JP2014519558A - フレキシブル基材上にバリヤー層を製造するための方法および機器 - Google Patents
フレキシブル基材上にバリヤー層を製造するための方法および機器 Download PDFInfo
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- JP2014519558A JP2014519558A JP2014515276A JP2014515276A JP2014519558A JP 2014519558 A JP2014519558 A JP 2014519558A JP 2014515276 A JP2014515276 A JP 2014515276A JP 2014515276 A JP2014515276 A JP 2014515276A JP 2014519558 A JP2014519558 A JP 2014519558A
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- Prior art keywords
- substrate
- electrodes
- oxide layer
- inorganic oxide
- layer
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-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6302—Non-deposition formation processes
- H10P14/6316—Formation by nitridation, e.g. nitridation of the substrate
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32018—Glow discharge
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/118—Electrodes comprising insulating layers having particular dielectric or electrostatic properties, e.g. having static charges
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K77/00—Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
- H10K77/10—Substrates, e.g. flexible substrates
- H10K77/111—Flexible substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
- H10P14/6516—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials
- H10P14/6518—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer
- H10P14/6524—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer the substance being nitrogen
- H10P14/6526—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer the substance being nitrogen introduced into an oxide material, e.g. changing SiO to SiON
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
- H10P14/6516—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials
- H10P14/6548—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by forming intermediate materials, e.g. capping layers or diffusion barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
- H10P14/665—Porous materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
- Y10T428/249967—Inorganic matrix in void-containing component
- Y10T428/249969—Of silicon-containing material [e.g., glass, etc.]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Laminated Bodies (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Electroluminescent Light Sources (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1110117.7 | 2011-06-16 | ||
| GBGB1110117.7A GB201110117D0 (en) | 2011-06-16 | 2011-06-16 | method and device for manufacturing a barrie layer on a flexible substrate |
| PCT/GB2012/050897 WO2012172304A1 (en) | 2011-06-16 | 2012-04-24 | Method and device for manufacturing a barrier layer on a flexible substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2014519558A true JP2014519558A (ja) | 2014-08-14 |
| JP2014519558A5 JP2014519558A5 (2) | 2015-06-18 |
Family
ID=44357840
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014515276A Pending JP2014519558A (ja) | 2011-06-16 | 2012-04-24 | フレキシブル基材上にバリヤー層を製造するための方法および機器 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US9117663B2 (2) |
| EP (1) | EP2721193B1 (2) |
| JP (1) | JP2014519558A (2) |
| GB (1) | GB201110117D0 (2) |
