ES2175129T3 - Adaptador generador de prueba de interfaz. - Google Patents

Adaptador generador de prueba de interfaz.

Info

Publication number
ES2175129T3
ES2175129T3 ES96932262T ES96932262T ES2175129T3 ES 2175129 T3 ES2175129 T3 ES 2175129T3 ES 96932262 T ES96932262 T ES 96932262T ES 96932262 T ES96932262 T ES 96932262T ES 2175129 T3 ES2175129 T3 ES 2175129T3
Authority
ES
Spain
Prior art keywords
interface
test
frame
unit
contact pads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES96932262T
Other languages
English (en)
Inventor
Melvin G Oster
Brian Fuchs
Kenneth Reid
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BAE Systems Aircraft Controls Inc
Original Assignee
BAE Systems Aircraft Controls Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BAE Systems Aircraft Controls Inc filed Critical BAE Systems Aircraft Controls Inc
Application granted granted Critical
Publication of ES2175129T3 publication Critical patent/ES2175129T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

SE DESCRIBE UN ADAPTADOR DE PRUEBA DE INTERFAZ GENERICA PARA CONEXION ENTRE UNA ESTACION DE PRUEBA Y UNA UNIDAD SOMETIDA A PRUEBA. EL ADAPTADOR DE PRUEBA DE LA INTERFAZ GENERICA INCLUYE UN BASTIDOR DE INTERFAZ Y UN CONJUNTO DE TARJETAS DE CIRCUITO INTERCAMBIABLES CONFIGURADAS PARA ENCAMINAR LAS SEÑALES ENTRE LA ESTACION DE PRUEBA Y LA UNIDAD EN PRUEBAS. EL BASTIDOR DE INTERFAZ INCLUYE UN PLANO DE INTERFAZ QUE TIENE UN CONJUNTO DE PATILLAS DE CONTACTO O SONDAS CON MUELLE Y EL GRUPO DE TARJETAS DE CIRCUITO TIENE UNA SERIE DE ZONAS TERMINALES DE CONTACTO, ALINEADAS PARA ACOPLARSE CON LAS PATILLAS DE CONTACTO. LAS CONEXIONES ELECTRICAS ENTRE LA ESTACION DE PRUEBAS Y LA UNIDAD EN PRUEBAS PUEDEN RECONFIGURARSE CON SOLO CAMBIAR EL GRUPO DE TARJETAS DE CIRCUITO INTERCAMBIABLES. SE PROPORCIONA UN BASTIDOR DE PRESION PARA SUJETAR DE FORMA SEGURA EL CONJUNTO DE TARJETAS DE CIRCUITO CONTRA EL PLANO DE INTERFAZ CON OBJETO DE PROPORCIONAR CONEXION ELECTRICA. UN MECANISMO DE LEVA Y RANURA ANGULAR DE LEVAACCIONADO POR UN BRAZO DE PALANCA TIRA DEL BASTIDOR DE PRESION HACIA EL BASTIDOR DE INTERFAZ.
ES96932262T 1995-12-15 1996-09-18 Adaptador generador de prueba de interfaz. Expired - Lifetime ES2175129T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/573,026 US5793218A (en) 1995-12-15 1995-12-15 Generic interface test adapter

Publications (1)

Publication Number Publication Date
ES2175129T3 true ES2175129T3 (es) 2002-11-16

Family

ID=24290357

Family Applications (1)

Application Number Title Priority Date Filing Date
ES96932262T Expired - Lifetime ES2175129T3 (es) 1995-12-15 1996-09-18 Adaptador generador de prueba de interfaz.

Country Status (10)

