JP3147590B2 - Method for manufacturing flexible circuit board for TAB - Google Patents
Method for manufacturing flexible circuit board for TABInfo
- Publication number
- JP3147590B2 JP3147590B2 JP13214393A JP13214393A JP3147590B2 JP 3147590 B2 JP3147590 B2 JP 3147590B2 JP 13214393 A JP13214393 A JP 13214393A JP 13214393 A JP13214393 A JP 13214393A JP 3147590 B2 JP3147590 B2 JP 3147590B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- tab
- flexible circuit
- resist
- copper foil
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4007—Surface contacts, e.g. bumps
Landscapes
- ing And Chemical Polishing (AREA)
- Wire Bonding (AREA)
- Lead Frames For Integrated Circuits (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は絶縁性、耐熱性に優れた
長尺フレキシブルフィルムからなるTAB用フレキシブ
ル回路基板製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a flexible circuit board for TAB comprising a long flexible film having excellent insulation and heat resistance.
【0002】[0002]
【従来の技術】ポリイミドフィルム等からなり、絶縁性
及び耐熱性に優れた長尺のフレキシブルフィルムに、例
えば銅箔により多数のリ−ドを形成してなるTAB用フ
レキシブル回路基板に半導体素子を実装したTAB式半
導体装置は、多量生産に適する、小型化できる、ファイ
ンパタ−ン化が可能である等、多くの特徴を有する為現
在では広く実用化されている。2. Description of the Related Art A semiconductor element is mounted on a TAB flexible circuit board formed of a polyimide film or the like and having a large number of leads formed of, for example, copper foil on a long flexible film having excellent insulation and heat resistance. The TAB type semiconductor device has many features such as being suitable for mass production, downsizing, fine patterning, etc., and has been widely put into practical use at present.
【0003】図10はTAB用フレキシブル回路基板を
説明するための平面図である。図において、1は長さ方
向に等間隔にデバイスホ−ル2、2a、2bが設けられ
た、厚さ50〜125μm程度、長さ200〜500m
程度の帯状フレキシブルフィルムである。FIG. 10 is a plan view for explaining a TAB flexible circuit board. In the drawing, reference numeral 1 denotes a device hole 2, 2a, 2b provided at regular intervals in the length direction, a thickness of about 50 to 125 μm, and a length of 200 to 500 m.
It is a strip-shaped flexible film of a degree.
【0004】3はベ−スフィルム1に設けられた銅の厚
さ15〜40μm、幅50〜300μm程度の銅箔から
なる多数のリ−ドで、その一部はデバイスホ−ル2内に
突出してインナ−リ−ド3aを形成している。4はベ−
スフィルム1を搬送するためのスプロケット穴である。[0004] Reference numeral 3 denotes a large number of leads made of copper foil having a thickness of 15 to 40 µm and a width of about 50 to 300 µm provided on the base film 1, some of which protrude into the device hole 2. Thus, an inner lead 3a is formed. 4 is a base
A sprocket hole for conveying the sfilm 1.
【0005】このようなTAB用フレキシブル回路基板
では、実装上の都合からオ−バ−ハング部の銅箔裏面側
の凹凸を除去して、なめらかな面にする必要があり、そ
の手段として化学研磨法が用いられていた。[0005] In such a TAB flexible circuit board, it is necessary to remove irregularities on the back side of the copper foil of the overhang portion to make the surface smooth because of the convenience of mounting. Method was used.
【0006】[0006]
【発明が解決しようとする課題】TAB用フレキシブル
回路基板は実装上の都合から、オ−バ−ハング部銅箔裏
面側の凹凸を除去し、なめらかな面にする要望が多くな
っている。そのために化学研磨法をもちいてエッチング
処理しているが、前述の従来技術では銅箔の表側も同時
にエッチングされてしまうため、銅箔裏面の凹凸を除去
するまでのエッチング量をかけると、回路基板としての
実用銅箔厚規格を割ってしまうという問題点を有してい
た。SUMMARY OF THE INVENTION There has been a growing demand for a TAB flexible circuit board to have a smooth surface by removing irregularities on the back side of an overhanging copper foil for convenience in mounting. For this reason, etching is performed using a chemical polishing method. However, in the above-described conventional technique, the front side of the copper foil is also etched at the same time. As a practical copper foil thickness standard.
