ES2171474T3 - Medicion del indice de refraccion de lentes para gafas. - Google Patents

Medicion del indice de refraccion de lentes para gafas.

Info

Publication number
ES2171474T3
ES2171474T3 ES95104527T ES95104527T ES2171474T3 ES 2171474 T3 ES2171474 T3 ES 2171474T3 ES 95104527 T ES95104527 T ES 95104527T ES 95104527 T ES95104527 T ES 95104527T ES 2171474 T3 ES2171474 T3 ES 2171474T3
Authority
ES
Spain
Prior art keywords
ray
sample
refraction index
retrorreflector
response
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES95104527T
Other languages
English (en)
Inventor
Thomas Dr Hellmuth
Charles E Campbell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss AG
Original Assignee
Carl Zeiss AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss AG filed Critical Carl Zeiss AG
Application granted granted Critical
Publication of ES2171474T3 publication Critical patent/ES2171474T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/15—Cat eye, i.e. reflection always parallel to incoming beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

SE PRESENTA UN APARATO PARA MEDIR EL INDICE DE REFRACCION DE UN CRISTAL TAL COMO UNA LENTE DE GAFAS SIN MEDIR LA GEOMETRIA SUPERFICIAL DEL CRISTAL. EN PARTICULAR, UNA CONFORMACION DE LA INVENCION INCLUYE: A) UNA FUENTE DE UN RAYO ESPACIALMENTE COHERENTE DE RADIACION; B) UN DIVISOR DE RAYO PARA SUMINISTRAR UN RAYO DE MUESTRA Y UN RAYO DE REFERENCIA EN RESPUESTA AL RAYO; C) UN RETRORREFLECTOR TRASLADABLE QUE REFLEJA EL RAYO DE REFERENCIA; D) UN DISPOSITIVO DE SUJECION PARA SUJETAR EL MATERIAL EN EL CAMINO DE RAYO DE MUESTRA, EL DISPOSITIVO DE SUJECION INCLUYE UN RETRORREFLECTOR QUE REFLEJA EL RAYO DE MUESTRA HACIA ATRAS A TRAVES DEL MATERIAL Y UN APARATO CALIBRADOR PARA MEDIR EL GROSOR DEL MATERIAL A TRAVES DEL CUAL PASA EL RAYO DE MUESTRA; E) UN DETECTOR QUE DETECTA EL RAYO DE REFERENCIA REFLEJADO Y EL RAYO DE MUESTRA REFLEJADO PARA PRODUCIR UNA SEÑAL DE SALIDA DEL DETECTOR; Y F) UN ANALIZADOR QUE DETERMINA UNA POSICION EL RETRORREFLECTOR TRASLADABLE EN RESPUESTA A LA SEÑAL DE SALIDA DEL DETECTOR Y QUE DETERMINA EL INDICE DE REFRACCION DEL MATERIAL EN RESPUESTA A LA POSICION DEL REFLECTOR TRASLADABLE Y DEL GROSOR DEL MATERIAL.
ES95104527T 1994-04-05 1995-03-28 Medicion del indice de refraccion de lentes para gafas. Expired - Lifetime ES2171474T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22343494A 1994-04-05 1994-04-05

Publications (1)

Publication Number Publication Date
ES2171474T3 true ES2171474T3 (es) 2002-09-16

Family

ID=22836480

Family Applications (1)

Application Number Title Priority Date Filing Date
ES95104527T Expired - Lifetime ES2171474T3 (es) 1994-04-05 1995-03-28 Medicion del indice de refraccion de lentes para gafas.

Country Status (6)

Country Link
US (1) US5469261A (es)
EP (1) EP0676629B1 (es)
JP (1) JP3645933B2 (es)
CA (1) CA2146300C (es)
DE (1) DE69525481D1 (es)
ES (1) ES2171474T3 (es)

