IL63781A - System for defect analysis in manufactured parts such as turbine blades - Google Patents

System for defect analysis in manufactured parts such as turbine blades

Info

Publication number
IL63781A
IL63781A IL63781A IL6378181A IL63781A IL 63781 A IL63781 A IL 63781A IL 63781 A IL63781 A IL 63781A IL 6378181 A IL6378181 A IL 6378181A IL 63781 A IL63781 A IL 63781A
Authority
IL
Israel
Prior art keywords
turbine blades
defect analysis
manufactured parts
manufactured
parts
Prior art date
Application number
IL63781A
Other languages
English (en)
Original Assignee
Trw Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trw Inc filed Critical Trw Inc
Publication of IL63781A publication Critical patent/IL63781A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/187—Segmentation; Edge detection involving region growing; involving region merging; involving connected component labelling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N2021/646—Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20076—Probabilistic image processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
IL63781A 1980-09-19 1981-09-09 System for defect analysis in manufactured parts such as turbine blades IL63781A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18865180A 1980-09-19 1980-09-19

Publications (1)

Publication Number Publication Date
IL63781A true IL63781A (en) 1985-03-31

Family

ID=22694021

Family Applications (1)

Application Number Title Priority Date Filing Date
IL63781A IL63781A (en) 1980-09-19 1981-09-09 System for defect analysis in manufactured parts such as turbine blades

Country Status (8)

Country Link
EP (1) EP0048568A3 (de)
JP (1) JPS57118145A (de)
AU (1) AU7517681A (de)
BR (1) BR8105987A (de)
CA (1) CA1175555A (de)
ES (1) ES505606A0 (de)
IL (1) IL63781A (de)
MX (1) MX151484A (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
US4542527A (en) * 1982-05-17 1985-09-17 Tokyo Shibaura Denki Kabushiki Kaisha Image processing device for continuously extracting features of small regions of an image
FR2571519B1 (fr) * 1984-10-04 1986-12-26 Mounet Jean Francois Systeme de traitement de donnees
JPH0772718B2 (ja) * 1985-02-15 1995-08-02 株式会社日立製作所 外観検査装置
IL79098A0 (en) * 1985-07-15 1986-09-30 Visionetics Corp Fine flaw detector for printed circuit boards
US4918739A (en) * 1988-08-12 1990-04-17 Maraven, S.A. Process and system for digital analysis of images applied to stratigraphic data
GB2222879A (en) * 1988-09-15 1990-03-21 Gkn Technology Ltd Crack detecting apparatus
GB9008632D0 (en) * 1990-04-17 1990-06-13 Leicester Polytechnic Inspecting garments
JPH0820380B2 (ja) * 1990-07-30 1996-03-04 参天製薬株式会社 樹脂成形品の検査装置
IT1246047B (it) * 1990-12-21 1994-11-07 Pirelli Prod Diversificati Procedimento ed apparecchiatura per individuare difettosita' supeficiali su strati e/o manicotti in materiale elastomerico
US5147047A (en) * 1991-01-14 1992-09-15 Westinghouse Electric Corp. Pellet inspection system
JPH0678895B2 (ja) * 1991-01-24 1994-10-05 肇産業株式会社 欠陥判別方法
GB9105358D0 (en) * 1991-03-13 1991-04-24 Secr Defence Anomaly detector
EP0572336B1 (de) * 1992-05-29 2001-03-14 Eastman Kodak Company Vorrichtung und Verfahren zur Schichtdickenbestimmung mittels Bildverarbeitung
US5304519A (en) * 1992-10-28 1994-04-19 Praxair S.T. Technology, Inc. Powder feed composition for forming a refraction oxide coating, process used and article so produced
FI100366B (fi) * 1994-09-01 1997-11-14 Spectra Physics Visiontech Oy Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta
EP1016862A1 (de) * 1998-12-28 2000-07-05 Siemens Aktiengesellschaft Verfahren sowie Vorrichtung zur Qualitätsüberprüfung einer Beschichtung
US8775436B1 (en) * 2004-03-19 2014-07-08 Google Inc. Image selection for news search
US8208711B2 (en) * 2007-09-07 2012-06-26 General Electric Company Method for automatic identification of defects in turbine engine blades
CN102384839A (zh) * 2010-09-06 2012-03-21 信义超薄玻璃(东莞)有限公司 获取玻璃光学性能的装置
CN103175848B (zh) * 2013-02-05 2015-01-14 厦门大学 一种rcf型铣刀刃部崩缺在线检测方法
CN103473781B (zh) * 2013-09-22 2016-03-23 长安大学 一种公路岩体边坡图像中节理裂纹的分割方法
CN119147543B (zh) * 2024-09-13 2026-04-28 珠海格力电器股份有限公司 空调器翅片的缺陷检测方法及装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3694658A (en) * 1970-10-22 1972-09-26 Morvue Inc Veneer inspection system
US3729619A (en) * 1971-03-04 1973-04-24 Steel Corp Apparatus for surface inspection of moving material with defect type recognition
US4183013A (en) * 1976-11-29 1980-01-08 Coulter Electronics, Inc. System for extracting shape features from an image
US4237539A (en) * 1977-11-21 1980-12-02 E. I. Du Pont De Nemours And Company On-line web inspection system
DE3027373A1 (de) * 1979-07-20 1981-03-19 Hitachi, Ltd., Tokyo Verfahren und einrichtung zur oberflaechenpruefung
JPS5677704A (en) * 1979-11-30 1981-06-26 Hitachi Ltd Inspection system for surface defect of substance

Also Published As

Publication number Publication date
AU7517681A (en) 1982-03-25
MX151484A (es) 1984-12-03
CA1175555A (en) 1984-10-02
ES8302911A1 (es) 1982-12-01
EP0048568A3 (de) 1983-09-21
BR8105987A (pt) 1982-06-08
JPS57118145A (en) 1982-07-22
ES505606A0 (es) 1982-12-01
EP0048568A2 (de) 1982-03-31

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