JP7286706B2 - Fpgaのテストおよび構成のためのシステムおよび方法 - Google Patents
Fpgaのテストおよび構成のためのシステムおよび方法 Download PDFInfo
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- JP7286706B2 JP7286706B2 JP2021077157A JP2021077157A JP7286706B2 JP 7286706 B2 JP7286706 B2 JP 7286706B2 JP 2021077157 A JP2021077157 A JP 2021077157A JP 2021077157 A JP2021077157 A JP 2021077157A JP 7286706 B2 JP7286706 B2 JP 7286706B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318516—Test of programmable logic devices [PLDs]
- G01R31/318519—Test of field programmable gate arrays [FPGA]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3177—Testing of logic operation, e.g. by logic analysers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
- G11C19/28—Digital stores in which the information is moved stepwise, e.g. shift registers using semiconductor elements
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
- H03K19/17724—Structural details of logic blocks
- H03K19/17728—Reconfigurable logic blocks, e.g. lookup tables
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
- H03K19/17736—Structural details of routing resources
- H03K19/1774—Structural details of routing resources for global signals, e.g. clock, reset
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
- H03K19/17748—Structural details of configuration resources
- H03K19/17764—Structural details of configuration resources for reliability
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/037—Bistable circuits
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- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- Computer Networks & Wireless Communication (AREA)
- Logic Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Description
Claims (6)
- 複数のルックアップテーブル(LUT)(21、22、911、912)を備えるFPGAを動作させる方法であって、前記LUTがそれぞれ、複数の構成入力、複数のデータ入力(920)、および1つ以上のデータ出力を備え、前記方法は、
プログラミングシフトレジスタ(37)に結合された出力を有するマルチプレクサ(38)に、テストプロトコルを実施する構成値を受け取る入力を選択するように命令するステップと、
複数のLUTフリップフロップ(915、916)に、テスト構成に入るように命令するステップであって、前記LUTフリップフロップ(915、916)がそれぞれ、前記テストプロトコルを実施する入力を受け取り、前記LUTフリップフロップ(915、916)がシフトレジスタとして接続される、ステップと、
前記プログラミングシフトレジスタ(37)をクロックして、前記テストプロトコルを実施する前記構成値に属するLUT構成値で前記プログラミングシフトレジスタ(37)の要素(3707、3708、3709、3710、3711、3712、3713、3714、3715)の第1のセットをロードするステップと、
前記プログラミングシフトレジスタ(37)をクロックして、前記テストプロトコルを実施する前記構成値に属するルーティングスイッチ構成値で前記シフトレジスタ(37)の要素(3701、3702、3703、3704、3705、3706)の第2のセットをロードするステップと、
前記複数のLUTフリップフロップ(915、916)に、前記LUTフリップフロップ(915、916)がそれぞれ前記複数のLUT(21、22)の前記出力それぞれから入力をそれぞれ受け取る演算構成に入るように命令するステップと、
前記複数のLUT(21、22)の前記入力(920)に、前記プログラミングシフトレジスタのそれぞれの要素からのデータを適用するステップと、
前記LUTフリップフロップ(915、916)をクロックして、それぞれの前記LUTフリップフロップ(915、916)への前記LUT(21、22)それぞれの前記出力をサンプリングするステップであって、前記出力が前記テストプロトコルおよび前記データ入力に応答する、ステップと、
前記LUTフリップフロップ(915、916)に、前記LUTフリップフロップがLUTシフトレジスタ内で接続され、かつシフトレジスタとして接続されるテスト構成に入るように命令するステップと、
前記LUTフリップフロップ(915、916)をクロックして、前記テストプロトコルおよび前記データ入力に応答する前記LUTの前記出力を含む、前記LUTシフトレジスタの前記値を読み出すステップと
を含む、方法。 - 第1のプログラミングシフトレジスタ(37)の前記出力を前記プログラミングシフトレジスタとして有効にするさらなるステップと、
さらなる前記プログラミングシフトレジスタに対して前記有効にするステップ、前記命令するステップ、および前記クロックするステップを繰り返すさらなるステップと
を含む、請求項1に記載の方法。 - 第1のプログラミングシフトレジスタ(37)の前記出力を前記プログラミングシフトレジスタとして有効にするさらなるステップと、
さらなる前記プログラミングシフトレジスタに対して前記有効にするステップおよび前記クロックするステップを繰り返すさらなるステップと
を含む、請求項1に記載の方法。 - 論理関数を実施する前記LUT構成、および前記プログラミングシフトレジスタから読み出された論理関数を実施するルーティングスイッチ構成を、論理関数を実施するLUT構成、および元々前記シフトレジスタに読み込まれた論理関数を実施するルーティングスイッチ構成と比較するさらなるステップを含む、請求項3に記載の方法。
- 請求項1~4のいずれか一項に記載のステップを実施するように適合されたコンピュータプログラム。
- 請求項5に記載のコンピュータプログラムを組み込んだコンピュータ可読媒体。
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP15306641.0A EP3157172B1 (en) | 2015-10-15 | 2015-10-15 | System and method for testing and configuration of an fpga |
| EP15306641.0 | 2015-10-15 | ||
| JP2017536024A JP2018537871A (ja) | 2015-10-15 | 2016-10-07 | Fpgaのテストおよび構成のためのシステムおよび方法 |
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| JP2017536024A Division JP2018537871A (ja) | 2015-10-15 | 2016-10-07 | Fpgaのテストおよび構成のためのシステムおよび方法 |
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| JP2021145339A JP2021145339A (ja) | 2021-09-24 |
| JP7286706B2 true JP7286706B2 (ja) | 2023-06-05 |
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| JP2017536024A Pending JP2018537871A (ja) | 2015-10-15 | 2016-10-07 | Fpgaのテストおよび構成のためのシステムおよび方法 |
| JP2021077157A Active JP7286706B2 (ja) | 2015-10-15 | 2021-04-30 | Fpgaのテストおよび構成のためのシステムおよび方法 |
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| US (2) | US10295595B2 (ja) |
| EP (2) | EP3157172B1 (ja) |
| JP (2) | JP2018537871A (ja) |
| KR (1) | KR102564093B1 (ja) |
| CN (3) | CN108028654B (ja) |
| IL (1) | IL253219B (ja) |
| MY (1) | MY184901A (ja) |
| RU (1) | RU2733092C2 (ja) |
| SG (1) | SG11201705319YA (ja) |
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