JP2000258292A - Apparatus for measuring refractive index distribution and method for measuring refractive index distribution - Google Patents
Apparatus for measuring refractive index distribution and method for measuring refractive index distributionInfo
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- JP2000258292A JP2000258292A JP11061119A JP6111999A JP2000258292A JP 2000258292 A JP2000258292 A JP 2000258292A JP 11061119 A JP11061119 A JP 11061119A JP 6111999 A JP6111999 A JP 6111999A JP 2000258292 A JP2000258292 A JP 2000258292A
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- Prior art keywords
- refractive index
- interference fringe
- index distribution
- light source
- test object
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Abstract
(57)【要約】
【課題】 屈折率分布の測定において、測定データと被
検物の形状データを重ね合わせることが簡単にできる装
置を提供する。
【解決手段】 光源1と、被検物Oとほぼ同じ屈折率の
試液Sを有する被検物保持装置10と、被検物を透過し
た被検波から干渉縞を形成する干渉計と、該干渉縞像を
結像させる結像光学系13’と、被検物を移動する移動
装置37と、干渉縞検出器15と、演算手段39と、上
記結像光学系に入射する第2の光源25と、基準板29
とを有する構成。測定に先だって基準板29の像を干渉
縞検出器15上に結像させ、像の倍率を求め、測定デー
タと形状とを重ね合わせられるようにする。
(57) [Problem] To provide an apparatus capable of easily superimposing measurement data and shape data of a test object in measurement of a refractive index distribution. SOLUTION: A light source 1, a test object holding device 10 having a test solution S having a refractive index substantially the same as the test object O, an interferometer for forming an interference fringe from a test wave transmitted through the test object, and the interference An imaging optical system 13 ′ for forming a fringe image, a moving device 37 for moving an object, an interference fringe detector 15, an arithmetic unit 39, and a second light source 25 incident on the imaging optical system And the reference plate 29
A configuration having: Prior to the measurement, the image of the reference plate 29 is formed on the interference fringe detector 15, the magnification of the image is obtained, and the measured data and the shape can be superimposed.
Description
【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION
【0001】[0001]
【発明が属する技術分野】本発明は、被検物に可干渉光
を透過させ、透過した被検波から干渉縞を形成して被検
物の位相分布を測定する技術に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for transmitting coherent light to a test object, forming interference fringes from the transmitted test wave, and measuring the phase distribution of the test object.
【0002】[0002]
【従来の技術】近年、レーザプリンタやカメラなどの光
学機器に使用される光学レンズの材料としてプラスチッ
クを用いることが多くなっている。プラスチック成形レ
ンズはガラス研磨レンズに比較して、コスト低減や非球
面レンズの製作性に優れ、安価であるというメリットが
ある。2. Description of the Related Art In recent years, plastics have been increasingly used as materials for optical lenses used in optical devices such as laser printers and cameras. Compared to a glass polished lens, a plastic molded lens has advantages in that it is superior in cost reduction and manufacturability of an aspherical lens, and is inexpensive.
【0003】しかし、その反面、ガラスレンズに比べ製
造上、屈折率分布が不安定でレンズの内部に不均一性を
生じることがある。レンズ内部に不均一性があると、光
学特性に大きな影響を及ぼし、画質の劣化やボケといっ
た原因につながる。従って、レンズ内部の屈折率分布を
3次元的に高精度に測定し、光学レンズの均質性を評価
する必要がある。[0003] On the other hand, however, the refractive index distribution is unstable in production as compared with a glass lens, and non-uniformity may occur inside the lens. Non-uniformity inside the lens has a great effect on optical characteristics, leading to deterioration of image quality and blurring. Therefore, it is necessary to measure the refractive index distribution inside the lens three-dimensionally with high accuracy and evaluate the homogeneity of the optical lens.
【0004】光学レンズの屈折率を測定する方法として
は、精密示差屈折計などを使用してVブロック法等によ
り屈折角を計測して屈折率を求める方法や、トワイマン
・グリーン干渉計などの干渉計を使用して干渉縞より屈
折率を測定する方法などがあり、また、光学的均質性の
測定方法として、フィゾー干渉計、マハツェンダ干渉計
などの干渉計を使用して干渉縞像の解析より透過波面を
計測し、屈折率分布から光学的均質性を求める方法が知
られている。As a method of measuring the refractive index of an optical lens, a method of measuring a refractive angle by a V-block method or the like using a precision differential refractometer or the like to obtain a refractive index, or an interference method such as a Twyman-Green interferometer or the like. There is a method of measuring the refractive index from the interference fringes using an interferometer, and the method of measuring optical homogeneity is based on the analysis of interference fringe images using an interferometer such as a Fizeau interferometer or a Mach-Zehnder interferometer. There is known a method of measuring a transmitted wavefront and obtaining optical homogeneity from a refractive index distribution.
【0005】しかしながら、上記のいずれの方法におい
ても、被検物は、所定形状に加工する必要があり、測定
対象の光学素子を破壊しなければならない。また、透過
波面より求められる屈折率分布は、光路進行方向に積算
された平均値となり、3次元空間的な屈折率分布を測定
し、屈折率の不均一部分を3次元空間的に特定すること
ができない。However, in any of the above methods, the test object must be processed into a predetermined shape, and the optical element to be measured must be destroyed. Also, the refractive index distribution obtained from the transmitted wavefront becomes an average value integrated in the optical path traveling direction, and the three-dimensional spatial refractive index distribution is measured to specify the non-uniform refractive index part three-dimensionally. Can not.
【0006】そこで、本発明の出願人は、先願の特願平
6−203502号において、図9に示すような、被検
物を試液中に浸した状態で干渉縞を形成し、干渉縞から
透過波面量を算出して屈折率分布を計測する装置を提案
している。In view of the above, the applicant of the present invention has proposed in Japanese Patent Application No. 6-203502 of the prior application that interference fringes are formed in a state where a test object is immersed in a test solution as shown in FIG. Has proposed a device for calculating the amount of transmitted wavefront from the above to measure the refractive index distribution.
