ITTO20000817A0 - Motociclo. - Google Patents

Motociclo.

Info

Publication number: ITTO20000817A0
Authority: IT; Italy
Prior art keywords: motorcycle
Prior art date: 1999-08-31

Application number

IT2000TO000817A

Other languages

English (en)

Inventor

Toshihisa Nagashii

Tai Nakashima

Original Assignee

Honda Motor Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1999-08-31

Filing date

2000-08-25

Publication date

2000-08-25

2000-08-25 Application filed by Honda Motor Co Ltd filed Critical Honda Motor Co Ltd

2000-08-25 Publication of ITTO20000817A0 publication Critical patent/ITTO20000817A0/it

2002-02-25 Publication of ITTO20000817A1 publication Critical patent/ITTO20000817A1/it

2003-12-10 Application granted granted Critical

2003-12-10 Publication of IT1320603B1 publication Critical patent/IT1320603B1/it

Links

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/88—Mounting, supporting, spacing, or insulating of electrodes or of electrode assemblies
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing

Landscapes

Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
Computer Hardware Design (AREA)
General Physics & Mathematics (AREA)
Theoretical Computer Science (AREA)
Measuring Leads Or Probes (AREA)
Tests Of Electronic Circuits (AREA)
Testing Of Optical Devices Or Fibers (AREA)
Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Testing Electric Properties And Detecting Electric Faults (AREA)
Automatic Cycles, And Cycles In General (AREA)

IT2000TO000817A 1999-08-31 2000-08-25 Motociclo. IT1320603B1 (it)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP24510499A JP3350899B2 (ja)	1999-08-31	1999-08-31	プローブブロックの支持枠体

Publications (3)

Publication Number	Publication Date
ITTO20000817A0 true ITTO20000817A0 (it)	2000-08-25
ITTO20000817A1 ITTO20000817A1 (it)	2002-02-25
IT1320603B1 IT1320603B1 (it)	2003-12-10

Family

ID=17128684

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
IT2000TO000817A IT1320603B1 (it)	1999-08-31	2000-08-25	Motociclo.

Country Status (7)

Country	Link
US (1)	US6450469B1 (it)
EP (1)	EP1081497A3 (it)
JP (1)	JP3350899B2 (it)
KR (1)	KR20010020825A (it)
CN (1)	CN1145066C (it)
IT (1)	IT1320603B1 (it)
TW (1)	TW459140B (it)

Families Citing this family (42)

