Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B11/00—Measuring arrangements characterised by the use of optical techniques
  • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
  • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
  • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
  • G01B11/0675—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using interferometry
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B9/00—Measuring instruments characterised by the use of optical techniques
  • G01B9/02—Interferometers
  • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
  • G01B9/02007—Two or more frequencies or sources used for interferometric measurement
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B9/00—Measuring instruments characterised by the use of optical techniques
  • G01B9/02—Interferometers
  • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
  • G01B9/02062—Active error reduction, i.e. varying with time
  • G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
  • G01B9/02065—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry using a second interferometer before or after measuring interferometer

Landscapes

• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Length Measuring Devices By Optical Means (AREA)
• Instruments For Measurement Of Length By Optical Means (AREA)

Applications Claiming Priority (1)

Publications (1)

Family

ID=25169136

Family Applications (1)

Country Status (5)

Families Citing this family (2)

• 1969
  • 1969-12-12 DE DE19691962359 patent/DE1962359A1/de active Pending
  • 1969-12-15 FR FR6943355A patent/FR2030857A5/fr not_active Expired
  • 1969-12-24 ES ES374897A patent/ES374897A1/es not_active Expired
  • 1969-12-30 NL NL6919571A patent/NL6919571A/xx unknown
  • 1969-12-30 BR BR21574569A patent/BR6915745D0/pt unknown

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