【0007】図9に示す装置は、マハツェンダ干渉計を
用いた構成である。マハツェンダ干渉計は、可干渉光と
してのレーザ光を射出する光源1と、ビームエキスパン
ダ3と、偏光ビームスプリッタからなる光分割器5と、
参照波の光路内に置かれたミラーからなる反射装置7
と、被検波を2つの光束に分割するビームスプリッタか
らなる反射装置9と、光重畳器11としての偏光ビーム
スプリッタと、結像レンズ13と、CCDなどからなる
干渉縞検出器15とを備えている。[0007] The apparatus shown in FIG. 9 has a configuration using a Mach-Zehnder interferometer. The Mach-Zehnder interferometer includes a light source 1 for emitting laser light as coherent light, a beam expander 3, a light splitter 5 including a polarizing beam splitter,
Reflector 7 consisting of a mirror placed in the optical path of the reference wave
A reflection device 9 composed of a beam splitter that divides a test wave into two light beams; a polarization beam splitter serving as an optical superposition device 11; an imaging lens 13; and an interference fringe detector 15 composed of a CCD or the like. I have.
【0008】図9において、被検物Oは屈折率が被検物
とほぼ一致した試液Sの中に浸された容器状の被検物支
持手段10中にあり、光束の入射口12及び出射口14
には面精度の良いオプティカルフラット16,18を取
り付けている。被検物Oは光軸に対して垂直な回転軸P
を持つ回転台20上に設置されており被検物支持手段1
0は固定された状態で被検物0が軸Pを中心に回転可能
である。そして、回転台20の回転は、微小な回転角や
昇降量を与えられるもので、ステッピングモータ等が用
いられている。In FIG. 9, a test object O is located in a container-like test object support means 10 immersed in a test solution S having a refractive index substantially equal to that of the test object. Mouth 14
The optical flats 16 and 18 having good surface accuracy are attached to. The test object O has a rotation axis P perpendicular to the optical axis.
Object supporting means 1 which is installed on a turntable 20 having
Reference numeral 0 denotes a fixed state in which the test object 0 can rotate around the axis P. The rotation of the turntable 20 can be given a small rotation angle or a vertical movement, and a stepping motor or the like is used.
【0009】光源1より出射するレーザ光は、ビームエ
キスパンダ3によって光束径を拡大され、光分割器5に
よってこれを直角に屈折して参照波aとなるレーザ光束
と、直進して被検物Oとしての位相物体を透過する被検
波bとに分割される。参照波aと被検波bとはほぼ1:
1となるようになっている。The laser beam emitted from the light source 1 is expanded in beam diameter by the beam expander 3, and is refracted at right angles by the beam splitter 5 to become a reference beam a. It is divided into a test wave b that passes through a phase object as O. The reference wave a and the test wave b are approximately 1:
It is set to 1.
【0010】反射装置7は、ピエゾ素子などによる電気
−変位変換素子19により支持され、位相シフト法によ
る干渉縞解析を行うために、参照波aの光路長を波長以
下のオーダで変更できるものである。The reflection device 7 is supported by an electric-displacement conversion element 19 such as a piezo element, and can change the optical path length of the reference wave a in the order of the wavelength or less in order to perform interference fringe analysis by the phase shift method. is there.
【0011】参照波aは反射装置7で反射され、光重畳
器11に達し、他方の被検波bは、被検物Oを透過して
反射装置兼光分割器9で一部b2が反射され、光重畳器
11に達して参照波aと重なり合うが、電気−変位変換
素子19により参照波aと被検波b2との光路長には、
nπ/2の位相の差ができるように調整される。The reference wave a is reflected by the reflection device 7 and reaches the optical superimposer 11, while the other test wave b is transmitted through the test object O and a part b2 is reflected by the reflection device / light splitter 9, Although the light reaches the optical superimposer 11 and overlaps with the reference wave a, the electric-displacement conversion element 19 causes the optical path length between the reference wave a and the test wave b2 to be:
It is adjusted so as to have a phase difference of nπ / 2.
【0012】参照波aと被検波bは重畳され、光重畳器
11から射出されて偏光子17を経て結像レンズ13に
入射し、干渉縞検出器15の撮像面に干渉縞を結像す
る。干渉縞検出器15には干渉縞と直交する方向に配置
されたリニアCCDやエリアCCD或いはアレイ状のセ
ンサを用いる。The reference wave “a” and the test wave “b” are superimposed, emitted from the optical superimposing device 11, enter the imaging lens 13 via the polarizer 17, and form an interference fringe on the imaging surface of the interference fringe detector 15. . As the interference fringe detector 15, a linear CCD, an area CCD, or an array sensor arranged in a direction orthogonal to the interference fringes is used.
【0013】干渉縞検出器15の測定結果は、干渉縞検
出器15の長さ方向をx軸とし、各素子の発する強度を
Wとすると、透過波面W(x,y)という関数で表され
る。干渉縞検出器15がx軸方向に延びる1次元CCD
の場合、1回の測定では、被検物をx−z面で切断した
1測定断面について透過波面が測定できることになる。The measurement result of the interference fringe detector 15 is expressed by a function of a transmitted wavefront W (x, y), where the length direction of the interference fringe detector 15 is x-axis, and the intensity generated by each element is W. You. One-dimensional CCD in which interference fringe detector 15 extends in the x-axis direction
In the case of (1), in one measurement, the transmitted wavefront can be measured for one measurement section obtained by cutting the test object in the xz plane.
【0014】こうして得られた透過波面W(x)をフー
リエ変換、極座標変換等の演算処理をすることによっ
て、上記の測定断面について、屈折率分布N(x)を得
ることができる。そして、y座標を複数箇所について同
様の測定を行い、屈折率分布N(x,y)を得ることが
できる。By performing arithmetic processing such as Fourier transform and polar coordinate transform on the thus obtained transmitted wavefront W (x), a refractive index distribution N (x) can be obtained for the above-mentioned measured cross section. Then, the same measurement is performed for a plurality of locations on the y coordinate, and the refractive index distribution N (x, y) can be obtained.
