JPH0113134B2 - - Google Patents

Info

Publication number
JPH0113134B2
JPH0113134B2 JP60016869A JP1686985A JPH0113134B2 JP H0113134 B2 JPH0113134 B2 JP H0113134B2 JP 60016869 A JP60016869 A JP 60016869A JP 1686985 A JP1686985 A JP 1686985A JP H0113134 B2 JPH0113134 B2 JP H0113134B2
Authority
JP
Japan
Prior art keywords
data
microprocessor
slight variation
function
debugger
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP60016869A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61175832A (ja
Inventor
Kazuaki Sakurai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP60016869A priority Critical patent/JPS61175832A/ja
Publication of JPS61175832A publication Critical patent/JPS61175832A/ja
Publication of JPH0113134B2 publication Critical patent/JPH0113134B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP60016869A 1985-01-31 1985-01-31 マイクロプロセツサデバツガ Granted JPS61175832A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60016869A JPS61175832A (ja) 1985-01-31 1985-01-31 マイクロプロセツサデバツガ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60016869A JPS61175832A (ja) 1985-01-31 1985-01-31 マイクロプロセツサデバツガ

Publications (2)

Publication Number Publication Date
JPS61175832A JPS61175832A (ja) 1986-08-07
JPH0113134B2 true JPH0113134B2 (de) 1989-03-03

Family

ID=11928208

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60016869A Granted JPS61175832A (ja) 1985-01-31 1985-01-31 マイクロプロセツサデバツガ

Country Status (1)

Country Link
JP (1) JPS61175832A (de)

Also Published As

Publication number Publication date
JPS61175832A (ja) 1986-08-07

Similar Documents

Publication Publication Date Title
US6516428B2 (en) On-chip debug system
US4338660A (en) Relational break signal generating device
US4720778A (en) Software debugging analyzer
US4709366A (en) Computer assisted fault isolation in circuit board testing
US20110271256A1 (en) Bi-directional probing of software
CN100412811C (zh) 测试程序除错装置与方法、半导体测试装置及测试方法
JP2962239B2 (ja) 半導体集積回路検査装置およびその検査方法
JPH0113134B2 (de)
US20010016923A1 (en) Program execution system for semiconductor testing apparatus
US4622652A (en) Signal identification
JP4132499B2 (ja) 半導体試験用プログラムデバッグ装置
JPH02220145A (ja) プログラムトレース方式
Krummel et al. Advances in microcomputer development systems
Lee Microprocessor analysers in the development and support of microprocessor-based systems
Cluley System Testing and Development
JPS63103985A (ja) 集積回路素子検査装置
JPH05173830A (ja) 異常動作検出方法、及びエミュレータ
JP2000112781A (ja) 電子回路解析装置及び電子回路解析方法並びに記憶媒体
JPH0749797A (ja) プログラム作成装置
JPS62260234A (ja) 故障診断装置
JPH06266575A (ja) エミュレータ
JPS6166171A (ja) インサ−キツトｉｃ試験機
KR19990031688A (ko) 어드벤테스트를 위한 테스트 프로그램을 자동으로 발생하는방법
JPH0711785B2 (ja) Ｍｐｕを内蔵する半導体装置の評価装置及び評価方法
JPS61166641A (ja) プログラム動作解析装置