JP7233258B2 - 異常診断装置 - Google Patents

異常診断装置 Download PDF

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Publication number
JP7233258B2
JP7233258B2 JP2019045371A JP2019045371A JP7233258B2 JP 7233258 B2 JP7233258 B2 JP 7233258B2 JP 2019045371 A JP2019045371 A JP 2019045371A JP 2019045371 A JP2019045371 A JP 2019045371A JP 7233258 B2 JP7233258 B2 JP 7233258B2
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Japanese (ja)
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JP2020149259A (ja
Inventor
嘉成 堀
憲一郎 岡
孝朗 関合
喜治 林
義幸 黒羽
政幸 平塚
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2019045371A priority Critical patent/JP7233258B2/ja
Priority to CN201980067454.1A priority patent/CN112912807A/zh
Priority to PCT/JP2019/043475 priority patent/WO2020183781A1/fr
Publication of JP2020149259A publication Critical patent/JP2020149259A/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2019045371A 2019-03-13 2019-03-13 異常診断装置 Active JP7233258B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2019045371A JP7233258B2 (ja) 2019-03-13 2019-03-13 異常診断装置
CN201980067454.1A CN112912807A (zh) 2019-03-13 2019-11-06 异常诊断装置
PCT/JP2019/043475 WO2020183781A1 (fr) 2019-03-13 2019-11-06 Dispositif de diagnostic d'anomalie

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019045371A JP7233258B2 (ja) 2019-03-13 2019-03-13 異常診断装置

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JP2020149259A JP2020149259A (ja) 2020-09-17
JP7233258B2 true JP7233258B2 (ja) 2023-03-06

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JP (1) JP7233258B2 (fr)
CN (1) CN112912807A (fr)
WO (1) WO2020183781A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI768606B (zh) * 2020-12-18 2022-06-21 日月光半導體製造股份有限公司 感測器監測系統及方法
CN116448468A (zh) * 2022-01-07 2023-07-18 泰科电子(上海)有限公司 人工智能诊断系统
JP7722253B2 (ja) * 2022-04-27 2025-08-13 横河電機株式会社 情報処理装置、要因分析方法及び要因分析プログラム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018051568A1 (fr) 2016-09-15 2018-03-22 株式会社日立製作所 Dispositif et système de diagnostic d'anomalie d'installation
JP2018159981A (ja) 2017-03-22 2018-10-11 オムロン株式会社 制御システム、制御装置、制御プログラム、および制御方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05322642A (ja) * 1992-05-22 1993-12-07 Hitachi Ltd 回転機器異常診断装置
US7933828B2 (en) * 2005-07-26 2011-04-26 Cfph, Llc System and method for displaying and/or analyzing a limit order book
JP4832609B1 (ja) * 2011-06-22 2011-12-07 株式会社日立エンジニアリング・アンド・サービス 異常予兆診断装置および異常予兆診断方法
JP6830414B2 (ja) * 2017-06-28 2021-02-17 株式会社日立製作所 診断装置及び診断方法
CN107506463B (zh) * 2017-08-30 2020-08-18 宁波城市职业技术学院 一种数据分类和处理方法及设备

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018051568A1 (fr) 2016-09-15 2018-03-22 株式会社日立製作所 Dispositif et système de diagnostic d'anomalie d'installation
JP2018159981A (ja) 2017-03-22 2018-10-11 オムロン株式会社 制御システム、制御装置、制御プログラム、および制御方法

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JP2020149259A (ja) 2020-09-17
CN112912807A (zh) 2021-06-04
WO2020183781A1 (fr) 2020-09-17

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