【0015】上記の出願による屈折率分布の測定方法及
び装置によれば、被検物Oを全く破壊することなく、使
用する形状のままで、高精度の計測が可能であるという
利点を有している。According to the method and the apparatus for measuring the refractive index distribution according to the above-mentioned application, there is an advantage that high-precision measurement is possible without destroying the test object O at all and keeping the shape to be used. ing.
【0016】[0016]
【発明が解決しようとする課題】ところで、上記の屈折
率分布の測定においては、干渉縞像から測定して得た屈
折率分布の測定データと被検物の形状データを重ね合わ
せることが必要である。そのためには、干渉縞検出器上
の干渉縞像の倍率が既知でなければならない。しかしな
がら、従来は、この倍率の計算が困難で、重ね合わせに
長時間を要していた。However, in the above-described measurement of the refractive index distribution, it is necessary to superimpose the measured data of the refractive index distribution obtained from the interference fringe image and the shape data of the test object. is there. For this purpose, the magnification of the interference fringe image on the interference fringe detector must be known. However, conventionally, it is difficult to calculate the magnification, and it takes a long time to superimpose.
【0017】本発明は、このような問題の解決を図った
もので、干渉縞の倍率を簡単に得ることができる屈折率
分布の測定装置を提供することを目的としている。ま
た、上記従来技術では、干渉縞検出器15の1次元セン
サの長さは一定であるのに対し、被検物の大きさは変化
する。そのため、干渉縞が小さすぎたり、大き過ぎたり
して、測定精度が粗くなったり、測定不能になってしま
うことがあった。本発明の目的は、被検物の大きさに左
右されることなく、常に、ほぼ同じ大きさの干渉縞像を
結像させることができる屈折率分布測定装置を提供する
ことを目的としている。An object of the present invention is to solve such a problem, and an object of the present invention is to provide an apparatus for measuring a refractive index distribution which can easily obtain the magnification of interference fringes. Further, in the above-described related art, the length of the one-dimensional sensor of the interference fringe detector 15 is constant, while the size of the test object changes. As a result, the interference fringes may be too small or too large, resulting in poor measurement accuracy or inability to measure. SUMMARY OF THE INVENTION It is an object of the present invention to provide a refractive index distribution measuring apparatus capable of always forming an interference fringe image having substantially the same size without being influenced by the size of a test object.
【0018】また、上記の測定装置では、光源からの光
量が強すぎたり、弱すぎたりすると、正確な測定ができ
ない。そこで、適当な光量を得ることができる屈折率分
布測定装置を提供することを目的としている。Further, in the above-described measuring apparatus, if the light amount from the light source is too strong or too weak, accurate measurement cannot be performed. Therefore, it is an object of the present invention to provide a refractive index distribution measuring device capable of obtaining an appropriate amount of light.
【0019】さらに、上記の測定方法によれば、フーリ
エ変換したり、極座標変換する等の複雑な演算処理を必
要としている。本発明は、比較的簡単な演算で屈折率分
布の計測が可能な方法を提供することを目的としてい
る。Further, according to the above-mentioned measuring method, complicated arithmetic processing such as Fourier transform or polar coordinate transform is required. An object of the present invention is to provide a method capable of measuring a refractive index distribution by a relatively simple operation.
【0020】[0020]
【課題を解決するための手段】上記の干渉縞像の倍率を
簡単に得るために、本発明の屈折率分布の測定装置で
は、可干渉光を射出する光源と、該光源から射出された
光束上に配置され被検物とほぼ同じ屈折率の試液を有す
るとともに相互に平行な入射口と射出口とを有する被検
物保持装置と、被検物を透過した被検波から被検物の1
測定断面について干渉縞を形成する干渉計と、該干渉計
で形成された干渉縞像を結像させる結像光学系と、被検
物を上記1測定断面と交叉する方向に移動する移動装置
と、干渉縞像の結像位置に設けられた干渉縞検出器と、
該干渉縞検出器の出力から屈折率分布を算出する演算手
段と、上記結像光学系に入射する第2の光源と、該第2
の光源と上記光学系との間に設けられた基準板とを有す
る構成を特徴としている。In order to easily obtain the magnification of the interference fringe image, the apparatus for measuring the refractive index distribution according to the present invention employs a light source for emitting coherent light and a light beam emitted from the light source. A specimen holding device disposed above and having a sample liquid having substantially the same refractive index as the specimen and having mutually parallel entrances and exits;
An interferometer for forming an interference fringe on the measurement section, an imaging optical system for forming an interference fringe image formed by the interferometer, and a moving device for moving the test object in a direction crossing the one measurement section. An interference fringe detector provided at an imaging position of the interference fringe image;
Calculating means for calculating a refractive index distribution from the output of the interference fringe detector; a second light source incident on the imaging optical system;
And a reference plate provided between the light source and the optical system.
【0021】上記光源と第2の光源との双方を制御する
光源駆動装置を設け、2つの光源が同時に点灯しないよ
うに制御される構成としたり、上記光学系がズームレン
ズである構成としたり、上記光源の光量を変更する透過
光量変更手段を設けた構成としたり、演算手段が、最小
自乗法による多項式近似により屈折率分布の多項式近似
係数を求める演算手段である構成とすることができる。A light source driving device for controlling both the light source and the second light source, a configuration in which the two light sources are controlled so as not to be simultaneously lit, a configuration in which the optical system is a zoom lens, The transmission light amount changing means for changing the light amount of the light source may be provided, or the calculation means may be a calculation means for obtaining a polynomial approximation coefficient of the refractive index distribution by a polynomial approximation by the method of least squares.
