JP4808729B2 - 離間した突き当て型コンポーネント構造体 - Google Patents
離間した突き当て型コンポーネント構造体 Download PDFInfo
- Publication number
- JP4808729B2 JP4808729B2 JP2007541308A JP2007541308A JP4808729B2 JP 4808729 B2 JP4808729 B2 JP 4808729B2 JP 2007541308 A JP2007541308 A JP 2007541308A JP 2007541308 A JP2007541308 A JP 2007541308A JP 4808729 B2 JP4808729 B2 JP 4808729B2
- Authority
- JP
- Japan
- Prior art keywords
- gap
- plate
- plates
- sensor according
- bump
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0035—Constitution or structural means for controlling the movement of the flexible or deformable elements
- B81B3/0059—Constitution or structural means for controlling the movement not provided for in groups B81B3/0037 - B81B3/0056
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0264—Pressure sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/681—Shapes or dispositions thereof comprising holes not having chips therein, e.g. for outgassing, underfilling or bond wire passage
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07236—Soldering or alloying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Wire Bonding (AREA)
- Micromachines (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
- Coils Or Transformers For Communication (AREA)
- Pressure Sensors (AREA)
Description
12 第1のプレート
14 第2のプレート
16 第1の間隙
18 ハンダボール(バンプ)
22 特異セクション
24 隆起したプラットホーム
26 第2の間隙
28 第2のプレートの下面
30 隆起したプラットホームの上面
32 支柱
38 穴
42 溝
44 金属プレート
46 プレートの残部
50 堀
52,54,56 テザー
58,60,62 ハンダバンプを収容するための領域
70 切欠きセクション(逃げ)
Claims (17)
- 静電容量センサーであって、
第1のプレートと、
第1の間隙によって前記第1のプレートから離間させられた第2のプレートであって、ダイアフラムを具備してなる第2のプレートと、
前記プレートを相互接続すると共に前記第1の間隙を形成する複数のハンダバンプと、を具備してなり、
前記プレートの少なくとも一つは、前記第1のプレートと前記ダイアフラムとの間に第2の間隙を形成するために、隆起したプラットホームおよび凹部のうちの一方を含む特異セクションを有し、前記第2の間隙は第1の間隙とは異なるサイズを有し、前記第1のプレートと前記ダイアフラムとは前記第2の間隙においてコンデンサーを形成しており、
静電容量センサーはさらに、
前記第2の間隙の寸法を固定するための、前記特異セクションにおける、前記プレート間の、複数の支柱を具備してなることを特徴とする静電容量センサー。 - 前記ダイアフラムはアルミナを具備してなることを特徴とする請求項1に記載の静電容量センサー。
- 前記プレートの前記一つは凹部を含む特異セクションを具備してなると共に、前記第2の間隙は前記第1の間隙よりも大きなものであることを特徴とする請求項1に記載の静電容量センサー。
- 前記プレートのそれぞれは隆起したプラットホームを有することを特徴とする請求項1に記載の静電容量センサー。
- 前記プレートのそれぞれは凹部を有することを特徴とする請求項1に記載の静電容量センサー。
- 前記プレートの一つは隆起したプラットホームを有しかつその他方は凹部を有することを特徴とする請求項1に記載の静電容量センサー。
- 前記バンプは前記特異セクションの外部に存在することを特徴とする請求項1に記載の静電容量センサー。
- 前記バンプは前記特異セクションの内部に存在することを特徴とする請求項1に記載の静電容量センサー。
- 前記バンプは前記特異セクションを取り囲んでいることを特徴とする請求項1に記載の静電容量センサー。
- 前記プレートの前記少なくとも一つは、前記バンプを部分的に受けるための切欠き部分を含むことを特徴とする請求項1に記載の静電容量センサー。
- 前記プレートは導電プレートおよび基板を含むことを特徴とする請求項1に記載の静電容量センサー。
- 前記導電プレートおよび前記基板はアルミナを含むことを特徴とする請求項11に記載の静電容量センサー。
- 前記プレートは集積回路チップおよび基板を含むことを特徴とする請求項1に記載の静電容量センサー。
- 前記集積回路チップはケイ素を含みかつ前記基板はアルミナを含むことを特徴とする請求項13に記載の静電容量センサー。
- 前記第2の間隙における前記プレートの向き合う面は金属で被覆されていることを特徴とする請求項1に記載の静電容量センサー。
- 前記プレートの一つは、ダイアフラムを構成する、前記第2の間隙近傍の穴部分を含むことを特徴とする請求項15に記載の静電容量センサー。
- 前記プレートの前記一つは隆起したプラットホームを含む特異セクションを具備してなると共に、前記第2の間隙は前記第1の間隙よりも小さなものであることを特徴とする請求項1に記載の静電容量センサー。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US62724904P | 2004-11-12 | 2004-11-12 | |
| US60/627,249 | 2004-11-12 | ||
| PCT/US2005/040721 WO2006053118A2 (en) | 2004-11-12 | 2005-11-10 | Spaced, bumped component structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008519702A JP2008519702A (ja) | 2008-06-12 |
| JP4808729B2 true JP4808729B2 (ja) | 2011-11-02 |
Family
ID=36337210
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007541308A Expired - Fee Related JP4808729B2 (ja) | 2004-11-12 | 2005-11-10 | 離間した突き当て型コンポーネント構造体 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7667323B2 (ja) |
| JP (1) | JP4808729B2 (ja) |
| CN (1) | CN101300913B (ja) |
