ES8401626A1 - "un circuito para generar una senal de comparacion en un aparato para detectar defectos en objetos". - Google Patents

"un circuito para generar una senal de comparacion en un aparato para detectar defectos en objetos".

Info

Publication number
ES8401626A1
ES8401626A1 ES516747A ES516747A ES8401626A1 ES 8401626 A1 ES8401626 A1 ES 8401626A1 ES 516747 A ES516747 A ES 516747A ES 516747 A ES516747 A ES 516747A ES 8401626 A1 ES8401626 A1 ES 8401626A1
Authority
ES
Spain
Prior art keywords
ratio
video signals
data signals
inspection device
comparing data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES516747A
Other languages
English (en)
Other versions
ES516747A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OI Glass Inc
Original Assignee
Owens Illinois Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Owens Illinois Inc filed Critical Owens Illinois Inc
Publication of ES8401626A1 publication Critical patent/ES8401626A1/es
Publication of ES516747A0 publication Critical patent/ES516747A0/es
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Closed-Circuit Television Systems (AREA)

Abstract

CIRCUITO PARA GENERAR UNA SEÑAL DE COMPARACION EN UN APARATO PARA DETECTAR DEFECTOS EN OBJETOS. COMPRENDE UNA CAMARA (10) QUE GENERE UNA PLURALIDAD DE SEÑALES EN LINEAS (12) CONECTADAS A UN MUESTREADOR (14) Y QUE, MEDIANTE OTRAS LINEAS (16), SE CONECTA A UN CIRCUITO DE COMPARACION (102). EXISTE UN CONTA DOR DE DIODO (60) QUE SELECCIONA LA SEÑAL DESDE UNA MEMORIA RAM (58), LA CUAL SE LLEVA A UN CIRCUITO SUMADOR (64).EXISTEN DIFERENTES ALTERNATIVAS PARA EL CIRCUITO DE COMPARACION.
ES516747A 1981-11-23 1982-10-22 "un circuito para generar una senal de comparacion en un aparato para detectar defectos en objetos". Granted ES516747A0 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/323,793 US4432013A (en) 1981-11-23 1981-11-23 Method and apparatus for comparing data signals in a container inspection device

Publications (2)

Publication Number Publication Date
ES8401626A1 true ES8401626A1 (es) 1983-12-16
ES516747A0 ES516747A0 (es) 1983-12-16

Family

ID=23260747

Family Applications (3)

Application Number Title Priority Date Filing Date
ES516747A Granted ES516747A0 (es) 1981-11-23 1982-10-22 "un circuito para generar una senal de comparacion en un aparato para detectar defectos en objetos".
ES525566A Granted ES525566A0 (es) 1981-11-23 1983-09-13 Un metodo para generar una senal de comparacion que representa la diferencia en magnitud de dos senales de video analogicas
ES525567A Expired ES8405947A1 (es) 1981-11-23 1983-09-13 Un aparato de inspeccion de objetos y un metodo correspondiente

Family Applications After (2)

Application Number Title Priority Date Filing Date
ES525566A Granted ES525566A0 (es) 1981-11-23 1983-09-13 Un metodo para generar una senal de comparacion que representa la diferencia en magnitud de dos senales de video analogicas
ES525567A Expired ES8405947A1 (es) 1981-11-23 1983-09-13 Un aparato de inspeccion de objetos y un metodo correspondiente

Country Status (16)