【0022】また、比較的簡単な演算で屈折率分布の計
測が可能な方法として、可干渉光を被検物に透過し、光
学系を介して干渉縞像を結像させ、結像位置に設けた干
渉縞検出器上の干渉縞像から被検物の1測定断面につい
て透過波面を求め、該透過波面から被検物の上記1測定
断面について屈折率の分布を算出する屈折率分布の測定
方法において、上記干渉縞検出器の測定方向をx’とし
て透過波面W(x’,y)を求め、該干渉縞検出器上に
長さが既知の基準パターンの像を結像させ、該基準パタ
ーンの像の長さから演算装置により倍率Mを求め、該演
算装置によって該倍率Mからx=Mx’によりW(x,
y)を算出し、さらに屈折率の分布N(x,y)を求め
ることを特徴とするAs a method capable of measuring the refractive index distribution by a relatively simple calculation, a method of transmitting coherent light to a test object, forming an interference fringe image via an optical system, and Measurement of a refractive index distribution for obtaining a transmitted wavefront for one measurement section of the test object from the interference fringe image on the interference fringe detector provided and calculating a distribution of the refractive index for the one measurement cross section of the test object from the transmitted wavefront. In the method, a transmitted wavefront W (x ', y) is obtained by setting the measurement direction of the interference fringe detector to x', and an image of a reference pattern having a known length is formed on the interference fringe detector. A magnification M is obtained from the length of the image of the pattern by an arithmetic unit, and W (x,
y), and a refractive index distribution N (x, y) is further obtained.
【0023】また、上記透過波面W(x,y)から屈折
率分布N(x,y)が、 N(x,y)=W(x,y)/d(x,y) (ここでd(x,y)は被検物の厚さ)により求めら
れ、かつ、演算装置が、上記透過波面から最小自乗法に
よる多項式近似によって屈折率分布の多項式近似係数を
求めることを特徴としている。From the transmitted wavefront W (x, y), the refractive index distribution N (x, y) is expressed as follows: N (x, y) = W (x, y) / d (x, y) (where d (X, y) is obtained from the thickness of the test object), and the arithmetic unit obtains a polynomial approximation coefficient of the refractive index distribution from the transmitted wavefront by a polynomial approximation by the least square method.
【0024】[0024]
【発明の実施の形態】以下に図面を用いて本発明の実施
例を詳細に説明する。図1は本発明の屈折率分布の測定
装置を示す図である。同図に示す装置の全体構成の大部
分は従来例と共通しているので、相違する構成を中心に
説明する。Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 1 is a diagram showing an apparatus for measuring a refractive index distribution according to the present invention. Since most of the entire configuration of the apparatus shown in FIG. 1 is common to the conventional example, the description will be focused on the different configuration.
【0025】本発明の装置では、光源1とビームエキス
パンダ3との間に、透過光量変更手段21を設けてい
る。この透過光量変更手段21は、円板状のNDフィル
タで、ステッピングモータ23で回転可能に支持されて
いる。そして、円周方向に透過率が変化するようになっ
ており、ステッピングモータ23で回転させるとNDフ
ィルタの透過場所が変化するので、透過光の強度を変化
させることができる。ステッピングモータの回転角が決
まると、透過率が決まることになる。In the apparatus of the present invention, the transmitted light amount changing means 21 is provided between the light source 1 and the beam expander 3. The transmitted light amount changing means 21 is a disk-shaped ND filter, and is rotatably supported by a stepping motor 23. Then, the transmittance changes in the circumferential direction, and when rotated by the stepping motor 23, the transmission location of the ND filter changes, so that the intensity of the transmitted light can be changed. When the rotation angle of the stepping motor is determined, the transmittance is determined.
【0026】図2は干渉縞検出器の出力を示す線図であ
る。縦軸が光の強度、横軸が画素(x軸)である。図2
(a)の2本の平行な点線の内、上方の点線が上限を示
し、下方の線が下限を示す。画素の出力がこの上限と下
限との間にあれば正確な測定が可能であるが、図2
(b)のように下限を下回ったり、図2(c)のように
上限を越えたりすると、正確な測定ができない。FIG. 2 is a diagram showing the output of the interference fringe detector. The vertical axis is the light intensity, and the horizontal axis is the pixel (x-axis). FIG.
Of the two parallel dotted lines in (a), the upper dotted line indicates the upper limit, and the lower line indicates the lower limit. If the output of the pixel is between the upper and lower limits, accurate measurement is possible.
If the value falls below the lower limit as shown in (b) or exceeds the upper limit as shown in FIG. 2 (c), accurate measurement cannot be performed.
【0027】また、本発明の装置では、反射装置9の近
傍に第2の光源25と、コリメータレンズ27と、基準
板29とを配置している。基準板29は、図3(a)に
示すように矩形をした不透明の板からなり、ここに2本
のスリット29aがLmmの既知の間隔で平行に形成さ
れている。In the apparatus of the present invention, the second light source 25, the collimator lens 27, and the reference plate 29 are arranged near the reflection device 9. The reference plate 29 is a rectangular opaque plate as shown in FIG. 3A, in which two slits 29a are formed in parallel at a known interval of L mm.
【0028】第2の光源25が点灯されると、コリメー
タレンズ27で平行光束にされ、基準板29を照射す
る。基準板29は不透明でスリット29a部分のみが透
明なので、ここを透過した光束が反射装置9を透過して
結像レンズ13に入射し、干渉縞検出器15の1次元C
CD上に結像する。When the second light source 25 is turned on, it is collimated by the collimator lens 27 and illuminates the reference plate 29. Since the reference plate 29 is opaque and only the slit 29a is transparent, the light transmitted therethrough passes through the reflecting device 9 and is incident on the imaging lens 13, and the one-dimensional C of the interference fringe detector 15 is detected.
Image on CD.