【0007】そこで本発明はこのような問題点を解決す
るもので、その目的とするところは銅箔裏面側の凹凸の
みを選択的に化学研磨処理する方法を提供するところに
ある。Accordingly, the present invention is to solve such a problem, and an object of the present invention is to provide a method for selectively performing chemical polishing treatment only on the irregularities on the back side of a copper foil.
【0008】[0008]
【課題を解決するための手段】本発明に係わるTAB用
フレキシブル回路基板の製造方法は、ベースフィルムの
一部に開口が形成されているとともに前記開口を含む前
記ベースフィルム上に金属箔が設けられ、前記金属箔の
前記ベースフィルムと接合された面の反対面に対してレ
ジストがコーティングされたTAB用フレキシブル回路
基板の基材を用意する工程と、前記レジストがコーティ
ングされた状態で、前記ベースフィルムの開口内に位置
する金属箔の露出部を化学研磨して前記金属箔の露出部
を平坦化する工程と、を含むことを特徴とする。また、
上記の方法に加えて、前記基材を用意する工程の後に行
われる前記基材を洗浄する工程と、前記平坦化する工程
の後に行われるパターン露光工程と、前記パターン露光
工程の後に前記レジストが設けられた面に相反する面に
対して行われるレジストコーティング工程と、回路を形
成するために前記金属箔の不要な部分を除去するエッチ
ング工程と、前記レジストを除去する工程と、をさらに
含むことを特徴とする。According to a method of manufacturing a flexible circuit board for TAB according to the present invention, an opening is formed in a part of a base film, and a metal foil is provided on the base film including the opening. Preparing a base material of a TAB flexible circuit board in which a resist is coated on a surface of the metal foil opposite to a surface bonded to the base film; and forming the base film in a state where the resist is coated. Chemically polishing an exposed portion of the metal foil located in the opening of the metal foil to flatten the exposed portion of the metal foil. Also,
In addition to the above method, a step of cleaning the base material performed after the step of preparing the base material, a pattern exposure step performed after the flattening step, and the resist after the pattern exposure step A resist coating process performed on a surface opposite to the provided surface, an etching process for removing an unnecessary portion of the metal foil to form a circuit, and a process for removing the resist. It is characterized by.
【0009】[0009]
【作用】TAB用フレキシブル回路基板の化学研磨処理
は従来、フォトレジストをコ−ティングする前の洗浄工
程の中に含めて実施されるのが一般的であった。In the past, chemical polishing of a TAB flexible circuit board has generally been performed in a cleaning step before coating a photoresist.
【0010】本発明においては、フォトレジストコ−テ
ィング後に化学研磨処理を実施することにより、表側は
完全にフォトレジストにおおわれているためエッチング
されず、選択的に銅箔裏面側の凹凸部分がエッチングさ
れるため、凹凸が除去されなめらかな面になるまで化学
研磨処理しても、実用銅箔厚が確保できる。In the present invention, by performing a chemical polishing treatment after the photoresist coating, the front side is completely etched by the photoresist, so that it is not etched, and the uneven portion on the copper foil rear side is selectively etched. Therefore, even if chemical polishing is performed until the unevenness is removed and the surface becomes smooth, a practical copper foil thickness can be secured.
【0011】[0011]
【実施例】以下、本発明の一実施例を図1から図10を
用いて説明する。TAB用フレキシブル回路基板は、図
1の洗浄工程、図2の従来の化学研磨工程、図3の従来
の表フォトレジストコ−ティング工程、図6のパタ−ン
露光工程、図7の現像裏面コ−ト工程、図8のエッチン
グ工程、図9のレジスト剥離工程、の各工程を経て、図
10のTAB用フレキシブル回路基板が完成する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to FIGS. The flexible circuit board for TAB includes a cleaning process shown in FIG. 1, a conventional chemical polishing process shown in FIG. 2, a conventional front photoresist coating process shown in FIG. 3, a pattern exposure process shown in FIG. 10, the etching step shown in FIG. 8, and the resist stripping step shown in FIG. 9, whereby the TAB flexible circuit board shown in FIG. 10 is completed.
