JP7256593B2 - 設置環境提案方法およびそのための計量装置 - Google Patents

設置環境提案方法およびそのための計量装置 Download PDF

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Publication number
JP7256593B2
JP7256593B2 JP2021504698A JP2021504698A JP7256593B2 JP 7256593 B2 JP7256593 B2 JP 7256593B2 JP 2021504698 A JP2021504698 A JP 2021504698A JP 2021504698 A JP2021504698 A JP 2021504698A JP 7256593 B2 JP7256593 B2 JP 7256593B2
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analysis
data
database
improvement
installation environment
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Japanese (ja)
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JPWO2020183633A1 (fr
Inventor
嘉國 佐藤
吉一 長根
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A&D Holon Holdings Co Ltd
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A&D Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01GWEIGHING
    • G01G23/00Auxiliary devices for weighing apparatus
    • G01G23/18Indicating devices, e.g. for remote indication; Recording devices; Scales, e.g. graduated
    • G01G23/36Indicating the weight by electrical means, e.g. using photoelectric cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01GWEIGHING
    • G01G23/00Auxiliary devices for weighing apparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01GWEIGHING
    • G01G23/00Auxiliary devices for weighing apparatus
    • G01G23/01Testing or calibrating of weighing apparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01GWEIGHING
    • G01G23/00Auxiliary devices for weighing apparatus
    • G01G23/18Indicating devices, e.g. for remote indication; Recording devices; Scales, e.g. graduated
    • G01G23/36Indicating the weight by electrical means, e.g. using photoelectric cells
    • G01G23/37Indicating the weight by electrical means, e.g. using photoelectric cells involving digital counting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01GWEIGHING
    • G01G23/00Auxiliary devices for weighing apparatus
    • G01G23/48Temperature-compensating arrangements
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/24Querying
    • G06F16/245Query processing
    • G06F16/2457Query processing with adaptation to user needs
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/28Databases characterised by their database models, e.g. relational or object models
    • G06F16/284Relational databases
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computing arrangements based on biological models
    • G06N3/02Neural networks
    • G06N3/08Learning methods

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Databases & Information Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Computational Linguistics (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Computing Systems (AREA)
  • Artificial Intelligence (AREA)
  • Biophysics (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Recording Measured Values (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
JP2021504698A 2019-03-13 2019-03-13 設置環境提案方法およびそのための計量装置 Active JP7256593B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/010198 WO2020183633A1 (fr) 2019-03-13 2019-03-13 Procédé permettant de proposer des environnements d'installation et dispositif de mesure associé

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JPWO2020183633A1 JPWO2020183633A1 (fr) 2020-09-17
JP7256593B2 true JP7256593B2 (ja) 2023-04-12

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JP2021504698A Active JP7256593B2 (ja) 2019-03-13 2019-03-13 設置環境提案方法およびそのための計量装置

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US (1) US11988545B2 (fr)
EP (1) EP3940353B1 (fr)
JP (1) JP7256593B2 (fr)
KR (1) KR102726756B1 (fr)
WO (1) WO2020183633A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116174912B (zh) * 2022-12-20 2025-09-09 安徽杰蓝特新材料有限公司 一种燃气管道用激光打码系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012154878A (ja) 2011-01-28 2012-08-16 A & D Co Ltd 計量装置
WO2013065174A1 (fr) 2011-11-04 2013-05-10 株式会社 エー・アンド・デイ Enregistreur de données pour dispositif de mesure

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2626023C3 (de) * 1976-06-10 1980-04-17 Maatschappij Van Berkel's, Patent N.V., Rotterdam (Niederlande) Wiegevorrichtung
JPS6232281Y2 (fr) 1979-10-29 1987-08-18
CH670507A5 (fr) 1986-05-23 1989-06-15 Mettler Instrumente Ag
JPH0743275B2 (ja) * 1990-07-30 1995-05-15 株式会社島津製作所 電子天びん
EP1785703B1 (fr) 2005-11-15 2011-12-21 Mettler-Toledo AG Procédé destiné à la surveillance et/ou la détermination de l'état d'un dispositif de mesure de force et dispositif de mesure de force
EP2159554A1 (fr) * 2008-08-29 2010-03-03 Mettler-Toledo AG Procédé de surveillance d'état d'un dispositif de mesure de force, dispositif de mesure de force et module de mesure de force
JP2010266349A (ja) * 2009-05-15 2010-11-25 A & D Co Ltd 定量滴定機器の性能検査用容器及び同容器を用いた計測環境判定方法
FI122872B (fi) * 2011-01-28 2012-08-15 Ponsse Oyj Menetelmä punnitusjärjestelmän tarkistuspunnituksessa ja ohjelmistotuote sekä järjestely punnitusjärjestelmän tarkistuspunnituksessa ja materiaalinkäsittelykone
JP2013024562A (ja) 2011-07-14 2013-02-04 Fujifilm Corp 質量測定方法及び質量測定装置
FR3041428B1 (fr) * 2015-09-22 2017-10-13 Seb Sa Procede de commande d’un dispositif de pesage
JP6568995B2 (ja) * 2016-03-07 2019-08-28 株式会社イシダ 組合せ計量装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012154878A (ja) 2011-01-28 2012-08-16 A & D Co Ltd 計量装置
WO2013065174A1 (fr) 2011-11-04 2013-05-10 株式会社 エー・アンド・デイ Enregistreur de données pour dispositif de mesure

Also Published As

Publication number Publication date
EP3940353A1 (fr) 2022-01-19
EP3940353B1 (fr) 2023-10-18
US11988545B2 (en) 2024-05-21
WO2020183633A1 (fr) 2020-09-17
US20220099481A1 (en) 2022-03-31
KR102726756B1 (ko) 2024-11-07
JPWO2020183633A1 (fr) 2020-09-17
KR20210136031A (ko) 2021-11-16
EP3940353A4 (fr) 2022-10-12

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