ES2528865B2 - Dispositivo de medida de temperatura, método de fabricación del dispositivo y sistema de medida de punto de impacto que incorpora el dispositivo - Google Patents

Dispositivo de medida de temperatura, método de fabricación del dispositivo y sistema de medida de punto de impacto que incorpora el dispositivo Download PDF

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Publication number
ES2528865B2
ES2528865B2 ES201431244A ES201431244A ES2528865B2 ES 2528865 B2 ES2528865 B2 ES 2528865B2 ES 201431244 A ES201431244 A ES 201431244A ES 201431244 A ES201431244 A ES 201431244A ES 2528865 B2 ES2528865 B2 ES 2528865B2
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ES
Spain
Prior art keywords
incorporates
impact point
temperature measuring
manufacturing
area
Prior art date
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Active
Application number
ES201431244A
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English (en)
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ES2528865A1 (es
Inventor
José Francisco RIVADULLA FERNÁNDEZ
Tinh CONG BUI
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Santiago de Compostela
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University of Santiago de Compostela
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to ES201431244A priority Critical patent/ES2528865B2/es
Application filed by University of Santiago de Compostela filed Critical University of Santiago de Compostela
Publication of ES2528865A1 publication Critical patent/ES2528865A1/es
Application granted granted Critical
Publication of ES2528865B2 publication Critical patent/ES2528865B2/es
Priority to EP15834428.3A priority patent/EP3184981A4/en
Priority to KR1020177007066A priority patent/KR20170045252A/ko
Priority to JP2017507448A priority patent/JP2017532534A/ja
Priority to PCT/ES2015/070626 priority patent/WO2016026996A1/es
Priority to US15/505,566 priority patent/US20170268936A1/en
Priority to CN201580044622.7A priority patent/CN107076622A/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/36—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using magnetic elements, e.g. magnets, coils
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02G—INSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
    • H02G3/00—Installations of electric cables or lines or protective tubing therefor in or on buildings, equivalent structures or vehicles
    • H02G3/02—Details
    • H02G3/04—Protective tubing or conduits, e.g. cable ladders or cable troughs
    • H02G3/0456—Ladders or other supports
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/70—Nanostructure
    • Y10S977/755—Nanosheet or quantum barrier/well, i.e. layer structure having one dimension or thickness of 100 nm or less
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/953—Detector using nanostructure
    • Y10S977/955—Of thermal property

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Architecture (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Hard Magnetic Materials (AREA)
  • Radiation Pyrometers (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Hall/Mr Elements (AREA)
  • Thermal Sciences (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)

Abstract

Dispositivo de medida de temperatura, método de fabricación del dispositivo y sistema de medida de punto de impacto que incorpora el dispositivo. En un aspecto la invención refiere a un dispositivo de medida de temperatura que comprende una lámina de película fina de material magnético-metálico de manera que, en funcionamiento y en presencia de un campo magnético aplicado, una variación de la temperatura en una zona de la lámina genera una tensión eléctrica en la zona, siendo leíble esta tensión eléctrica generada, a través de medios para la lectura de la tensión eléctrica correspondientes a la zona. En otro aspecto la invención se refiere a un procedimiento para la fabricación del dispositivo. En otro aspecto la invención se refiere a un sistema de medida de punto de impacto, de radiación o de partículas, que incorpora el dispositivo.

Description

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Claims (1)

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ES201431244A 2014-08-21 2014-08-21 Dispositivo de medida de temperatura, método de fabricación del dispositivo y sistema de medida de punto de impacto que incorpora el dispositivo Active ES2528865B2 (es)

Priority Applications (7)

Application Number Priority Date Filing Date Title
ES201431244A ES2528865B2 (es) 2014-08-21 2014-08-21 Dispositivo de medida de temperatura, método de fabricación del dispositivo y sistema de medida de punto de impacto que incorpora el dispositivo
EP15834428.3A EP3184981A4 (en) 2014-08-21 2015-08-17 Temperature-measuring device, method for manufacturing the device, and system for measuring the point of impact incorporated in the device
CN201580044622.7A CN107076622A (zh) 2014-08-21 2015-08-17 温度测量设备、设备制造方法以及包括该设备的碰撞点测量系统
US15/505,566 US20170268936A1 (en) 2014-08-21 2015-08-17 Temperature-measuring device, method for manufacturing the device, and system for measuring the point of impact incorporated in the device
KR1020177007066A KR20170045252A (ko) 2014-08-21 2015-08-17 온도-측정 장치, 장치의 제조 방법 및 장치를 포함하는 충격 지점 측정 시스템
JP2017507448A JP2017532534A (ja) 2014-08-21 2015-08-17 温度測定デバイス、デバイスの製造方法及びデバイスに組み込まれた衝突点測定システム
PCT/ES2015/070626 WO2016026996A1 (es) 2014-08-21 2015-08-17 Dispositivo de medida de temperatura, método de fabricación del dispositivo y sistema de medida de punto de impacto que incorpora el dispositivo