| WO (1) | WO2012172304A1 (2) |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB201210836D0 (en) * | 2012-06-19 | 2012-08-01 | Fujifilm Mfg Europe Bv | Method and device for manufacturing a barrier layer on a flexible substrate |
| JP6117124B2 (ja) * | 2013-03-19 | 2017-04-19 | 富士フイルム株式会社 | 酸化物半導体膜及びその製造方法 |
| GB201403551D0 (en) | 2014-02-28 | 2014-04-16 | Fujifilm Mfg Europe Bv | Membrane stacks |
| CN106783720B (zh) * | 2017-03-03 | 2020-06-23 | 京东方科技集团股份有限公司 | 一种显示基板及其制作方法 |
| US10224224B2 (en) | 2017-03-10 | 2019-03-05 | Micromaterials, LLC | High pressure wafer processing systems and related methods |
| US10622214B2 (en) | 2017-05-25 | 2020-04-14 | Applied Materials, Inc. | Tungsten defluorination by high pressure treatment |
| US10847360B2 (en) | 2017-05-25 | 2020-11-24 | Applied Materials, Inc. | High pressure treatment of silicon nitride film |
| KR102574914B1 (ko) | 2017-06-02 | 2023-09-04 | 어플라이드 머티어리얼스, 인코포레이티드 | 보론 카바이드 하드마스크의 건식 스트리핑 |
| US10269571B2 (en) | 2017-07-12 | 2019-04-23 | Applied Materials, Inc. | Methods for fabricating nanowire for semiconductor applications |
| US10234630B2 (en) | 2017-07-12 | 2019-03-19 | Applied Materials, Inc. | Method for creating a high refractive index wave guide |
| US10179941B1 (en) | 2017-07-14 | 2019-01-15 | Applied Materials, Inc. | Gas delivery system for high pressure processing chamber |
| US10276411B2 (en) | 2017-08-18 | 2019-04-30 | Applied Materials, Inc. | High pressure and high temperature anneal chamber |
| JP6947914B2 (ja) | 2017-08-18 | 2021-10-13 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 高圧高温下のアニールチャンバ |
| CN111095524B (zh) | 2017-09-12 | 2023-10-03 | 应用材料公司 | 用于使用保护阻挡物层制造半导体结构的设备和方法 |
| US10643867B2 (en) | 2017-11-03 | 2020-05-05 | Applied Materials, Inc. | Annealing system and method |
| KR102585074B1 (ko) | 2017-11-11 | 2023-10-04 | 마이크로머티어리얼즈 엘엘씨 | 고압 프로세싱 챔버를 위한 가스 전달 시스템 |
| SG11202003438QA (en) | 2017-11-16 | 2020-05-28 | Applied Materials Inc | High pressure steam anneal processing apparatus |
| JP2021503714A (ja) | 2017-11-17 | 2021-02-12 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 高圧処理システムのためのコンデンサシステム |
| JP7299898B2 (ja) | 2018-01-24 | 2023-06-28 | アプライド マテリアルズ インコーポレイテッド | 高圧アニールを用いたシーム修復 |
| CN111902929B (zh) | 2018-03-09 | 2025-09-19 | 应用材料公司 | 用于含金属材料的高压退火处理 |
| US10714331B2 (en) | 2018-04-04 | 2020-07-14 | Applied Materials, Inc. | Method to fabricate thermally stable low K-FinFET spacer |
| US10950429B2 (en) | 2018-05-08 | 2021-03-16 | Applied Materials, Inc. | Methods of forming amorphous carbon hard mask layers and hard mask layers formed therefrom |
| US10566188B2 (en) | 2018-05-17 | 2020-02-18 | Applied Materials, Inc. | Method to improve film stability |
| US10704141B2 (en) | 2018-06-01 | 2020-07-07 | Applied Materials, Inc. | In-situ CVD and ALD coating of chamber to control metal contamination |
| US10748783B2 (en) | 2018-07-25 | 2020-08-18 | Applied Materials, Inc. | Gas delivery module |
| US10675581B2 (en) | 2018-08-06 | 2020-06-09 | Applied Materials, Inc. | Gas abatement apparatus |
| JP7179172B6 (ja) | 2018-10-30 | 2022-12-16 | アプライド マテリアルズ インコーポレイテッド | 半導体用途の構造体をエッチングするための方法 |
| KR20210077779A (ko) | 2018-11-16 | 2021-06-25 | 어플라이드 머티어리얼스, 인코포레이티드 | 강화된 확산 프로세스를 사용한 막 증착 |
| WO2020117462A1 (en) | 2018-12-07 | 2020-06-11 | Applied Materials, Inc. | Semiconductor processing system |
