JP4860588B2 - イオン濃度測定装置 - Google Patents
イオン濃度測定装置 Download PDFInfo
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- JP4860588B2 JP4860588B2 JP2007260924A JP2007260924A JP4860588B2 JP 4860588 B2 JP4860588 B2 JP 4860588B2 JP 2007260924 A JP2007260924 A JP 2007260924A JP 2007260924 A JP2007260924 A JP 2007260924A JP 4860588 B2 JP4860588 B2 JP 4860588B2
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- Prior art keywords
- ion
- electrode
- current
- measuring
- amplifier
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- 238000005259 measurement Methods 0.000 claims description 28
- 238000006243 chemical reaction Methods 0.000 claims description 26
- 230000006866 deterioration Effects 0.000 claims description 12
- 238000005070 sampling Methods 0.000 claims description 9
- 239000012488 sample solution Substances 0.000 claims description 6
- 150000002500 ions Chemical class 0.000 description 97
- 238000002847 impedance measurement Methods 0.000 description 15
- 238000001514 detection method Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 8
- 239000010408 film Substances 0.000 description 6
- 230000001360 synchronised effect Effects 0.000 description 6
- 101100489713 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) GND1 gene Proteins 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- WCUXLLCKKVVCTQ-UHFFFAOYSA-M Potassium chloride Chemical compound [Cl-].[K+] WCUXLLCKKVVCTQ-UHFFFAOYSA-M 0.000 description 2
- 101100489717 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) GND2 gene Proteins 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- GTKRFUAGOKINCA-UHFFFAOYSA-M chlorosilver;silver Chemical compound [Ag].[Ag]Cl GTKRFUAGOKINCA-UHFFFAOYSA-M 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000010485 coping Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 235000011164 potassium chloride Nutrition 0.000 description 1
- 239000001103 potassium chloride Substances 0.000 description 1
- 230000003449 preventive effect Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
Claims (2)
- 試料溶液中に浸漬させたイオン選択性電極および比較電極の間の電位差を高入力インピーダンスのバッファアンプを用い測定することによりイオン濃度を測定するイオン濃度測定装置において、
電極インピーダンス測定用の交流信号を比較電極に印加する印加手段と、
前記イオン選択性電極に接続される、前記バッファアンプと共通の入力点に接続され、前記電極間に流れる電流の交流成分を低入力インピーダンスの電流−電圧変換アンプを用い計測する交流信号計測手段と、
を備え、
前記バッファアンプの電源および接地点と、電流−電圧変換アンプの電源および接地点とをアイソレートするとともに、前記バッファアンプと電流−電圧変換アンプの出力間をアイソレートし、前記電位差を測定しつつ、前記交流成分の測定値からイオン選択性電極の劣化を検出することを特徴とするイオン濃度測定装置。 - 前記交流成分の測定値を印加する交流信号の周波数に同期してサンプリングすることを特徴とする請求項1記載のイオン濃度測定装置。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007260924A JP4860588B2 (ja) | 2007-10-04 | 2007-10-04 | イオン濃度測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007260924A JP4860588B2 (ja) | 2007-10-04 | 2007-10-04 | イオン濃度測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2009092414A JP2009092414A (ja) | 2009-04-30 |
| JP4860588B2 true JP4860588B2 (ja) | 2012-01-25 |
Family
ID=40664551
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007260924A Expired - Fee Related JP4860588B2 (ja) | 2007-10-04 | 2007-10-04 | イオン濃度測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4860588B2 (ja) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10788447B2 (en) | 2014-11-26 | 2020-09-29 | Horiba Advanced Techno Co., Ltd. | Liquid analyzer and liquid analysis system |
| JP6890569B2 (ja) * | 2018-09-28 | 2021-06-18 | 株式会社日立ハイテク | 電解質測定装置 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62261950A (ja) * | 1986-05-09 | 1987-11-14 | Toa Denpa Kogyo Kk | pH等の計測装置における検出端部のクラツク発生の検出方法,及びその装置 |
| JPH01242958A (ja) * | 1988-03-24 | 1989-09-27 | Shimadzu Corp | イオン濃度測定装置 |
| JP2684769B2 (ja) * | 1989-05-24 | 1997-12-03 | 横河電機株式会社 | pH変換器 |
| JP3255817B2 (ja) * | 1995-02-03 | 2002-02-12 | 東亜ディーケーケー株式会社 | イオン濃度測定装置 |
-
2007
- 2007-10-04 JP JP2007260924A patent/JP4860588B2/ja not_active Expired - Fee Related
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| Publication number | Publication date |
|---|---|
| JP2009092414A (ja) | 2009-04-30 |
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