Country Link
US (1) US5793218A (es)
EP (1) EP0866977B1 (es)
KR (1) KR100479136B1 (es)
AU (1) AU7112896A (es)
DE (1) DE69621152T2 (es)
ES (1) ES2175129T3 (es)
IN (1) IN189781B (es)
PT (1) PT866977E (es)
TW (1) TW312747B (es)
WO (1) WO1997022886A1 (es)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6178255B1 (en) * 1998-04-28 2001-01-23 Cross Match Technologies, Inc. Individualized fingerprint scanner
US6269319B1 (en) 1999-01-29 2001-07-31 The Mcdonnell Douglas Corporation Reconfigurable integration test station
US6272562B1 (en) * 1999-05-28 2001-08-07 Cross Match Technologies, Inc. Access control unit interface
US6239592B1 (en) * 1999-06-02 2001-05-29 Sun Microsystems, Inc. Test fixture with quick connect and release board interconnect mechanism
US6886104B1 (en) 1999-06-25 2005-04-26 Cross Match Technologies Rechargeable mobile hand-held fingerprint scanner with a data and power communication interface
US6744910B1 (en) 1999-06-25 2004-06-01 Cross Match Technologies, Inc. Hand-held fingerprint scanner with on-board image normalization data storage
JP2003506799A (ja) * 1999-08-09 2003-02-18 クロス マッチ テクノロジーズ， インコーポレイテッド Ｇｕｉと指紋スキャナとの間のインターフェースのための方法、システム、およびコンピュータプログラム製品
JP2003506793A (ja) * 1999-08-09 2003-02-18 クロス マッチ テクノロジーズ， インコーポレイテッド インターフェイスケーブルを介して位置アドレスおよびラインスキャンデータを有するパケットを送信するシステムおよび方法
US7162060B1 (en) 1999-08-09 2007-01-09 Cross Match Technologies Method, system, and computer program product for control of platen movement during a live scan
US6658164B1 (en) * 1999-08-09 2003-12-02 Cross Match Technologies, Inc. Calibration and correction in a fingerprint scanner
US6483932B1 (en) * 1999-08-19 2002-11-19 Cross Match Technologies, Inc. Method and apparatus for rolled fingerprint capture
WO2001031564A1 (en) 1999-10-22 2001-05-03 Cross Match Technologies, Inc. Adjustable, rotatable finger guide in a tenprint scanner with movable prism platen
ATE322720T1 (de) * 2000-08-18 2006-04-15 Cross Match Technologies Inc System und verfahren zum automatischen steuern eines fingerabdruckabtasters
US6611152B1 (en) 2000-10-31 2003-08-26 The Boeing Company Test adapter for configuring the electrical communication between a unit under test and an electronic test station and associated separator plate
US6928195B2 (en) 2000-12-18 2005-08-09 Cross Match Technologies, Inc. Palm scanner using a programmable nutating mirror for increased resolution
TW561263B (en) * 2001-03-10 2003-11-11 Samsung Electronics Co Ltd Parallel test board used in testing semiconductor memory devices
EP1390196A4 (en) 2001-04-26 2005-12-28 Cross Match Technologies Inc SILICONE RUBBER SURFACES FOR PRISMS WITH TOTAL INTERNAL REFLECTION (TIR) OF BIOMETRIC PRINTING
US6504730B1 (en) * 2001-07-23 2003-01-07 Hamilton Sundstrand Corporation Serviceable power modules for a power distribution assembly
US6841990B2 (en) * 2001-10-31 2005-01-11 Agilent Technologies, Inc. Mechanical interface for rapid replacement of RF fixture components
US7308122B2 (en) 2002-01-17 2007-12-11 Cross Match Technologies, Inc. Biometric imaging system and method
US6954260B2 (en) 2002-01-17 2005-10-11 Cross Match Technologies, Inc. Systems and methods for illuminating a platen in a print scanner
US6867850B2 (en) 2002-01-17 2005-03-15 Cross Match Technologies, Inc. Light wedge for illuminating a platen in a print scanner
JP2003307552A (ja) * 2002-04-17 2003-10-31 Tokyo Electron Ltd 信号検出用接触体及び信号校正装置
US6944768B2 (en) 2002-04-19 2005-09-13 Cross Match Technologies, Inc. System and methods for access control utilizing two factors to control access
US7073711B2 (en) 2002-04-19 2006-07-11 Cross Match Technologies, Inc. Mobile handheld code reader and print scanner system and method
US7079007B2 (en) 2002-04-19 2006-07-18 Cross Match Technologies, Inc. Systems and methods utilizing biometric data
WO2004013801A2 (en) 2002-08-02 2004-02-12 Cross Match Technologies, Inc. System and method for counting ridges in a captured print image
US6906544B1 (en) * 2003-02-14 2005-06-14 Cisco Technology, Inc. Methods and apparatus for testing a circuit board using a surface mountable adaptor
US7164440B2 (en) * 2003-02-28 2007-01-16 Cross Match Technologies, Inc. Dynamic image adaptation method for adjusting the quality of digital prints
EP1612571A4 (en) * 2003-04-04 2010-03-03 Advantest Corp CONNECTION UNIT, TEST HEAD AND TEST UNIT
US7277562B2 (en) 2003-08-01 2007-10-02 Cross Match Technologies, Inc. Biometric imaging capture system and method
US7082676B2 (en) * 2003-08-05 2006-08-01 Qualitau, Inc. Electrostatic discharge (ESD) tool for electronic device under test (DUT) boards
US20050047631A1 (en) * 2003-08-26 2005-03-03 Cross Match Technologies, Inc. Method and apparatus for rolled fingerprint image capture with variable blending
TWI273248B (en) 2006-01-26 2007-02-11 Au Optronics Corp Universal probing apparatus for TFT array test
WO2008128286A1 (en) * 2007-04-18 2008-10-30 Tiip Pty Ltd Test instrument enclosure
US20080295090A1 (en) * 2007-05-24 2008-11-27 Lockheed Martin Corporation Software configuration manager
US7866784B2 (en) * 2008-08-19 2011-01-11 Silverbrook Research Pty Ltd Diagnostic probe assembly for printhead integrated circuitry
DE102012103893A1 (de) * 2012-05-03 2013-11-07 Turbodynamics Gmbh Modul zum Austauschen einer Schnittstelleneinheit in einem Testsystem zum Testen von Halbleiterelementen und Testsystem mit einem solchen Modul
FR2996367B1 (fr) 2012-10-01 2014-10-03 Airbus Operations Sas Systeme de connexion pour connecter un equipement electronique, en particulier pour aeronef, a une unite de test.
CN106324460B (zh) * 2016-11-08 2024-03-22 沈小晴 一种可换针盘式通用测试机构
CN107608842B (zh) * 2017-10-31 2023-11-21 江苏特创科技有限公司 一种接口测试组件及接口测试装置
KR102107111B1 (ko) 2019-09-19 2020-05-06 한화시스템 주식회사 Lru 결합형 sru 시험 장치 및 방법
KR102466483B1 (ko) * 2021-12-20 2022-11-11 한화시스템 주식회사 다중 신호를 사용하는 sru를 위한 시험 장치 및 방법
CN116027124B (zh) * 2022-10-21 2026-02-27 深圳市朗科智能电气股份有限公司 一种可拆式模块化测试平台
US12117481B2 (en) * 2022-12-27 2024-10-15 Intelligent Memory Limited Autonomous detection of memory insertion into test equipment without requiring power to the tester unit