【0029】図3(b)は干渉縞検出器15の出力状態
を示す図で、縦軸が光の強度、横軸が画素(x軸)であ
る。スリット29aを透過した光が結像した画素のみが
大きな光量を受けるので、これらの間隔L’を測定し、
M=L/L’から倍率Mを求めることができる。FIG. 3B shows an output state of the interference fringe detector 15, in which the vertical axis represents light intensity and the horizontal axis represents pixels (x-axis). Since only pixels where light transmitted through the slit 29a forms an image receive a large amount of light, these distances L 'are measured.
The magnification M can be obtained from M = L / L ′.
【0030】図4は、制御部分のブロック図である。干
渉縞検出器15は、CCDカメラ駆動装置31に接続さ
れ、ステッピングモータ23はステッピングモータ駆動
装置33に接続され、光源1と第2の光源25とは共に
光源駆動装置35に接続されている。光源駆動装置35
は、光源1と第2の光源25の双方が同時に点灯しない
ように制御する。符号37は回転台20をy軸方向に昇
降させる被検物移動装置である。そして、これらCCD
カメラ駆動装置31、ステッピングモータ駆動装置3
3、光源駆動装置35及び被検物移動装置37は、それ
ぞれパーソナルコンピュータ39に接続され、パーソナ
ルコンピュータ39にインストールされたプログラムに
よって、図示しないキーボードからの指示により操作さ
れる。また、各操作状況や干渉縞検出器15上に結像さ
れた干渉縞像は、ディスプレイ41に表示され、目視に
より確認しながら操作できるようになっている。FIG. 4 is a block diagram of the control part. The interference fringe detector 15 is connected to a CCD camera driving device 31, the stepping motor 23 is connected to a stepping motor driving device 33, and both the light source 1 and the second light source 25 are connected to a light source driving device 35. Light source driving device 35
Controls so that both the light source 1 and the second light source 25 are not turned on at the same time. Reference numeral 37 denotes an object moving device that moves the turntable 20 up and down in the y-axis direction. And these CCD
Camera driving device 31, stepping motor driving device 3
3. The light source driving device 35 and the object moving device 37 are connected to a personal computer 39, respectively, and are operated by instructions from a keyboard (not shown) by a program installed in the personal computer 39. In addition, each operation state and the interference fringe image formed on the interference fringe detector 15 are displayed on the display 41, so that the user can operate while visually confirming the operation.
【0031】本発明の装置では、結像レンズ13が可変
焦点レンズになっている。特に、実施例ではズームレン
ズとし、干渉縞検出器15の位置を変更することなく干
渉縞像を結像できるようにしている。In the apparatus according to the present invention, the imaging lens 13 is a varifocal lens. In particular, in the embodiment, a zoom lens is used so that an interference fringe image can be formed without changing the position of the interference fringe detector 15.
【0032】次ぎに、測定方法について、説明する。測
定の順序は、図5のフローチャートに示す順序で進め
る。すなわち、光量調節→倍率の取得→透過波面測定→
屈折率分布の算出→多項式近似のようになる。ただし、
光量調節と倍率の取得との順序は入れ替え可能である。Next, the measuring method will be described. The measurement order proceeds in the order shown in the flowchart of FIG. That is, light quantity adjustment → acquisition of magnification → transmitted wavefront measurement →
Calculation of refractive index distribution → polynomial approximation. However,
The order of light amount adjustment and magnification acquisition can be interchanged.
【0033】まず、被検物Oを回転台20上に置き光源
1を点灯して干渉縞像を干渉縞検出器15の1次元CC
D上に結像させる。そして、図6のフローチャートにし
たがって、次のようにして光量の調節をする。First, the test object O is placed on the turntable 20, the light source 1 is turned on, and the interference fringe image is formed by the one-dimensional CC of the interference fringe detector 15.
An image is formed on D. Then, according to the flowchart of FIG. 6, the light amount is adjusted as follows.
【0034】まず、干渉縞検出器15の画素から強度の
最大値を得る(S101)。そして、その最大値が予め
設定されている上限(図2(a)の上の点線)より下に
あるか上にあるかを判断する(S103)。First, the maximum value of the intensity is obtained from the pixel of the interference fringe detector 15 (S101). Then, it is determined whether the maximum value is below or above a preset upper limit (a dotted line in FIG. 2A) (S103).
【0035】上限より上にある場合は透過光量変更手段
21のNDフィルターに光量を下げる余裕があるか否か
を判断する(S105)。下げる余裕があれば、ステッ
ピングモータ駆動装置33に指示を出し、透過光量変更
手段21を回転させ、透過光量が上限より下がるように
する(S107)。次ぎに、S101に戻り、最大値を
求め、ふたたび上限と比較するが、上限より下にあるは
ずなので、こんどは下限と比較する(S109)。下限
より上であれば測定を開始する。If it is above the upper limit, it is determined whether or not the ND filter of the transmitted light amount changing means 21 has a margin for reducing the light amount (S105). If there is room to lower the transmission amount, an instruction is issued to the stepping motor driving device 33, and the transmitted light amount changing means 21 is rotated so that the transmitted light amount falls below the upper limit (S107). Next, returning to S101, the maximum value is obtained and compared again with the upper limit. However, since it should be lower than the upper limit, it is compared with the lower limit (S109). If it is above the lower limit, start the measurement.
【0036】上記S109で、下限より下である場合
は、透過光量変更手段21のNDフィルターに光量を上
げる余裕があるか否かを判断する(S111)。上げる
余裕があれば、ステッピングモータ駆動装置33に指示
を出し、透過光量変更手段21を回転させ、透過光量が
下限より上がるようにする(S113)。もし、既に上
限を越えていて透過光量を下げた後であれば、ここで
は、前回の回転量より少なくする。これによって、最大
値が上限と下限の中間に収まるようになる。If it is lower than the lower limit in S109, it is determined whether or not the ND filter of the transmitted light amount changing means 21 has room to increase the light amount (S111). If there is room to raise the transmission amount, an instruction is issued to the stepping motor driving device 33, and the transmitted light amount changing means 21 is rotated so that the transmitted light amount becomes higher than the lower limit (S113). If the transmitted light amount has already been exceeded and the transmitted light amount has been reduced, the rotation amount is set smaller than the previous rotation amount. As a result, the maximum value falls between the upper and lower limits.
