JP7143019B2 - ウェーハの加工方法 - Google Patents
ウェーハの加工方法 Download PDFInfo
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- JP7143019B2 JP7143019B2 JP2018108955A JP2018108955A JP7143019B2 JP 7143019 B2 JP7143019 B2 JP 7143019B2 JP 2018108955 A JP2018108955 A JP 2018108955A JP 2018108955 A JP2018108955 A JP 2018108955A JP 7143019 B2 JP7143019 B2 JP 7143019B2
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- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
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- C09J167/00—Adhesives based on polyesters obtained by reactions forming a carboxylic ester link in the main chain; Adhesives based on derivatives of such polymers
- C09J167/02—Polyesters derived from dicarboxylic acids and dihydroxy compounds
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- C09J5/00—Adhesive processes in general; Adhesive processes not provided for elsewhere, e.g. relating to primers
- C09J5/06—Adhesive processes in general; Adhesive processes not provided for elsewhere, e.g. relating to primers involving heating of the applied adhesive
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- C09J7/00—Adhesives in the form of films or foils
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- C09J7/10—Adhesives in the form of films or foils without carriers
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
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- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/35—Heat-activated
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P10/00—Bonding of wafers, substrates or parts of devices
- H10P10/12—Bonding of semiconductor wafers or semiconductor substrates to semiconductor wafers or semiconductor substrates
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- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0436—Apparatus for thermal treatment mainly by radiation
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0442—Apparatus for placing on an insulating substrate, e.g. tape
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0602—Temperature monitoring
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- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3206—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
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- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3212—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips or lead frames
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
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- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/90—Thermal treatments, e.g. annealing or sintering
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/01—Manufacture or treatment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/40—Additional features of adhesives in the form of films or foils characterized by the presence of essential components
- C09J2301/416—Additional features of adhesives in the form of films or foils characterized by the presence of essential components use of irradiation
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/50—Additional features of adhesives in the form of films or foils characterized by process specific features
- C09J2301/502—Additional features of adhesives in the form of films or foils characterized by process specific features process for debonding adherents
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2467/00—Presence of polyester
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H10P72/742—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/501—Marks applied to devices, e.g. for alignment or identification for use before dicing
- H10W46/503—Located in scribe lines
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Dicing (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Description
1a 表面
1b 裏面
3 分割予定ライン
3a 切削痕
5 デバイス
7 フレーム
7a 開口
9 ポリエステル系シート
9a 切断痕
11 フレームユニット
2 チャックテーブル
2a 保持面
2b,40a 吸引源
2c,40b 切り替え部
4 ヒートガン
4a 熱風
6 ヒートローラー
8 赤外線ランプ
8a 赤外線
10 カッター
12 切削装置
14 切削ユニット
16 スピンドルハウジング
18 切削ブレード
20 切削水供給ノズル
22 ピックアップ装置
24 ドラム
26 フレーム保持ユニット
28 クランプ
30 フレーム支持台
