ES2147281T3 - Procedimiento para hacer crecer una pelicula epitaxial sobre una superficie de un oxido y producto. - Google Patents
Procedimiento para hacer crecer una pelicula epitaxial sobre una superficie de un oxido y producto.Info
- Publication number
- ES2147281T3 ES2147281T3 ES95904844T ES95904844T ES2147281T3 ES 2147281 T3 ES2147281 T3 ES 2147281T3 ES 95904844 T ES95904844 T ES 95904844T ES 95904844 T ES95904844 T ES 95904844T ES 2147281 T3 ES2147281 T3 ES 2147281T3
- Authority
- ES
- Spain
- Prior art keywords
- perovskite
- spinel
- built
- metal oxide
- oxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 229910052596 spinel Inorganic materials 0.000 abstract 4
- 239000011029 spinel Substances 0.000 abstract 4
- 229910044991 metal oxide Inorganic materials 0.000 abstract 3
- 150000004706 metal oxides Chemical class 0.000 abstract 3
- 150000001768 cations Chemical class 0.000 abstract 2
- 239000010408 film Substances 0.000 abstract 2
- 239000002184 metal Substances 0.000 abstract 2
- 229910000287 alkaline earth metal oxide Inorganic materials 0.000 abstract 1
- 239000000470 constituent Substances 0.000 abstract 1
- 239000013078 crystal Substances 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 239000010409 thin film Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B6/13—Integrated optical circuits characterised by the manufacturing method
- G02B6/131—Integrated optical circuits characterised by the manufacturing method by using epitaxial growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/22—Complex oxides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/22—Complex oxides
- C30B29/32—Titanates; Germanates; Molybdates; Tungstates
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/967—Semiconductor on specified insulator
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Semiconductor Memories (AREA)
- Surface Treatment Of Optical Elements (AREA)
Abstract
UN PROCESO Y ESTRUCTURA EN DONDE UN FILME QUE CONSTA DE UNA PEROVSQUITA O UNA ESPINELA SE CONSTRUYE EPITAXIALMENTE EN UNA SUPERFICIE (22), COMO UNA SUPERFICIE DE OXIDOS ALCALINOTERREOS, INVOLUCRA LA CONSTRUCCION EPITAXIAL DE PLANOS DE CONSTITUYENTES ALTERNANTES DE OXIDOS METALICOS DE PEROVSQUITA O ESPINELA (20, 26, 28). LA PRIMERA CAPA DE OXIDO ME TALICO CONTRUIDA SOBRE LA SUPERFICIE (22) INCLUYE UN ELEMENTO METALICO QUE PROPORCIONA UN CATION PEQUEÑO EN LA ESTRUCTURA CRISTALINA DE LA PEROVSQUITA O ESPINELA, Y LA SEGUNDA CAPA DE OXIDO METALICO CONSTRUIDA SOBRE LA SUPERFICIE (22) INCLUYE UN ELEMENTO METALICO QUE PROPORCIONA UN CATION GRANDE EN LA ESTRUCTURA CRISTALINA DE LA PEROVSQUITA O ESPINELA. LA SECUENCIA DE CAPAS QUE INCLUYE LA CONSTRUCCION DEL FILME REDUCE PROBLEMAS QUE RESULTAN EN OTROS CASOS DEBIDOS A LA ELECTROSTATICA INTERFACIAL DE LA PRIMERA CAPA ATOMICA, Y ESTOS OXIDOS SE PUEDEN ESTABILIZAR COMO COMO PELICULAS FINAS COMENSURADAS EN UN ESPESOR DE LA CELULA DE LA UNIDAD O CRECER CON ALTA CALIDAD CRISTALINA HASTA ESPESORES DE 0,5 - 0,7 {ZE}M PARA APLICACIONES EN EQUIPOS OPTICOS.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/163,427 US5450812A (en) | 1993-07-30 | 1993-12-08 | Process for growing a film epitaxially upon an oxide surface and structures formed with the process |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2147281T3 true ES2147281T3 (es) | 2000-09-01 |
Family
ID=22589967
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES95904844T Expired - Lifetime ES2147281T3 (es) | 1993-12-08 | 1994-12-08 | Procedimiento para hacer crecer una pelicula epitaxial sobre una superficie de un oxido y producto. |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US5450812A (es) |
| EP (1) | EP0819187B1 (es) |
| JP (1) | JP3671055B2 (es) |
| AT (1) | ATE194172T1 (es) |
| CA (1) | CA2178656C (es) |
| DE (1) | DE69425078T2 (es) |
| DK (1) | DK0819187T3 (es) |