【0037】最大値が上限より上で、しかも透過光量を
低下させる余裕がない場合、及び、最大値が下限より下
で、しかも透過光量を上げる余裕がない場合には、測定
不能を表示する(S115)。以上で光量の調整が完了
する。以上の操作はパーソナルコンピュータ39が自動
的に行うようになっている。If the maximum value is above the upper limit and there is no room to reduce the amount of transmitted light, or if the maximum value is below the lower limit and there is no room to increase the amount of transmitted light, a measurement impossible is displayed ( S115). Thus, the adjustment of the light amount is completed. The above operation is automatically performed by the personal computer 39.
【0038】次ぎに、干渉縞検出器15上の干渉縞像の
大きさが適当な大きさになるように結像レンズ13’を
操作する。これは、手動で行う。干渉縞像が変動したこ
とで最大値が変化する場合もあり、その場合、上記の光
量調整を再度行う。Next, the imaging lens 13 'is operated so that the size of the interference fringe image on the interference fringe detector 15 becomes an appropriate size. This is done manually. In some cases, the maximum value changes due to the fluctuation of the interference fringe image. In such a case, the light amount adjustment is performed again.
【0039】次ぎに、光源駆動装置35を介して光源1
を消灯し、第2の光源25を点灯し、基準板29のスリ
ット像を干渉縞検出器15上に結像させる。そして、
L’を測定し倍率Mを算出する。これは1次元CCDの
出力からパーソナルコンピュータ39が算出可能であ
る。Next, the light source 1 is transmitted through the light source driving device 35.
Is turned off, the second light source 25 is turned on, and a slit image of the reference plate 29 is formed on the interference fringe detector 15. And
Measure L ′ and calculate magnification M. This can be calculated by the personal computer 39 from the output of the one-dimensional CCD.
【0040】干渉縞像は、被検物Oをx−z面で切断し
た1測定断面について干渉縞検出器15上に結像され
る。そして、各画素の出力から透過波面としてW
(x’,yi)が測定される。これはy座標がiにおけ
る透過波面である。x’は、画素上での座標なので、こ
れに倍率Mを掛けて被検物上のx座標とし、W(x,y
i)を得る。The interference fringe image is formed on the interference fringe detector 15 for one measurement section obtained by cutting the object O along the xz plane. Then, from the output of each pixel, W
(X ′, yi) is measured. This is the transmitted wavefront at y coordinate i. Since x ′ is a coordinate on a pixel, it is multiplied by a magnification M to obtain an x coordinate on the test object, and W (x, y
Obtain i).
【0041】パーソナルコンピュータ39は、被検物移
動装置37に指示を出し、被検物Oを上昇あるいは下降
させ、y0,y1,y2……について複数回の透過波面
測定を行い、W(x,y0)、W(x,y1)、W
(x,y2)……を得る。The personal computer 39 issues an instruction to the object moving device 37, raises or lowers the object O, performs a plurality of transmission wavefront measurements on y0, y1, y2,. y0), W (x, y1), W
(X, y2) ... are obtained.
【0042】被検物の厚みをd(x,y)とし、2次元
の屈折率分布をn(x,y)とすると、次式Assuming that the thickness of the test object is d (x, y) and the two-dimensional refractive index distribution is n (x, y), the following equation is obtained.
【数1】 で与えられる。ここで、d(x,y)は被検物の形状デ
ータの設計値、又は他の測定装置による形状測定によっ
て求めた被検物の形状データ等から得る。屈折率分布を
何次まで多項式近似するかは、必要に応じて決定するこ
とになるが、ここでは、4次まで多項式近似する場合を
一例として挙げる。(Equation 1) Given by Here, d (x, y) is obtained from the design value of the shape data of the test object, the shape data of the test object obtained by shape measurement by another measuring device, or the like. The order of the polynomial approximation of the refractive index distribution is determined as needed. Here, the case of approximating the polynomial up to the fourth order will be described as an example.
【0043】屈折率分布の多項式近似を次ぎのように定
義する。The polynomial approximation of the refractive index distribution is defined as follows.
【数2】 (Equation 2)
【0044】式(1)から各yの値におけるn(x,y
i)を求め、これらから多項式近似された屈折率分布
N’(x,yi)を求める。From equation (1), n (x, y) at each y value
i), and a refractive index distribution N ′ (x, yi) approximated by a polynomial is obtained from these.
【数3】 (Equation 3)
【0045】図7はn(x,yi)とN’(x,yi)
とを図示したものである。図7(a)はy=y1、
(b)はy=y2の例である。図中の細かい折曲部を多
数有する細い線は、測定データW(x,yi)から得た
屈折率分布n(x,yi)で、太い緩やかな曲線が多項
式近似した屈折率分布N’(x,yi)を示す。FIG. 7 shows n (x, yi) and N '(x, yi)
Are illustrated in FIG. FIG. 7A shows y = y1,
(B) is an example of y = y2. A thin line having many fine bent portions in the figure is a refractive index distribution n (x, yi) obtained from the measurement data W (x, yi), and a refractive index distribution N ′ ( x, yi).
【0046】上記の式における各係数a’(i),b’
(i),c’(i)……は、最小自乗法による多項式近
似により求めることができる。図8はこうして求めた
a’(i),b’(i)を縦軸にa’又はb’をとり、
横軸にyをとって表示したものである。これらの図に示
すように、a’(i),b’(i)もyの関数として表
すことができ、次のように多項式近似できる。Each coefficient a '(i), b' in the above equation
(I), c ′ (i)... Can be obtained by polynomial approximation by the least square method. FIG. 8 shows a ′ (i) and b ′ (i) thus determined with a vertical axis representing a ′ or b ′.
