ES2171409T3 - Deteccion sin contacto de defectos superficiales. - Google Patents

Deteccion sin contacto de defectos superficiales.

Info

Publication number
ES2171409T3
ES2171409T3 ES93308855T ES93308855T ES2171409T3 ES 2171409 T3 ES2171409 T3 ES 2171409T3 ES 93308855 T ES93308855 T ES 93308855T ES 93308855 T ES93308855 T ES 93308855T ES 2171409 T3 ES2171409 T3 ES 2171409T3
Authority
ES
Spain
Prior art keywords
pixels
balls
bad
edges
cracks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES93308855T
Other languages
English (en)
Inventor
John Charles Lichauer
Nicola Gabriel Arlia
Lawrence Joseph Zana
John Martin Beatty
Hassan Juma Ahmed
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Westinghouse Electric Co LLC
Westinghouse Electric Corp
Original Assignee
Westinghouse Electric Co LLC
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Co LLC, Westinghouse Electric Corp filed Critical Westinghouse Electric Co LLC
Application granted granted Critical
Publication of ES2171409T3 publication Critical patent/ES2171409T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21C—NUCLEAR REACTORS
    • G21C17/00—Monitoring; Testing ; Maintaining
    • G21C17/06—Devices or arrangements for monitoring or testing fuel or fuel elements outside the reactor core, e.g. for burn-up, for contamination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20172—Image enhancement details
    • G06T2207/20192—Edge enhancement; Edge preservation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/30—Nuclear fission reactors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Signal Processing (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Quality & Reliability (AREA)
  • Geometry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)

Abstract

UN SISTEMA PARA LA DETECCION SIN CONTACTO DE LAS GRIETAS DE UNA SUPERFICIE PARA PIEZAS DE TRABAJO TALES COMO BOLITAS COMBUSTIBLES NUCLEARES QUE TRANSPORTA LAS BOLITAS DE MANERA CONTINUA A LO LARGO DE UNA TRAYECTORIA ILUMINADA AL TIEMPO QUE LAS HACE ROTAR. UNA CAMARA DE EXPLORACION DE LINEAS REGISTRA UNA SERIE DE EXPLORACIONES DE LINEAS DE LAS BOLITAS Y SE DIGITALIZAN LOS VALORES RESULTANTES DE LA REFLECTIVIDAD DE LAS BOLITAS. LOS VALORES DE LOS PIXELS SE COMPARAN CON LOS UMBRALES DEFINIDOS ADAPTIVAMENTE BIEN ESTABLECIENDO UNA MEDIA Y/O UTILIZANDO UN FILTRO DE RESPUESTA A LOS IMPULSOS FINITOS DE VIDEO PARA GENERAR UN MAPA BINARIO DE PIXELS "BUENOS" Y "MALOS", QUE DEFINE TAMBIEN LOS BORDES DE LA BOLITA EN EL MAPA. UN PROCESADOR CUENTA Y ASOCIA LOS PIXELS MALOS PARA DEFINIR LOGICAMENTE Y EVALUAR MANCHAS DE PIXELS MALOS. EL PROCESADOR VERIFICA LA COINCIDENCIA DE LOS PIXELS DE LOS BORDES CON LA LINEA DE REBORDE NOMINAL QUE MAS COINCIDA CON EL BORDE, PARA ENCONTRAR GRIETAS EN LOS BORDES. SE SELECCIONAN O RECHAZAN LAS BOLITAS ASI EVALUADAS. UNOS ELEMENTOS DETECTORES FOTOGRAFICOS SE NORMALIZAN EN CUANTO A SU GANANCIA Y DESVIACION. EL DESPLAZAMIENTO DEL DATO DE PIXELS CANCELA LA OBLICUIDAD PRODUCIDA AL EXPLORAR LAS BOLITAS EN MOVIMIENTO. UNOS FILTROS DE CONVOLUCION CANCELAN LOS PIXELS MALOS AISLADOS Y AUMENTAN EL CONTRASTE EN EL BORDE. PARA EL PROCESAMIENTO DE LAS AREAS ADYACENTES, SE PUEDE DIVIDIR EN CUADRADOS LA IMAGEN DE PIXELS DE LAS BOLITAS, EVALUANDOSE LAS GRIETAS QUE PUENTEAN LOS CUADRADITOS COMO UNA SOLA MANCHA. EL APARATO SE UTILIZA PREFERENTEMENTE EN LA PRODUCCION DE TUBERIAS PARALELAS PARA ENCONTRAR LOS DEFECTOS QUE PUDIERA HABER EN LAS PAREDES LATERALES Y EN LOS BORDES Y SE PUEDE APLICAR A UNA SERIE DE TABLEROS DE VME MODULARES.
ES93308855T 1992-11-12 1993-11-05 Deteccion sin contacto de defectos superficiales. Expired - Lifetime ES2171409T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/975,050 US5309486A (en) 1992-11-12 1992-11-12 Non-contact flaw detection for cylindrical nuclear fuel pellets

Publications (1)

Publication Number Publication Date
ES2171409T3 true ES2171409T3 (es) 2002-09-16

Family

ID=25522657

Family Applications (1)

Application Number Title Priority Date Filing Date
ES93308855T Expired - Lifetime ES2171409T3 (es) 1992-11-12 1993-11-05 Deteccion sin contacto de defectos superficiales.