32 ロッド
34 エアシリンダ
36 ベース
38 突き上げ機構
38a エアー
40 コレット
Claims (9)
- 複数のデバイスが、分割予定ラインによって区画された表面の各領域に形成されたウェーハを個々のデバイスチップに分割するウェーハの加工方法であって、
ウェーハを収容する開口を有するフレームの該開口内にウェーハを位置付け、該ウェーハの裏面と該フレームの外周とに糊層を備えないポリエステル系シートを配設するポリエステル系シート配設工程と、
該ポリエステル系シートを加熱し熱圧着により該ウェーハと該フレームとを該ポリエステル系シートを介して一体化する一体化工程と、
切削ブレードを回転可能に備えた切削装置を用いて該ウェーハを分割予定ラインに沿って切削して該ウェーハを個々のデバイスチップに分割する分割工程と、
該ポリエステル系シート側からエアーを吹き付けることにより個々にデバイスチップを突き上げ、該ポリエステル系シートから個々の該デバイスチップをピックアップするピックアップ工程と、
を備えることを特徴とするウェーハの加工方法。 - 該一体化工程において、赤外線の照射によって該熱圧着を実施することを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、一体化を実施した後、該フレームの外周からはみ出したポリエステル系シートを除去することを特徴とする請求項1記載のウェーハの加工方法。
- 該ピックアップ工程では、該ポリエステル系シートを拡張して各デバイスチップ間の間隔を広げることを特徴とする請求項1記載のウェーハの加工方法。
- 該ポリエステル系シートは、ポリエチレンテレフタレートシート、ポリエチレンナフタレートシートのいずれかであることを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、該ポリエステル系シートが該ポリエチレンテレフタレートシートである場合に加熱温度は250℃~270℃であり、該ポリエステル系シートが該ポリエチレンナフタレートシートである場合に加熱温度は160℃~180℃であることを特徴とする請求項5記載のウェーハの加工方法。
- 該ウェーハは、Si、GaN、GaAs、ガラスのいずれかで構成されることを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、該ポリエステル系シートに熱風を当てて該ポリエステル系シートを加熱して該熱圧着を実施することを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、該ポリエステル系シートをローラーで押圧して該熱圧着を実施することを特徴とする請求項1記載のウェーハの加工方法。
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018108955A JP7143019B2 (ja) | 2018-06-06 | 2018-06-06 | ウェーハの加工方法 |
| MYPI2019002834A MY191394A (en) | 2018-06-06 | 2019-05-17 | Wafer processing method |
| US16/419,139 US11018043B2 (en) | 2018-06-06 | 2019-05-22 | Wafer processing method using a ring frame and a polyester sheet |
| SG10201904710UA SG10201904710UA (en) | 2018-06-06 | 2019-05-24 | Wafer processing method |
| CN201910479952.9A CN110571133B (zh) | 2018-06-06 | 2019-06-04 | 晶片的加工方法 |
| KR1020190065794A KR102752176B1 (ko) | 2018-06-06 | 2019-06-04 | 웨이퍼의 가공 방법 |
| TW108119433A TWI815900B (zh) | 2018-06-06 | 2019-06-05 | 晶圓的加工方法 |
| DE102019208259.9A DE102019208259B4 (de) | 2018-06-06 | 2019-06-06 | Waferbearbeitungsverfahren |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018108955A JP7143019B2 (ja) | 2018-06-06 | 2018-06-06 | ウェーハの加工方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2019212810A JP2019212810A (ja) | 2019-12-12 |
| JP7143019B2 true JP7143019B2 (ja) | 2022-09-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018108955A Active JP7143019B2 (ja) | 2018-06-06 | 2018-06-06 | ウェーハの加工方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US11018043B2 (ja) |
| JP (1) | JP7143019B2 (ja) |
| KR (1) | KR102752176B1 (ja) |
| CN (1) | CN110571133B (ja) |
| DE (1) | DE102019208259B4 (ja) |
| MY (1) | MY191394A (ja) |
| SG (1) | SG10201904710UA (ja) |
| TW (1) | TWI815900B (ja) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7430515B2 (ja) * | 2019-11-06 | 2024-02-13 | 株式会社ディスコ | ウエーハの処理方法 |
| JP7777937B2 (ja) * | 2021-07-28 | 2025-12-01 | 株式会社ディスコ | 被加工物の加工方法 |
| JP7844124B2 (ja) | 2021-09-24 | 2026-04-13 | 株式会社ディスコ | 板状物の加工方法 |
| JP7847960B2 (ja) * | 2021-09-27 | 2026-04-20 | 株式会社ディスコ | 板状物の加工方法 |
Citations (6)
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|---|---|---|---|---|
| JP2003188195A (ja) | 2001-12-19 | 2003-07-04 | Nidec Tosok Corp | ピックアップ補助装置 |
| JP2006335860A (ja) | 2005-06-01 | 2006-12-14 | Lintec Corp | 接着シート |
| JP2009105249A (ja) | 2007-10-24 | 2009-05-14 | Nec Electronics Corp | ピックアップ装置およびピックアップ方法 |
| JP2011014778A (ja) | 2009-07-03 | 2011-01-20 | Lintec Corp | シート貼付装置および貼付方法 |
| JP2012054582A (ja) | 2006-06-23 | 2012-03-15 | Hitachi Chem Co Ltd | 接着フィルム |
| WO2016151911A1 (ja) | 2015-03-23 | 2016-09-29 | リンテック株式会社 | 半導体加工用シートおよび半導体装置の製造方法 |
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| TWI815900B (zh) | 2023-09-21 |
| CN110571133B (zh) | 2024-02-27 |
| KR20190139143A (ko) | 2019-12-17 |
| TW202002055A (zh) | 2020-01-01 |
| MY191394A (en) | 2022-06-23 |
| DE102019208259A1 (de) | 2019-12-12 |
| DE102019208259B4 (de) | 2025-04-17 |
| US11018043B2 (en) | 2021-05-25 |
| SG10201904710UA (en) | 2020-01-30 |
| CN110571133A (zh) | 2019-12-13 |
| US20190378745A1 (en) | 2019-12-12 |
| JP2019212810A (ja) | 2019-12-12 |
| KR102752176B1 (ko) | 2025-01-09 |
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