| ES (1) | ES2147281T3 (es) |
| GR (1) | GR3034394T3 (es) |
| PT (1) | PT819187E (es) |
| WO (1) | WO1995016061A1 (es) |
Families Citing this family (60)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19627793C2 (de) * | 1996-07-10 | 2002-02-28 | Forschungszentrum Juelich Gmbh | Wellenleiter |
| US6023082A (en) * | 1996-08-05 | 2000-02-08 | Lockheed Martin Energy Research Corporation | Strain-based control of crystal anisotropy for perovskite oxides on semiconductor-based material |
| US6093242A (en) * | 1996-08-05 | 2000-07-25 | Ut-Battelle, Llc | Anisotropy-based crystalline oxide-on-semiconductor material |
| US6080235A (en) * | 1997-06-03 | 2000-06-27 | Ut-Battelle, Llc | Geometric shape control of thin film ferroelectrics and resulting structures |
| US5767543A (en) * | 1996-09-16 | 1998-06-16 | Motorola, Inc. | Ferroelectric semiconductor device having a layered ferroelectric structure |
| US6020024A (en) * | 1997-08-04 | 2000-02-01 | Motorola, Inc. | Method for forming high dielectric constant metal oxides |
| US6103008A (en) * | 1998-07-30 | 2000-08-15 | Ut-Battelle, Llc | Silicon-integrated thin-film structure for electro-optic applications |
| US6241821B1 (en) | 1999-03-22 | 2001-06-05 | Motorola, Inc. | Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon |
| US6248459B1 (en) | 1999-03-22 | 2001-06-19 | Motorola, Inc. | Semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon |
| US6270568B1 (en) * | 1999-07-15 | 2001-08-07 | Motorola, Inc. | Method for fabricating a semiconductor structure with reduced leakage current density |
| US6306668B1 (en) | 1999-09-23 | 2001-10-23 | Ut-Battelle, Llc | Control method and system for use when growing thin-films on semiconductor-based materials |
| US6291319B1 (en) | 1999-12-17 | 2001-09-18 | Motorola, Inc. | Method for fabricating a semiconductor structure having a stable crystalline interface with silicon |
| US6479173B1 (en) | 1999-12-17 | 2002-11-12 | Motorola, Inc. | Semiconductor structure having a crystalline alkaline earth metal silicon nitride/oxide interface with silicon |
| US6392257B1 (en) | 2000-02-10 | 2002-05-21 | Motorola Inc. | Semiconductor structure, semiconductor device, communicating device, integrated circuit, and process for fabricating the same |
| US6693033B2 (en) | 2000-02-10 | 2004-02-17 | Motorola, Inc. | Method of removing an amorphous oxide from a monocrystalline surface |
| KR20030011083A (ko) | 2000-05-31 | 2003-02-06 | 모토로라 인코포레이티드 | 반도체 디바이스 및 이를 제조하기 위한 방법 |
| US6477285B1 (en) | 2000-06-30 | 2002-11-05 | Motorola, Inc. | Integrated circuits with optical signal propagation |
| US6501973B1 (en) | 2000-06-30 | 2002-12-31 | Motorola, Inc. | Apparatus and method for measuring selected physical condition of an animate subject |
| US6427066B1 (en) | 2000-06-30 | 2002-07-30 | Motorola, Inc. | Apparatus and method for effecting communications among a plurality of remote stations |
| US6410941B1 (en) | 2000-06-30 | 2002-06-25 | Motorola, Inc. | Reconfigurable systems using hybrid integrated circuits with optical ports |
| AU2001277001A1 (en) | 2000-07-24 | 2002-02-05 | Motorola, Inc. | Heterojunction tunneling diodes and process for fabricating same |
| US6555946B1 (en) | 2000-07-24 | 2003-04-29 | Motorola, Inc. | Acoustic wave device and process for forming the same |
| US6224669B1 (en) | 2000-09-14 | 2001-05-01 | Motorola, Inc. | Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon |
| US6638838B1 (en) | 2000-10-02 | 2003-10-28 | Motorola, Inc. | Semiconductor structure including a partially annealed layer and method of forming the same |
| US6583034B2 (en) | 2000-11-22 | 2003-06-24 | Motorola, Inc. | Semiconductor structure including a compliant substrate having a graded monocrystalline layer and methods for fabricating the structure and semiconductor devices including the structure |