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3654585A (en) * 1970-03-11 1972-04-04 Brooks Research And Mfg Inc Coordinate conversion for the testing of printed circuit boards
US3751649A (en) * 1971-05-17 1973-08-07 Marcrodata Co Memory system exerciser
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
CA1038042A (en) * 1975-03-03 1978-09-05 Motorola Programmable probe fixture and method of connecting units under test with test equipment
US4352061A (en) * 1979-05-24 1982-09-28 Fairchild Camera & Instrument Corp. Universal test fixture employing interchangeable wired personalizers
DE3013215A1 (de) * 1980-04-03 1981-10-15 Luther & Maelzer Gmbh, 3050 Wunstorf Adapter fuer ein selbstprogrammierbares leiterplattenpruefgeraet
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
US4402055A (en) * 1981-01-27 1983-08-30 Westinghouse Electric Corp. Automatic test system utilizing interchangeable test devices
DE3116079A1 (de) * 1981-04-23 1982-11-11 Robert Bosch Gmbh, 7000 Stuttgart Pruefsystem
EP0115135A1 (en) * 1982-12-27 1984-08-08 Genrad, Inc. Electrical test fixture for printed circuit boards and the like
US4590581A (en) * 1983-05-09 1986-05-20 Valid Logic Systems, Inc. Method and apparatus for modeling systems of complex circuits
US4551675A (en) * 1983-12-19 1985-11-05 Ncr Corporation Apparatus for testing printed circuit boards
DK291184D0 (da) * 1984-06-13 1984-06-13 Boeegh Petersen Allan Fremgangsmaade og indretning til test af kredsloebsplader
JPS6125263A (ja) * 1984-07-13 1986-02-04 Sony Corp 電子機器制御システム
US4724383A (en) * 1985-05-03 1988-02-09 Testsystems, Inc. PC board test fixture
US4899306A (en) * 1985-08-26 1990-02-06 American Telephone And Telegraph Company, At&T Bell Laboratories Test interface circuit which generates different interface control signals for different target computers responding to control signals from host computer
US4716500A (en) * 1985-10-18 1987-12-29 Tektronix, Inc. Probe cable assembly
US4718064A (en) * 1986-02-28 1988-01-05 Western Digital Corporation Automatic test system
US4901259A (en) * 1988-08-15 1990-02-13 Lsi Logic Corporation Asic emulator
US5291129A (en) * 1988-10-24 1994-03-01 Nhk Spring Co., Ltd. Contact probe
CN1045655A (zh) * 1988-11-23 1990-09-26 约翰弗兰克制造公司 系统自动诊断的内核测试接口和方法
US5036479A (en) * 1989-04-20 1991-07-30 Trw Inc. Modular automated avionics test system
US5058110A (en) * 1989-05-03 1991-10-15 Ultra Network Technologies Protocol processor
NL9001478A (nl) * 1990-06-28 1992-01-16 Philips Nv Testinrichting voor electrische schakelingen op panelen.
US5103378A (en) * 1990-09-21 1992-04-07 Virginia Panel Corporation Hinged interlocking receiver for mainframe card cage
US5196789A (en) * 1991-01-28 1993-03-23 Golden Joseph R Coaxial spring contact probe
US5218302A (en) * 1991-02-06 1993-06-08 Sun Electric Corporation Interface for coupling an analyzer to a distributorless ignition system
US5223788A (en) * 1991-09-12 1993-06-29 Grumman Aerospace Corporation Functional avionic core tester
US5357519A (en) * 1991-10-03 1994-10-18 Apple Computer, Inc. Diagnostic system
US5175493A (en) * 1991-10-11 1992-12-29 Interconnect Devices, Inc. Shielded electrical contact spring probe assembly
US5406199A (en) * 1993-07-28 1995-04-11 At&T Corp. Test fixture carrying a channel card for logic level translation