Country Link
US (1) US4432013A (es)
JP (1) JPS5892068A (es)
AU (1) AU530883B2 (es)
BR (1) BR8206752A (es)
CA (1) CA1185672A (es)
DE (1) DE3240635A1 (es)
ES (3) ES516747A0 (es)
FR (1) FR2517065B1 (es)
GB (1) GB2109928B (es)
GR (1) GR76784B (es)
IT (1) IT1148479B (es)
MX (1) MX154936A (es)
NL (1) NL191189C (es)
PH (1) PH19476A (es)
PT (1) PT75880A (es)
ZA (1) ZA827418B (es)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0085380B1 (en) * 1982-01-25 1988-07-27 Hitachi, Ltd. Method for testing a joint
DE3314465A1 (de) * 1983-04-21 1984-10-25 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur optischen oberflaechenpruefung
DE3412503A1 (de) * 1984-04-03 1985-10-10 Siemens AG, 1000 Berlin und 8000 München Verfahren und vorrichtung zur auswertung eines mit einem bildwandler erfassten videobildes
US4595836A (en) * 1984-06-29 1986-06-17 International Business Machines Corporation Alignment correction technique
JPS6147542A (ja) * 1984-08-13 1986-03-08 Fuji Photo Film Co Ltd 感光フィルムの表面検査方法および装置
JPS61193009A (ja) * 1985-02-22 1986-08-27 Toyo Glass Kk 容器の開口天面欠陥検査方法
GB2197463B (en) * 1986-10-30 1990-10-31 Charles Thomas Austin Hardness testing machine
US4760270A (en) * 1987-06-04 1988-07-26 Owens-Illinois Television Products Inc. Method of and apparatus for comparing data signals in an electrooptical inspection system
US7971497B2 (en) * 2007-11-26 2011-07-05 Air Products And Chemicals, Inc. Devices and methods for performing inspections, repairs, and/or other operations within vessels

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3863248A (en) * 1973-01-02 1975-01-28 Univ Sherbrooke Digital compressor-expander
US3877821A (en) * 1973-07-23 1975-04-15 Inex Inc Apparatus for detecting flaws using an array of photo sensitive devices
US3949162A (en) * 1974-02-25 1976-04-06 Actron Industries, Inc. Detector array fixed-pattern noise compensation
US3958127A (en) * 1974-08-09 1976-05-18 E. I. Du Pont De Nemours And Company Optical-electrical web inspection system
US4136930A (en) * 1977-01-10 1979-01-30 The Coca-Cola Company Method and apparatus for detecting foreign particles in full beverage containers
JPS54130828A (en) * 1978-03-31 1979-10-11 Canon Inc Photo sensor array device and image scanner using it
JPS54172625U (es) * 1978-05-24 1979-12-06
GB2025037A (en) * 1978-06-26 1980-01-16 Agfa Gevaert Nv Photoelectric detection of flaws in sheets
US4292672A (en) * 1979-03-19 1981-09-29 Rca Corporation Inspection system for detecting defects in regular patterns
US4437116A (en) * 1980-12-22 1984-03-13 Owens-Illinois, Inc. Method and apparatus for comparing data signals in a container inspection device

Also Published As

Publication number Publication date
GB2109928B (en) 1985-08-14
ES8405946A1 (es) 1984-06-16
PH19476A (en) 1986-05-14
PT75880A (en) 1982-12-01
GR76784B (es) 1984-09-04
MX154936A (es) 1988-01-08
BR8206752A (pt) 1983-10-04
JPS5892068A (ja) 1983-06-01
ZA827418B (en) 1983-08-31
JPH0225221B2 (es) 1990-06-01
ES525566A0 (es) 1984-06-16
DE3240635A1 (de) 1983-06-01
GB2109928A (en) 1983-06-08
DE3240635C2 (es) 1989-03-16
AU8920482A (en) 1983-06-02
US4432013A (en) 1984-02-14
NL191189C (nl) 1995-03-01
NL8204107A (nl) 1983-06-16
ES525567A0 (es) 1984-06-16
CA1185672A (en) 1985-04-16
ES8405947A1 (es) 1984-06-16
AU530883B2 (en) 1983-08-04
IT1148479B (it) 1986-12-03
ES516747A0 (es) 1983-12-16
FR2517065B1 (fr) 1986-11-21
NL191189B (nl) 1994-10-03
FR2517065A1 (fr) 1983-05-27
IT8249531A0 (it) 1982-11-19

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