Country Status (6)

Country Link
US (1) US5309486A (es)
EP (1) EP0597639B1 (es)
JP (1) JPH07318498A (es)
KR (1) KR100301976B1 (es)
ES (1) ES2171409T3 (es)
TW (1) TW239890B (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113654470A (zh) * 2021-07-29 2021-11-16 佛山市科莱机器人有限公司 浴缸表面积水检测方法、系统、设备及介质

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3214942B2 (ja) * 1993-02-25 2001-10-02 三菱原子燃料株式会社 ペレット端面検査方法及び装置
GB9309238D0 (en) * 1993-05-05 1993-06-16 British Nuclear Fuels Plc Apparatus for detection of surface defects
US5850468A (en) * 1995-04-11 1998-12-15 Matsushita Electric Industrial Co., Ltd. Flaw detection apparatus
US6038335A (en) * 1995-06-05 2000-03-14 Matsushita Electric Industrial Co. Ltd. Flaw detection apparatus using digital image data indicative of a surface of an object
US5594764A (en) * 1995-06-06 1997-01-14 Westinghouse Electric Corporation Automated video characterization of nuclear power plant components
US5602885A (en) * 1995-08-25 1997-02-11 Westinghouse Electric Corporation Automated girth weld inspection of nuclear fuel rods
KR100241006B1 (ko) * 1995-12-26 2000-03-02 이구택 후판표면흠 영상검출시스템
FR2762530B1 (fr) * 1997-04-24 1999-07-16 Franco Belge Combustibles Dispositif de tri automatique de pastilles cylindriques
US6023522A (en) * 1997-05-05 2000-02-08 Draganoff; Georgi H. Inexpensive adaptive fingerprint image acquisition framegrabber
US5887041A (en) * 1997-10-28 1999-03-23 Westinghouse Electric Corporation Nuclear power plant component identification and verification system and method
US6272437B1 (en) 1998-04-17 2001-08-07 Cae Inc. Method and apparatus for improved inspection and classification of attributes of a workpiece
AU3401099A (en) * 1998-04-17 1999-11-08 Cae Electronics Ltd. Method and apparatus for identification of probable defects in a workpiece
US6266436B1 (en) * 1999-04-09 2001-07-24 Kimberly-Clark Worldwide, Inc. Process control using multiple detections
DE10033180B4 (de) * 2000-06-29 2006-08-31 Carl Zeiss Jena Gmbh Verfahren zur Detektion von Farbstoffen in der Fluoreszenzmikroskopie
US6958811B2 (en) 2000-06-29 2005-10-25 Carl Zeiss Jena Gmbh Method for the detection of dyes in fluorescence microscopy
KR100387197B1 (ko) * 2000-08-03 2003-06-12 주식회사 비솔 고속 결함 검출 시스템 및 방법
US6748110B1 (en) * 2000-11-09 2004-06-08 Cognex Technology And Investment Object and object feature detector system and method
US6898304B2 (en) * 2000-12-01 2005-05-24 Applied Materials, Inc. Hardware configuration for parallel data processing without cross communication
GB2394042B (en) * 2002-10-11 2005-09-07 Statoil Asa Method and apparatus for the inspection of surfaces
US7415335B2 (en) * 2003-11-21 2008-08-19 Harris Corporation Mobile data collection and processing system and methods
FR2862803B1 (fr) * 2003-11-24 2007-12-07 Franco Belge Combustibles Procede de controle non destructif d'un element pour reacteur nucleaire
WO2006012194A1 (en) * 2004-06-24 2006-02-02 Ircon, Inc. Method and apparatus for monitoring and detecting defects in plastic package sealing
FR2882437B1 (fr) * 2005-02-21 2007-12-14 Electricite De France Procede de controle de l'etat d'un outil et appareil mettant en oeuvre ce procede
JP4565252B2 (ja) * 2007-03-07 2010-10-20 株式会社野毛電気工業 移動物品の欠陥部等の検出方法
US20100118136A1 (en) * 2007-06-13 2010-05-13 Riet Jan Arie Pieter Van Surface inspection device and an arrangement for inspecting a surface
US8594417B2 (en) 2007-11-27 2013-11-26 Alcoa Inc. Systems and methods for inspecting anodes and smelting management relating to the same
JP5760462B2 (ja) * 2011-02-01 2015-08-12 Ｊｆｅスチール株式会社 尾端クロップ検出装置
JP2016537219A (ja) * 2013-10-21 2016-12-01 サウディ ベーシック インダストリーズ コーポレイション ポリマー押出アセンブリおよびポリマー押出アセンブリ内のカッターブレードの破損検出方法
CN106767566B (zh) * 2016-11-29 2019-07-02 湖北文理学院 一种工件质量在线监测评估方法及监测系统
CN106872493B (zh) * 2017-01-12 2019-09-13 中国原子能科学研究院 核燃料组件无损探测装置
CN106871786A (zh) * 2017-03-23 2017-06-20 杭州兆深科技有限公司 一种用于移液吸头端口的检测方法和系统
CA3153701A1 (en) * 2019-11-07 2021-05-14 Amgen Inc. Targeted application of deep learning to automated visual inspection equipment
JP7569669B2 (ja) * 2020-11-25 2024-10-18 株式会社ブリヂストン 配管劣化診断方法、及び、配管劣化診断システム
CN113588663B (zh) * 2021-08-03 2024-01-23 上海圭目机器人有限公司 一种管线缺陷识别与信息提取方法
CN117325012B (zh) * 2023-10-25 2024-04-12 江阴市精奇数控有限公司 磨削加工轴承裂纹缺陷管理装置
KR102684740B1 (ko) * 2023-12-11 2024-07-12 라디안 주식회사 사용 후 핵연료를 점검하기 위한 핵연료 감시 장치, 핵연료 감시 장치의 제어 방법, 및 핵연료 감시 장치에서 실행되는 컴퓨터 프로그램

