ITTO990894A0 - Dispositivo e procedimento per testare un elaboratore durante il proce sso di fabbricazione. - Google Patents

Dispositivo e procedimento per testare un elaboratore durante il proce sso di fabbricazione.

Info

Publication number
ITTO990894A0
ITTO990894A0 IT99TO000894A ITTO990894A ITTO990894A0 IT TO990894 A0 ITTO990894 A0 IT TO990894A0 IT 99TO000894 A IT99TO000894 A IT 99TO000894A IT TO990894 A ITTO990894 A IT TO990894A IT TO990894 A0 ITTO990894 A0 IT TO990894A0
Authority
IT
Italy
Prior art keywords
testing
procedure
manufacturing process
computer during
computer
Prior art date
Application number
IT99TO000894A
Other languages
English (en)
Inventor
Subhashini Rajan
Roger Wong
Richard D Amberg
Original Assignee
Dell Usa Lp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dell Usa Lp filed Critical Dell Usa Lp
Publication of ITTO990894A0 publication Critical patent/ITTO990894A0/it
Publication of ITTO990894A1 publication Critical patent/ITTO990894A1/it
Application granted granted Critical
Publication of IT1309112B1 publication Critical patent/IT1309112B1/it

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/273Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)
  • Tests Of Electronic Circuits (AREA)
  • General Factory Administration (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Small-Scale Networks (AREA)
  • Cash Registers Or Receiving Machines (AREA)
  • Debugging And Monitoring (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
IT1999TO000894A 1998-10-22 1999-10-15 Dispositivo e procedimento per testare un elaboratore durante ilprocesso di fabbricazione. IT1309112B1 (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/177,420 US6285967B1 (en) 1998-10-22 1998-10-22 Troubleshooting computer systems during manufacturing using state and attribute information

Publications (3)

Publication Number Publication Date
ITTO990894A0 true ITTO990894A0 (it) 1999-10-15
ITTO990894A1 ITTO990894A1 (it) 2001-04-15
IT1309112B1 IT1309112B1 (it) 2002-01-16

Family

ID=22648530

Family Applications (1)

Application Number Title Priority Date Filing Date
IT1999TO000894A IT1309112B1 (it) 1998-10-22 1999-10-15 Dispositivo e procedimento per testare un elaboratore durante ilprocesso di fabbricazione.

Country Status (14)

