ES2159109T3 - Un metodo para determinar el perfil de densidad. - Google Patents

Un metodo para determinar el perfil de densidad.

Info

Publication number
ES2159109T3
ES2159109T3 ES97904349T ES97904349T ES2159109T3 ES 2159109 T3 ES2159109 T3 ES 2159109T3 ES 97904349 T ES97904349 T ES 97904349T ES 97904349 T ES97904349 T ES 97904349T ES 2159109 T3 ES2159109 T3 ES 2159109T3
Authority
ES
Spain
Prior art keywords
plate
source
pct
density
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES97904349T
Other languages
English (en)
Inventor
Steen Teller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wesser and Dueholm AS
Original Assignee
Wesser and Dueholm AS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wesser and Dueholm AS filed Critical Wesser and Dueholm AS
Application granted granted Critical
Publication of ES2159109T3 publication Critical patent/ES2159109T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

Un método para determinar el perfil de densidad de un material con forma de placa (M), cuya densidad varía discreta o continuamente a través del espesor de la placa, mientras que la densidad en una profundidad específica de dicha placa es considerada preferentemente constante, como por ejemplo placas a base de madera, por medio de rayos X o de rayos gamma procedentes de una fuente (K) que se encuentra dispuesta en un lado de dicha placa (M), por lo que al menos dos detectores (T, F) se disponen en el lado opuesto de la placa sin fn que se hace avanzar en una dirección longitudinal durante una medición sin fn, estando colocado un primer detector (T) en la dirección de radiación de la fuente (K) de manera que mida la radiación transmitida a través de la placa (M), y estando colocado al menos un detector (F) fuera de la dirección de radiación de la citada fuente (K) para medir así la radiación dispersada desde los volúmenes parciales a lo largo de la dirección de radiación de la fuente (K), que se caracteriza por compensar la radiación dispersada múltiple en cada volumen parcial individual restando la radiación dispersada múltiple de la radiación dispersada medida, siendo calculada dicha radiación dispersada múltiple por medio dela fórmula (1) **fórmula** en donde I0 representa la intensidad incidente, és el coeficiente de absorción, p es la densidad media de la placa (M), t es el espesor y alfa y beta dependen de la disposición de medida.
ES97904349T 1996-02-14 1997-02-14 Un metodo para determinar el perfil de densidad. Expired - Lifetime ES2159109T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DK015196A DK171779B1 (da) 1996-02-14 1996-02-14 Fremgangsmåde til bestemmelse af densitetsprofil

Publications (1)

Publication Number Publication Date
ES2159109T3 true ES2159109T3 (es) 2001-09-16

Family

ID=8090344

Family Applications (1)

Application Number Title Priority Date Filing Date
ES97904349T Expired - Lifetime ES2159109T3 (es) 1996-02-14 1997-02-14 Un metodo para determinar el perfil de densidad.

Country Status (10)

Country Link
US (1) US6094470A (es)
EP (1) EP1017986B1 (es)
AT (1) ATE202212T1 (es)
AU (1) AU1719397A (es)
CA (1) CA2243629C (es)
DE (1) DE69705244T2 (es)
DK (1) DK171779B1 (es)
ES (1) ES2159109T3 (es)
PT (1) PT1017986E (es)
WO (1) WO1997030336A1 (es)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2348150C (en) 2000-05-25 2007-03-13 Esam M.A. Hussein Non-rotating x-ray system for three-dimensional, three-parameter imaging
CA2355560C (en) 2000-08-28 2003-11-18 Balza Achmad X-ray compton scatter density measurement at a point within an object
EP1258723A1 (en) * 2001-05-18 2002-11-20 Imal S.R.L. Non destructive process for continuously measuring the density profile of panels
CA2513990C (en) * 2004-08-27 2010-09-14 Paul Jacob Arsenault X-ray scatter image reconstruction by balancing of discrepancies between detector responses, and apparatus therefor
DE102004057743B4 (de) * 2004-09-08 2007-08-09 Mahlo Gmbh & Co Kg Verfahren und Vorrichtung zum Bestimmen des Flächengewichtes einer geförderten Materialprobe
NZ538649A (en) * 2005-03-07 2006-10-27 Inst Geolog Nuclear Sciences Estimating strengths of wooden supports using gamma rays
US20070085241A1 (en) * 2005-10-14 2007-04-19 Northrop Grumman Corporation High density performance process

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4228351A (en) * 1979-02-26 1980-10-14 The United States Of America As Represented By The United States Department Of Energy Method for measuring the density of lightweight materials
DE2939146A1 (de) * 1979-09-27 1981-04-16 Philips Patentverwaltung Gmbh, 2000 Hamburg Verfahren zur untersuchung eines koerpers mit durchdringender strahlung
US4799247A (en) * 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
DK171492B1 (da) * 1994-06-20 1996-11-25 Wesser & Dueholm Fremgangsmåde til bestemmelse af densitetsprofil i et pladeformet materiale

Also Published As

Publication number Publication date
CA2243629A1 (en) 1997-08-21
CA2243629C (en) 2001-05-29
DE69705244T2 (de) 2001-10-25
EP1017986A1 (en) 2000-07-12
DK15196A (da) 1997-05-20
US6094470A (en) 2000-07-25
DE69705244D1 (de) 2001-07-19
WO1997030336A1 (en) 1997-08-21
AU1719397A (en) 1997-09-02
EP1017986B1 (en) 2001-06-13
PT1017986E (pt) 2001-09-28
ATE202212T1 (de) 2001-06-15
DK171779B1 (da) 1997-05-20

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