ITMI912385A0 - Procedimento di verifica delle memorie di un microcalcolato9re programmato, mediante un microprogramma incorporato nello stesso microcalcolatore - Google Patents
Procedimento di verifica delle memorie di un microcalcolato9re programmato, mediante un microprogramma incorporato nello stesso microcalcolatoreInfo
- Publication number
- ITMI912385A0 ITMI912385A0 IT91MI2385A ITMI912385A ITMI912385A0 IT MI912385 A0 ITMI912385 A0 IT MI912385A0 IT 91MI2385 A IT91MI2385 A IT 91MI2385A IT MI912385 A ITMI912385 A IT MI912385A IT MI912385 A0 ITMI912385 A0 IT MI912385A0
- Authority
- IT
- Italy
- Prior art keywords
- microcomputation
- memories
- verification
- programmed
- procedure
- Prior art date
Links
- 238000000034 method Methods 0.000 title 1
- 238000012795 verification Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
- G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| ITMI912385A IT1251565B (it) | 1991-09-10 | 1991-09-10 | Procedimento di verifica delle memorie di un microcalcolatore programmato, mediante un microprogramma incorporato nello stesso microcalcolatore. |
| JP22385192A JP3184998B2 (ja) | 1991-09-10 | 1992-08-24 | マイクロコンピュータ自体に組込まれたマイクロプログラムによってプログラム化マイクロコンピュータのメモリをチェックするプロセス |
| DE69220740T DE69220740T2 (de) | 1991-09-10 | 1992-09-02 | Verfahren zum Prüfen von Speichern eines programmierten Mikrorechners mittels eines im besagten Mikrorechner eingebauten Mikroprogramms |
| EP92202654A EP0532087B1 (en) | 1991-09-10 | 1992-09-02 | Process for checking the memories of a programmed micro-computer, by means of a micro-programme incorporated in the micro-computer itself |
| US07/943,186 US5467358A (en) | 1991-09-10 | 1992-09-10 | Process for checking the memories of a programmed microcomputer by means of a micro-program incorporated in the microcomputer itself |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| ITMI912385A IT1251565B (it) | 1991-09-10 | 1991-09-10 | Procedimento di verifica delle memorie di un microcalcolatore programmato, mediante un microprogramma incorporato nello stesso microcalcolatore. |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| ITMI912385A0 true ITMI912385A0 (it) | 1991-09-10 |
| ITMI912385A1 ITMI912385A1 (it) | 1993-03-10 |
| IT1251565B IT1251565B (it) | 1995-05-17 |
Family
ID=11360634
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ITMI912385A IT1251565B (it) | 1991-09-10 | 1991-09-10 | Procedimento di verifica delle memorie di un microcalcolatore programmato, mediante un microprogramma incorporato nello stesso microcalcolatore. |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5467358A (it) |
| EP (1) | EP0532087B1 (it) |
| JP (1) | JP3184998B2 (it) |
| DE (1) | DE69220740T2 (it) |
| IT (1) | IT1251565B (it) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5883844A (en) * | 1997-05-23 | 1999-03-16 | Stmicroelectronics, Inc. | Method of stress testing integrated circuit having memory and integrated circuit having stress tester for memory thereof |
| CA2345605A1 (en) * | 2001-04-30 | 2002-10-30 | Robert A. Abbott | Method of testing embedded memory array and embedded memory controller for use therewith |
| US7367016B2 (en) * | 2003-07-14 | 2008-04-29 | Sun Microsystems, Inc. | Method and system for expressing the algorithms for the manipulation of hardware state using an abstract language |
| US7389455B2 (en) * | 2005-05-16 | 2008-06-17 | Texas Instruments Incorporated | Register file initialization to prevent unknown outputs during test |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57176600A (en) * | 1981-04-23 | 1982-10-29 | Mitsubishi Electric Corp | One chip microcomputer |
| JPS59119595A (ja) * | 1982-12-27 | 1984-07-10 | Hitachi Ltd | Ram内蔵論理lsi |
| US4744049A (en) * | 1984-10-15 | 1988-05-10 | Motorola, Inc. | Microcode testing of a cache in a data processor |
| US4878174A (en) * | 1987-11-03 | 1989-10-31 | Lsi Logic Corporation | Flexible ASIC microcomputer permitting the modular modification of dedicated functions and macroinstructions |
| JPH0719215B2 (ja) * | 1989-06-01 | 1995-03-06 | 三菱電機株式会社 | マイクロプロセッサ |
| US5153882A (en) * | 1990-03-29 | 1992-10-06 | National Semiconductor Corporation | Serial scan diagnostics apparatus and method for a memory device |
| US5224101A (en) * | 1990-05-16 | 1993-06-29 | The United States Of America As Represented By The Secretary Of The Air Force | Micro-coded built-in self-test apparatus for a memory array |
| US5130568A (en) * | 1990-11-05 | 1992-07-14 | Vertex Semiconductor Corporation | Scannable latch system and method |
-
1991
- 1991-09-10 IT ITMI912385A patent/IT1251565B/it active IP Right Grant
-
1992
- 1992-08-24 JP JP22385192A patent/JP3184998B2/ja not_active Expired - Fee Related
- 1992-09-02 DE DE69220740T patent/DE69220740T2/de not_active Expired - Fee Related
- 1992-09-02 EP EP92202654A patent/EP0532087B1/en not_active Expired - Lifetime
- 1992-09-10 US US07/943,186 patent/US5467358A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP0532087A3 (en) | 1993-10-20 |
| DE69220740T2 (de) | 1998-01-02 |
| JPH05324383A (ja) | 1993-12-07 |
| IT1251565B (it) | 1995-05-17 |
| DE69220740D1 (de) | 1997-08-14 |
| EP0532087A2 (en) | 1993-03-17 |
| EP0532087B1 (en) | 1997-07-09 |
| US5467358A (en) | 1995-11-14 |
| ITMI912385A1 (it) | 1993-03-10 |
| JP3184998B2 (ja) | 2001-07-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 0001 | Granted | ||
| TA | Fee payment date (situation as of event date), data collected since 19931001 |
Effective date: 19970929 |