Also Published As

Publication number Publication date
EP0866977B1 (en) 2002-05-08
DE69621152D1 (de) 2002-06-13
IN189781B (es) 2003-04-19
WO1997022886A1 (en) 1997-06-26
PT866977E (pt) 2002-09-30
DE69621152T2 (de) 2003-01-02
TW312747B (es) 1997-08-11
KR100479136B1 (ko) 2005-05-16
US5793218A (en) 1998-08-11
AU7112896A (en) 1997-07-14
EP0866977A1 (en) 1998-09-30
HK1011223A1 (en) 1999-07-09
KR20000064402A (ko) 2000-11-06

Similar Documents

Publication Publication Date Title
ES2175129T3 (es) Adaptador generador de prueba de interfaz.
MXPA03011230A (es) Conjunto de interposicion y metodo.
ES2171274T3 (es) Procedimiento para la fabricacion de un modulo de tarjeta de chip para una tarjeta de chip combinada.
MX9304484A (es) Sistema de comunicacion entre dispositivos de comunicacion portatiles.
ES2175815T3 (es) Procedimiento de telecomunicacion y sistema apropiado para establecer una comunicacion con un aparato movil.
EP0236963A3 (en) Contact member in form of a resilient socket contact, or a resilient pin, and process for manufacturing the same
KR910005382A (ko) 반도체기판의 접착방법 및 접착장치
EP1437804A3 (en) Electrical adapter
ES2145758T3 (es) Conector con filtro de alta densidad.
CO4650089A1 (es) Contacto elastomerico para conectar circuitos electricos montados sobre sustratos separados
ES2077671T3 (es) Zocalo para un portador de chip de bajo perfil.
ES2148754T3 (es) Conector electrico.
BRPI0417278A (pt) alojamento de conector
BR0317407A (pt) Subconjunto eletromecânico
AR241255A1 (es) Conjunto conector electrico.
ES2050890T3 (es) Disposicion de contactos para selectores de etapas de transformadores escalonados.
WO2023235843A3 (en) Methods, systems, and devices for sample interface
DE3271412D1 (en) Lightbulb socket
ES8402982A1 (es) Perfeccionamientos en un conector de circuito hibrido.
US2205733A (en) Means for illuminating levels
DE3682020D1 (de) Glimmlampeneinsatz fuer elektrische installationsgeraete.
EP1120527A3 (de) Schaltleiste für eine Schliesskanten-Sicherung
DE69006488D1 (de) Erdankersystem.
ATE293845T1 (de) Isolierkörper mit kurzschlussfeder
ES2152093T3 (es) Lampara incandescente pequeña, y portalamparas para lampara incandescente pequeña.

Legal Events

Date Code Title Description
FG2A Definitive protection

Ref document number: 866977

Country of ref document: ES