JP2018507384A - 圧着測定装置 - Google Patents
圧着測定装置 Download PDFInfo
- Publication number
- JP2018507384A JP2018507384A JP2017519327A JP2017519327A JP2018507384A JP 2018507384 A JP2018507384 A JP 2018507384A JP 2017519327 A JP2017519327 A JP 2017519327A JP 2017519327 A JP2017519327 A JP 2017519327A JP 2018507384 A JP2018507384 A JP 2018507384A
- Authority
- JP
- Japan
- Prior art keywords
- measuring
- knife
- crimping
- measuring device
- crimp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
- G01B5/06—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness
- G01B5/061—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness height gauges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/04—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for forming connections by deformation, e.g. crimping tool
- H01R43/048—Crimping apparatus or processes
- H01R43/0488—Crimping apparatus or processes with crimp height adjusting means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70625—Dimensions, e.g. line width, critical dimension [CD], profile, sidewall angle or edge roughness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
Description
2:測定点
3:圧着コネクタ
4:ケーブルラグ
5:電気絶縁ケーブル
6:導電体端部
6:中心導電体
7:絶縁圧着部
8:ケーブル端部
9:圧着縁部
10:溝側の接点
11:基部上の接点
12:弾性的に起立したツール(プレート型部材)
12:ツール
13:弾性部材
14:溝
15:キャビティ
16:底部
17:キャビティ
17:ホルダー
18:偏心リセス
19:底部のボルト
20:制止手段
21:カム
22:溝
23:ばね
図面訳
図7
Scan WorkOrder 作業命令をスキャン
Parameter setis loaded パラメーターセットがロードされる
Scan press プレスをスキャン
Scanapplicator アプリケーターをスキャン
Scan contact コンタクトをスキャン
Referencecrimp 基準の圧着
Startproduction 製造の開始
Batch control バッチコントロール
Continueproduction 製造を続ける
Claims (15)
- 圧着コネクタにおける圧着部の圧着高さ(CH)を測定する測定装置であって、弾性ツールが設けられている測定ナイフを備え、このツールは、前記測定ナイフの中心に配置され、前記測定ナイフの向きに対して垂直なプレート型ツールからなる、測定装置。
- 圧着装置はまた、前記測定ナイフに対するホルダーを備える、請求項1に記載の測定装置。
- 前記測定ナイフは、前記ホルダーによって測定点に対向して側方に可動である、請求項2に記載の測定装置。
- 前記ホルダーは円筒形である、請求項2又は3に記載の測定装置。
- 前記測定ナイフは、前記ホルダー内に偏心して配置される、請求項4に記載の測定装置。
- 前記ホルダーは、該ホルダーを側方に変位させるために、係合点又は該ホルダーを回転させるボルトを備える、請求項2〜5のいずれか1項に記載の測定装置。
- 前記測定ナイフには、前記ツールに対する溝が設けられている、請求項1〜6のいずれか1項に記載の測定装置。
- 前記測定ナイフには、弾性部材若しくはばねに対するキャビティが設けられている、請求項1〜7のいずれか1項に記載の測定装置。
- 前記測定ナイフには取外し可能な底部が設けられている、請求項1〜8のいずれか1項に記載の測定装置。
- コンタクトが内部に保持されると前記測定装置の自動的な閉鎖をもたらすソフトクローズ機構を備える、請求項1〜9のいずれか1項に記載の測定装置。
- 前記プレート型ツールは、頂部の鋭い点で終端する、請求項1〜10のいずれか1項に記載の測定装置。
- 前記プレート型ツールの底部側には、1つ又は複数のカムが設けられている、請求項1〜11のいずれか1項に記載の測定装置。
- 前記測定装置には、カメラ又は光学レンズを備えるCCD型カメラが設けられている、請求項1〜12のいずれか1項に記載の測定装置。
- 前記カメラは、前記測定ナイフに対して垂直に、また圧着コンタクトと同じ高さに位置決めされる、請求項13に記載の測定装置。
- 前記測定装置はトレーサビリティソフトウェアを備え、これにより、製造中、圧着プロセスの監視及び圧着パラメーターの調整を柔軟に行うことが確実になる、請求項1〜14のいずれか1項に記載の測定装置。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| BE2015/5778 | 2015-12-02 | ||
| BE2015/5778A BE1023160B1 (nl) | 2015-12-02 | 2015-12-02 | Krimp meetapparaat |
| PCT/IB2016/055190 WO2017093815A1 (en) | 2015-12-02 | 2016-08-31 | Crimping measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP6291630B1 JP6291630B1 (ja) | 2018-03-14 |
| JP2018507384A true JP2018507384A (ja) | 2018-03-15 |
Family
ID=55352954
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017519327A Expired - Fee Related JP6291630B1 (ja) | 2015-12-02 | 2016-08-31 | 圧着測定装置 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US9903706B2 (ja) |
| EP (1) | EP3191790B1 (ja) |
| JP (1) | JP6291630B1 (ja) |
| CN (1) | CN107532876A (ja) |
| BE (1) | BE1023160B1 (ja) |
| HU (1) | HUE038948T2 (ja) |
| MX (1) | MX2017003668A (ja) |
| PL (1) | PL3191790T3 (ja) |