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US7073768B2 (en) *	2002-07-12	2006-07-11	John Piscovich	Device and method for setting a frame
JP3457938B2 (ja) *	2000-10-16	2003-10-20	株式会社双晶テック	表示基板又は回路基板の検査装置における表示基板又は回路基板の交換方法
TW509329U (en) *	2001-04-19	2002-11-01	Hannstar Display Corp	Electrified rack
KR20020091691A (ko) *	2001-05-31	2002-12-06	주식회사 현대 디스플레이 테크놀로지	액정표시장치 테스트 프레임
CN1309248C (zh) *	2002-08-02	2007-04-04	Nec液晶技术株式会社	显示器和显示板的支撑框架及其制造方法
US20040051693A1 (en) *	2002-09-12	2004-03-18	Ming-Jian Chen	Electronic screen having display panel displayed in changeable length-width ratio
US7012583B2 (en) *	2003-02-07	2006-03-14	Shimadzu Corporation	Apparatus and method for testing pixels of flat panel display
US7355418B2 (en)	2004-02-12	2008-04-08	Applied Materials, Inc.	Configurable prober for TFT LCD array test
US7319335B2 (en)	2004-02-12	2008-01-15	Applied Materials, Inc.	Configurable prober for TFT LCD array testing
US6833717B1 (en)	2004-02-12	2004-12-21	Applied Materials, Inc.	Electron beam test system with integrated substrate transfer module
JP4790997B2 (ja) *	2004-03-26	2011-10-12	株式会社日本マイクロニクス	プローブ装置
JP4570930B2 (ja) *	2004-10-22	2010-10-27	株式会社日本マイクロニクス	パネルの検査装置に用いられる電気的接続装置
KR100776177B1 (ko) *	2004-12-17	2007-11-16	주식회사 디이엔티	평판 표시패널 검사장치용 워크 테이블
US7535238B2 (en)	2005-04-29	2009-05-19	Applied Materials, Inc.	In-line electron beam test system
US20070018062A1 (en) *	2005-07-20	2007-01-25	Theodor Calinescu	Universal wall mount bracket for displays
KR100748072B1 (ko) *	2005-08-01	2007-08-09	가부시키가이샤 니혼 마이크로닉스	표시패널의 전기검사장치
JP4916712B2 (ja) *	2005-12-16	2012-04-18	株式会社日本マイクロニクス	表示パネル検査装置
US7569818B2 (en)	2006-03-14	2009-08-04	Applied Materials, Inc.	Method to reduce cross talk in a multi column e-beam test system
US7786742B2 (en)	2006-05-31	2010-08-31	Applied Materials, Inc.	Prober for electronic device testing on large area substrates
US7602199B2 (en)	2006-05-31	2009-10-13	Applied Materials, Inc.	Mini-prober for TFT-LCD testing
JP4917852B2 (ja) *	2006-08-21	2012-04-18	株式会社日本マイクロニクス	パネル支持機構及び検査装置
GB0711626D0 (en) *	2007-06-18	2007-07-25	Barco Nv	Support for direct light displays
KR100911236B1 (ko) *	2007-08-22	2009-08-06	주식회사 플라켐	블록형 엘이디 조명장치
JP4845897B2 (ja) *	2008-01-15	2011-12-28	株式会社東芝	サンプルステージ
KR100920383B1 (ko) *	2009-01-29	2009-10-07	주식회사 에이디피엔지니어링	평판표시소자 제조장치
CN102884567B (zh) *	2010-06-17	2015-01-28	夏普株式会社	点亮检查装置
KR101102556B1 (ko)	2010-06-30	2012-01-03	(주)이노셈코리아	맞춤형 소비전력 및 멀티형성을 갖는 탈·부착식 ｌｅｄ 모듈
CN102455528B (zh) *	2010-10-27	2015-01-07	纬创资通股份有限公司	结合上下盖外观件的平面显示器
TWI435294B (zh) *	2010-12-03	2014-04-21	Wistron Corp	無膠框結構的平面顯示器
US20130128513A1 (en) *	2011-11-18	2013-05-23	Shenzhen China Star Optoelectronics Technology Co., Ltd.	Mold for Back Frame and Bracing Piece, Method for Manufacturing Back Frame, and Backlight System
CN102830517B (zh) *	2012-08-28	2015-02-18	深圳市华星光电技术有限公司	一种背框和液晶显示装置
US8850992B1 (en) *	2013-05-22	2014-10-07	Itoro Akpaffiong	Portable articulated support frame for supporting objects on a user's lap
KR102242643B1 (ko) *	2014-10-30	2021-04-22	주성엔지니어링(주)	유기 발광 장치
CN104360510B (zh) *	2014-11-24	2018-02-16	合肥鑫晟光电科技有限公司	一种检测用探针块及其检测装置
KR102608599B1 (ko)	2018-08-16	2023-12-01	삼성디스플레이 주식회사	압력 센서를 테스트하는 장치 및 방법 그리고 이를 이용한 표시 장치
JP7202483B2 (ja) *	2019-04-17	2023-01-11	メガセン・カンパニー・リミテッド	マザーガラスパネル移送装置、ディスプレイパネル検査装置およびディスプレイパネル検査設備
KR102081609B1 (ko) *	2019-04-17	2020-02-26	우리마이크론(주)	원장 패널 이송 장치, 디스플레이 패널 검사 장치 및 디스플레이 패널 검사 설비
JP7250182B2 (ja) *	2019-07-01	2023-03-31	メガセン・カンパニー・リミテッド	ディスプレイパネル検査のためのプローブブロック組立体、この制御方法およびディスプレイパネル検査装置
KR102097456B1 (ko) *	2019-07-01	2020-04-07	우리마이크론(주)	디스플레이 패널 검사를 위한 프로브 블록 조립체, 이의 제어 방법 및 디스플레이 패널 검사 장치
KR102097455B1 (ko) *	2019-07-01	2020-04-07	우리마이크론(주)	디스플레이 패널 검사를 위한 프로브 블록 조립체, 이의 제어 방법 및 디스플레이 패널 검사 장치
KR102154758B1 (ko) *	2020-03-30	2020-09-10	우리마이크론(주)	디스플레이 패널 검사를 위한 프로브 블록 조립체, 이의 제어 방법 및 디스플레이 패널 검사 장치
KR102154760B1 (ko) *	2020-03-30	2020-09-10	우리마이크론(주)	디스플레이 패널 검사를 위한 프로브 블록 조립체, 이의 제어 방법 및 디스플레이 패널 검사 장치