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US5640270A (en) * 1996-03-11 1997-06-17 Wyko Corporation Orthogonal-scanning microscope objective for vertical-scanning and phase-shifting interferometry
JP3459327B2 (ja) * 1996-06-17 2003-10-20 理化学研究所 積層構造体の層厚および屈折率の測定方法およびその測定装置
US5855074A (en) * 1997-12-07 1999-01-05 Visionix Ltd. Methods and apparatus for measuring and mapping opthalmic elements
JPH11170275A (ja) * 1997-12-17 1999-06-29 Topcon Corp レンズ成形装置及びレンズ成形器具
US5975697A (en) * 1998-11-25 1999-11-02 Oti Ophthalmic Technologies, Inc. Optical mapping apparatus with adjustable depth resolution
US6546272B1 (en) 1999-06-24 2003-04-08 Mackinnon Nicholas B. Apparatus for in vivo imaging of the respiratory tract and other internal organs
US6618152B2 (en) * 2000-05-09 2003-09-09 Fuji Photo Film Co., Ltd. Optical coherence tomography apparatus using optical-waveguide structure which reduces pulse width of low-coherence light
WO2003059162A1 (en) * 2002-01-15 2003-07-24 Broad Of Regents, The University Of Texas System Methods and compositions to reduce scattering of light during therapeutic and diagnostic imaging procedures
JP3578144B2 (ja) 2002-01-16 2004-10-20 住友電気工業株式会社 回折型光学部品の光学特性測定装置及び測定方法
GB2385417B (en) * 2002-03-14 2004-01-21 Taylor Hobson Ltd Surface profiling apparatus
CN1320334C (zh) * 2002-03-14 2007-06-06 泰勒·霍布森有限公司 表面成型设备和获得数据方法，数据处理设备及其相关器
US7113818B2 (en) * 2002-04-08 2006-09-26 Oti Ophthalmic Technologies Inc. Apparatus for high resolution imaging of moving organs
CA2390072C (en) 2002-06-28 2018-02-27 Adrian Gh Podoleanu Optical mapping apparatus with adjustable depth resolution and multiple functionality
DE10333426B4 (de) * 2003-07-17 2006-02-09 Carl Zeiss Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
CN1902639A (zh) * 2003-11-10 2007-01-24 科技创新有限责任公司 数字成像组合件及其方法
FR2878979B1 (fr) * 2004-12-03 2007-04-20 Essilor Int Procede et dispositif de mesure de puissance d'une lentille ophtalmique par mesure optique globale sans contact et palpage combines
WO2006096469A2 (en) * 2005-03-03 2006-09-14 Ilko Ilev Confocal fiber-optic laser device and method for intraocular lens power measurement
US7384146B2 (en) * 2005-06-28 2008-06-10 Carestream Health, Inc. Health care kiosk having automated diagnostic eye examination and a fulfillment remedy based thereon
GB2429522A (en) * 2005-08-26 2007-02-28 Univ Kent Canterbury Optical mapping apparatus
JP5168168B2 (ja) * 2009-01-22 2013-03-21 パナソニック株式会社 屈折率測定装置
EP2551634A1 (de) * 2011-07-26 2013-01-30 Alicona Imaging GmbH Retroflektierender Probenhalter und Messeinrichtung
DE102011119806B4 (de) 2011-11-25 2020-10-15 Carl Zeiss Vision International Gmbh Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
CN103512730B (zh) * 2013-10-08 2017-02-01 中国计量科学研究院 一种镜片后顶焦度的测量装置
CN103487239B (zh) * 2013-10-11 2015-11-25 杭州奥普特光学有限公司 手持式镜片面焦度测量装置
US10670494B2 (en) 2015-05-10 2020-06-02 6 Over 6 Vision Ltd. Apparatus, system and method of determining one or more optical parameters of a lens
ES2979076T3 (es) 2015-05-10 2024-09-24 6 OVER 6 VISION Ltd Aparato, sistema y método de determinar uno o más parámetros ópticos de una lente
RU2738913C2 (ru) * 2016-01-23 2020-12-18 6 Овер 6 Вижн Лтд. Устройство, система и способ определения одного или более оптических параметров линзы
CN112556990B (zh) * 2019-09-10 2025-02-14 宁波法里奥光学科技发展有限公司 镜片折射率测量装置及其测量方法
CN110514411B (zh) * 2019-09-10 2024-02-02 宁波法里奥光学科技发展有限公司 镜片折射率检测装置及方法
KR102791941B1 (ko) * 2022-03-29 2025-04-08 서울대학교산학협력단 박막 두께 측정장치 및 방법

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3539262A (en) * 1968-06-11 1970-11-10 Us Army Optical interferometer for high speed plasma diagnostics
US4072422A (en) * 1975-10-27 1978-02-07 Canon Kabushiki Kaisha Apparatus for interferometrically measuring the physical properties of test object
US4180325A (en) * 1977-07-05 1979-12-25 Humphrey Instruments, Inc. Lens meter with automated readout
SU1173177A1 (ru) * 1983-06-03 1985-08-15 Новосибирский Институт Инженеров Геодезии,Аэрофотосъемки И Картографии Устройство дл измерени перемещени объектов и показателей преломлени прозрачных сред
JPS61178635A (ja) * 1985-02-04 1986-08-11 Canon Inc 波面収差測定用の干渉装置
US4685803A (en) * 1986-01-23 1987-08-11 Zygo Corporation Method and apparatus for the measurement of the refractive index of a gas
DE3703086A1 (de) * 1987-02-03 1988-08-11 Dieter Froelich Physikalische Laserinterferometer-refraktometer
DE3707331A1 (de) * 1987-03-07 1988-09-15 Zeiss Carl Fa Interferometer zur messung von optischen phasendifferenzen
US4733967A (en) * 1987-03-19 1988-03-29 Zygo Corporation Apparatus for the measurement of the refractive index of a gas
JPS6475903A (en) * 1987-09-18 1989-03-22 Ricoh Kk Method for measuring refractive index and film thickness
US5151752A (en) * 1988-06-16 1992-09-29 Asahi Kogaku Kogyo K.K. Method of measuring refractive indices of lens and sample liquid
JP2892075B2 (ja) * 1990-01-31 1999-05-17 末三 中楯 屈折率分布、透過波面の測定方法およびこの方法に用いる測定装置
JP2672738B2 (ja) * 1991-10-22 1997-11-05 ホーヤ株式会社 屈折率測定方法及び装置

Also Published As

Publication number Publication date
DE69525481D1 (de) 2002-03-28
JP3645933B2 (ja) 2005-05-11
CA2146300A1 (en) 1995-10-06
EP0676629A3 (en) 1997-10-29
EP0676629B1 (en) 2002-02-20
EP0676629A2 (en) 1995-10-11
US5469261A (en) 1995-11-21
JPH07286939A (ja) 1995-10-31
CA2146300C (en) 1999-06-15

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