| WO (1) | WO2017093815A1 (ja) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112461081A (zh) * | 2020-11-21 | 2021-03-09 | 杭州锦航日用品制造有限公司 | 一种木质工艺品外形尺寸检测装置 |
| CN113048318B (zh) * | 2021-04-13 | 2024-10-22 | 南京晨光东螺波纹管有限公司 | 一种在线监测位移的波纹管补偿器及在线监测位移的方法 |
| CN115319540B (zh) * | 2022-07-26 | 2023-08-25 | 南阳煜众精密机械有限公司 | 一种在机刀具偏心参数的视觉测量方法 |
| CN115790333A (zh) * | 2022-11-28 | 2023-03-14 | 南通弘晖精密塑胶有限公司 | 一种电视机异形塑料配件检测装置及检测方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5263443U (ja) * | 1975-11-05 | 1977-05-11 | ||
| JPH0251001A (ja) * | 1988-08-12 | 1990-02-21 | Yazaki Corp | バリ高さ測定法及び測定具 |
| JPH09119804A (ja) * | 1995-10-26 | 1997-05-06 | Sumitomo Wiring Syst Ltd | 圧着端子のかしめ部測定装置 |
| JPH10332307A (ja) * | 1997-05-30 | 1998-12-18 | Mitsuboshi Belting Ltd | 歯付ベルトの背厚測定器 |
| EP0964485A1 (en) * | 1998-06-11 | 1999-12-15 | The Whitaker Corporation | Crimp height measuring device |
| JP2000266501A (ja) * | 1999-03-15 | 2000-09-29 | Yazaki Corp | マイクロメータ |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4856186A (en) * | 1988-11-04 | 1989-08-15 | Amp Incorporated | Apparatus and method for determination of crimp height |
| US5421101A (en) * | 1994-04-14 | 1995-06-06 | Ut Automotive, Inc. | Dedicated crimp measuring gauge |
| EP1780846B1 (de) * | 2005-10-27 | 2009-03-18 | komax Holding AG | Messkopf und Verfahren zur Bestimmung der Crimphöhe eines Leitercrimps |
| CN102735138B (zh) * | 2011-04-12 | 2015-07-01 | 科马斯控股股份公司 | 测量结构以及用于至少确定压接触头的导线压接体的压接高度的方法 |
| JP6013847B2 (ja) * | 2012-09-14 | 2016-10-25 | 矢崎総業株式会社 | 端子圧着状態の検査方法及びその装置 |
| WO2014129095A1 (ja) * | 2013-02-23 | 2014-08-28 | 古河電気工業株式会社 | 接続構造体の製造方法、及び接続構造体の製造装置 |
| CN104457652A (zh) * | 2013-09-25 | 2015-03-25 | 珠海格力电器股份有限公司 | 端子压接质量检测装置、方法及端子压接系统 |
-
2015
- 2015-12-02 BE BE2015/5778A patent/BE1023160B1/nl not_active IP Right Cessation
-
2016
- 2016-08-31 CN CN201680003487.6A patent/CN107532876A/zh active Pending
- 2016-08-31 MX MX2017003668A patent/MX2017003668A/es unknown
- 2016-08-31 US US15/513,721 patent/US9903706B2/en active Active
- 2016-08-31 WO PCT/IB2016/055190 patent/WO2017093815A1/en not_active Ceased
- 2016-08-31 JP JP2017519327A patent/JP6291630B1/ja not_active Expired - Fee Related
- 2016-08-31 EP EP16767365.6A patent/EP3191790B1/en active Active
- 2016-08-31 HU HUE16767365A patent/HUE038948T2/hu unknown
- 2016-08-31 PL PL16767365T patent/PL3191790T3/pl unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5263443U (ja) * | 1975-11-05 | 1977-05-11 | ||
| JPH0251001A (ja) * | 1988-08-12 | 1990-02-21 | Yazaki Corp | バリ高さ測定法及び測定具 |
| JPH09119804A (ja) * | 1995-10-26 | 1997-05-06 | Sumitomo Wiring Syst Ltd | 圧着端子のかしめ部測定装置 |
| JPH10332307A (ja) * | 1997-05-30 | 1998-12-18 | Mitsuboshi Belting Ltd | 歯付ベルトの背厚測定器 |
| EP0964485A1 (en) * | 1998-06-11 | 1999-12-15 | The Whitaker Corporation | Crimp height measuring device |
| JP2000266501A (ja) * | 1999-03-15 | 2000-09-29 | Yazaki Corp | マイクロメータ |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2017093815A1 (en) | 2017-06-08 |
| US9903706B2 (en) | 2018-02-27 |
| JP6291630B1 (ja) | 2018-03-14 |
| US20170307356A1 (en) | 2017-10-26 |
| EP3191790B1 (en) | 2018-03-07 |
| CN107532876A (zh) | 2018-01-02 |
| BE1023160B1 (nl) | 2016-12-05 |
| MX2017003668A (es) | 2017-10-31 |
| EP3191790A1 (en) | 2017-07-19 |
| HUE038948T2 (hu) | 2018-12-28 |
| PL3191790T3 (pl) | 2018-06-29 |
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