Country Link
US (1) US6285967B1 (it)
JP (1) JP3256527B2 (it)
KR (1) KR100366149B1 (it)
CN (1) CN1111792C (it)
AU (1) AU765711B2 (it)
BR (1) BR9903728A (it)
DE (1) DE19949841B4 (it)
FR (1) FR2787903B1 (it)
GB (1) GB2346463B (it)
IE (2) IE20040367A1 (it)
IT (1) IT1309112B1 (it)
MY (1) MY115926A (it)
SG (3) SG128414A1 (it)
TW (1) TW454118B (it)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6477486B1 (en) * 1998-09-10 2002-11-05 Dell Usa, L.P. Automatic location determination of devices under test
US6654347B1 (en) * 1999-10-22 2003-11-25 Dell Usa L.P. Site-to-site dynamic virtual local area network
US6711798B2 (en) 2000-01-18 2004-03-30 Dell Products L.P. Method for manufacturing products according to customer orders
US6631606B2 (en) 2000-01-18 2003-10-14 Dell Products L.P. System and method for accommodating atypical customer requirements in a mass customization manufacturing facility
US6892104B2 (en) * 2000-01-18 2005-05-10 Dell Products L.P. System and method for manufacturing products according to customer orders
US6766267B2 (en) 2000-10-13 2004-07-20 Ciena Corporation Automated monitoring system, virtual oven and method for stress testing logically grouped modules
ES2346409T3 (es) * 2001-02-24 2010-10-15 International Business Machines Corporation Direccionamiento de ethernet mediante la ubicacion fisica para sistemas masivamente paralelos.
US6615092B2 (en) 2001-03-05 2003-09-02 Dell Products L.P. Method, system and facility for controlling resource allocation within a manufacturing environment
US6816746B2 (en) * 2001-03-05 2004-11-09 Dell Products L.P. Method and system for monitoring resources within a manufacturing environment
US20030055932A1 (en) * 2001-09-19 2003-03-20 Dell Products L.P. System and method for configuring a storage area network
GB2382168B (en) * 2001-11-15 2005-03-30 Inventec Corp Network-based computer testing system
US7024262B2 (en) 2002-03-26 2006-04-04 Seiko Epson Corporation Process management systems and methods of the same
US8027843B2 (en) * 2002-11-07 2011-09-27 International Business Machines Corporation On-demand supplemental diagnostic and service resource planning for mobile systems
US7266820B2 (en) * 2003-08-14 2007-09-04 Dell Products L.P. Trunked customized connectivity process for installing software onto an information handling system
RU2235367C1 (ru) * 2003-10-29 2004-08-27 Общество с ограниченной ответственностью "Совместное предприятие ПЕТРОКОМ" Система автоматизированного обучения планам локализации и ликвидации аварийных ситуаций
US7284120B2 (en) 2003-11-17 2007-10-16 Lenovo (Singapore) Pte. Ltd. Method and system for allowing a system under test (SUT) to boot a plurality of operating systems without a need for local media
US20050114640A1 (en) * 2003-11-17 2005-05-26 International Business Machines Corporation Method and system for efficiently binding a customer order with a processing system assembly in a manufacturing environment
US20050138205A1 (en) * 2003-12-17 2005-06-23 Schneider Automation Sas Bar Coded Addressing Technique
CN1299470C (zh) * 2004-06-01 2007-02-07 中兴通讯股份有限公司 一种网管系统的机架设备可视化的方法
US20060122879A1 (en) * 2004-12-07 2006-06-08 O'kelley Brian Method and system for pricing electronic advertisements
US8793587B2 (en) * 2005-06-29 2014-07-29 Hewlett-Packard Development Company, L.P. Interactive display of data center assets
US7853926B2 (en) * 2005-11-21 2010-12-14 International Business Machines Corporation Automated context-sensitive operating system switch
DE102007036664A1 (de) * 2007-08-03 2009-02-05 Wincor Nixdorf International Gmbh Verfahren und Vorrichtung zum Testen von Benutzerendgeräten
US8086834B2 (en) * 2009-04-16 2011-12-27 Dell Products L.P. System and method for populating a dedicated system service repository for an information handling system
US9495273B2 (en) * 2011-03-02 2016-11-15 Lenovo Enterprise Solutions (Singapore) Pte. Ltd Systems and methods for displaying blade chassis data
CN103675497A (zh) * 2012-09-18 2014-03-26 英业达科技有限公司 电子装置检测时的电子装置定位系统及其方法
US9158863B2 (en) * 2012-12-12 2015-10-13 Imagine Communications Corp. Data acquisition
US10754494B2 (en) 2015-06-23 2020-08-25 Dell Products, L.P. Method and control system providing one-click commissioning and push updates to distributed, large-scale information handling system (LIHS)
US10009232B2 (en) 2015-06-23 2018-06-26 Dell Products, L.P. Method and control system providing an interactive interface for device-level monitoring and servicing of distributed, large-scale information handling system (LIHS)
US10063629B2 (en) 2015-06-23 2018-08-28 Dell Products, L.P. Floating set points to optimize power allocation and use in data center
US10862799B2 (en) * 2018-11-19 2020-12-08 Dell Products, L.P. Virtual burn rack monitor
US11347675B2 (en) * 2020-02-18 2022-05-31 Dell Products L.P. System and method for dynamically configuring storage mapping

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1403048A (en) * 1919-10-01 1922-01-10 Ralph H Mecorney Theater-seat-indicating apparatus
US4899306A (en) * 1985-08-26 1990-02-06 American Telephone And Telegraph Company, At&T Bell Laboratories Test interface circuit which generates different interface control signals for different target computers responding to control signals from host computer
US4706208A (en) 1985-09-03 1987-11-10 American Telephone And Telegraph Company, At&T Bell Laboratories Technique for the operational life test of microprocessors
US4866714A (en) * 1987-10-15 1989-09-12 Westinghouse Electric Corp. Personal computer-based dynamic burn-in system
GB8908470D0 (en) * 1989-04-14 1989-06-01 Smiths Industries Plc Processors
US5325309A (en) * 1991-04-30 1994-06-28 Lsi Logic Corporation Method and apparatus for integrated circuit diagnosis
JPH05261649A (ja) * 1992-03-17 1993-10-12 Fujitsu Ltd 投入制御方式
US5557559A (en) 1992-07-06 1996-09-17 Motay Electronics, Inc. Universal burn-in driver system and method therefor
JPH06102317A (ja) * 1992-09-17 1994-04-15 Minoru Ogasawara 電子回路基板の検査方法
JPH06309011A (ja) * 1993-04-08 1994-11-04 Internatl Business Mach Corp <Ibm> Faシステムの生産セル制御装置
US5434775A (en) * 1993-11-04 1995-07-18 The General Hospital Corporation Managing an inventory of devices
JPH08241185A (ja) * 1994-11-03 1996-09-17 Motorola Inc 統合型試験および測定手段ならびにグラフィカル・ユーザ・インタフェースを採用する方法
JPH0929589A (ja) * 1995-07-24 1997-02-04 Fujitsu Ltd 製造ライン管理方式
FR2739956B1 (fr) * 1995-10-17 1998-01-09 Bec Etudes Commercialisation Dispositifs detecteurs de presence d'objet dans une enceinte de stockage, notamment un mini-bar, et systeme de telecollecte associe
US6026378A (en) * 1996-12-05 2000-02-15 Cnet Co., Ltd. Warehouse managing system
US5961604A (en) * 1997-06-03 1999-10-05 Alpha Technologies, Inc. Status monitoring systems for cable television signal distribution networks
KR19990050848A (ko) * 1997-12-17 1999-07-05 윤종용 모니터링번인테스팅 및 방법
US6154728A (en) * 1998-04-27 2000-11-28 Lucent Technologies Inc. Apparatus, method and system for distributed and automatic inventory, status and database creation and control for remote communication sites
US6477486B1 (en) * 1998-09-10 2002-11-05 Dell Usa, L.P. Automatic location determination of devices under test

