JP4317728B2 - ガス濃度フラックス計測装置 - Google Patents

ガス濃度フラックス計測装置 Download PDF

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Publication number
JP4317728B2
JP4317728B2 JP2003338466A JP2003338466A JP4317728B2 JP 4317728 B2 JP4317728 B2 JP 4317728B2 JP 2003338466 A JP2003338466 A JP 2003338466A JP 2003338466 A JP2003338466 A JP 2003338466A JP 4317728 B2 JP4317728 B2 JP 4317728B2
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JP
Japan
Prior art keywords
signal
measurement
modulation
laser
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003338466A
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English (en)
Japanese (ja)
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JP2005106546A (ja
Inventor
研二 牟田
昌純 田浦
耕 中屋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Central Research Institute of Electric Power Industry
Mitsubishi Heavy Industries Ltd
Original Assignee
Central Research Institute of Electric Power Industry
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2003338466A priority Critical patent/JP4317728B2/ja
Application filed by Central Research Institute of Electric Power Industry, Mitsubishi Heavy Industries Ltd filed Critical Central Research Institute of Electric Power Industry
Priority to CA 2689693 priority patent/CA2689693A1/en
Priority to US10/570,344 priority patent/US7365352B2/en
Priority to AU2004276642A priority patent/AU2004276642B2/en
Priority to CN2004800282746A priority patent/CN1860360B/zh
Priority to CA 2536416 priority patent/CA2536416C/en
Priority to DE200460031962 priority patent/DE602004031962D1/de
Priority to RU2006114763A priority patent/RU2308023C1/ru
Priority to PCT/JP2004/014159 priority patent/WO2005031275A2/ja
Priority to DK04788226T priority patent/DK1669736T3/da
Priority to EP20040788226 priority patent/EP1669736B1/en
Publication of JP2005106546A publication Critical patent/JP2005106546A/ja
Priority to NO20061901A priority patent/NO20061901L/no
Priority to AU2009200023A priority patent/AU2009200023B2/en
Application granted granted Critical
Publication of JP4317728B2 publication Critical patent/JP4317728B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2003338466A 2003-09-29 2003-09-29 ガス濃度フラックス計測装置 Expired - Fee Related JP4317728B2 (ja)

Priority Applications (13)

Application Number Priority Date Filing Date Title
JP2003338466A JP4317728B2 (ja) 2003-09-29 2003-09-29 ガス濃度フラックス計測装置
EP20040788226 EP1669736B1 (en) 2003-09-29 2004-09-28 Gas concentration flux measuring device
AU2004276642A AU2004276642B2 (en) 2003-09-29 2004-09-28 Gas flux measuring device
CN2004800282746A CN1860360B (zh) 2003-09-29 2004-09-28 气体浓度通量测量装置
CA 2536416 CA2536416C (en) 2003-09-29 2004-09-28 Gas flux measuring device
DE200460031962 DE602004031962D1 (de) 2003-09-29 2004-09-28 Gaskonzentrationsflussmessvorrichtung
CA 2689693 CA2689693A1 (en) 2003-09-29 2004-09-28 Gas flux measuring device
PCT/JP2004/014159 WO2005031275A2 (ja) 2003-09-29 2004-09-28 ガス濃度フラックス計測装置
DK04788226T DK1669736T3 (da) 2003-09-29 2004-09-28 Indretning til måling af en gaskoncentrationsstrøm
US10/570,344 US7365352B2 (en) 2003-09-29 2004-09-28 Gas concentration flux measuring device
RU2006114763A RU2308023C1 (ru) 2003-09-29 2004-09-28 Устройство для измерения потока газа
NO20061901A NO20061901L (no) 2003-09-29 2006-04-28 Apparat for maling av gassutslipp
AU2009200023A AU2009200023B2 (en) 2003-09-29 2009-01-02 Gas flux measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003338466A JP4317728B2 (ja) 2003-09-29 2003-09-29 ガス濃度フラックス計測装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009089702A Division JP2009150909A (ja) 2009-04-02 2009-04-02 ガス濃度フラックス計測装置

Publications (2)

Publication Number Publication Date
JP2005106546A JP2005106546A (ja) 2005-04-21
JP4317728B2 true JP4317728B2 (ja) 2009-08-19

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Family Applications (1)

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JP2003338466A Expired - Fee Related JP4317728B2 (ja) 2003-09-29 2003-09-29 ガス濃度フラックス計測装置

Country Status (11)

Country Link
US (1) US7365352B2 (da)
EP (1) EP1669736B1 (da)
JP (1) JP4317728B2 (da)
CN (1) CN1860360B (da)
AU (2) AU2004276642B2 (da)
CA (2) CA2536416C (da)
DE (1) DE602004031962D1 (da)
DK (1) DK1669736T3 (da)
NO (1) NO20061901L (da)
RU (1) RU2308023C1 (da)
WO (1) WO2005031275A2 (da)

Cited By (1)

* Cited by examiner, † Cited by third party
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KR101336207B1 (ko) * 2013-02-14 2013-12-06 대한민국 물질 교환량 분석 방법 및 장치

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JP4732277B2 (ja) * 2006-08-23 2011-07-27 トヨタ自動車株式会社 ガス分析装置及びガス分析方法
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KR101925502B1 (ko) * 2017-01-12 2019-02-27 서강대학교산학협력단 다원 기체의 농도 및 압력 산출 방법
CN107367570B (zh) * 2017-08-15 2019-05-24 江苏师范大学 一种化石燃料燃烧温度与气体浓度测量方法
JP7081146B2 (ja) * 2017-12-27 2022-06-07 富士電機株式会社 ガス分析装置
CN109211799A (zh) * 2018-11-14 2019-01-15 国网黑龙江省电力有限公司电力科学研究院 980nm波段激光测量六氟化硫气体中二氧化硫气体浓度的方法
CN109405907B (zh) * 2018-12-12 2023-10-03 中国农业大学 一种气体排放通量的检测方法及系统
CN110346315A (zh) * 2019-08-19 2019-10-18 大连世有电力科技有限公司 一种烟气测量装置
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Also Published As

Publication number Publication date
US20060262311A1 (en) 2006-11-23
EP1669736A4 (en) 2009-12-30
CA2689693A1 (en) 2005-04-07
AU2009200023A1 (en) 2009-02-05
RU2308023C1 (ru) 2007-10-10
EP1669736A2 (en) 2006-06-14
JP2005106546A (ja) 2005-04-21
EP1669736B1 (en) 2011-03-23
CN1860360B (zh) 2010-05-12
WO2005031275A3 (ja) 2005-05-19
WO2005031275A2 (ja) 2005-04-07
AU2004276642A1 (en) 2005-04-07
CN1860360A (zh) 2006-11-08
US7365352B2 (en) 2008-04-29
AU2004276642B2 (en) 2008-10-30
DK1669736T3 (da) 2011-06-27
AU2009200023B2 (en) 2010-08-26
CA2536416A1 (en) 2005-04-07
NO20061901L (no) 2006-04-28
CA2536416C (en) 2010-08-17
DE602004031962D1 (de) 2011-05-05

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