIN MODIFICACION EN LA CAMARA DE OBSERVACION DEL M.E.B.. UN DISPOSITIVO DE CALENTAMIENTO (22) DE LA PROBETA (9) PUEDE ESTAR INTEGRADA EN LA MAQUINA. UN DISPOSITIVO DE INVERSION PERMITE APLICAR UNA COMPRESION A UNA PROBETA.
ES94915193T 1993-04-30 1994-04-29 Maquina de traccion in situ y probeta para microscopio electronico de barrido. Expired - Lifetime ES2096469T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9305169A FR2704649B1 (fr) 1993-04-30 1993-04-30 Machine de traction in situ et eprouvette pour microscope electronique a balayage.

Publications (1)

Publication Number Publication Date
ES2096469T3 true ES2096469T3 (es) 1997-03-01

Family

ID=9446636

Family Applications (1)

Application Number Title Priority Date Filing Date
ES94915193T Expired - Lifetime ES2096469T3 (es) 1993-04-30 1994-04-29 Maquina de traccion in situ y probeta para microscopio electronico de barrido.

Country Status (7)

Country Link
US (1) US5606168A (es)
EP (1) EP0696351B1 (es)
JP (1) JPH08512402A (es)
DE (1) DE69401353T2 (es)
ES (1) ES2096469T3 (es)
FR (1) FR2704649B1 (es)
WO (1) WO1994025846A2 (es)

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FR2792412B1 (fr) * 1999-04-14 2001-09-21 Framatome Sa Dispositif et procede d'essai mecanique sur une eprouvette disposee a l'interieur d'une enceinte autoclave
US6545275B1 (en) * 1999-09-03 2003-04-08 Applied Materials, Inc. Beam evaluation
US7106502B1 (en) 2003-08-21 2006-09-12 The United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration Operation of a Cartesian robotic system in a compact microscope imaging system with intelligent controls
FR2890746A1 (fr) * 2005-09-15 2007-03-16 Univ Lille Sciences Tech Dispositif de traction in situ destine a appareiller un dispositif de microscopie analytique.
CN100386619C (zh) * 2005-09-23 2008-05-07 东华大学 一种用于显微镜上的微测量方法、装置及用途
US7681459B1 (en) * 2006-04-12 2010-03-23 Hysitron, Incorporated Multi-scale & three-axis sensing tensile testing apparatus
JP4772638B2 (ja) * 2006-10-06 2011-09-14 住友ゴム工業株式会社 メッシュおよびゴム切片の観察方法
EP2097744A2 (en) * 2006-12-26 2009-09-09 Abbott Diabetes Care Inc. Analyte meter protectors and methods
CN101776699B (zh) * 2010-01-29 2013-04-10 天津大学 双pzt对称集成化大应变加载装置
CN102262016B (zh) * 2011-04-29 2013-04-24 吉林大学 跨尺度微纳米级原位复合载荷力学性能测试平台
CN102331376B (zh) * 2011-06-24 2013-02-06 赵宏伟 跨尺度微纳米级原位三点弯曲力学性能测试平台
FR2977670B1 (fr) * 2011-07-06 2014-04-18 Arts Micromachine d'essais mecaniques de type traction et compression ayant une accessibilite optimisee.
CN102353591A (zh) * 2011-09-05 2012-02-15 吉林大学 跨尺度微纳米级原位拉伸力学性能测试装置
CN102346117B (zh) * 2011-10-11 2013-01-23 吉林大学 扫描电镜下微弧度级精度原位扭转材料力学性能测试装置
CN102384878B (zh) * 2011-11-10 2013-04-24 吉林大学 显微组件下跨尺度原位微纳米拉伸/压缩液压驱动测试装置
CN102645370A (zh) * 2012-04-12 2012-08-22 吉林大学 双轴向拉伸/压缩模式扫描电镜下力学测试装置
CN102768147B (zh) * 2012-07-02 2014-04-16 北京工业大学 一种研究材料特定温度下力学性能原位tem拉伸台
CN103063689B (zh) * 2012-12-27 2015-01-21 中国科学技术大学 一种与x射线散射联用的恒幅宽薄膜拉伸装置及其实验方法
FR3001543B1 (fr) * 2013-01-31 2016-01-08 Commissariat Energie Atomique Dispositif pour la mise sous traction ou sous compression d'une eprouvette
FR3005733B1 (fr) * 2013-05-17 2015-04-24 Snecma Banc d'essai en fatigue oligocyclique ou en fatigue oligocyclique et polycyclique
FR3009752B1 (fr) * 2013-08-13 2019-07-19 Safran Aircraft Engines Banc d'essai a sollicitation uniaxiale et procede d'essai mis en oeuvre avec ce banc
JP6373568B2 (ja) * 2013-10-07 2018-08-15 株式会社日立ハイテクノロジーズ 荷電粒子線装置
CN103712851B (zh) * 2013-12-20 2016-01-20 浙江大学 高压氢环境材料试验机疲劳试验夹具
JP2016157688A (ja) * 2015-02-23 2016-09-01 株式会社日立ハイテクサイエンス 試料加工評価装置
JP6665624B2 (ja) * 2015-03-27 2020-03-13 日本製鉄株式会社 試験装置およびそれを備えた電子顕微鏡
CN105758728A (zh) * 2016-04-18 2016-07-13 吉林大学 变温复合载荷原位力学测试平台
CN106370527A (zh) * 2016-10-08 2017-02-01 浙江大学 一种扫描电子显微镜中原位高温微观力学测试装置
JP1588647S (es) * 2017-05-19 2018-10-15
CN109781516B (zh) * 2018-12-28 2024-02-02 东北大学 一种材料应变原位ebsd观察试验用夹具及该试验方法
CN109946160A (zh) * 2019-05-05 2019-06-28 中国人民解放军陆军装甲兵学院 涂层材料原位拉伸观测系统
CN110044702A (zh) * 2019-05-05 2019-07-23 中国人民解放军陆军装甲兵学院 真空声发射无损检测系统
KR102404931B1 (ko) * 2020-11-23 2022-06-07 한국기초과학지원연구원 복수 개의 물성을 동시에 분석 가능한 장치
CN114894634B (zh) * 2022-05-20 2025-08-08 哈尔滨焊接研究院有限公司 一种金属超塑性试验装置及试验方法
CN114858837A (zh) * 2022-06-07 2022-08-05 浙江祺跃科技有限公司 扫描电镜原位拉伸实验的位移补偿方法、装置及扫描电镜
CN115326850A (zh) * 2022-08-26 2022-11-11 中国科学技术大学 一种适用于ebsd观测的esem原位力学试验平台
CN116626091B (zh) * 2023-07-21 2023-09-29 江苏德励达新材料股份有限公司 一种聚氨酯材料耐热检测装置