【0012】実施段階において本発明では、図2の従来
の化学研磨工程において、ベ−スフィルム1、オ−バ−
ハング部2、接着剤5、銅箔6、から成るTAB用フレ
キシブル回路基板の基材に対して、オ−バ−ハング部2
の銅箔裏面側の凹凸を除去する際に、いかに銅箔の総厚
を減らさずに銅箔の裏面側をなめらかな面にするかが課
題であった。In the present embodiment, in the present invention, in the conventional chemical polishing process shown in FIG.
An overhang portion 2 is formed on the base material of the TAB flexible circuit board including the hang portion 2, the adhesive 5, and the copper foil 6.
When removing the irregularities on the back side of the copper foil, the problem was how to make the back side of the copper foil a smooth surface without reducing the total thickness of the copper foil.
【0013】図2の従来の化学研磨工程では、デッピン
グ方式(化学研磨液の中へテ−プを浸漬させる)で化学
研磨処理を実施した場合、例えば、銅箔裏面の凹凸が7
μm程度あったとすると、これを除去するためには表側
も7μm研磨されてしまうことになり、銅箔の総厚が当
初40μmあったものは26μmなってしまい回路基板
としての実用銅箔強度が問題になる。又、銅箔裏面方向
を選択的に化学研磨処理する方法として、スプレ−方式
による方法もあるが、化学研磨液の銅箔表側への回り込
み等により、裏面に対して表側も50%程度の率で研磨
されてしまい銅箔の総厚を必要以上に減少させる要因と
なっていた。In the conventional chemical polishing step shown in FIG. 2, when the chemical polishing treatment is performed by dipping (dipping the tape in a chemical polishing liquid), for example, the irregularities on the back surface of the copper foil are reduced by 7%.
If it was about μm, the front side would be polished by 7 μm to remove this, and the copper foil with a total thickness of 40 μm initially would be 26 μm, and the practical copper foil strength as a circuit board would be a problem. become. As a method of selectively performing the chemical polishing treatment on the back side of the copper foil, there is a method using a spray method. And the total thickness of the copper foil was unnecessarily reduced.
【0014】これらの課題を解決するために本発明で
は、図1の洗浄工程後に図4の本発明の表フォトレジス
トコ−ティング工程を従来方式の工程順と入れ替えて実
施し、その後で図5の本発明の化学研磨工程を実施して
いる。これにより化学研磨実施時点では、銅箔表側は完
全にフォトレジストにおおわれているため、スプレ−方
式及びデッピング方式の、いずれの化学研磨方式を実施
しても、2のオ−バ−ハング部銅箔裏面側のみを選択的
に化学研磨処理できることになる。従来の化学研磨工程
がフォトレジストコ−ティング工程の前にあった理由と
して、化学研磨液にフォトレジストがおかされ、強度的
に弱くなり、フォトレジスト本来の役目であるパタ−ニ
ング品質に悪い影響をおよぼすとが考えられていた。し
かし、TAB用フレキシブル回路基板の製造に使用され
る高性能フォトレジストの場合、柔軟性及び耐薬品性に
おいて、近年めざましい進歩があり、特に東京応化株式
会社製、PMER−RF、PMER−RZ、ヘキスト社
製AZ−8112においては、硝酸、硫酸をベ−スに合
成されている化学研磨液に対して、まったく問題のない
レベルにある。又、本来フォトレジストの場合、回路基
板のエッチングレジストとして使用されるケ−スが多
い、従って回路基板のエッチング液として一般的な塩化
第二鉄や塩化第二銅の酸性エッチング液に対しては、耐
薬品性は充分であることから、他のフォトレジストのな
かにも化学研磨液に対して実用的に問題のないレベルに
あるものが多いものと予測できる。In order to solve these problems, according to the present invention, after the cleaning step shown in FIG. 1, the front photoresist coating step of the present invention shown in FIG. Of the present invention is carried out. As a result, at the time of chemical polishing, the copper foil front side is completely covered with the photoresist. Only the foil backside can be selectively chemically polished. The reason that the conventional chemical polishing process was performed before the photoresist coating process was that the photoresist was placed in the chemical polishing solution, the strength became weak, and the patterning quality, which is the original role of the photoresist, was adversely affected. Was thought to be affected. However, in the case of a high-performance photoresist used for manufacturing a flexible circuit board for TAB, remarkable progress has been made in recent years in flexibility and chemical resistance, and in particular, PMER-RF, PMER-RZ, Hoechst manufactured by Tokyo Ohka Co., Ltd. In the case of AZ-8112 manufactured by Nissan, there is no problem at all with respect to the chemical polishing solution which is based on nitric acid and sulfuric acid. Also, in the case of photoresist, there are many cases that are used as an etching resist for a circuit board. Therefore, an acid etching solution of ferric chloride or cupric chloride, which is a general etching solution for a circuit board, is not used. Since the chemical resistance is sufficient, it can be expected that many of the other photoresists are at a level that is practically acceptable for the chemical polishing liquid.