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US3612508A (en) *	1970-04-08	1971-10-12	Gen Motors Corp	Heater core fixture for face soldering
JPS5391376A (en) *	1977-01-24	1978-08-11	Hirohide Yano	Device for inspecting printed board
US5003254A (en) *	1989-11-02	1991-03-26	Huntron, Inc.	Multi-axis universal circuit board test fixture
JPH0996802A (ja) *	1995-10-03	1997-04-08	Sharp Corp	液晶パネル製造用治具
JP3592831B2 (ja) *	1996-02-26	2004-11-24	株式会社日本マイクロニクス	プローブユニット及びその調節方法
US5954106A (en) *	1998-05-18	1999-09-21	Huang; Jin Lai	Work bench having an adjustable guide
US6150833A (en) *	1999-02-03	2000-11-21	Industrial Technology Research Institute	LCD panel power-up test fixture and method of using

1999
- 1999-08-31 JP JP24510499A patent/JP3350899B2/ja not_active Expired - Lifetime
2000
- 2000-04-26 TW TW089107918A patent/TW459140B/zh not_active IP Right Cessation
- 2000-05-05 US US09/566,010 patent/US6450469B1/en not_active Expired - Fee Related
- 2000-05-05 EP EP00303804A patent/EP1081497A3/en not_active Withdrawn
- 2000-05-10 KR KR1020000024824A patent/KR20010020825A/ko not_active Withdrawn
- 2000-06-06 CN CNB001179705A patent/CN1145066C/zh not_active Expired - Lifetime
- 2000-08-25 IT IT2000TO000817A patent/IT1320603B1/it active

Also Published As

Publication number	Publication date
KR20010020825A (ko)	2001-03-15
CN1145066C (zh)	2004-04-07
EP1081497A3 (en)	2004-05-12
EP1081497A2 (en)	2001-03-07
JP3350899B2 (ja)	2002-11-25
US6450469B1 (en)	2002-09-17
JP2001074599A (ja)	2001-03-23
TW459140B (en)	2001-10-11
ITTO20000817A1 (it)	2002-02-25
IT1320603B1 (it)	2003-12-10
CN1291728A (zh)	2001-04-18

Publication	Publication Date	Title
IT1320603B1 (it)	2003-12-10	Motociclo.
DE60008327D1 (de)	2004-03-25	Motorrad
ITRM20010537A0 (it)	2001-09-06	Motociclo.
DE60010177D1 (de)	2004-06-03	Rollerartiges Motorrad
MA25499A1 (fr)	2002-07-01	Contacteur-disjoncteur.
MA26849A1 (fr)	2004-12-20	4-pyridinyle-n-acyl-l-phenylalanines.
ITRM20010523A0 (it)	2001-08-30	Motociclo.
IT1320668B1 (it)	2003-12-10	Motociclo.
DE60041378D1 (de)	2009-03-05	Motorrad
ITBO990359A0 (it)	1999-06-30	Elettromandrino .
DE60029755D1 (de)	2006-09-14	Congawandschutz.
IT1320615B1 (it)	2003-12-10	Motociclo.
ITBO990358A0 (it)	1999-06-30	Elettromandrino .
BR0101022B1 (pt)	2009-08-11	motocicleta.
IT1320614B1 (it)	2003-12-10	Motociclo.
ITTO20010846A0 (it)	2001-09-05	Motociclo.
ITBO990075A0 (it)	1999-02-23	Bicicletta .
ITMO990032A0 (it)	1999-02-26	Bicicletta.
ES1044838Y (es)	2000-11-16	Friegasuelos.
ITSS990004V0 (it)	1999-06-08	Piramide - ricordo.
ES1044367Y (es)	2000-09-01	Piñata mejorada.
ITMO990086A0 (it)	1999-04-28	Monopattino perfezionato.
ES1045636Y (es)	2001-03-16	Triciclo.
ES1042390Y (es)	2000-02-01	Motocicleta.
ITTO20011139A0 (it)	2001-12-07	Motociclo.