IT1141597B - Metodo per ottenere un profilo di drogaggio a gradiente in silicio amorfo - Google Patents

Metodo per ottenere un profilo di drogaggio a gradiente in silicio amorfo

Info

Publication number
IT1141597B
IT1141597B IT26956/80A IT2695680A IT1141597B IT 1141597 B IT1141597 B IT 1141597B IT 26956/80 A IT26956/80 A IT 26956/80A IT 2695680 A IT2695680 A IT 2695680A IT 1141597 B IT1141597 B IT 1141597B
Authority
IT
Italy
Prior art keywords
obtaining
amorphous silicon
drawing profile
gradient drawing
gradient
Prior art date
Application number
IT26956/80A
Other languages
English (en)
Other versions
IT8026956A0 (it
Inventor
Theodore D Moustakas
Robert A Friedman
Christopher R Wronski
Original Assignee
Exxon Research Engineering Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Exxon Research Engineering Co filed Critical Exxon Research Engineering Co
Publication of IT8026956A0 publication Critical patent/IT8026956A0/it
Application granted granted Critical
Publication of IT1141597B publication Critical patent/IT1141597B/it

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/10Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
    • H10F71/103Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material including only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • H10F10/10Individual photovoltaic cells, e.g. solar cells having potential barriers
    • H10F10/18Photovoltaic cells having only Schottky potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/16Material structures, e.g. crystalline structures, film structures or crystal plane orientations
    • H10F77/162Non-monocrystalline materials, e.g. semiconductor particles embedded in insulating materials
    • H10F77/166Amorphous semiconductors
    • H10F77/1662Amorphous semiconductors including only Group IV materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/22Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using physical deposition, e.g. vacuum deposition or sputtering
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3202Materials thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3202Materials thereof
    • H10P14/3241Materials thereof being conductive materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3404Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
    • H10P14/3411Silicon, silicon germanium or germanium
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3438Doping during depositing
    • H10P14/3441Conductivity type
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3451Structure
    • H10P14/3452Microstructure
    • H10P14/3454Amorphous
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/548Amorphous silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product
IT26956/80A 1979-12-28 1980-12-24 Metodo per ottenere un profilo di drogaggio a gradiente in silicio amorfo IT1141597B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/108,024 US4251289A (en) 1979-12-28 1979-12-28 Gradient doping in amorphous silicon

Publications (2)

Publication Number Publication Date
IT8026956A0 IT8026956A0 (it) 1980-12-24
IT1141597B true IT1141597B (it) 1986-10-01

Family

ID=22319829

Family Applications (1)

Application Number Title Priority Date Filing Date
IT26956/80A IT1141597B (it) 1979-12-28 1980-12-24 Metodo per ottenere un profilo di drogaggio a gradiente in silicio amorfo

Country Status (8)