【0015】次に、2のオ−バ−ハング部銅箔裏面側の
化学研磨処理の必要性については、半導体素子の実装上
の理由が大きい。その理由として2つあげられる。1つ
目はめっきの密着性を確かなものにして、実装における
信頼性を確保することにある。Next, the necessity of the chemical polishing treatment on the back surface side of the copper foil of the overhang portion 2 is largely due to the mounting of the semiconductor element. There are two reasons. The first is to ensure the adhesion of the plating and to ensure the reliability in mounting.
【0016】TAB用フレキシブル回路基板に使用され
る銅箔には、全面にわたって防錆処理がほどこされてい
る。特に銅箔裏面側の防錆処理層は厚いため、化学研磨
処理しないと除去できない。この防錆処理層が少しでも
残った場合、防錆剤としてクロム系化合物を使用してい
るため、めっきの密着性を悪くする。2つ目は、めっき
析出量の均一化による実装信頼性の確保である。つま
り、銅箔裏面側には凹凸があるため、表側に比べ表面積
は数倍にも達している。しかも凹凸の形状はさまざまで
あるため、場所によってかなり表面積に差があるものと
考えられる。そこへめっきがついた場合、表側は厚みの
コントロ−ルをすれば一定のめっき析出量が得られる
が、裏面側の場合表面積が大きい分だけめっき析出量も
多くなり、しかも場所によって量のバラツキもあるとい
うことになる。このような状態においてインナ−リ−ド
ボンディングを実施した場合、インナ−リ−ド部裏面側
の凹凸面から余剰のめっき分が溶け出し、共晶コブを発
生させ、いちじるしく信頼性を悪くしている例も実際に
発生している。The copper foil used for the TAB flexible circuit board has been rust-proofed over the entire surface. In particular, the rust-preventive layer on the back side of the copper foil is thick and cannot be removed without chemical polishing. If any of the rust-preventive layer remains, the adhesion of the plating deteriorates because a chromium-based compound is used as a rust-preventive agent. The second is to secure the mounting reliability by making the plating deposition amount uniform. That is, since the copper foil rear surface has irregularities, the surface area is several times as large as that of the front surface. Moreover, since the shapes of the irregularities are various, it is considered that there is a considerable difference in the surface area depending on the location. When plating is applied, a certain amount of plating deposition can be obtained by controlling the thickness on the front side, but the amount of plating deposition increases on the back side due to the large surface area, and the amount varies depending on the location. There is also. When the inner lead bonding is performed in such a state, excess plating melts out from the uneven surface on the back surface side of the inner lead portion, and eutectic bumps are generated, thereby significantly lowering the reliability. Some examples have actually occurred.
【0017】以上、2つの問題点は、化学研磨処理によ
り銅箔裏面側の凹凸をフラットにすることにより解決さ
れる。The above two problems can be solved by flattening the irregularities on the back side of the copper foil by chemical polishing.
【0018】[0018]
【発明の効果】以上の説明の通り本発明は、TAB用フ
レキシブル回路基板の信頼性確保のために不可欠な、化
学研磨処理を銅箔裏面側の凹凸面のみに選択的に実施す
ることにより銅箔厚みを実用厚み以上に保ちながら、か
つ凹凸面をフラットにできるという効果を有する。As described above, according to the present invention, copper polishing is performed by selectively performing chemical polishing, which is indispensable for securing the reliability of a flexible circuit board for TAB, only on the uneven surface on the back side of the copper foil. This has the effect that the thickness of the foil can be kept above the practical thickness and the uneven surface can be made flat.
【図1】 洗浄工程断面図。FIG. 1 is a sectional view of a cleaning step.
【図2】 従来の化学研磨工程断面図。FIG. 2 is a cross-sectional view of a conventional chemical polishing process.
