JP4986464B2 - スロット付基板 - Google Patents
スロット付基板 Download PDFInfo
- Publication number
- JP4986464B2 JP4986464B2 JP2006022523A JP2006022523A JP4986464B2 JP 4986464 B2 JP4986464 B2 JP 4986464B2 JP 2006022523 A JP2006022523 A JP 2006022523A JP 2006022523 A JP2006022523 A JP 2006022523A JP 4986464 B2 JP4986464 B2 JP 4986464B2
- Authority
- JP
- Japan
- Prior art keywords
- chip
- substrate
- metal plate
- resin
- slot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/18—Water
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D41/00—Regeneration of the filtering material or filter elements outside the filter for liquid or gaseous fluids
- B01D41/04—Regeneration of the filtering material or filter elements outside the filter for liquid or gaseous fluids of rigid self-supporting filtering material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/34—Purifying; Cleaning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Molecular Biology (AREA)
- Biomedical Technology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Wire Bonding (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
11 能動面
12 チップ
13,14,15,16 金属板
17 樹脂
30 基板
31 能動面
32 チップ
33,34,35,36 金属板
37 樹脂
351 第一表面
352 第二表面
353,354 スロット
356 貫通孔となったスロット
Claims (3)
- スロット付基板であって、
能動面と、
前記能動面に形成された複数の金属板と、を備え、
各金属板は第一表面と第二表面とを有し、第一表面は前記能動面に接続され、少なくとも一つの金属板は、前記第二表面に形成された少なくとも一つのスロットを有し、
前記金属板は、複数のワイヤ金属板と少なくとも一つの擬似リードとに分類され、
前記スロット付基板は、前記能動面に配置されると共に前記ワイヤ金属板に電気的に接続された少なくとも一つのチップをさらに備え、前記チップは、複数の側面と複数のコーナとを有し、前記ワイヤ金属板は、前記チップ側面の対応位置に配置され、前記擬似リードは、前記チップに電気的に接続されておらず、且つ前記チップにおける少なくとも一つのコーナの対応位置に配置され、
前記スロット付基板は、前記チップの側面とコーナとを囲むように塗布され且つ前記チップと前記金属板とを気密的に接続させている樹脂をさらに備え、
前記擬似リードは、前記樹脂を保持する溝状のスロットを少なくとも一つを有し、前記スロットの深さは金属板の高さより低いことを特徴とするスロット付基板。 - 前記基板はフレキシブル基板であることを特徴とする請求項1に記載の基板。
- チップ側面の対応位置に配置された前記ワイヤ金属板は、少なくとも一つのスロットを有することを特徴とする請求項1または2に記載の基板。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW094104035A TWI267972B (en) | 2005-02-05 | 2005-02-05 | Substrate with slot |
| TW094104035 | 2005-02-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2006216950A JP2006216950A (ja) | 2006-08-17 |
| JP4986464B2 true JP4986464B2 (ja) | 2012-07-25 |
Family
ID=36778781
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006022523A Expired - Fee Related JP4986464B2 (ja) | 2005-02-05 | 2006-01-31 | スロット付基板 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7449770B2 (ja) |
| JP (1) | JP4986464B2 (ja) |
| KR (1) | KR101147929B1 (ja) |
| TW (1) | TWI267972B (ja) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8536718B2 (en) * | 2010-06-24 | 2013-09-17 | Stats Chippac Ltd. | Integrated circuit packaging system with trenches and method of manufacture thereof |
| CN108735701B (zh) * | 2017-04-13 | 2021-12-24 | 恩智浦美国有限公司 | 具有用于包封期间的毛刺缓解的虚设引线的引线框架 |
| KR102932179B1 (ko) | 2021-07-22 | 2026-03-04 | 삼성전자주식회사 | 반도체 패키지 |
| TWI823452B (zh) * | 2022-06-30 | 2023-11-21 | 頎邦科技股份有限公司 | 半導體封裝構造及其電路板 |
| TWI845296B (zh) * | 2023-05-04 | 2024-06-11 | 頎邦科技股份有限公司 | 軟性電路板之佈線結構 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4330790A (en) * | 1980-03-24 | 1982-05-18 | National Semiconductor Corporation | Tape operated semiconductor device packaging |
| US4496965A (en) * | 1981-05-18 | 1985-01-29 | Texas Instruments Incorporated | Stacked interdigitated lead frame assembly |
| US5647124A (en) | 1994-04-25 | 1997-07-15 | Texas Instruments Incorporated | Method of attachment of a semiconductor slotted lead to a substrate |
| JPH0823009A (ja) * | 1994-07-06 | 1996-01-23 | Toshiba Corp | 半導体装置の製造方法 |
| JPH0951067A (ja) * | 1995-08-08 | 1997-02-18 | Sony Corp | リードフレーム |
| US5691242A (en) * | 1996-02-26 | 1997-11-25 | Motorola, Inc. | Method for making an electronic component having an organic substrate |
| JP3564970B2 (ja) * | 1997-02-17 | 2004-09-15 | セイコーエプソン株式会社 | テープキャリアおよびこれを用いたテープキャリアデバイス |
| JP3683434B2 (ja) * | 1999-04-16 | 2005-08-17 | 富士通株式会社 | 半導体装置 |
| JP2001185578A (ja) * | 1999-12-24 | 2001-07-06 | Toshiba Corp | 半導体装置 |
| JP3536023B2 (ja) * | 2000-10-13 | 2004-06-07 | シャープ株式会社 | Cof用テープキャリアおよびこれを用いて製造されるcof構造の半導体装置 |
| JP2003204027A (ja) | 2002-01-09 | 2003-07-18 | Matsushita Electric Ind Co Ltd | リードフレーム及びその製造方法、樹脂封止型半導体装置及びその製造方法 |
-
2005
- 2005-02-05 TW TW094104035A patent/TWI267972B/zh not_active IP Right Cessation
-
2006
- 2006-01-27 US US11/341,877 patent/US7449770B2/en not_active Expired - Fee Related
- 2006-01-31 JP JP2006022523A patent/JP4986464B2/ja not_active Expired - Fee Related
- 2006-02-03 KR KR1020060010632A patent/KR101147929B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| TW200629515A (en) | 2006-08-16 |
| US20060175088A1 (en) | 2006-08-10 |
| JP2006216950A (ja) | 2006-08-17 |
| KR101147929B1 (ko) | 2012-05-22 |
| KR20060089872A (ko) | 2006-08-09 |
| US7449770B2 (en) | 2008-11-11 |
| TWI267972B (en) | 2006-12-01 |
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