Country Link
US (1) US4251289A (it)
JP (1) JPS56101741A (it)
AU (1) AU538266B2 (it)
CA (1) CA1148669A (it)
DE (1) DE3048857A1 (it)
FR (1) FR2472835A1 (it)
GB (1) GB2066858B (it)
IT (1) IT1141597B (it)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4533450A (en) * 1979-12-31 1985-08-06 Exxon Research And Engineering Co. Control of the hydrogen bonding in reactively sputtered amorphous silicon
US5582947A (en) * 1981-01-16 1996-12-10 Canon Kabushiki Kaisha Glow discharge process for making photoconductive member
US4539283A (en) * 1981-01-16 1985-09-03 Canon Kabushiki Kaisha Amorphous silicon photoconductive member
US5258250A (en) * 1981-01-16 1993-11-02 Canon Kabushiki Kaisha Photoconductive member
US4490453A (en) * 1981-01-16 1984-12-25 Canon Kabushiki Kaisha Photoconductive member of a-silicon with nitrogen
US4464451A (en) * 1981-02-06 1984-08-07 Canon Kabushiki Kaisha Electrophotographic image-forming member having aluminum oxide layer on a substrate
US4417092A (en) * 1981-03-16 1983-11-22 Exxon Research And Engineering Co. Sputtered pin amorphous silicon semi-conductor device and method therefor
US4490208A (en) * 1981-07-08 1984-12-25 Agency Of Industrial Science And Technology Method of producing thin films of silicon
JPS5868971A (ja) * 1981-10-19 1983-04-25 Konishiroku Photo Ind Co Ltd 太陽電池の製造方法
US4536460A (en) * 1981-11-09 1985-08-20 Canon Kabushiki Kaisha Photoconductive member
US4423133A (en) * 1981-11-17 1983-12-27 Canon Kabushiki Kaisha Photoconductive member of amorphous silicon
US4460670A (en) * 1981-11-26 1984-07-17 Canon Kabushiki Kaisha Photoconductive member with α-Si and C, N or O and dopant
US4460669A (en) * 1981-11-26 1984-07-17 Canon Kabushiki Kaisha Photoconductive member with α-Si and C, U or D and dopant
US4465750A (en) * 1981-12-22 1984-08-14 Canon Kabushiki Kaisha Photoconductive member with a -Si having two layer regions
GB2115570B (en) * 1981-12-28 1985-07-10 Canon Kk Photoconductive member
DE3303266A1 (de) * 1982-02-01 1983-08-11 Canon K.K., Tokyo Fotoeleitfaehiges element
US4522905A (en) * 1982-02-04 1985-06-11 Canon Kk Amorphous silicon photoconductive member with interface and rectifying layers
US4452874A (en) * 1982-02-08 1984-06-05 Canon Kabushiki Kaisha Photoconductive member with multiple amorphous Si layers
US4452875A (en) * 1982-02-15 1984-06-05 Canon Kabushiki Kaisha Amorphous photoconductive member with α-Si interlayers
GB2117971A (en) * 1982-04-05 1983-10-19 Hitachi Ltd Amorphous silicon photovoltaic device
EP0103168A3 (en) * 1982-09-10 1986-07-02 Hitachi, Ltd. Amorphous silicon solar battery
JPS5955012A (ja) * 1982-09-24 1984-03-29 Mitsubishi Chem Ind Ltd アモルフアスシリコン半導体材料用基板
US4471036A (en) * 1983-06-29 1984-09-11 The United States Of America As Represented By The United States Department Of Energy Electrochemical photovoltaic cells and electrodes
DE3427637A1 (de) * 1983-07-26 1985-02-14 Konishiroku Photo Industry Co., Ltd., Tokio/Tokyo Photorezeptor und verfahren zu seiner herstellung
DE3417732A1 (de) * 1984-05-12 1986-07-10 Leybold-Heraeus GmbH, 5000 Köln Verfahren zum aufbringen von siliziumhaltigen schichten auf substraten durch katodenzerstaeubung und zerstaeubungskatode zur durchfuehrung des verfahrens
JPS613471A (ja) * 1984-06-15 1986-01-09 Kanegafuchi Chem Ind Co Ltd 半導体装置
US4681061A (en) * 1985-04-05 1987-07-21 Square D Company Button indicator and switch assembly
JPH0228372A (ja) * 1988-04-20 1990-01-30 Konica Corp イメージセンサ
TWI298472B (en) * 2003-12-15 2008-07-01 Hannstar Display Corp Pixel driving circuit and method thereof
US7601246B2 (en) * 2004-09-29 2009-10-13 Lam Research Corporation Methods of sputtering a protective coating on a semiconductor substrate
CN101910470B (zh) * 2008-10-30 2013-04-17 松下电器产业株式会社 光电化学电池及使用该光电化学电池的能量系统
JP5274663B2 (ja) 2009-08-05 2013-08-28 パナソニック株式会社 光電気化学セル及びそれを用いたエネルギーシステム
US8829342B2 (en) 2009-10-19 2014-09-09 The University Of Toledo Back contact buffer layer for thin-film solar cells
TWI497730B (zh) * 2009-10-20 2015-08-21 Iner Aec Executive Yuan 一種薄膜光伏裝置及其製造方法
EP2500449B1 (en) * 2009-11-10 2017-09-27 Panasonic Intellectual Property Management Co., Ltd. Photoelectrochemical cell and energy system using same
WO2011150290A2 (en) 2010-05-26 2011-12-01 The University Of Toledo Photovoltaic structures having a light scattering interface layer and methods of making the same
US9112103B1 (en) 2013-03-11 2015-08-18 Rayvio Corporation Backside transparent substrate roughening for UV light emitting diode
JPWO2014064769A1 (ja) * 2012-10-23 2016-09-05 パナソニックIpマネジメント株式会社 太陽電池
CN105132875B (zh) * 2015-08-31 2017-07-28 辽宁工业大学 一种扩散法制备高浓度梯度azo单晶导电薄膜的方法
EP4379427A1 (en) * 2022-12-01 2024-06-05 Consejo Superior De Investigaciones Científicas Silicon carbide dosimeter for high dose pulsed radiation