Also Published As

Publication number Publication date
AU5017499A (en) 2000-05-04
IE990623A1 (en) 2000-06-28
ITTO990894A1 (it) 2001-04-15
CN1111792C (zh) 2003-06-18
SG97807A1 (en) 2003-08-20
GB9922463D0 (en) 1999-11-24
DE19949841A1 (de) 2000-05-04
JP2000132421A (ja) 2000-05-12
JP3256527B2 (ja) 2002-02-12
KR20000028623A (ko) 2000-05-25
TW454118B (en) 2001-09-11
FR2787903A1 (fr) 2000-06-30
IE20040367A1 (en) 2005-01-12
GB2346463A (en) 2000-08-09
AU765711B2 (en) 2003-09-25
US6285967B1 (en) 2001-09-04
IT1309112B1 (it) 2002-01-16
CN1267858A (zh) 2000-09-27
BR9903728A (pt) 2000-09-05
DE19949841B4 (de) 2007-01-11
IE20040366A1 (en) 2005-01-12
SG128414A1 (en) 2007-01-30
KR100366149B1 (ko) 2002-12-31
FR2787903B1 (fr) 2005-02-11
MY115926A (en) 2003-09-30
GB2346463B (en) 2003-05-28
SG135060A1 (en) 2007-09-28

Similar Documents

Publication Publication Date Title
ITTO990894A0 (it) Dispositivo e procedimento per testare un elaboratore durante il proce sso di fabbricazione.
DE69832110D1 (de) Herstellungsverfahren für eine Prüfnadel für Halbleitergeräte
DE69518793D1 (de) Herstellungsverfahren für eine Halbleitervorrichtung
KR960012575A (ko) 반도체 장치 제조 방법
DE69719868D1 (de) Herstellungsverfahren für eine Nadelschutzvorrichtung
GB9503419D0 (en) Semiconductor device,production method therefor,method for testing semiconductor elements,test substrate for the method and method for producing the test
DE69738595D1 (de) Herstellungsmethode für ein Halbleiter-Bauteil
KR960012574A (ko) 반도체장치 제조방법
NO20003449L (no) Sentreringsenhet
FI952719A7 (fi) Menetelmä puolijohdelaitteen valmistamiseksi
DE19981380D2 (de) Ultraschall-Prüfeinrichtung
DE69712080D1 (de) Herstellungsverfahren für eine halbleitervorrichtung
DE69932219D1 (de) Abgeschlossene Vorrichtung
DE69839906D1 (de) Herstellungsverfahren für eine integrierte Schaltung
DE69730064D1 (de) Prozess zum Takten einer integrierten Schaltung
FI954241L (fi) Puolijohdelaitteen valmistusmenetelmä
DE59907054D1 (de) Vorrichtung zum kontaktieren einer elektrischen leitung, insbesondere einer flachbandleitung
SG78391A1 (en) Semiconductor device manufacturing method
NL1000363C2 (nl) Sonde-verbindingsstuk.
IT1311739B1 (it) Apparecchio di bobina a connettore integrato
DE69841080D1 (de) Montageverfahren für eine Halbleiteranordnung
GB2326024B (en) Method for manufacturing a semiconductor device
FI956099A7 (fi) Menetelmä puolijohdelaitteen valmistamiseksi
DE69625007D1 (de) Halbleiterelement-Herstellungsverfahren
DE69821641D1 (de) Herstellungsverfahren für knochenverbindungsvorrichtung