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3027373A1 (de) * 1979-07-20 1981-03-19 Hitachi, Ltd., Tokyo Verfahren und einrichtung zur oberflaechenpruefung
US4448680A (en) * 1980-07-22 1984-05-15 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for classifying fuel pellets for nuclear reactor
US4496056A (en) * 1982-03-25 1985-01-29 General Electric Company Automated inspection system
US4549662A (en) * 1982-03-25 1985-10-29 General Electric Company Transport apparatus
US4633504A (en) * 1984-06-28 1986-12-30 Kla Instruments Corporation Automatic photomask inspection system having image enhancement means
JPS6239746A (ja) * 1985-08-16 1987-02-20 Mitsubishi Nuclear Fuel Co Ltd 円筒体外観検査装置
IT1183983B (it) * 1985-11-29 1987-10-22 Elsag Sistema di acquisizione ed elaborazione flessibile di immagini
JPH02123441A (ja) * 1988-11-02 1990-05-10 Hitachi Ltd データ記憶装置
USH1084H (en) * 1990-08-10 1992-08-04 The United States Of America As Represented By The Department Of Energy Ultrasonic thickness measuring and imaging system and method
FR2667398B1 (fr) * 1990-09-27 1992-10-30 Cogema Procede et installation d'examen automatique de la surface circonferentielle d'objets cylindriques.
US5147047A (en) * 1991-01-14 1992-09-15 Westinghouse Electric Corp. Pellet inspection system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113654470A (zh) * 2021-07-29 2021-11-16 佛山市科莱机器人有限公司 浴缸表面积水检测方法、系统、设备及介质

Also Published As

Publication number Publication date
EP0597639B1 (en) 2002-02-06
US5309486A (en) 1994-05-03
EP0597639A1 (en) 1994-05-18
KR100301976B1 (ko) 2001-10-22
TW239890B (es) 1995-02-01
KR940012410A (ko) 1994-06-23
JPH07318498A (ja) 1995-12-08

Similar Documents

Publication Publication Date Title
ES2171409T3 (es) Deteccion sin contacto de defectos superficiales.
Heck Assessment of crop losses from air pollutants in the United States.
EP0362679A3 (en) Inside surface inspection system and method therefor
MY100429A (en) Distortion inspection apparatus of a glass plate
BE905695A (fr) Equipement de jeu et procede pour sa mise en oeuvre.
DE69819159D1 (de) System zum detektieren von oberflächenanomalien und/oder -merkmalen
CA1283964C (en) Surface inspection apparatus
FR2538155B1 (fr) Procede et dispositif de detection d'elements combustibles defectueux utilisant l'absorption ultrasonore
AU1964595A (en) Arrangement and method for the detection of defects in timber
SE8105001L (sv) Anordning for optisk avkenning av foremal
GR3005375T3 (es)
EP0246832A3 (en) Pattern alignment generator
JPH05188006A (ja) 表面疵検知装置
JPS545789A (en) Inspecting apparatus of oxygen concentration detectors
SE8704739D0 (sv) Detekteringsanordning
JPS57173705A (en) Method for checking mask for printed substrate
JPS6426104A (en) Appearance inspecting device for semiconductor device
JPS56150827A (en) Inspection device for abnormality of mask
JPS57184957A (en) Defect inspecting device
SE9300047D0 (sv) Foerfarande och anordning foer att maeta avstaand
JPS57111443A (en) Control apparatus of ultrasonic dislocation image pickup
JPS56134735A (en) Deficiency detector for regular pattern
JPS5382492A (en) Surface inspecting method
Bidle " Nuclear Explosions: The Future of Test Bans will be the Title of Edmund E. Muskie's Address
Zunarelli-Vandini et al. Effects of industrial pollution on polychaete communities of sandy bottoms.

Legal Events

Date Code Title Description
FG2A Definitive protection

Ref document number: 597639

Country of ref document: ES