| US6563118B2 (en) | 2000-12-08 | 2003-05-13 | Motorola, Inc. | Pyroelectric device on a monocrystalline semiconductor substrate and process for fabricating same |
| US20020096683A1 (en) | 2001-01-19 | 2002-07-25 | Motorola, Inc. | Structure and method for fabricating GaN devices utilizing the formation of a compliant substrate |
| US6673646B2 (en) | 2001-02-28 | 2004-01-06 | Motorola, Inc. | Growth of compound semiconductor structures on patterned oxide films and process for fabricating same |
| US7046719B2 (en) | 2001-03-08 | 2006-05-16 | Motorola, Inc. | Soft handoff between cellular systems employing different encoding rates |
| WO2002082551A1 (en) | 2001-04-02 | 2002-10-17 | Motorola, Inc. | A semiconductor structure exhibiting reduced leakage current |
| US20020152953A1 (en) * | 2001-04-23 | 2002-10-24 | Chambers Scott A. | Spinel-structured metal oxide on a substrate and method of making same by molecular beam epitaxy |
| US6709989B2 (en) | 2001-06-21 | 2004-03-23 | Motorola, Inc. | Method for fabricating a semiconductor structure including a metal oxide interface with silicon |
| US6992321B2 (en) | 2001-07-13 | 2006-01-31 | Motorola, Inc. | Structure and method for fabricating semiconductor structures and devices utilizing piezoelectric materials |
| US6646293B2 (en) | 2001-07-18 | 2003-11-11 | Motorola, Inc. | Structure for fabricating high electron mobility transistors utilizing the formation of complaint substrates |
| US7019332B2 (en) | 2001-07-20 | 2006-03-28 | Freescale Semiconductor, Inc. | Fabrication of a wavelength locker within a semiconductor structure |
| US6693298B2 (en) | 2001-07-20 | 2004-02-17 | Motorola, Inc. | Structure and method for fabricating epitaxial semiconductor on insulator (SOI) structures and devices utilizing the formation of a compliant substrate for materials used to form same |
| US6472694B1 (en) | 2001-07-23 | 2002-10-29 | Motorola, Inc. | Microprocessor structure having a compound semiconductor layer |
| US6855992B2 (en) | 2001-07-24 | 2005-02-15 | Motorola Inc. | Structure and method for fabricating configurable transistor devices utilizing the formation of a compliant substrate for materials used to form the same |
| US6585424B2 (en) | 2001-07-25 | 2003-07-01 | Motorola, Inc. | Structure and method for fabricating an electro-rheological lens |
| US6594414B2 (en) | 2001-07-25 | 2003-07-15 | Motorola, Inc. | Structure and method of fabrication for an optical switch |
| US6667196B2 (en) | 2001-07-25 | 2003-12-23 | Motorola, Inc. | Method for real-time monitoring and controlling perovskite oxide film growth and semiconductor structure formed using the method |
| MY134020A (en) * | 2001-08-03 | 2007-11-30 | Asml Us Inc | Oxide structure useable for optical waveguide and method of forming the oxide structure |
| US6639249B2 (en) | 2001-08-06 | 2003-10-28 | Motorola, Inc. | Structure and method for fabrication for a solid-state lighting device |
| US6589856B2 (en) | 2001-08-06 | 2003-07-08 | Motorola, Inc. | Method and apparatus for controlling anti-phase domains in semiconductor structures and devices |
| US6462360B1 (en) | 2001-08-06 | 2002-10-08 | Motorola, Inc. | Integrated gallium arsenide communications systems |
| US20030034491A1 (en) | 2001-08-14 | 2003-02-20 | Motorola, Inc. | Structure and method for fabricating semiconductor structures and devices for detecting an object |
| US6673667B2 (en) | 2001-08-15 | 2004-01-06 | Motorola, Inc. | Method for manufacturing a substantially integral monolithic apparatus including a plurality of semiconductor materials |
| US20030071327A1 (en) | 2001-10-17 | 2003-04-17 | Motorola, Inc. | Method and apparatus utilizing monocrystalline insulator |
| US6916717B2 (en) | 2002-05-03 | 2005-07-12 | Motorola, Inc. | Method for growing a monocrystalline oxide layer and for fabricating a semiconductor device on a monocrystalline substrate |