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES201431244A ES2528865B2 (es) 2014-08-21 2014-08-21 Dispositivo de medida de temperatura, método de fabricación del dispositivo y sistema de medida de punto de impacto que incorpora el dispositivo

Publications (2)

Publication Number Publication Date
ES2528865A1 ES2528865A1 (es) 2015-02-12
ES2528865B2 true ES2528865B2 (es) 2015-05-12

Family

ID=52452822

Family Applications (1)

Application Number Title Priority Date Filing Date
ES201431244A Active ES2528865B2 (es) 2014-08-21 2014-08-21 Dispositivo de medida de temperatura, método de fabricación del dispositivo y sistema de medida de punto de impacto que incorpora el dispositivo

Country Status (7)

Country Link
US (1) US20170268936A1 (es)
EP (1) EP3184981A4 (es)
JP (1) JP2017532534A (es)
KR (1) KR20170045252A (es)
CN (1) CN107076622A (es)
ES (1) ES2528865B2 (es)
WO (1) WO2016026996A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110440831A (zh) * 2019-07-05 2019-11-12 华南师范大学 一种传感器及其制备方法
CN111551581B (zh) * 2020-05-12 2023-10-03 南方科技大学 一种热电材料性能测量系统
KR102923734B1 (ko) 2020-12-04 2026-02-04 삼성전자주식회사 원적외선 검출 소자, 원적외선 검출 소자 어레이 구조, 원적외선 온도 검출 장치 및 열화상 표시 장치

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4603372A (en) * 1984-11-05 1986-07-29 Direction De La Meteorologie Du Ministere Des Transports Method of fabricating a temperature or humidity sensor of the thin film type, and sensors obtained thereby
US4898471A (en) * 1987-06-18 1990-02-06 Tencor Instruments Particle detection on patterned wafers and the like
JPH01132105A (ja) * 1987-11-18 1989-05-24 Hitachi Ltd 超伝導磁性微粒子およびその用途
US5792569A (en) * 1996-03-19 1998-08-11 International Business Machines Corporation Magnetic devices and sensors based on perovskite manganese oxide materials
CN1166015C (zh) * 1998-06-22 2004-09-08 索尼株式会社 磁隧道器件、其制造方法及磁头
JP2005233645A (ja) * 2004-02-17 2005-09-02 Mirapuro:Kk 温度計測器
JP2006003320A (ja) * 2004-06-21 2006-01-05 Mirapuro:Kk 温度計測器
DE102004052647B4 (de) * 2004-10-29 2009-01-02 Qimonda Ag Methode zur Verbesserung der thermischen Eigenschaften von Halbleiter-Speicherzellen im Herstellungsverfahren und nichtflüchtige, resistiv schaltende Speicherzelle
FR2923602B1 (fr) * 2007-11-12 2009-11-20 Commissariat Energie Atomique Detecteur de rayonnement electromagnetique a thermometre a nanofil et procede de realisation
WO2012153642A1 (ja) * 2011-05-09 2012-11-15 日本電気株式会社 位置検出装置
JP6092856B2 (ja) * 2011-06-24 2017-03-08 カウンシル オブ サイエンティフィック アンド インダストリアル リサーチ 抵抗スイッチングのための高感度磁性制御ヘテロ接合デバイス
JP5849344B2 (ja) * 2011-08-09 2016-01-27 日本電気株式会社 位置検出装置
WO2013069471A1 (ja) * 2011-11-09 2013-05-16 独立行政法人科学技術振興機構 固体電子装置
CN102573158B (zh) * 2012-01-05 2014-04-09 江苏舾普泰克自动化科技有限公司 一种电磁感应式金属表面涂层去除方法及其设备

Also Published As

Publication number Publication date
CN107076622A (zh) 2017-08-18
WO2016026996A1 (es) 2016-02-25
JP2017532534A (ja) 2017-11-02
KR20170045252A (ko) 2017-04-26
EP3184981A1 (en) 2017-06-28
EP3184981A4 (en) 2018-04-04
ES2528865A1 (es) 2015-02-12
US20170268936A1 (en) 2017-09-21

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