| DE (1) | DE112005002762T5 (ja) |
| WO (1) | WO2006053118A2 (ja) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060191351A1 (en) * | 2005-02-25 | 2006-08-31 | Meehan Peter G | Sealed capacitive sensor |
| US7401523B2 (en) * | 2005-02-25 | 2008-07-22 | Analog Devices, Inc. | Capacitive sensor and method of fabricating |
| WO2007031298A1 (de) * | 2005-09-14 | 2007-03-22 | Htc Beteiligungs Gmbh | Flip-chip-modul und verfahren zum erzeugen eines flip-chip-moduls |
| JP2009246006A (ja) * | 2008-03-28 | 2009-10-22 | Shinko Electric Ind Co Ltd | 半導体装置およびその製造方法ならびに半導体装置の実装構造 |
| TWI380413B (en) * | 2008-06-19 | 2012-12-21 | Unimicron Technology Corp | Pressure sensing device package and manufacturing method thereof |
| JP5445001B2 (ja) * | 2009-09-29 | 2014-03-19 | 沖電気工業株式会社 | 半導体素子内蔵基板及び半導体素子内蔵基板の製造方法 |
| DE102015109549A1 (de) * | 2014-06-25 | 2015-12-31 | Ford Global Technologies, Llc | Näherungsschalteranordnung mit einer Furche zwischen benachbarten Näherungssensoren |
Citations (10)
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| JPH07283334A (ja) * | 1994-04-11 | 1995-10-27 | Murata Mfg Co Ltd | 気密封止電子部品 |
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| JPH09503298A (ja) * | 1993-09-30 | 1997-03-31 | コミツサリア タ レネルジー アトミーク | 物理的量を特徴付けるための集積電子センサおよびかかるセンサを製造するための方法 |
| JPH10256310A (ja) * | 1997-03-12 | 1998-09-25 | Toshiba Corp | 半導体装置及び半導体装置の製造方法 |
| JPH1187196A (ja) * | 1997-07-11 | 1999-03-30 | Micronas Intermetall Gmbh | キャパシタ構造およびその製造方法 |
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| JP2005066727A (ja) * | 2003-08-21 | 2005-03-17 | Olympus Corp | 半導体装置 |
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| JP2006098206A (ja) * | 2004-09-29 | 2006-04-13 | Kyocera Corp | 圧力検出装置用パッケージおよび圧力検出装置 |
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-
2005
- 2005-11-10 DE DE112005002762T patent/DE112005002762T5/de not_active Withdrawn
- 2005-11-10 CN CN2005800387140A patent/CN101300913B/zh not_active Expired - Fee Related
- 2005-11-10 US US11/272,564 patent/US7667323B2/en not_active Expired - Lifetime
- 2005-11-10 WO PCT/US2005/040721 patent/WO2006053118A2/en not_active Ceased
- 2005-11-10 JP JP2007541308A patent/JP4808729B2/ja not_active Expired - Fee Related
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60501177A (ja) * | 1983-03-24 | 1985-07-25 | ツィ−グラ−、カ−ルハインツ | 圧力センサ |
| JPH09503298A (ja) * | 1993-09-30 | 1997-03-31 | コミツサリア タ レネルジー アトミーク | 物理的量を特徴付けるための集積電子センサおよびかかるセンサを製造するための方法 |
| JPH07283334A (ja) * | 1994-04-11 | 1995-10-27 | Murata Mfg Co Ltd | 気密封止電子部品 |
| JPH08236577A (ja) * | 1995-02-28 | 1996-09-13 | Nec Corp | フェイスダウン実装方法 |
| JPH10256310A (ja) * | 1997-03-12 | 1998-09-25 | Toshiba Corp | 半導体装置及び半導体装置の製造方法 |
| JPH1187196A (ja) * | 1997-07-11 | 1999-03-30 | Micronas Intermetall Gmbh | キャパシタ構造およびその製造方法 |
| US20030100200A1 (en) * | 2001-11-28 | 2003-05-29 | Franzon Paul D. | Buried solder bumps for AC-coupled microelectronic interconnects |
| JP2005066727A (ja) * | 2003-08-21 | 2005-03-17 | Olympus Corp | 半導体装置 |
| JP2006084327A (ja) * | 2004-09-16 | 2006-03-30 | Denso Corp | 容量式力学量センサ装置 |
| JP2006098206A (ja) * | 2004-09-29 | 2006-04-13 | Kyocera Corp | 圧力検出装置用パッケージおよび圧力検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101300913A (zh) | 2008-11-05 |
| JP2008519702A (ja) | 2008-06-12 |
| CN101300913B (zh) | 2012-01-25 |
| US20060163726A1 (en) | 2006-07-27 |
| DE112005002762T5 (de) | 2007-08-30 |
| US7667323B2 (en) | 2010-02-23 |
| WO2006053118A3 (en) | 2007-05-24 |
| WO2006053118A2 (en) | 2006-05-18 |
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