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FR1234255A (fr) * 1959-05-13 1960-10-17 France Etat Perfectionnements apportés aux dispositifs de mors pour tenir les éprouvettes dans les machines de fatigue ou semblables
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DE2930805A1 (de) * 1979-07-28 1981-02-19 Kontron Gmbh Zusatzeinrichtung fuer mikroskope, insbesondere fuer rasterelektronenmikroskope
JPS58218636A (ja) * 1982-06-14 1983-12-19 Toshiba Corp 材料試験片の製造方法
US4548085A (en) * 1983-12-14 1985-10-22 Ppg Industries, Inc. Tension measuring device and method for flexible linear material
US4970895A (en) * 1985-05-02 1990-11-20 Measurex Corporation System and method for the determination of certain physical characteristics of sheet materials.
US4721000A (en) * 1986-09-19 1988-01-26 Instron Corporation Axial loading material testing
US4996433A (en) * 1989-11-06 1991-02-26 Gatan, Inc. Specimen heating holder for electron microscopes
JPH03273134A (ja) * 1990-03-23 1991-12-04 Shimadzu Corp 走査型電子顕微鏡付き材料試験機
FR2667152B1 (fr) * 1990-09-20 1993-07-30 Aerospatiale Dispositif d'essai en traction et compression sur une eprouvette apres simulation de rentree en atmosphere.
US5056372A (en) * 1990-11-28 1991-10-15 Gte Laboratories Incorporated Copper collet grip mechanism
US5355683A (en) * 1993-12-14 1994-10-18 The United States Of America As Represented By The Secretary Of The Navy Cryogenic temperature control and tension/compression attachment stage for an electron microscope

Also Published As

Publication number Publication date
DE69401353D1 (de) 1997-02-13
DE69401353T2 (de) 1997-07-24
EP0696351B1 (fr) 1997-01-02
EP0696351A1 (fr) 1996-02-14
WO1994025846A2 (fr) 1994-11-10
WO1994025846A3 (fr) 1995-01-12
US5606168A (en) 1997-02-25
JPH08512402A (ja) 1996-12-24
FR2704649B1 (fr) 1995-07-21
FR2704649A1 (fr) 1994-11-04

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