IL68568A0 - Apparatus and method for automatic inspection of printed circuitboards - Google Patents

Apparatus and method for automatic inspection of printed circuitboards

Info

Publication number
IL68568A0
IL68568A0 IL68568A IL6856883A IL68568A0 IL 68568 A0 IL68568 A0 IL 68568A0 IL 68568 A IL68568 A IL 68568A IL 6856883 A IL6856883 A IL 6856883A IL 68568 A0 IL68568 A0 IL 68568A0
Authority
IL
Israel
Prior art keywords
automatic inspection
printed circuitboards
circuitboards
printed
inspection
Prior art date
Application number
IL68568A
Other languages
English (en)
Original Assignee
Optrotech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optrotech Ltd filed Critical Optrotech Ltd
Priority to IL68568A priority Critical patent/IL68568A0/xx
Publication of IL68568A0 publication Critical patent/IL68568A0/xx
Priority to AU27207/84A priority patent/AU2720784A/en
Priority to ZA843009A priority patent/ZA843009B/xx
Priority to JP59086069A priority patent/JPS6046470A/ja
Priority to EP84630072A priority patent/EP0128107A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/304—Contactless testing of printed or hybrid circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
IL68568A 1983-05-04 1983-05-04 Apparatus and method for automatic inspection of printed circuitboards IL68568A0 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
IL68568A IL68568A0 (en) 1983-05-04 1983-05-04 Apparatus and method for automatic inspection of printed circuitboards
AU27207/84A AU2720784A (en) 1983-05-04 1984-04-24 Printed circuit board testing apparatus
ZA843009A ZA843009B (en) 1983-05-04 1984-04-24 Apparatus and method for automatic inspection of printed circuit-boards
JP59086069A JPS6046470A (ja) 1983-05-04 1984-04-27 印刷回路基板検査装置
EP84630072A EP0128107A1 (fr) 1983-05-04 1984-05-02 Appareil et procédé d'inspection automatique de circuits imprimés

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL68568A IL68568A0 (en) 1983-05-04 1983-05-04 Apparatus and method for automatic inspection of printed circuitboards

Publications (1)

Publication Number Publication Date
IL68568A0 true IL68568A0 (en) 1983-09-30

Family

ID=11054222

Family Applications (1)

Application Number Title Priority Date Filing Date
IL68568A IL68568A0 (en) 1983-05-04 1983-05-04 Apparatus and method for automatic inspection of printed circuitboards

Country Status (5)

Country Link
EP (1) EP0128107A1 (fr)
JP (1) JPS6046470A (fr)
AU (1) AU2720784A (fr)
IL (1) IL68568A0 (fr)
ZA (1) ZA843009B (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0264482B1 (fr) * 1986-10-23 1991-12-18 International Business Machines Corporation Procédé de test sans contact sous conditions atmosphériques pour substrats de circuits intégrés
EP0264481B1 (fr) * 1986-10-23 1992-05-13 International Business Machines Corporation Procédé de test dans le vide pour substrats de circuits intégrés employant un laser
FR2623615B1 (fr) * 1987-11-20 1991-01-25 Thomson Csf Dispositif de mesure electronique d'une surface, notamment applicable au controle de connexion
US20010015641A1 (en) * 1998-09-23 2001-08-23 Mark A. Swart Circuit board testing apparatus
US6788078B2 (en) 2001-11-16 2004-09-07 Delaware Capital Formation, Inc. Apparatus for scan testing printed circuit boards

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD100564A1 (fr) * 1972-03-01 1973-09-20
DE2700252C2 (de) * 1977-01-05 1985-03-14 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zum Prüfen definierter Strukturen

Also Published As

Publication number Publication date
JPS6046470A (ja) 1985-03-13
EP0128107A1 (fr) 1984-12-12
AU2720784A (en) 1984-11-08
ZA843009B (en) 1984-11-28

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