【図3】 従来の表フォトレジストコ−ティング工程断
面図。FIG. 3 is a cross-sectional view of a conventional front photoresist coating process.
【図4】 本発明の表フォトレジストコ−ティング工程
断面図。FIG. 4 is a sectional view of a front photoresist coating process of the present invention.
【図5】 本発明の化学研磨工程断面図。FIG. 5 is a sectional view of a chemical polishing step of the present invention.
【図6】 パタ−ン露光工程断面図。FIG. 6 is a sectional view of a pattern exposure step.
【図7】 現像裏面コ−ト工程断面図。FIG. 7 is a sectional view of a developing backside coating process.
【図8】 エッチング工程断面図。FIG. 8 is a sectional view of an etching step.
【図9】 レジスト剥離工程断面図。FIG. 9 is a sectional view of a resist peeling step.
【図10】 TAB用フレキシブル回路基板の完成平面
図。FIG. 10 is a completed plan view of a TAB flexible circuit board.
1 ベ−スフィルム 2 オ−バ−ハング部 3 リ−ド 4 スプロケット穴 5 接着剤 6 銅箔 7 表フォトレジスト 8 裏面レジスト DESCRIPTION OF SYMBOLS 1 Base film 2 Overhang part 3 Lead 4 Sprocket hole 5 Adhesive 6 Copper foil 7 Front photoresist 8 Backside resist
Claims (2)
ているとともに前記開口を含む前記ベースフィルム上に
金属箔が設けられ、前記金属箔の前記ベースフィルムと
接合された面の反対面に対してレジストがコーティング
されたTAB用フレキシブル回路基板の基材を用意する
工程と、 前記レジストがコーティングされた状態で、前記ベース
フィルムの開口内に位置する金属箔の露出部を化学研磨
して前記金属箔の露出部を平坦化する工程と、を含むこ
とを特徴とするTAB用フレキシブル回路基板の製造方
法。An opening is formed in a part of the base film, and a metal foil is provided on the base film including the opening, and a surface of the metal foil opposite to a surface bonded to the base film is provided. Preparing a substrate of a TAB flexible circuit board coated with a resist by applying a resist, and chemically polishing the exposed portion of a metal foil located in an opening of the base film in a state where the resist is coated, thereby forming the metal. Flattening the exposed portion of the foil. A method for manufacturing a flexible circuit board for TAB, comprising:
前記基材を洗浄する工程と、 前記平坦化する工程の後に行われるパターン露光工程
と、 前記パターン露光工程の後に前記レジストが設けられた
面に相反する面に対して行われるレジストコーティング
工程と、 回路を形成するために前記金属箔の不要な部分を除去す
るエッチング工程と、 前記レジストを除去する工程と、 をさらに含むことを特徴とする請求項1記載のTAB用
フレキシブル回路基板の製造方法。2. A step of cleaning the base material performed after the step of preparing the base material; a pattern exposure step performed after the flattening step; and the resist being provided after the pattern exposure step. A resist coating process performed on a surface contradictory to the bent surface, an etching process for removing an unnecessary portion of the metal foil to form a circuit, and a process for removing the resist. The method for manufacturing a flexible circuit board for TAB according to claim 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13214393A JP3147590B2 (en) | 1993-06-02 | 1993-06-02 | Method for manufacturing flexible circuit board for TAB |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13214393A JP3147590B2 (en) | 1993-06-02 | 1993-06-02 | Method for manufacturing flexible circuit board for TAB |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH06342828A JPH06342828A (en) | 1994-12-13 |
| JP3147590B2 true JP3147590B2 (en) | 2001-03-19 |
Family
ID=15074372
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13214393A Expired - Fee Related JP3147590B2 (en) | 1993-06-02 | 1993-06-02 | Method for manufacturing flexible circuit board for TAB |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3147590B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6678113B2 (en) | 2001-03-19 | 2004-01-13 | Hitachi Global Storage Technologies Netherlands B.V. | Device and method for monitoring lubricant within a disk drive |
-
1993
- 1993-06-02 JP JP13214393A patent/JP3147590B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6678113B2 (en) | 2001-03-19 | 2004-01-13 | Hitachi Global Storage Technologies Netherlands B.V. | Device and method for monitoring lubricant within a disk drive |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH06342828A (en) | 1994-12-13 |
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