| US11996540B2 (en) | 2019-12-20 | 2024-05-28 | Intecells, Inc. | Method and apparatus for making lithium ion battery electrodes |
| US11621411B2 (en) * | 2019-12-23 | 2023-04-04 | Intecells, Inc. | Method of insulating lithium ion electrochemical cell components with metal oxide coatings |
| US11901222B2 (en) | 2020-02-17 | 2024-02-13 | Applied Materials, Inc. | Multi-step process for flowable gap-fill film |
| GB202109309D0 (en) * | 2021-06-29 | 2021-08-11 | Fujifilm Mfg Europe Bv | Gas separation membranes |
| SE2330191A1 (en) | 2023-05-01 | 2024-11-02 | Volvo Truck Corp | Radar-based wheel end modules for determining wheel force generating capability |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003264058A (ja) * | 2002-03-07 | 2003-09-19 | Konica Corp | 基板及び該基板を用いた有機エレクトロルミネッセンス表示装置 |
| EP1403902A1 (en) * | 2002-09-30 | 2004-03-31 | Fuji Photo Film B.V. | Method and arrangement for generating an atmospheric pressure glow discharge plasma (APG) |
| JP2004276566A (ja) * | 2003-03-19 | 2004-10-07 | Dainippon Printing Co Ltd | ガスバリア性積層材 |
| US20060148140A1 (en) * | 2004-12-31 | 2006-07-06 | Lin-En Chou | Method for forming a silicon oxynitride layer |
| US20070026243A1 (en) * | 2005-07-11 | 2007-02-01 | Fuji Photo Film Co., Ltd. | Gas barrier film, substrate film, and organic electroluminescence device |
| WO2009104443A1 (ja) * | 2008-02-19 | 2009-08-27 | コニカミノルタホールディングス株式会社 | 薄膜形成方法及び薄膜積層体 |
| US20110014424A1 (en) * | 2008-02-21 | 2011-01-20 | Fujifilm Manufacturing Europe B.V. | Plasma treatment apparatus and method for treatment of a substrate with atmospheric pressure glow discharge electrode configuration |
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| JPH04249520A (ja) | 1991-01-08 | 1992-09-04 | Matsushita Electric Works Ltd | 液状エポキシ樹脂成形材料 |
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| US6794311B2 (en) * | 2000-07-14 | 2004-09-21 | Applied Materials Inc. | Method and apparatus for treating low k dielectric layers to reduce diffusion |
| JP2003068850A (ja) * | 2001-08-29 | 2003-03-07 | Tokyo Electron Ltd | 半導体装置およびその製造方法 |
| ATE524574T1 (de) | 2001-10-02 | 2011-09-15 | Nat Inst Of Advanced Ind Scien | Verfahren zur herstellung vom dünnen metalloxidfilm |
| US6774569B2 (en) | 2002-07-11 | 2004-08-10 | Fuji Photo Film B.V. | Apparatus for producing and sustaining a glow discharge plasma under atmospheric conditions |
| US7288204B2 (en) | 2002-07-19 | 2007-10-30 | Fuji Photo Film B.V. | Method and arrangement for treating a substrate with an atmospheric pressure glow plasma (APG) |
| US20050202168A1 (en) * | 2002-08-16 | 2005-09-15 | General Electric Company | Thermally-stabilized thermal barrier coating and process therefor |
| KR100808790B1 (ko) | 2003-05-23 | 2008-03-03 | 주식회사 엘지화학 | 질소 플라즈마 처리된 ito 필름 및 이를 양극으로사용한 유기 발광 소자 |
| JP4057972B2 (ja) * | 2003-07-25 | 2008-03-05 | 富士通株式会社 | 半導体装置の製造方法 |
| JP2005142325A (ja) * | 2003-11-06 | 2005-06-02 | Semiconductor Leading Edge Technologies Inc | 半導体装置及びその製造方法 |
| EP1548795A1 (en) | 2003-12-22 | 2005-06-29 | Fuji Photo Film B.V. | Method and apparatus for stabilizing a glow discharge plasma under atmospheric conditions |
| EP1697962B1 (en) | 2003-12-22 | 2009-12-09 | FUJIFILM Manufacturing Europe B.V. | Method of and arrangement for removing contaminants from a substrate surface using an atmospheric pressure glow plasma |