This is displayed by taking y on the horizontal axis. As shown in these figures, a ′ (i) and b ′ (i) can also be represented as functions of y, and can be approximated by a polynomial as follows.
【0047】[0047]
【数4】 (Equation 4)
【0048】上記の各係数a0,a1,a2……、b
0,b10,b2……も、最小自乗法により求めること
ができ、結局、a(y)、b(y)……を得ることがで
き、これらを式(2)に代入すれば、多項式近似された
屈折率分布N(x,y)を求めることができる。The above coefficients a0, a1, a2,..., B
.. Can be obtained by the least squares method, and eventually a (y), b (y)... Can be obtained. By substituting these into equation (2), polynomial approximation can be obtained. The obtained refractive index distribution N (x, y) can be obtained.
【0049】以上の計算は、パーソナルコンピュータ3
9にプログラムをインストールしておくことによって、
行うことが可能である。また、この計算方法は、フーリ
エ変換と極座標変換とを組み合わせた計算方法よりも簡
単なので、短時間で測定できることになる。The above calculation is performed by the personal computer 3
By installing the program on 9,
It is possible to do. This calculation method is simpler than the calculation method combining the Fourier transform and the polar coordinate transform, so that the measurement can be performed in a short time.
【0050】なお、上記実施例はマハツェンダ干渉計を
用いたが、他の干渉計でも同様に測定が可能であり、さ
らに、参照波を用いずに被検波を2つに分割して横ずら
しを与えるシアリング干渉計でも測定が可能である。Although the above-described embodiment uses the Mach-Zehnder interferometer, other interferometers can also be used for measurement. In addition, the test wave is divided into two without using the reference wave, and the lateral shift is performed. Measurements can also be made with the shearing interferometer provided.
【0051】[0051]
【発明の効果】以上説明したように本発明の屈折率分布
測定装置は、結像光学系に入射する第2の光源と、該第
2の光源と上記光学系との間に設けられた基準板とを設
けたので、干渉縞の倍率を容易に求めることができ、測
定データと被検物の形状データとの重ね合わせが簡単に
できるようになった。As described above, the refractive index distribution measuring apparatus according to the present invention comprises a second light source incident on an imaging optical system and a reference provided between the second light source and the optical system. With the provision of the plate, the magnification of the interference fringes can be easily obtained, and the measurement data and the shape data of the test object can be easily superimposed.
【0052】また、光源と第2の光源との双方を制御す
る光源駆動装置を設け、2つの光源が同時に点灯しない
ように制御すると、双方の光源が点灯することによる測
定ミスを防止することができる。When a light source driving device for controlling both the light source and the second light source is provided so that the two light sources are not turned on at the same time, a measurement error caused by turning on both light sources can be prevented. it can.
【0053】光学系をズームレンズにすると、干渉縞像
の大きさを自由に変化させることができ、測定が容易に
なる。透過光量変更手段を設ければ、光源の光量を変更
して適正な光量で測定でき、測定精度を向上することが
できる。測定データを多項式近似で処理すれば、演算処
理が簡単になり、測定時間を短縮できる。また、多項式
近似で係数で表すことができれば、複雑な屈折率分布を
数個の数で表すことができ、測定した屈折率分布を用い
た光学シミュレーション等への入力が簡単になる。When the optical system is a zoom lens, the size of the interference fringe image can be freely changed, and the measurement becomes easy. If the transmitted light amount changing means is provided, the light amount of the light source can be changed to perform measurement with an appropriate light amount, and the measurement accuracy can be improved. If the measurement data is processed by the polynomial approximation, the arithmetic processing is simplified and the measurement time can be reduced. Further, if it can be represented by a coefficient by polynomial approximation, a complex refractive index distribution can be represented by several numbers, and input to an optical simulation or the like using the measured refractive index distribution can be simplified.
【図1】本発明の屈折率分布測定装置の構成を示す図で
ある。FIG. 1 is a diagram showing a configuration of a refractive index distribution measuring device of the present invention.
【図2】干渉縞検出器の出力状態を示す線図である。FIG. 2 is a diagram showing an output state of an interference fringe detector.
【図3】(a)は基準板の図、(b)は基準板を結像さ
せたときの干渉縞検出器の出力状態を示す図である。3A is a diagram of a reference plate, and FIG. 3B is a diagram illustrating an output state of an interference fringe detector when an image is formed on the reference plate.
【図4】図1の装置の制御部分のブロック図である。FIG. 4 is a block diagram of a control part of the apparatus of FIG. 1;
【図5】図1の装置の測定順序を示すフローチャートで
ある。FIG. 5 is a flowchart showing a measurement order of the apparatus of FIG. 1;
【図6】光量調整を行うフローチャートである。FIG. 6 is a flowchart for performing light amount adjustment.
【図7】n(x,y)とN’(x,y)との関係を示す
線図である。FIG. 7 is a diagram showing a relationship between n (x, y) and N ′ (x, y).
【図8】a(y),b(y)の求め方を説明する線図で
ある。FIG. 8 is a diagram illustrating how to obtain a (y) and b (y).
【図9】従来の屈折率分布測定装置の構成を示す図であ
る。FIG. 9 is a diagram showing a configuration of a conventional refractive index distribution measuring device.
