JP2005148497A5 - - Google Patents
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- Publication number
- JP2005148497A5 JP2005148497A5 JP2003387096A JP2003387096A JP2005148497A5 JP 2005148497 A5 JP2005148497 A5 JP 2005148497A5 JP 2003387096 A JP2003387096 A JP 2003387096A JP 2003387096 A JP2003387096 A JP 2003387096A JP 2005148497 A5 JP2005148497 A5 JP 2005148497A5
- Authority
- JP
- Japan
- Prior art keywords
- laser
- light
- laser beam
- laser light
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims 10
- 238000004587 chromatography analysis Methods 0.000 claims 3
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003387096A JP2005148497A (ja) | 2003-11-17 | 2003-11-17 | 走査型レーザ顕微鏡システム |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003387096A JP2005148497A (ja) | 2003-11-17 | 2003-11-17 | 走査型レーザ顕微鏡システム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005148497A JP2005148497A (ja) | 2005-06-09 |
| JP2005148497A5 true JP2005148497A5 (de) | 2007-01-11 |
Family
ID=34694585
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003387096A Pending JP2005148497A (ja) | 2003-11-17 | 2003-11-17 | 走査型レーザ顕微鏡システム |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2005148497A (de) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007183111A (ja) * | 2006-01-04 | 2007-07-19 | Nikon Corp | 光強度検出装置とこれを有する光学装置、顕微鏡 |
| JP5075722B2 (ja) * | 2008-04-14 | 2012-11-21 | オリンパス株式会社 | 走査型レーザ顕微鏡 |
| EP2629133A4 (de) * | 2010-10-14 | 2017-12-13 | Nikon Corporation | Vorrichtung für strukturierte beleuchtung, mikroskopvorrichtung für strukturierte beleuchtung und vorrichtung zur messung einer oberflächenform |
| WO2015087629A1 (ja) * | 2013-12-10 | 2015-06-18 | ソニー株式会社 | 画像取得装置及び画像取得方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2666840B2 (ja) * | 1987-05-12 | 1997-10-22 | オリンパス光学工業株式会社 | 高温顕微鏡 |
| JP3343276B2 (ja) * | 1993-04-15 | 2002-11-11 | 興和株式会社 | レーザー走査型光学顕微鏡 |
| DE19861383B4 (de) * | 1998-06-18 | 2008-03-27 | Carl Zeiss Jena Gmbh | Laserscanmikroskop |
| JP2001013417A (ja) * | 1999-07-01 | 2001-01-19 | Keyence Corp | 光走査装置 |
| DE10037783A1 (de) * | 2000-08-03 | 2002-02-14 | Leica Microsystems | Verfahren und Vorrichtung zur Phasenkorrektur von Positions- und Detektionssignalen in der Scanmikroskopie und Scanmikroskop |
| JP3861000B2 (ja) * | 2001-12-25 | 2006-12-20 | オリンパス株式会社 | 走査型レーザー顕微鏡 |
| JP2003270146A (ja) * | 2002-03-15 | 2003-09-25 | Communication Research Laboratory | 顕微鏡システム |
| JP2005140981A (ja) * | 2003-11-06 | 2005-06-02 | Nikon Corp | 顕微鏡装置 |
-
2003
- 2003-11-17 JP JP2003387096A patent/JP2005148497A/ja active Pending
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