| DE602004003697T2 (de) | 2004-08-13 | 2007-10-04 | Fuji Film Manufacturing Europe B.V. | Verfahren und Vorrichtung zur Steuerung eines Glühentladungsplasmas unter atmosphärischem Druck |
| US7229918B2 (en) | 2005-02-14 | 2007-06-12 | Infineon Technologies Ag | Nitrogen rich barrier layers and methods of fabrication thereof |
| WO2007024134A1 (en) | 2005-08-26 | 2007-03-01 | Fujifilm Manufacturing Europe B.V. | Method and arrangement for generating and controlling a discharge plasma |
| US20080242118A1 (en) * | 2007-03-29 | 2008-10-02 | International Business Machines Corporation | Methods for forming dense dielectric layer over porous dielectrics |
| US7629264B2 (en) * | 2008-04-09 | 2009-12-08 | International Business Machines Corporation | Structure and method for hybrid tungsten copper metal contact |
| KR20090116477A (ko) * | 2008-05-07 | 2009-11-11 | 삼성전자주식회사 | 초저유전막을 포함하는 반도체 소자의 제조 방법 |
| JP5173863B2 (ja) * | 2009-01-20 | 2013-04-03 | パナソニック株式会社 | 半導体装置およびその製造方法 |
| EP2226832A1 (en) | 2009-03-06 | 2010-09-08 | FUJIFILM Manufacturing Europe B.V. | Substrate plasma treatment using side tabs |
| US8334202B2 (en) * | 2009-11-03 | 2012-12-18 | Infineon Technologies Ag | Device fabricated using an electroplating process |
-
2011
- 2011-06-16 GB GBGB1110117.7A patent/GB201110117D0/en not_active Ceased
-
2012
- 2012-04-24 WO PCT/GB2012/050897 patent/WO2012172304A1/en not_active Ceased
- 2012-04-24 US US14/126,572 patent/US9117663B2/en active Active
- 2012-04-24 JP JP2014515276A patent/JP2014519558A/ja active Pending
- 2012-04-24 EP EP12719037.9A patent/EP2721193B1/en not_active Not-in-force
-
2015
- 2015-07-15 US US14/799,603 patent/US9390908B2/en not_active Expired - Fee Related
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003264058A (ja) * | 2002-03-07 | 2003-09-19 | Konica Corp | 基板及び該基板を用いた有機エレクトロルミネッセンス表示装置 |
| EP1403902A1 (en) * | 2002-09-30 | 2004-03-31 | Fuji Photo Film B.V. | Method and arrangement for generating an atmospheric pressure glow discharge plasma (APG) |
| JP2004276566A (ja) * | 2003-03-19 | 2004-10-07 | Dainippon Printing Co Ltd | ガスバリア性積層材 |
| US20060148140A1 (en) * | 2004-12-31 | 2006-07-06 | Lin-En Chou | Method for forming a silicon oxynitride layer |
| US20070026243A1 (en) * | 2005-07-11 | 2007-02-01 | Fuji Photo Film Co., Ltd. | Gas barrier film, substrate film, and organic electroluminescence device |
| WO2009104443A1 (ja) * | 2008-02-19 | 2009-08-27 | コニカミノルタホールディングス株式会社 | 薄膜形成方法及び薄膜積層体 |
| US20110052924A1 (en) * | 2008-02-19 | 2011-03-03 | Konica Minolta Holdings, Inc. | Thin film forming method and thin film stack |
| US20110014424A1 (en) * | 2008-02-21 | 2011-01-20 | Fujifilm Manufacturing Europe B.V. | Plasma treatment apparatus and method for treatment of a substrate with atmospheric pressure glow discharge electrode configuration |
| JP2011512459A (ja) * | 2008-02-21 | 2011-04-21 | フジフィルム マニュファクチュアリング ヨーロッパ ビー.ヴィ. | プラズマ処理装置、及び大気圧グロー放電電極構成を使用して基板を処理するための方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012172304A1 (en) | 2012-12-20 |
| US20140138802A1 (en) | 2014-05-22 |
| EP2721193A1 (en) | 2014-04-23 |
| US9390908B2 (en) | 2016-07-12 |
| GB201110117D0 (en) | 2011-07-27 |
| US20150315701A1 (en) | 2015-11-05 |
| US9117663B2 (en) | 2015-08-25 |
| EP2721193B1 (en) | 2015-03-04 |
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