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3271637A (en) * 1963-07-22 1966-09-06 Nasa Gaas solar detector using manganese as a doping agent
GB1062998A (en) * 1964-12-16 1967-03-22 Ca Atomic Energy Ltd Large volume lithium-drifted diodes
US4196438A (en) * 1976-09-29 1980-04-01 Rca Corporation Article and device having an amorphous silicon containing a halogen and method of fabrication
US4177473A (en) * 1977-05-18 1979-12-04 Energy Conversion Devices, Inc. Amorphous semiconductor member and method of making the same
US4177474A (en) * 1977-05-18 1979-12-04 Energy Conversion Devices, Inc. High temperature amorphous semiconductor member and method of making the same
US4178415A (en) * 1978-03-22 1979-12-11 Energy Conversion Devices, Inc. Modified amorphous semiconductors and method of making the same
US4163677A (en) * 1978-04-28 1979-08-07 Rca Corporation Schottky barrier amorphous silicon solar cell with thin doped region adjacent metal Schottky barrier

Also Published As

Publication number Publication date
JPS56101741A (en) 1981-08-14
GB2066858B (en) 1983-08-24
FR2472835A1 (fr) 1981-07-03
AU6580980A (en) 1981-07-02
CA1148669A (en) 1983-06-21
US4251289A (en) 1981-02-17
GB2066858A (en) 1981-07-15
AU538266B2 (en) 1984-08-09
DE3048857A1 (de) 1981-09-17
FR2472835B1 (it) 1985-04-05
IT8026956A0 (it) 1980-12-24

Similar Documents

Publication Publication Date Title
IT1141597B (it) Metodo per ottenere un profilo di drogaggio a gradiente in silicio amorfo
BE878851A (fr) Porte-outil et procede pour fabrication
JPS5344622A (en) Immunologically measuring method
BG27743A3 (bg) Метод за получаване на аминоалкил-хетероцикли
AT376328B (de) Verfahren zum herstellen von silizium -photoelementen
JPS539446A (en) Method and device for scanning article profile
IT7949821A0 (it) Dispositivo di serraggio per oggetti a simmetria di rotazione
IT1133195B (it) Metodo per la misura di perdite
ES491033A0 (es) Dispositivo de patilla para montura de gafas
GB2041690B (en) Optical method for measuring distances and contours
IT1113780B (it) Metodo per formare articoli di calcestruzzo
IT1129686B (it) Metodo di fabbricazione di acciaio
IT1195255B (it) Metodo per la preparazione di indene
IT1090402B (it) Dispositivo e procedimento per la rifinitura di ingranaggi
ES492098A0 (es) Mejoras en un metodo de fabricacion de vidrio fundido
IT1074953B (it) Dispositivo e procedimento per il riscaldamento di un pezzo in lavorazione
IT1084009B (it) Apparecchio per il raccolto di steli o simili
MX145898A (es) Mejoras en metodo para formar envases de vidrio
IT1148720B (it) Metodo di formazione sintetica di diamanti
IT1112376B (it) Dispositivo di misura per pezzi in lavorazione
GB1538811A (en) Method for interferometric surface flatness investigation
AT353828B (de) Vorrichtung zum abschinittweisen herstellen einer mehrfeldrigen bruecke
JPS5347521A (en) Immunologically measuring method
IT1144865B (it) Metodo per accrescere lingotti di silicio
IT1209328B (it) Dispositivo atto a drenare in verticale.