| WO2004023194A2 (en) * | 2002-09-04 | 2004-03-18 | Massachusetts Institute Of Technology | Optical isolator with magneto-optical material and manufacturing method |
| US7169619B2 (en) | 2002-11-19 | 2007-01-30 | Freescale Semiconductor, Inc. | Method for fabricating semiconductor structures on vicinal substrates using a low temperature, low pressure, alkaline earth metal-rich process |
| US6885065B2 (en) | 2002-11-20 | 2005-04-26 | Freescale Semiconductor, Inc. | Ferromagnetic semiconductor structure and method for forming the same |
| US6965128B2 (en) | 2003-02-03 | 2005-11-15 | Freescale Semiconductor, Inc. | Structure and method for fabricating semiconductor microresonator devices |
| US7020374B2 (en) | 2003-02-03 | 2006-03-28 | Freescale Semiconductor, Inc. | Optical waveguide structure and method for fabricating the same |
| US9023662B2 (en) | 2011-05-09 | 2015-05-05 | Board Of Regents, The University Of Texas System | Efficiently injecting spin-polarized current into semiconductors by interfacing crystalline ferromagnetic oxides directly on the semiconductor material |
| US20130320813A1 (en) * | 2012-06-04 | 2013-12-05 | Tdk Corporation | Dielectric device |
| US20180151301A1 (en) * | 2016-11-25 | 2018-05-31 | The Boeing Company | Epitaxial perovskite materials for optoelectronics |
| US11342484B2 (en) | 2020-05-11 | 2022-05-24 | Silanna UV Technologies Pte Ltd | Metal oxide semiconductor-based light emitting device |
| JP7814510B2 (ja) | 2021-11-10 | 2026-02-16 | シランナ・ユー・ブイ・テクノロジーズ・プライベート・リミテッド | エピタキシャル酸化物材料、構造、及びデバイス |
| EP4430674A4 (en) | 2021-11-10 | 2025-10-01 | Silanna UV Technologies Pte Ltd | EPITAXIAL OXIDE MATERIALS, STRUCTURES AND DEVICES |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3655429A (en) * | 1969-04-16 | 1972-04-11 | Westinghouse Electric Corp | Method of forming thin insulating films particularly for piezoelectric transducers |
| US4996187A (en) * | 1988-10-17 | 1991-02-26 | Allied-Signal Inc. | Epitaxial Ba-Y-Cu-O superconductor film |
| US5225031A (en) * | 1991-04-10 | 1993-07-06 | Martin Marietta Energy Systems, Inc. | Process for depositing an oxide epitaxially onto a silicon substrate and structures prepared with the process |
| US5323024A (en) * | 1992-10-09 | 1994-06-21 | Adams Jeff C | Relativistic semiconductor plasma wave frequency up-converter |
-
1993
- 1993-12-08 US US08/163,427 patent/US5450812A/en not_active Expired - Lifetime
-
1994
- 1994-12-08 DK DK95904844T patent/DK0819187T3/da active
- 1994-12-08 PT PT95904844T patent/PT819187E/pt unknown
- 1994-12-08 EP EP95904844A patent/EP0819187B1/en not_active Expired - Lifetime
- 1994-12-08 ES ES95904844T patent/ES2147281T3/es not_active Expired - Lifetime
- 1994-12-08 AT AT95904844T patent/ATE194172T1/de not_active IP Right Cessation
- 1994-12-08 JP JP51633395A patent/JP3671055B2/ja not_active Expired - Fee Related
- 1994-12-08 CA CA002178656A patent/CA2178656C/en not_active Expired - Fee Related
- 1994-12-08 WO PCT/US1994/014098 patent/WO1995016061A1/en not_active Ceased
- 1994-12-08 DE DE69425078T patent/DE69425078T2/de not_active Expired - Fee Related
-
2000
- 2000-09-13 GR GR20000402084T patent/GR3034394T3/el not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| CA2178656C (en) | 2005-06-28 |
| JP3671055B2 (ja) | 2005-07-13 |
| PT819187E (pt) | 2000-10-31 |
| GR3034394T3 (en) | 2000-12-29 |
| EP0819187B1 (en) | 2000-06-28 |
| EP0819187A1 (en) | 1998-01-21 |
| DK0819187T3 (da) | 2000-08-28 |
| ATE194172T1 (de) | 2000-07-15 |
| DE69425078T2 (de) | 2000-11-02 |
| JPH09509640A (ja) | 1997-09-30 |
| WO1995016061A1 (en) | 1995-06-15 |
| DE69425078D1 (de) | 2000-08-03 |
| EP0819187A4 (es) | 1998-01-21 |
| CA2178656A1 (en) | 1995-06-15 |
| US5450812A (en) | 1995-09-19 |
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