1 光源 10 被検物保持装置 13’ 結像光学系 15 干渉縞検出器 21 透過光量変更手段 25 第2の光源 29 基準板 35 光源駆動装置 37 移動装置 39 演算手段 Reference Signs List 1 light source 10 subject holding device 13 'imaging optical system 15 interference fringe detector 21 transmitted light amount changing means 25 second light source 29 reference plate 35 light source driving device 37 moving device 39 calculating device
Claims (7)
射出された光束上に配置され被検物とほぼ同じ屈折率の
試液を有するとともに相互に平行な入射口と射出口とを
有する被検物保持装置と、被検物を透過した被検波から
被検物の1測定断面について干渉縞を形成する干渉計
と、該干渉計で形成された干渉縞像を結像させる結像光
学系と、被検物を上記1測定断面と交叉する方向に移動
する移動装置と、干渉縞像の結像位置に設けられた干渉
縞検出器と、該干渉縞検出器の出力から屈折率分布を算
出する演算手段と、上記結像光学系に入射する第2の光
源と、該第2の光源と上記光学系との間に設けられた基
準板とを有することを特徴とする屈折率分布の測定装
置。1. A light source for emitting coherent light, a sample liquid having a refractive index substantially the same as that of a test object arranged on a light beam emitted from the light source, and an entrance and an exit parallel to each other. An object holding device, an interferometer for forming an interference fringe for one measurement section of the object from a test wave transmitted through the object, and an imaging optics for imaging an interference fringe image formed by the interferometer A system, a moving device for moving the test object in a direction crossing the one measurement section, an interference fringe detector provided at a position where an interference fringe image is formed, and a refractive index distribution based on an output of the interference fringe detector. , A second light source incident on the imaging optical system, and a reference plate provided between the second light source and the optical system. Measuring device.
る光源駆動装置を設け、2つの光源が同時に点灯しない
ように制御されることを特徴とする請求項1記載の屈折
率分布の測定装置。2. The refractive index distribution according to claim 1, wherein a light source driving device for controlling both the light source and the second light source is provided, and the two light sources are controlled so as not to be turned on at the same time. measuring device.
特徴とする請求項1又は2記載の屈折率分布の測定装
置。3. An apparatus according to claim 1, wherein said optical system is a zoom lens.
手段を設けたことを特徴とする請求項1から3のいずれ
かに記載の屈折率分布の測定装置。4. The apparatus for measuring a refractive index distribution according to claim 1, further comprising a transmitted light amount changing means for changing the light amount of the light source.
式近似により屈折率分布の多項式近似係数を求める演算
手段であることを特徴とする請求項1記載の屈折率の測
定装置。5. The apparatus for measuring a refractive index according to claim 1, wherein said calculating means is a calculating means for obtaining a polynomial approximation coefficient of a refractive index distribution by a polynomial approximation by a least square method.
して干渉縞像を結像させ、結像位置に設けた干渉縞検出
器上の干渉縞像から被検物の1測定断面について透過波
面を求め、該透過波面から被検物の上記1測定断面につ
いて屈折率の分布を算出する屈折率分布の測定方法にお
いて、 上記干渉縞検出器の測定方向をx’として透過波面W
(x’,y)を求め、該干渉縞検出器上に長さが既知の
基準パターンの像を結像させ、該基準パターンの像の長
さから演算装置により倍率Mを求め、該演算装置によっ
て該倍率Mからx=Mx’によりW(x,y)を算出
し、さらに屈折率の分布N(x,y)を求めることを特
徴とする屈折率の測定方法。6. Transmitting the coherent light to the test object, forming an interference fringe image via an optical system, and detecting the interference fringe image from the interference fringe image on the interference fringe detector provided at the imaging position. In a method for measuring a refractive index distribution for obtaining a transmitted wavefront for a measurement section and calculating a refractive index distribution for the one measurement section of the test object from the transmitted wavefront, the transmitted wavefront is defined as x ′ in the measurement direction of the interference fringe detector. W
(X ′, y) is obtained, an image of a reference pattern having a known length is formed on the interference fringe detector, and a magnification M is obtained from a length of the image of the reference pattern by an arithmetic unit. A W (x, y) is calculated from the magnification M by x = Mx ′, and a refractive index distribution N (x, y) is further obtained.
布N(x,y)が、 N(x,y)=W(x,y)/d(x,y) ただし:d(x,y)は被検物の厚さにより求められ、
かつ、演算装置が、上記透過波面から最小自乗法による
多項式近似によって屈折率分布の多項式近似係数を求め
ることを特徴とする請求項6記載の屈折率分布の測定方
法。7. From the transmitted wavefront W (x, y), the refractive index distribution N (x, y) is given by N (x, y) = W (x, y) / d (x, y) where: d (x, y) x, y) is determined by the thickness of the test object,
7. The method of measuring a refractive index distribution according to claim 6, wherein the arithmetic unit obtains a polynomial approximation coefficient of the refractive index distribution from the transmitted wavefront by a polynomial approximation by the least square method.
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| JP06111999A JP3948852B2 (en) | 1999-03-09 | 1999-03-09 | Refractive index distribution measuring apparatus and refractive index distribution measuring method |
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| JP06111999A JP3948852B2 (en) | 1999-03-09 | 1999-03-09 | Refractive index distribution measuring apparatus and refractive index distribution measuring method |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006200998A (en) * | 2005-01-19 | 2006-08-03 | Canon Inc | Image processing apparatus, image processing program, and refractive index distribution measuring apparatus |
| CN102297758A (en) * | 2010-05-25 | 2011-12-28 | 佳能株式会社 | Refractive index distribution measuring method and refractive index distribution measuring apparatus |
| CN106970049A (en) * | 2017-05-15 | 2017-07-21 | 中国工程物理研究院激光聚变研究中心 | Transmissivity distribution measurement system and method |
-
1999
- 1999-03-09 JP JP06111999A patent/JP3948852B2/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006200998A (en) * | 2005-01-19 | 2006-08-03 | Canon Inc | Image processing apparatus, image processing program, and refractive index distribution measuring apparatus |
| CN102297758A (en) * | 2010-05-25 | 2011-12-28 | 佳能株式会社 | Refractive index distribution measuring method and refractive index distribution measuring apparatus |
| CN106970049A (en) * | 2017-05-15 | 2017-07-21 | 中国工程物理研究院激光聚变研究中心 | Transmissivity distribution measurement system and method |
| CN106970049B (en) * | 2017-05-15 | 2024-01-02 | 中国工程物理研究院激光聚变研究中心 | Transmittance distribution measurement system and method |
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| Publication number | Publication date |
|---|---|
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